Arleen M. Vazquez

Array ( [id] => 8560638 [patent_doc_number] => 08334704 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-12-18 [patent_title] => 'Systems and methods for providing a system-on-a-substrate' [patent_app_type] => utility [patent_app_number] => 12/565085 [patent_app_country] => US [patent_app_date] => 2009-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 4330 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12565085 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6467176 [patent_doc_number] => 20100007332 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-14 [patent_title] => 'METHOD AND APPARATUS FOR EVALUATING RAPID CHANGES IN CURRENT' [patent_app_type] => utility [patent_app_number] => 12/562786 [patent_app_country] => US [patent_app_date] => 2009-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1971 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20100007332.pdf [firstpage_image] =>[orig_patent_app_number] => 12562786 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6203616 [patent_doc_number] => 20110066402 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-17 [patent_title] => 'MIXED SIGNAL ACQUISITION SYSTEM FOR A MEASUREMENT INSTRUMENT' [patent_app_type] => utility [patent_app_number] => 12/561908 [patent_app_country] => US [patent_app_date] => 2009-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4142 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20110066402.pdf [firstpage_image] =>[orig_patent_app_number] => 12561908 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6561614 [patent_doc_number] => 20100289481 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-18 [patent_title] => 'APPARATUS AND METHOD FOR DC VOLTAGE MEASUREMENT' [patent_app_type] => utility [patent_app_number] => 12/561249 [patent_app_country] => US [patent_app_date] => 2009-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3057 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0289/20100289481.pdf [firstpage_image] =>[orig_patent_app_number] => 12561249 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6355250 [patent_doc_number] => 20100073020 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-25 [patent_title] => 'Probe of electrical measuring instrument' [patent_app_type] => utility [patent_app_number] => 12/585490 [patent_app_country] => US [patent_app_date] => 2009-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 6032 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0073/20100073020.pdf [firstpage_image] =>[orig_patent_app_number] => 12585490 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8245408 [patent_doc_number] => 08203336 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-06-19 [patent_title] => 'Eddy current probes having magnetic gap' [patent_app_type] => utility [patent_app_number] => 12/558531 [patent_app_country] => US [patent_app_date] => 2009-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1275 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/203/08203336.pdf [firstpage_image] =>[orig_patent_app_number] => 12558531 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8116061 [patent_doc_number] => 08159249 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-17 [patent_title] => 'Inspection unit' [patent_app_type] => utility [patent_app_number] => 12/553386 [patent_app_country] => US [patent_app_date] => 2009-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 21 [patent_no_of_words] => 7221 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/159/08159249.pdf [firstpage_image] =>[orig_patent_app_number] => 12553386 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8283566 [patent_doc_number] => 08217673 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-10 [patent_title] => 'Method and circuit for testing integrated circuit' [patent_app_type] => utility [patent_app_number] => 12/552288 [patent_app_country] => US [patent_app_date] => 2009-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4295 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12552288 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6216910 [patent_doc_number] => 20100052655 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-04 [patent_title] => 'Self Contained Kilowatt-Hour meter Integral to Standard Load Center' [patent_app_type] => utility [patent_app_number] => 12/551891 [patent_app_country] => US [patent_app_date] => 2009-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4767 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0052/20100052655.pdf [firstpage_image] =>[orig_patent_app_number] => 12551891 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8956742 [patent_doc_number] => 08502524 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-08-06 [patent_title] => 'Current measurement in an inverter unit and a frequency converter' [patent_app_type] => utility [patent_app_number] => 12/547353 [patent_app_country] => US [patent_app_date] => 2009-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3227 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12547353 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4511867 [patent_doc_number] => 07915904 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-29 [patent_title] => 'System resistance simulating apparatus' [patent_app_type] => utility [patent_app_number] => 12/546640 [patent_app_country] => US [patent_app_date] => 2009-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1046 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/915/07915904.pdf [firstpage_image] =>[orig_patent_app_number] => 12546640 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8714033 [patent_doc_number] => 08400176 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-19 [patent_title] => 'Wafer level contactor' [patent_app_type] => utility [patent_app_number] => 12/543386 [patent_app_country] => US [patent_app_date] => 2009-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 7279 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12543386 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4473122 [patent_doc_number] => 07944229 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-17 [patent_title] => 'Method and apparatus for calibrating internal pulses in an integrated circuit' [patent_app_type] => utility [patent_app_number] => 12/543215 [patent_app_country] => US [patent_app_date] => 2009-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 4384 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/944/07944229.pdf [firstpage_image] =>[orig_patent_app_number] => 12543215 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5926220 [patent_doc_number] => 20110037458 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-17 [patent_title] => 'Open loop magneto-resistive magnetic field sensor' [patent_app_type] => utility [patent_app_number] => 12/583253 [patent_app_country] => US [patent_app_date] => 2009-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4138 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0037/20110037458.pdf [firstpage_image] =>[orig_patent_app_number] => 12583253 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5300764 [patent_doc_number] => 20090295416 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-03 [patent_title] => 'REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER' [patent_app_type] => utility [patent_app_number] => 12/539208 [patent_app_country] => US [patent_app_date] => 2009-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 3165 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20090295416.pdf [firstpage_image] =>[orig_patent_app_number] => 12539208 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5949457 [patent_doc_number] => 20110031968 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-10 [patent_title] => 'Three axis field monitor' [patent_app_type] => utility [patent_app_number] => 12/462498 [patent_app_country] => US [patent_app_date] => 2009-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4688 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0031/20110031968.pdf [firstpage_image] =>[orig_patent_app_number] => 12462498 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6193602 [patent_doc_number] => 20110025356 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-03 [patent_title] => 'METHOD FOR MAKING ELECTRICAL TEST PROBE CONTACTS' [patent_app_type] => utility [patent_app_number] => 12/512838 [patent_app_country] => US [patent_app_date] => 2009-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6531 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20110025356.pdf [firstpage_image] =>[orig_patent_app_number] => 12512838 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6146211 [patent_doc_number] => 20110018579 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-27 [patent_title] => 'AUXILIARY POWER UNIT DIAGNOSTIC TOOL' [patent_app_type] => utility [patent_app_number] => 12/509891 [patent_app_country] => US [patent_app_date] => 2009-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2848 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20110018579.pdf [firstpage_image] =>[orig_patent_app_number] => 12509891 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6507691 [patent_doc_number] => 20100013509 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-21 [patent_title] => 'PROBER AND SEMICONDUCTOR WAFER TESTING METHOD USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/502286 [patent_app_country] => US [patent_app_date] => 2009-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 6967 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20100013509.pdf [firstpage_image] =>[orig_patent_app_number] => 12502286 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6443465 [patent_doc_number] => 20100088888 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-15 [patent_title] => 'LITHOGRAPHIC CONTACT ELEMENTS' [patent_app_type] => utility [patent_app_number] => 12/498886 [patent_app_country] => US [patent_app_date] => 2009-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 14946 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20100088888.pdf [firstpage_image] =>[orig_patent_app_number] => 12498886 [rel_patent_id] =>[rel_patent_doc_number] =>)