Search

Arleen M. Vazquez

Supervisory Patent Examiner (ID: 12561, Phone: (571)272-2619 , Office: P/2868 )

Most Active Art Unit
2829
Art Unit(s)
2858, 2857, 2868, 2829
Total Applications
508
Issued Applications
374
Pending Applications
25
Abandoned Applications
113

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6155036 [patent_doc_number] => 20110156739 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-30 [patent_title] => 'TEST KIT FOR TESTING A CHIP SUBASSEMBLY AND A TESTING METHOD BY USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/651067 [patent_app_country] => US [patent_app_date] => 2009-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2920 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20110156739.pdf [firstpage_image] =>[orig_patent_app_number] => 12651067 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/651067
TEST KIT FOR TESTING A CHIP SUBASSEMBLY AND A TESTING METHOD BY USING THE SAME Dec 30, 2009 Abandoned
Array ( [id] => 8802995 [patent_doc_number] => 08441272 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-05-14 [patent_title] => 'MEMS probe for probe cards for integrated circuits' [patent_app_type] => utility [patent_app_number] => 12/649109 [patent_app_country] => US [patent_app_date] => 2009-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 19 [patent_no_of_words] => 5544 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12649109 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/649109
MEMS probe for probe cards for integrated circuits Dec 28, 2009 Issued
Array ( [id] => 8352771 [patent_doc_number] => 08248098 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-21 [patent_title] => 'Apparatus and method for measuring characteristics of semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/647499 [patent_app_country] => US [patent_app_date] => 2009-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3554 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12647499 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/647499
Apparatus and method for measuring characteristics of semiconductor device Dec 26, 2009 Issued
Array ( [id] => 6257251 [patent_doc_number] => 20100295570 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-25 [patent_title] => 'Probe Connector' [patent_app_type] => utility [patent_app_number] => 12/647415 [patent_app_country] => US [patent_app_date] => 2009-12-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 926 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20100295570.pdf [firstpage_image] =>[orig_patent_app_number] => 12647415 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/647415
Probe Connector Dec 24, 2009 Abandoned
Array ( [id] => 8470630 [patent_doc_number] => 08299812 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-30 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 12/646776 [patent_app_country] => US [patent_app_date] => 2009-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5764 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12646776 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/646776
Probe card Dec 22, 2009 Issued
Array ( [id] => 8953582 [patent_doc_number] => RE044407 [patent_country] => US [patent_kind] => E1 [patent_issue_date] => 2013-08-06 [patent_title] => 'Space transformers employing wire bonds for interconnections with fine pitch contacts' [patent_app_type] => reissue [patent_app_number] => 12/646661 [patent_app_country] => US [patent_app_date] => 2009-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4168 [patent_no_of_claims] => 68 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12646661 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/646661
Space transformers employing wire bonds for interconnections with fine pitch contacts Dec 22, 2009 Issued
Array ( [id] => 5964463 [patent_doc_number] => 20110148429 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-23 [patent_title] => 'DC Testing Integrated Circuits' [patent_app_type] => utility [patent_app_number] => 12/643105 [patent_app_country] => US [patent_app_date] => 2009-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2703 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20110148429.pdf [firstpage_image] =>[orig_patent_app_number] => 12643105 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/643105
DC Testing Integrated Circuits Dec 20, 2009 Abandoned
Array ( [id] => 6403780 [patent_doc_number] => 20100148811 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-17 [patent_title] => 'Probe card, and apparatus and method for testing semiconductor device using the probe card' [patent_app_type] => utility [patent_app_number] => 12/654235 [patent_app_country] => US [patent_app_date] => 2009-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5237 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20100148811.pdf [firstpage_image] =>[orig_patent_app_number] => 12654235 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/654235
Probe card, and apparatus and method for testing semiconductor device using the probe card Dec 14, 2009 Issued
Array ( [id] => 4444173 [patent_doc_number] => 07928747 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Operating an integrated circuit at a minimum supply voltage' [patent_app_type] => utility [patent_app_number] => 12/634373 [patent_app_country] => US [patent_app_date] => 2009-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 16 [patent_no_of_words] => 13091 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928747.pdf [firstpage_image] =>[orig_patent_app_number] => 12634373 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/634373
Operating an integrated circuit at a minimum supply voltage Dec 8, 2009 Issued
Array ( [id] => 8550034 [patent_doc_number] => 08324919 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-12-04 [patent_title] => 'Scrub inducing compliant electrical contact' [patent_app_type] => utility [patent_app_number] => 12/629790 [patent_app_country] => US [patent_app_date] => 2009-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 3417 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12629790 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/629790
Scrub inducing compliant electrical contact Dec 1, 2009 Issued
Array ( [id] => 6458298 [patent_doc_number] => 20100039739 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-18 [patent_title] => 'VOLTAGE FAULT DETECTION AND PROTECTION' [patent_app_type] => utility [patent_app_number] => 12/606788 [patent_app_country] => US [patent_app_date] => 2009-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5653 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20100039739.pdf [firstpage_image] =>[orig_patent_app_number] => 12606788 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/606788
VOLTAGE FAULT DETECTION AND PROTECTION Oct 26, 2009 Abandoned
Array ( [id] => 6462105 [patent_doc_number] => 20100040107 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-18 [patent_title] => 'TESTING DEVICE AND TESTING METHOD OF SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 12/606609 [patent_app_country] => US [patent_app_date] => 2009-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8932 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20100040107.pdf [firstpage_image] =>[orig_patent_app_number] => 12606609 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/606609
Testing device and testing method of semiconductor devices Oct 26, 2009 Issued
Array ( [id] => 6115540 [patent_doc_number] => 20110074396 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-31 [patent_title] => 'BIOSENSOR AND ELECTRODE STRUCTURE THEREOF' [patent_app_type] => utility [patent_app_number] => 12/604984 [patent_app_country] => US [patent_app_date] => 2009-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2199 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20110074396.pdf [firstpage_image] =>[orig_patent_app_number] => 12604984 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/604984
BIOSENSOR AND ELECTRODE STRUCTURE THEREOF Oct 22, 2009 Abandoned
Array ( [id] => 6036882 [patent_doc_number] => 20110089931 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-21 [patent_title] => 'TEMPERATURE-COMPENSATED SHUNT CURRENT MEASUREMENT' [patent_app_type] => utility [patent_app_number] => 12/581300 [patent_app_country] => US [patent_app_date] => 2009-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 6820 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0089/20110089931.pdf [firstpage_image] =>[orig_patent_app_number] => 12581300 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/581300
TEMPERATURE-COMPENSATED SHUNT CURRENT MEASUREMENT Oct 18, 2009 Abandoned
Array ( [id] => 6618888 [patent_doc_number] => 20100225347 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-09 [patent_title] => 'Circuit for Measuring Magnitude of Electrostatic Discharge (ESD) Events for Semiconductor Chip Bonding' [patent_app_type] => utility [patent_app_number] => 12/577780 [patent_app_country] => US [patent_app_date] => 2009-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7211 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20100225347.pdf [firstpage_image] =>[orig_patent_app_number] => 12577780 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/577780
Circuit for measuring magnitude of electrostatic discharge (ESD) events for semiconductor chip bonding Oct 12, 2009 Issued
Array ( [id] => 6579613 [patent_doc_number] => 20100097088 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'SENSOR APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/576590 [patent_app_country] => US [patent_app_date] => 2009-10-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2551 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20100097088.pdf [firstpage_image] =>[orig_patent_app_number] => 12576590 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/576590
Sensor apparatus Oct 8, 2009 Issued
Array ( [id] => 6386038 [patent_doc_number] => 20100176836 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-15 [patent_title] => 'Wafer Level Burn-In and Electrical Test System and Method' [patent_app_type] => utility [patent_app_number] => 12/574447 [patent_app_country] => US [patent_app_date] => 2009-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 5169 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 22 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0176/20100176836.pdf [firstpage_image] =>[orig_patent_app_number] => 12574447 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/574447
Wafer level burn-in and electrical test system and method Oct 5, 2009 Issued
Array ( [id] => 4544379 [patent_doc_number] => 07876116 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-01-25 [patent_title] => 'Compliant chuck for semiconducting device testing and chiller thereof' [patent_app_type] => utility [patent_app_number] => 12/568785 [patent_app_country] => US [patent_app_date] => 2009-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 3400 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/876/07876116.pdf [firstpage_image] =>[orig_patent_app_number] => 12568785 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/568785
Compliant chuck for semiconducting device testing and chiller thereof Sep 28, 2009 Issued
Array ( [id] => 8726254 [patent_doc_number] => 08405380 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-26 [patent_title] => 'Digital multimeters including a remote display' [patent_app_type] => utility [patent_app_number] => 12/568602 [patent_app_country] => US [patent_app_date] => 2009-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 28 [patent_figures_cnt] => 28 [patent_no_of_words] => 4325 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12568602 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/568602
Digital multimeters including a remote display Sep 27, 2009 Issued
Array ( [id] => 4488471 [patent_doc_number] => 07902813 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-08 [patent_title] => 'Protective digital relay device' [patent_app_type] => utility [patent_app_number] => 12/566279 [patent_app_country] => US [patent_app_date] => 2009-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 32 [patent_no_of_words] => 6732 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/902/07902813.pdf [firstpage_image] =>[orig_patent_app_number] => 12566279 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/566279
Protective digital relay device Sep 23, 2009 Issued
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