Search

Arleen M. Vazquez

Supervisory Patent Examiner (ID: 12561, Phone: (571)272-2619 , Office: P/2868 )

Most Active Art Unit
2829
Art Unit(s)
2858, 2857, 2868, 2829
Total Applications
508
Issued Applications
374
Pending Applications
25
Abandoned Applications
113

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8653682 [patent_doc_number] => 08373433 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-02-12 [patent_title] => 'Test apparatus, test method and manufacturing method' [patent_app_type] => utility [patent_app_number] => 12/703568 [patent_app_country] => US [patent_app_date] => 2010-02-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8602 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12703568 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/703568
Test apparatus, test method and manufacturing method Feb 9, 2010 Issued
Array ( [id] => 6499242 [patent_doc_number] => 20100201391 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-12 [patent_title] => 'APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 12/702347 [patent_app_country] => US [patent_app_date] => 2010-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4806 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20100201391.pdf [firstpage_image] =>[orig_patent_app_number] => 12702347 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/702347
Apparatus and method for testing semiconductor devices Feb 8, 2010 Issued
Array ( [id] => 6474907 [patent_doc_number] => 20100207648 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-19 [patent_title] => 'Contact Resistance Test Structure and Method Suitable for Three-Dimensional Integrated Circuits' [patent_app_type] => utility [patent_app_number] => 12/699206 [patent_app_country] => US [patent_app_date] => 2010-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4606 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20100207648.pdf [firstpage_image] =>[orig_patent_app_number] => 12699206 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/699206
Contact resistance test structure and method suitable for three-dimensional integrated circuits Feb 2, 2010 Issued
Array ( [id] => 6312749 [patent_doc_number] => 20100194416 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-05 [patent_title] => 'ELECTRICAL CONNECTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/698058 [patent_app_country] => US [patent_app_date] => 2010-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4757 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0194/20100194416.pdf [firstpage_image] =>[orig_patent_app_number] => 12698058 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/698058
Electrical connecting apparatus Jan 31, 2010 Issued
Array ( [id] => 6512044 [patent_doc_number] => 20100219855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-02 [patent_title] => 'Semiconductor device having CMOS transfer circuit and clamp element' [patent_app_type] => utility [patent_app_number] => 12/656453 [patent_app_country] => US [patent_app_date] => 2010-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5510 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20100219855.pdf [firstpage_image] =>[orig_patent_app_number] => 12656453 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/656453
Semiconductor device having CMOS transfer circuit and clamp element Jan 28, 2010 Issued
Array ( [id] => 8713994 [patent_doc_number] => 08400138 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-19 [patent_title] => 'Method and apparatus for measuring current output of low-voltage pad-mount distribution power transformers' [patent_app_type] => utility [patent_app_number] => 12/696319 [patent_app_country] => US [patent_app_date] => 2010-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 4915 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12696319 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/696319
Method and apparatus for measuring current output of low-voltage pad-mount distribution power transformers Jan 28, 2010 Issued
Array ( [id] => 6106834 [patent_doc_number] => 20110187396 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-04 [patent_title] => 'QUIESCENT CURRENT (IDDQ) INDICATION AND TESTING APPARATUS AND METHODS' [patent_app_type] => utility [patent_app_number] => 12/696257 [patent_app_country] => US [patent_app_date] => 2010-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 8679 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0187/20110187396.pdf [firstpage_image] =>[orig_patent_app_number] => 12696257 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/696257
Quiescent current (IDDQ) indication and testing apparatus and methods Jan 28, 2010 Issued
Array ( [id] => 6106834 [patent_doc_number] => 20110187396 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-04 [patent_title] => 'QUIESCENT CURRENT (IDDQ) INDICATION AND TESTING APPARATUS AND METHODS' [patent_app_type] => utility [patent_app_number] => 12/696257 [patent_app_country] => US [patent_app_date] => 2010-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 8679 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0187/20110187396.pdf [firstpage_image] =>[orig_patent_app_number] => 12696257 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/696257
Quiescent current (IDDQ) indication and testing apparatus and methods Jan 28, 2010 Issued
Array ( [id] => 7753000 [patent_doc_number] => 08111059 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2012-02-07 [patent_title] => 'Electric current locator' [patent_app_type] => utility [patent_app_number] => 12/695197 [patent_app_country] => US [patent_app_date] => 2010-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 10456 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 486 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/111/08111059.pdf [firstpage_image] =>[orig_patent_app_number] => 12695197 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/695197
Electric current locator Jan 27, 2010 Issued
Array ( [id] => 6453540 [patent_doc_number] => 20100283496 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-11 [patent_title] => 'TRANSMISSION-MODULATED PHOTOCONDUCTIVE DECAY MEASUREMENT SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/694914 [patent_app_country] => US [patent_app_date] => 2010-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7755 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0283/20100283496.pdf [firstpage_image] =>[orig_patent_app_number] => 12694914 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/694914
Transmission-modulated photoconductive decay measurement system Jan 26, 2010 Issued
Array ( [id] => 9060686 [patent_doc_number] => 08547125 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-01 [patent_title] => 'Test apparatus and test module' [patent_app_type] => utility [patent_app_number] => 12/694149 [patent_app_country] => US [patent_app_date] => 2010-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7177 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12694149 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/694149
Test apparatus and test module Jan 25, 2010 Issued
Array ( [id] => 8376007 [patent_doc_number] => 08258803 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-04 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 12/694154 [patent_app_country] => US [patent_app_date] => 2010-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 9506 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12694154 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/694154
Test apparatus and test method Jan 25, 2010 Issued
Array ( [id] => 8376005 [patent_doc_number] => 08258802 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-04 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 12/694151 [patent_app_country] => US [patent_app_date] => 2010-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7319 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12694151 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/694151
Test apparatus and test method Jan 25, 2010 Issued
Array ( [id] => 8578532 [patent_doc_number] => 08344748 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-01 [patent_title] => 'Probe for testing semiconductor devices' [patent_app_type] => utility [patent_app_number] => 12/693428 [patent_app_country] => US [patent_app_date] => 2010-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 30 [patent_no_of_words] => 6497 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12693428 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/693428
Probe for testing semiconductor devices Jan 24, 2010 Issued
Array ( [id] => 8726279 [patent_doc_number] => 08405405 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-26 [patent_title] => 'Wideband I-V probe and method' [patent_app_type] => utility [patent_app_number] => 12/656203 [patent_app_country] => US [patent_app_date] => 2010-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 29 [patent_no_of_words] => 3408 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12656203 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/656203
Wideband I-V probe and method Jan 20, 2010 Issued
Array ( [id] => 6170940 [patent_doc_number] => 20110175596 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-21 [patent_title] => 'CURRENT MEASURING APPARATUS FOR POWER SUPPLY' [patent_app_type] => utility [patent_app_number] => 12/689187 [patent_app_country] => US [patent_app_date] => 2010-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 933 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0175/20110175596.pdf [firstpage_image] =>[orig_patent_app_number] => 12689187 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/689187
Current measuring apparatus for power supply Jan 17, 2010 Issued
Array ( [id] => 8846982 [patent_doc_number] => 08456169 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-04 [patent_title] => 'High speed measurement of random variation/yield in integrated circuit device testing' [patent_app_type] => utility [patent_app_number] => 12/686476 [patent_app_country] => US [patent_app_date] => 2010-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4198 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12686476 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/686476
High speed measurement of random variation/yield in integrated circuit device testing Jan 12, 2010 Issued
Array ( [id] => 6474690 [patent_doc_number] => 20100207625 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-19 [patent_title] => 'CURRENT SENSOR' [patent_app_type] => utility [patent_app_number] => 12/686289 [patent_app_country] => US [patent_app_date] => 2010-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2936 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20100207625.pdf [firstpage_image] =>[orig_patent_app_number] => 12686289 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/686289
Current sensor Jan 11, 2010 Issued
Array ( [id] => 6305951 [patent_doc_number] => 20100109696 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-06 [patent_title] => 'ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHUCK HAVING DIFFERENT COEFFICIENTS OF THERMAL EXPANSION' [patent_app_type] => utility [patent_app_number] => 12/684051 [patent_app_country] => US [patent_app_date] => 2010-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 15383 [patent_no_of_claims] => 94 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20100109696.pdf [firstpage_image] =>[orig_patent_app_number] => 12684051 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/684051
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Jan 6, 2010 Issued
Array ( [id] => 5941386 [patent_doc_number] => 20110102006 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-05 [patent_title] => 'CIRCUIT AND METHOD FOR TESTING SEMICONDUCTOR APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/651066 [patent_app_country] => US [patent_app_date] => 2009-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4335 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0102/20110102006.pdf [firstpage_image] =>[orig_patent_app_number] => 12651066 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/651066
CIRCUIT AND METHOD FOR TESTING SEMICONDUCTOR APPARATUS Dec 30, 2009 Abandoned
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