
Arleen M. Vazquez
Supervisory Patent Examiner (ID: 12561, Phone: (571)272-2619 , Office: P/2868 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2857, 2868, 2829 |
| Total Applications | 508 |
| Issued Applications | 374 |
| Pending Applications | 25 |
| Abandoned Applications | 113 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6155036
[patent_doc_number] => 20110156739
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-06-30
[patent_title] => 'TEST KIT FOR TESTING A CHIP SUBASSEMBLY AND A TESTING METHOD BY USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/651067
[patent_app_country] => US
[patent_app_date] => 2009-12-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2920
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0156/20110156739.pdf
[firstpage_image] =>[orig_patent_app_number] => 12651067
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/651067 | TEST KIT FOR TESTING A CHIP SUBASSEMBLY AND A TESTING METHOD BY USING THE SAME | Dec 30, 2009 | Abandoned |
Array
(
[id] => 8802995
[patent_doc_number] => 08441272
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-05-14
[patent_title] => 'MEMS probe for probe cards for integrated circuits'
[patent_app_type] => utility
[patent_app_number] => 12/649109
[patent_app_country] => US
[patent_app_date] => 2009-12-29
[patent_effective_date] => 0000-00-00
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12649109
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/649109 | MEMS probe for probe cards for integrated circuits | Dec 28, 2009 | Issued |
Array
(
[id] => 8352771
[patent_doc_number] => 08248098
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-08-21
[patent_title] => 'Apparatus and method for measuring characteristics of semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 12/647499
[patent_app_country] => US
[patent_app_date] => 2009-12-27
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[patent_current_assignee] =>[type] => patent
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/647499 | Apparatus and method for measuring characteristics of semiconductor device | Dec 26, 2009 | Issued |
Array
(
[id] => 6257251
[patent_doc_number] => 20100295570
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-11-25
[patent_title] => 'Probe Connector'
[patent_app_type] => utility
[patent_app_number] => 12/647415
[patent_app_country] => US
[patent_app_date] => 2009-12-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/647415 | Probe Connector | Dec 24, 2009 | Abandoned |
Array
(
[id] => 8470630
[patent_doc_number] => 08299812
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-10-30
[patent_title] => 'Probe card'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/646776 | Probe card | Dec 22, 2009 | Issued |
Array
(
[id] => 8953582
[patent_doc_number] => RE044407
[patent_country] => US
[patent_kind] => E1
[patent_issue_date] => 2013-08-06
[patent_title] => 'Space transformers employing wire bonds for interconnections with fine pitch contacts'
[patent_app_type] => reissue
[patent_app_number] => 12/646661
[patent_app_country] => US
[patent_app_date] => 2009-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/646661 | Space transformers employing wire bonds for interconnections with fine pitch contacts | Dec 22, 2009 | Issued |
Array
(
[id] => 5964463
[patent_doc_number] => 20110148429
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-06-23
[patent_title] => 'DC Testing Integrated Circuits'
[patent_app_type] => utility
[patent_app_number] => 12/643105
[patent_app_country] => US
[patent_app_date] => 2009-12-21
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[pdf_file] => publications/A1/0148/20110148429.pdf
[firstpage_image] =>[orig_patent_app_number] => 12643105
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/643105 | DC Testing Integrated Circuits | Dec 20, 2009 | Abandoned |
Array
(
[id] => 6403780
[patent_doc_number] => 20100148811
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-17
[patent_title] => 'Probe card, and apparatus and method for testing semiconductor device using the probe card'
[patent_app_type] => utility
[patent_app_number] => 12/654235
[patent_app_country] => US
[patent_app_date] => 2009-12-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0148/20100148811.pdf
[firstpage_image] =>[orig_patent_app_number] => 12654235
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/654235 | Probe card, and apparatus and method for testing semiconductor device using the probe card | Dec 14, 2009 | Issued |
Array
(
[id] => 4444173
[patent_doc_number] => 07928747
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-19
[patent_title] => 'Operating an integrated circuit at a minimum supply voltage'
[patent_app_type] => utility
[patent_app_number] => 12/634373
[patent_app_country] => US
[patent_app_date] => 2009-12-09
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/634373 | Operating an integrated circuit at a minimum supply voltage | Dec 8, 2009 | Issued |
Array
(
[id] => 8550034
[patent_doc_number] => 08324919
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[patent_issue_date] => 2012-12-04
[patent_title] => 'Scrub inducing compliant electrical contact'
[patent_app_type] => utility
[patent_app_number] => 12/629790
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/629790 | Scrub inducing compliant electrical contact | Dec 1, 2009 | Issued |
Array
(
[id] => 6458298
[patent_doc_number] => 20100039739
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[patent_kind] => A1
[patent_issue_date] => 2010-02-18
[patent_title] => 'VOLTAGE FAULT DETECTION AND PROTECTION'
[patent_app_type] => utility
[patent_app_number] => 12/606788
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/606788 | VOLTAGE FAULT DETECTION AND PROTECTION | Oct 26, 2009 | Abandoned |
Array
(
[id] => 6462105
[patent_doc_number] => 20100040107
[patent_country] => US
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[patent_issue_date] => 2010-02-18
[patent_title] => 'TESTING DEVICE AND TESTING METHOD OF SEMICONDUCTOR DEVICES'
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Array
(
[id] => 6115540
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Array
(
[id] => 6036882
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[patent_title] => 'TEMPERATURE-COMPENSATED SHUNT CURRENT MEASUREMENT'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/581300 | TEMPERATURE-COMPENSATED SHUNT CURRENT MEASUREMENT | Oct 18, 2009 | Abandoned |
Array
(
[id] => 6618888
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[patent_title] => 'Circuit for Measuring Magnitude of Electrostatic Discharge (ESD) Events for Semiconductor Chip Bonding'
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Array
(
[id] => 6579613
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/576590 | Sensor apparatus | Oct 8, 2009 | Issued |
Array
(
[id] => 6386038
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[patent_title] => 'Wafer Level Burn-In and Electrical Test System and Method'
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Array
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Array
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[firstpage_image] =>[orig_patent_app_number] => 12566279
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/566279 | Protective digital relay device | Sep 23, 2009 | Issued |