Arleen M. Vazquez

Array ( [id] => 8399124 [patent_doc_number] => 08269515 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-18 [patent_title] => 'High impedance, high parallelism, high temperature memory test system architecture' [patent_app_type] => utility [patent_app_number] => 12/849700 [patent_app_country] => US [patent_app_date] => 2010-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 4373 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12849700 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6419721 [patent_doc_number] => 20100277195 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-04 [patent_title] => 'Modular Probe System' [patent_app_type] => utility [patent_app_number] => 12/837693 [patent_app_country] => US [patent_app_date] => 2010-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4811 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0277/20100277195.pdf [firstpage_image] =>[orig_patent_app_number] => 12837693 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8262351 [patent_doc_number] => 20120161784 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-06-28 [patent_title] => 'HIGH FREQUENCY MEASUREMENT APPARATUS AND METHOD WITH LOAD PULL' [patent_app_type] => utility [patent_app_number] => 13/376256 [patent_app_country] => US [patent_app_date] => 2010-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7336 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13376256 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7811825 [patent_doc_number] => 08134357 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-13 [patent_title] => 'Multi-electrode measuring system' [patent_app_type] => utility [patent_app_number] => 12/777942 [patent_app_country] => US [patent_app_date] => 2010-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 5584 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 254 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/134/08134357.pdf [firstpage_image] =>[orig_patent_app_number] => 12777942 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4518791 [patent_doc_number] => 07932738 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-04-26 [patent_title] => 'Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit' [patent_app_type] => utility [patent_app_number] => 12/800054 [patent_app_country] => US [patent_app_date] => 2010-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3999 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/932/07932738.pdf [firstpage_image] =>[orig_patent_app_number] => 12800054 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6209092 [patent_doc_number] => 20110133757 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-09 [patent_title] => 'Apparatus and method for evaluating capacitor' [patent_app_type] => utility [patent_app_number] => 12/662717 [patent_app_country] => US [patent_app_date] => 2010-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5074 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0133/20110133757.pdf [firstpage_image] =>[orig_patent_app_number] => 12662717 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6538762 [patent_doc_number] => 20100271041 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'TESTING APPARATUS WITH HIGH EFFICIENCY AND HIGH ACCURACY' [patent_app_type] => utility [patent_app_number] => 12/766935 [patent_app_country] => US [patent_app_date] => 2010-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2244 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271041.pdf [firstpage_image] =>[orig_patent_app_number] => 12766935 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6538867 [patent_doc_number] => 20100271052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'Disconnection detecting device' [patent_app_type] => utility [patent_app_number] => 12/662568 [patent_app_country] => US [patent_app_date] => 2010-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8815 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271052.pdf [firstpage_image] =>[orig_patent_app_number] => 12662568 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4497054 [patent_doc_number] => 07956630 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-06-07 [patent_title] => 'Real-time effective-wavelength error correction for HDVSI' [patent_app_type] => utility [patent_app_number] => 12/766744 [patent_app_country] => US [patent_app_date] => 2010-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4145 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/956/07956630.pdf [firstpage_image] =>[orig_patent_app_number] => 12766744 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6538881 [patent_doc_number] => 20100271054 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'INTEGRATED CIRCUIT DEVICE HAVING GROUND OPEN DETECTION CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/764505 [patent_app_country] => US [patent_app_date] => 2010-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5933 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271054.pdf [firstpage_image] =>[orig_patent_app_number] => 12764505 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7507481 [patent_doc_number] => 20110254573 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-10-20 [patent_title] => 'METHOD AND SYSTEM FOR ANALYZING A CHEMICALLY-ACTIVE MATERIAL' [patent_app_type] => utility [patent_app_number] => 12/759730 [patent_app_country] => US [patent_app_date] => 2010-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9905 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0254/20110254573.pdf [firstpage_image] =>[orig_patent_app_number] => 12759730 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8352751 [patent_doc_number] => 08248083 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-21 [patent_title] => 'Processing device for piezoelectric actuator and processing method for piezoelectric actuator' [patent_app_type] => utility [patent_app_number] => 12/759804 [patent_app_country] => US [patent_app_date] => 2010-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3714 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12759804 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6453936 [patent_doc_number] => 20100283513 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-11 [patent_title] => 'RF SENSING CIRCUIT WITH A VOLTAGE-CONTROLLED OSCILLATOR' [patent_app_type] => utility [patent_app_number] => 12/757249 [patent_app_country] => US [patent_app_date] => 2010-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2068 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0283/20100283513.pdf [firstpage_image] =>[orig_patent_app_number] => 12757249 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8933355 [patent_doc_number] => 08493060 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2013-07-23 [patent_title] => 'Electronic circuit tester and method of use' [patent_app_type] => utility [patent_app_number] => 12/752276 [patent_app_country] => US [patent_app_date] => 2010-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5316 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12752276 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6406496 [patent_doc_number] => 20100179777 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-15 [patent_title] => 'TEST PULSES FOR ENABLING REVENUE TESTABLE PANEL METERS' [patent_app_type] => utility [patent_app_number] => 12/728567 [patent_app_country] => US [patent_app_date] => 2010-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4042 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20100179777.pdf [firstpage_image] =>[orig_patent_app_number] => 12728567 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8760943 [patent_doc_number] => 08421472 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-16 [patent_title] => 'Apparatuses and methods for testing welding apparatuses' [patent_app_type] => utility [patent_app_number] => 12/721597 [patent_app_country] => US [patent_app_date] => 2010-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4661 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12721597 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6618851 [patent_doc_number] => 20100225345 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-09 [patent_title] => 'APPARATUS AND METHOD FOR TESTING A SEMICONDUCTOR DEVICE' [patent_app_type] => utility [patent_app_number] => 12/710650 [patent_app_country] => US [patent_app_date] => 2010-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4316 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20100225345.pdf [firstpage_image] =>[orig_patent_app_number] => 12710650 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6052972 [patent_doc_number] => 20110109339 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-12 [patent_title] => 'APPARATUS AND METHOD FOR INSPECTING CIRCUIT OF SUBSTRATE' [patent_app_type] => utility [patent_app_number] => 12/710149 [patent_app_country] => US [patent_app_date] => 2010-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5529 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20110109339.pdf [firstpage_image] =>[orig_patent_app_number] => 12710149 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9060688 [patent_doc_number] => 08547127 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-01 [patent_title] => 'Probe block' [patent_app_type] => utility [patent_app_number] => 13/203641 [patent_app_country] => US [patent_app_date] => 2010-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 4976 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13203641 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6482812 [patent_doc_number] => 20100213950 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-26 [patent_title] => 'SYSTEM IN PACKAGE BATCH TEST METHOD AND BATCH TEST SYSTEM THEREOF' [patent_app_type] => utility [patent_app_number] => 12/708758 [patent_app_country] => US [patent_app_date] => 2010-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9253 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0213/20100213950.pdf [firstpage_image] =>[orig_patent_app_number] => 12708758 [rel_patent_id] =>[rel_patent_doc_number] =>)