Search

Arleen M. Vazquez

Supervisory Patent Examiner (ID: 6486, Phone: (571)272-2619 , Office: P/2868 )

Most Active Art Unit
2829
Art Unit(s)
2858, 2857, 2829, 2868
Total Applications
509
Issued Applications
380
Pending Applications
19
Abandoned Applications
113

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4533739 [patent_doc_number] => 07924042 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-12 [patent_title] => 'Semiconductor device, and design method, inspection method, and design program therefor' [patent_app_type] => utility [patent_app_number] => 11/509270 [patent_app_country] => US [patent_app_date] => 2006-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 4877 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/924/07924042.pdf [firstpage_image] =>[orig_patent_app_number] => 11509270 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509270
Semiconductor device, and design method, inspection method, and design program therefor Aug 23, 2006 Issued
Array ( [id] => 5152409 [patent_doc_number] => 20070035291 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-15 [patent_title] => 'IC sorter' [patent_app_type] => utility [patent_app_number] => 11/500491 [patent_app_country] => US [patent_app_date] => 2006-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6948 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0035/20070035291.pdf [firstpage_image] =>[orig_patent_app_number] => 11500491 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/500491
IC sorter Aug 7, 2006 Abandoned
Array ( [id] => 5145724 [patent_doc_number] => 20070045778 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-01 [patent_title] => 'Wafer holder, heater unit used for wafer prober having the wafer holder, and wafer prober having the heater unit' [patent_app_type] => utility [patent_app_number] => 11/498988 [patent_app_country] => US [patent_app_date] => 2006-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 12303 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20070045778.pdf [firstpage_image] =>[orig_patent_app_number] => 11498988 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/498988
Wafer holder, heater unit used for wafer prober having the wafer holder, and wafer prober having the heater unit Aug 3, 2006 Abandoned
Array ( [id] => 4686039 [patent_doc_number] => 20080030220 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-07 [patent_title] => 'Characterization Array and Method for Determining Threshold Voltage Variation' [patent_app_type] => utility [patent_app_number] => 11/462186 [patent_app_country] => US [patent_app_date] => 2006-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3347 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20080030220.pdf [firstpage_image] =>[orig_patent_app_number] => 11462186 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/462186
Characterization array and method for determining threshold voltage variation Aug 2, 2006 Issued
Array ( [id] => 4444112 [patent_doc_number] => 07928723 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Measurement of dissipated power' [patent_app_type] => utility [patent_app_number] => 11/997286 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3406 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928723.pdf [firstpage_image] =>[orig_patent_app_number] => 11997286 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/997286
Measurement of dissipated power Jul 27, 2006 Issued
Array ( [id] => 5623323 [patent_doc_number] => 20060261828 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-23 [patent_title] => 'Resilient contact probe apparatus' [patent_app_type] => utility [patent_app_number] => 11/493974 [patent_app_country] => US [patent_app_date] => 2006-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9237 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0261/20060261828.pdf [firstpage_image] =>[orig_patent_app_number] => 11493974 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/493974
Resilient contact probe apparatus Jul 26, 2006 Issued
Array ( [id] => 4907559 [patent_doc_number] => 20080018325 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-24 [patent_title] => 'APPARATUS AND METHOD FOR MEASURING AN OUTPUT POWER OF A POWER SUPPLY' [patent_app_type] => utility [patent_app_number] => 11/309285 [patent_app_country] => US [patent_app_date] => 2006-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1573 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20080018325.pdf [firstpage_image] =>[orig_patent_app_number] => 11309285 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/309285
APPARATUS AND METHOD FOR MEASURING AN OUTPUT POWER OF A POWER SUPPLY Jul 20, 2006 Abandoned
Array ( [id] => 5073429 [patent_doc_number] => 20070013404 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-18 [patent_title] => 'Apparatus, customer tray, and method for testing semiconductor packages' [patent_app_type] => utility [patent_app_number] => 11/488087 [patent_app_country] => US [patent_app_date] => 2006-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3087 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20070013404.pdf [firstpage_image] =>[orig_patent_app_number] => 11488087 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/488087
Apparatus, customer tray, and method for testing semiconductor packages Jul 17, 2006 Abandoned
Array ( [id] => 7551321 [patent_doc_number] => 08063655 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-22 [patent_title] => 'Method and circuit for reducing degradation in a regulated circuit' [patent_app_type] => utility [patent_app_number] => 11/483686 [patent_app_country] => US [patent_app_date] => 2006-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3463 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/063/08063655.pdf [firstpage_image] =>[orig_patent_app_number] => 11483686 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/483686
Method and circuit for reducing degradation in a regulated circuit Jul 9, 2006 Issued
Array ( [id] => 4992640 [patent_doc_number] => 20070007984 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-11 [patent_title] => 'Socket for inspection apparatus' [patent_app_type] => utility [patent_app_number] => 11/481586 [patent_app_country] => US [patent_app_date] => 2006-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7378 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20070007984.pdf [firstpage_image] =>[orig_patent_app_number] => 11481586 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/481586
Socket for inspection apparatus Jul 5, 2006 Abandoned
Array ( [id] => 296546 [patent_doc_number] => 07541820 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-06-02 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 11/883885 [patent_app_country] => US [patent_app_date] => 2006-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3881 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/541/07541820.pdf [firstpage_image] =>[orig_patent_app_number] => 11883885 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/883885
Probe card Jun 26, 2006 Issued
Array ( [id] => 5600018 [patent_doc_number] => 20060290363 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Micro Kelvin Probes and Micro Kelvin Probe Methodology' [patent_app_type] => utility [patent_app_number] => 11/425490 [patent_app_country] => US [patent_app_date] => 2006-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2077 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20060290363.pdf [firstpage_image] =>[orig_patent_app_number] => 11425490 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/425490
Micro Kelvin probes and micro Kelvin probe methodology Jun 20, 2006 Issued
Array ( [id] => 373804 [patent_doc_number] => 07474109 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-06 [patent_title] => 'Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus' [patent_app_type] => utility [patent_app_number] => 11/438605 [patent_app_country] => US [patent_app_date] => 2006-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 12655 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/474/07474109.pdf [firstpage_image] =>[orig_patent_app_number] => 11438605 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/438605
Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus May 21, 2006 Issued
Array ( [id] => 5283054 [patent_doc_number] => 20090096728 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-16 [patent_title] => 'Test Circuit for Liquid Crystal Display Device, LCD Device Including Test Circuit, and Testing Method for LCD Device' [patent_app_type] => utility [patent_app_number] => 11/920388 [patent_app_country] => US [patent_app_date] => 2006-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5784 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0096/20090096728.pdf [firstpage_image] =>[orig_patent_app_number] => 11920388 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/920388
Test circuit for liquid crystal display device, LCD device including test circuit, and testing method for LCD device May 8, 2006 Issued
Array ( [id] => 5014453 [patent_doc_number] => 20070257661 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-08 [patent_title] => 'Current probing system' [patent_app_type] => utility [patent_app_number] => 11/430386 [patent_app_country] => US [patent_app_date] => 2006-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7043 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0257/20070257661.pdf [firstpage_image] =>[orig_patent_app_number] => 11430386 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/430386
Current probing system May 7, 2006 Abandoned
Array ( [id] => 901188 [patent_doc_number] => 07339367 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-04 [patent_title] => 'Interface for detection and control of multiple test probes' [patent_app_type] => utility [patent_app_number] => 11/413990 [patent_app_country] => US [patent_app_date] => 2006-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5634 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/339/07339367.pdf [firstpage_image] =>[orig_patent_app_number] => 11413990 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/413990
Interface for detection and control of multiple test probes Apr 27, 2006 Issued
Array ( [id] => 5675913 [patent_doc_number] => 20060181268 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-17 [patent_title] => 'APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS' [patent_app_type] => utility [patent_app_number] => 11/380044 [patent_app_country] => US [patent_app_date] => 2006-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 14362 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0181/20060181268.pdf [firstpage_image] =>[orig_patent_app_number] => 11380044 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/380044
Apparatus and method for detecting photon emissions from transistors Apr 24, 2006 Issued
Array ( [id] => 5208595 [patent_doc_number] => 20070247179 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-10-25 [patent_title] => 'Surface mount component RF test fixture' [patent_app_type] => utility [patent_app_number] => 11/411387 [patent_app_country] => US [patent_app_date] => 2006-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2460 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0247/20070247179.pdf [firstpage_image] =>[orig_patent_app_number] => 11411387 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/411387
Surface mount component RF test fixture Apr 24, 2006 Abandoned
Array ( [id] => 627462 [patent_doc_number] => 07135849 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-11-14 [patent_title] => 'Extremal voltage detector with high input impedance' [patent_app_type] => utility [patent_app_number] => 11/408988 [patent_app_country] => US [patent_app_date] => 2006-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3787 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/135/07135849.pdf [firstpage_image] =>[orig_patent_app_number] => 11408988 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/408988
Extremal voltage detector with high input impedance Apr 23, 2006 Issued
Array ( [id] => 5702089 [patent_doc_number] => 20060191135 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-31 [patent_title] => 'Methods for establishing electrical connections by drawing one or both of an element of an electrical connector and a contact toward the other' [patent_app_type] => utility [patent_app_number] => 11/409388 [patent_app_country] => US [patent_app_date] => 2006-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4483 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0191/20060191135.pdf [firstpage_image] =>[orig_patent_app_number] => 11409388 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/409388
Methods for establishing electrical connections by drawing one or both of an element of an electrical connector and a contact toward the other Apr 20, 2006 Abandoned
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