
Arleen M. Vazquez
Supervisory Patent Examiner (ID: 6486, Phone: (571)272-2619 , Office: P/2868 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2857, 2829, 2868 |
| Total Applications | 509 |
| Issued Applications | 380 |
| Pending Applications | 19 |
| Abandoned Applications | 113 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4533739
[patent_doc_number] => 07924042
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-12
[patent_title] => 'Semiconductor device, and design method, inspection method, and design program therefor'
[patent_app_type] => utility
[patent_app_number] => 11/509270
[patent_app_country] => US
[patent_app_date] => 2006-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 12
[patent_no_of_words] => 4877
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/924/07924042.pdf
[firstpage_image] =>[orig_patent_app_number] => 11509270
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/509270 | Semiconductor device, and design method, inspection method, and design program therefor | Aug 23, 2006 | Issued |
Array
(
[id] => 5152409
[patent_doc_number] => 20070035291
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-15
[patent_title] => 'IC sorter'
[patent_app_type] => utility
[patent_app_number] => 11/500491
[patent_app_country] => US
[patent_app_date] => 2006-08-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 6948
[patent_no_of_claims] => 33
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0035/20070035291.pdf
[firstpage_image] =>[orig_patent_app_number] => 11500491
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/500491 | IC sorter | Aug 7, 2006 | Abandoned |
Array
(
[id] => 5145724
[patent_doc_number] => 20070045778
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-01
[patent_title] => 'Wafer holder, heater unit used for wafer prober having the wafer holder, and wafer prober having the heater unit'
[patent_app_type] => utility
[patent_app_number] => 11/498988
[patent_app_country] => US
[patent_app_date] => 2006-08-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 12303
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0045/20070045778.pdf
[firstpage_image] =>[orig_patent_app_number] => 11498988
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/498988 | Wafer holder, heater unit used for wafer prober having the wafer holder, and wafer prober having the heater unit | Aug 3, 2006 | Abandoned |
Array
(
[id] => 4686039
[patent_doc_number] => 20080030220
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-07
[patent_title] => 'Characterization Array and Method for Determining Threshold Voltage Variation'
[patent_app_type] => utility
[patent_app_number] => 11/462186
[patent_app_country] => US
[patent_app_date] => 2006-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3347
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0030/20080030220.pdf
[firstpage_image] =>[orig_patent_app_number] => 11462186
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/462186 | Characterization array and method for determining threshold voltage variation | Aug 2, 2006 | Issued |
Array
(
[id] => 4444112
[patent_doc_number] => 07928723
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-19
[patent_title] => 'Measurement of dissipated power'
[patent_app_type] => utility
[patent_app_number] => 11/997286
[patent_app_country] => US
[patent_app_date] => 2006-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3406
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 120
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/928/07928723.pdf
[firstpage_image] =>[orig_patent_app_number] => 11997286
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/997286 | Measurement of dissipated power | Jul 27, 2006 | Issued |
Array
(
[id] => 5623323
[patent_doc_number] => 20060261828
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-23
[patent_title] => 'Resilient contact probe apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/493974
[patent_app_country] => US
[patent_app_date] => 2006-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 9237
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0261/20060261828.pdf
[firstpage_image] =>[orig_patent_app_number] => 11493974
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/493974 | Resilient contact probe apparatus | Jul 26, 2006 | Issued |
Array
(
[id] => 4907559
[patent_doc_number] => 20080018325
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-24
[patent_title] => 'APPARATUS AND METHOD FOR MEASURING AN OUTPUT POWER OF A POWER SUPPLY'
[patent_app_type] => utility
[patent_app_number] => 11/309285
[patent_app_country] => US
[patent_app_date] => 2006-07-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1573
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0018/20080018325.pdf
[firstpage_image] =>[orig_patent_app_number] => 11309285
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/309285 | APPARATUS AND METHOD FOR MEASURING AN OUTPUT POWER OF A POWER SUPPLY | Jul 20, 2006 | Abandoned |
Array
(
[id] => 5073429
[patent_doc_number] => 20070013404
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-18
[patent_title] => 'Apparatus, customer tray, and method for testing semiconductor packages'
[patent_app_type] => utility
[patent_app_number] => 11/488087
[patent_app_country] => US
[patent_app_date] => 2006-07-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 3087
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0013/20070013404.pdf
[firstpage_image] =>[orig_patent_app_number] => 11488087
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/488087 | Apparatus, customer tray, and method for testing semiconductor packages | Jul 17, 2006 | Abandoned |
Array
(
[id] => 7551321
[patent_doc_number] => 08063655
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-11-22
[patent_title] => 'Method and circuit for reducing degradation in a regulated circuit'
[patent_app_type] => utility
[patent_app_number] => 11/483686
[patent_app_country] => US
[patent_app_date] => 2006-07-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 3463
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/063/08063655.pdf
[firstpage_image] =>[orig_patent_app_number] => 11483686
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/483686 | Method and circuit for reducing degradation in a regulated circuit | Jul 9, 2006 | Issued |
Array
(
[id] => 4992640
[patent_doc_number] => 20070007984
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-11
[patent_title] => 'Socket for inspection apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/481586
[patent_app_country] => US
[patent_app_date] => 2006-07-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 7378
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0007/20070007984.pdf
[firstpage_image] =>[orig_patent_app_number] => 11481586
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/481586 | Socket for inspection apparatus | Jul 5, 2006 | Abandoned |
Array
(
[id] => 296546
[patent_doc_number] => 07541820
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-06-02
[patent_title] => 'Probe card'
[patent_app_type] => utility
[patent_app_number] => 11/883885
[patent_app_country] => US
[patent_app_date] => 2006-06-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3881
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 180
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/541/07541820.pdf
[firstpage_image] =>[orig_patent_app_number] => 11883885
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/883885 | Probe card | Jun 26, 2006 | Issued |
Array
(
[id] => 5600018
[patent_doc_number] => 20060290363
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-28
[patent_title] => 'Micro Kelvin Probes and Micro Kelvin Probe Methodology'
[patent_app_type] => utility
[patent_app_number] => 11/425490
[patent_app_country] => US
[patent_app_date] => 2006-06-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 2077
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0290/20060290363.pdf
[firstpage_image] =>[orig_patent_app_number] => 11425490
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/425490 | Micro Kelvin probes and micro Kelvin probe methodology | Jun 20, 2006 | Issued |
Array
(
[id] => 373804
[patent_doc_number] => 07474109
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-01-06
[patent_title] => 'Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/438605
[patent_app_country] => US
[patent_app_date] => 2006-05-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 17
[patent_no_of_words] => 12655
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 224
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/474/07474109.pdf
[firstpage_image] =>[orig_patent_app_number] => 11438605
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/438605 | Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus | May 21, 2006 | Issued |
Array
(
[id] => 5283054
[patent_doc_number] => 20090096728
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-16
[patent_title] => 'Test Circuit for Liquid Crystal Display Device, LCD Device Including Test Circuit, and Testing Method for LCD Device'
[patent_app_type] => utility
[patent_app_number] => 11/920388
[patent_app_country] => US
[patent_app_date] => 2006-05-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 5784
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0096/20090096728.pdf
[firstpage_image] =>[orig_patent_app_number] => 11920388
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/920388 | Test circuit for liquid crystal display device, LCD device including test circuit, and testing method for LCD device | May 8, 2006 | Issued |
Array
(
[id] => 5014453
[patent_doc_number] => 20070257661
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-11-08
[patent_title] => 'Current probing system'
[patent_app_type] => utility
[patent_app_number] => 11/430386
[patent_app_country] => US
[patent_app_date] => 2006-05-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 7043
[patent_no_of_claims] => 13
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0257/20070257661.pdf
[firstpage_image] =>[orig_patent_app_number] => 11430386
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/430386 | Current probing system | May 7, 2006 | Abandoned |
Array
(
[id] => 901188
[patent_doc_number] => 07339367
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-03-04
[patent_title] => 'Interface for detection and control of multiple test probes'
[patent_app_type] => utility
[patent_app_number] => 11/413990
[patent_app_country] => US
[patent_app_date] => 2006-04-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 5634
[patent_no_of_claims] => 11
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[patent_words_short_claim] => 177
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/339/07339367.pdf
[firstpage_image] =>[orig_patent_app_number] => 11413990
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/413990 | Interface for detection and control of multiple test probes | Apr 27, 2006 | Issued |
Array
(
[id] => 5675913
[patent_doc_number] => 20060181268
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-17
[patent_title] => 'APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS'
[patent_app_type] => utility
[patent_app_number] => 11/380044
[patent_app_country] => US
[patent_app_date] => 2006-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0181/20060181268.pdf
[firstpage_image] =>[orig_patent_app_number] => 11380044
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/380044 | Apparatus and method for detecting photon emissions from transistors | Apr 24, 2006 | Issued |
Array
(
[id] => 5208595
[patent_doc_number] => 20070247179
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-10-25
[patent_title] => 'Surface mount component RF test fixture'
[patent_app_type] => utility
[patent_app_number] => 11/411387
[patent_app_country] => US
[patent_app_date] => 2006-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0247/20070247179.pdf
[firstpage_image] =>[orig_patent_app_number] => 11411387
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/411387 | Surface mount component RF test fixture | Apr 24, 2006 | Abandoned |
Array
(
[id] => 627462
[patent_doc_number] => 07135849
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-11-14
[patent_title] => 'Extremal voltage detector with high input impedance'
[patent_app_type] => utility
[patent_app_number] => 11/408988
[patent_app_country] => US
[patent_app_date] => 2006-04-24
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/135/07135849.pdf
[firstpage_image] =>[orig_patent_app_number] => 11408988
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/408988 | Extremal voltage detector with high input impedance | Apr 23, 2006 | Issued |
Array
(
[id] => 5702089
[patent_doc_number] => 20060191135
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-31
[patent_title] => 'Methods for establishing electrical connections by drawing one or both of an element of an electrical connector and a contact toward the other'
[patent_app_type] => utility
[patent_app_number] => 11/409388
[patent_app_country] => US
[patent_app_date] => 2006-04-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 4483
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0191/20060191135.pdf
[firstpage_image] =>[orig_patent_app_number] => 11409388
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/409388 | Methods for establishing electrical connections by drawing one or both of an element of an electrical connector and a contact toward the other | Apr 20, 2006 | Abandoned |