
Barry Bowser
Examiner (ID: 19002)
| Most Active Art Unit | 2213 |
| Art Unit(s) | 2858, 2607, 2213, 2899 |
| Total Applications | 268 |
| Issued Applications | 248 |
| Pending Applications | 4 |
| Abandoned Applications | 16 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3116968
[patent_doc_number] => 05414351
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-09
[patent_title] => 'Method and apparatus for testing the reliability of semiconductor terminals'
[patent_app_type] => 1
[patent_app_number] => 8/139859
[patent_app_country] => US
[patent_app_date] => 1993-10-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1952
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 157
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/414/05414351.pdf
[firstpage_image] =>[orig_patent_app_number] => 139859
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/139859 | Method and apparatus for testing the reliability of semiconductor terminals | Oct 21, 1993 | Issued |
Array
(
[id] => 3494749
[patent_doc_number] => 05471152
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-28
[patent_title] => 'Storage element for delay testing'
[patent_app_type] => 1
[patent_app_number] => 8/133588
[patent_app_country] => US
[patent_app_date] => 1993-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 2290
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 154
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/471/05471152.pdf
[firstpage_image] =>[orig_patent_app_number] => 133588
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/133588 | Storage element for delay testing | Oct 7, 1993 | Issued |
Array
(
[id] => 3477452
[patent_doc_number] => 05477158
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-19
[patent_title] => 'Compact noncontact excess carrier lifetime characterization apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/130908
[patent_app_country] => US
[patent_app_date] => 1993-10-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 2400
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 146
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/477/05477158.pdf
[firstpage_image] =>[orig_patent_app_number] => 130908
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/130908 | Compact noncontact excess carrier lifetime characterization apparatus | Oct 3, 1993 | Issued |
Array
(
[id] => 3545054
[patent_doc_number] => 05481199
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-02
[patent_title] => 'System for improving measurement accuracy of transducer by measuring transducer temperature and resistance change using thermoelectric voltages'
[patent_app_type] => 1
[patent_app_number] => 8/125888
[patent_app_country] => US
[patent_app_date] => 1993-09-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3822
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/481/05481199.pdf
[firstpage_image] =>[orig_patent_app_number] => 125888
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/125888 | System for improving measurement accuracy of transducer by measuring transducer temperature and resistance change using thermoelectric voltages | Sep 23, 1993 | Issued |
Array
(
[id] => 3479551
[patent_doc_number] => 05428300
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-06-27
[patent_title] => 'Method and apparatus for testing TFT-LCD'
[patent_app_type] => 1
[patent_app_number] => 8/121798
[patent_app_country] => US
[patent_app_date] => 1993-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 38
[patent_no_of_words] => 5305
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/428/05428300.pdf
[firstpage_image] =>[orig_patent_app_number] => 121798
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/121798 | Method and apparatus for testing TFT-LCD | Sep 14, 1993 | Issued |
Array
(
[id] => 3434066
[patent_doc_number] => 05463313
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-31
[patent_title] => 'Reduced magnetic field line integral current sensor'
[patent_app_type] => 1
[patent_app_number] => 8/119269
[patent_app_country] => US
[patent_app_date] => 1993-09-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 6506
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 98
[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/463/05463313.pdf
[firstpage_image] =>[orig_patent_app_number] => 119269
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/119269 | Reduced magnetic field line integral current sensor | Sep 8, 1993 | Issued |
Array
(
[id] => 3417665
[patent_doc_number] => 05444365
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-22
[patent_title] => 'Voltage measuring apparatus having an electro-optic member'
[patent_app_type] => 1
[patent_app_number] => 8/113239
[patent_app_country] => US
[patent_app_date] => 1993-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 4727
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 54
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/444/05444365.pdf
[firstpage_image] =>[orig_patent_app_number] => 113239
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/113239 | Voltage measuring apparatus having an electro-optic member | Aug 29, 1993 | Issued |
Array
(
[id] => 3477484
[patent_doc_number] => 05477160
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-19
[patent_title] => 'Module test card'
[patent_app_type] => 1
[patent_app_number] => 8/103294
[patent_app_country] => US
[patent_app_date] => 1993-08-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 18
[patent_no_of_words] => 8853
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/477/05477160.pdf
[firstpage_image] =>[orig_patent_app_number] => 103294
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/103294 | Module test card | Aug 5, 1993 | Issued |
Array
(
[id] => 3120638
[patent_doc_number] => 05410245
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-25
[patent_title] => 'Method and apparatus for calibrating electronic scales for the horizontal axis'
[patent_app_type] => 1
[patent_app_number] => 8/098799
[patent_app_country] => US
[patent_app_date] => 1993-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 4239
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 216
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/410/05410245.pdf
[firstpage_image] =>[orig_patent_app_number] => 098799
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/098799 | Method and apparatus for calibrating electronic scales for the horizontal axis | Jul 28, 1993 | Issued |
Array
(
[id] => 3119451
[patent_doc_number] => 05396172
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-07
[patent_title] => 'Transformer fault analyzer'
[patent_app_type] => 1
[patent_app_number] => 8/093615
[patent_app_country] => US
[patent_app_date] => 1993-07-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 29
[patent_figures_cnt] => 29
[patent_no_of_words] => 5580
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/396/05396172.pdf
[firstpage_image] =>[orig_patent_app_number] => 093615
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/093615 | Transformer fault analyzer | Jul 19, 1993 | Issued |
| 08/096159 | DC CURRENT SENSOR USING A CONTINOUS ANNULARLY SHAPED DETECTION CORE | Jul 8, 1993 | Pending |
Array
(
[id] => 3420920
[patent_doc_number] => 05453681
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-26
[patent_title] => 'Current sensor employing a mutually inductive current sensing scheme'
[patent_app_type] => 1
[patent_app_number] => 8/085788
[patent_app_country] => US
[patent_app_date] => 1993-07-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 4390
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/453/05453681.pdf
[firstpage_image] =>[orig_patent_app_number] => 085788
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/085788 | Current sensor employing a mutually inductive current sensing scheme | Jul 5, 1993 | Issued |
Array
(
[id] => 3428221
[patent_doc_number] => 05459395
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-17
[patent_title] => 'Reduced flux current sensor'
[patent_app_type] => 1
[patent_app_number] => 8/085789
[patent_app_country] => US
[patent_app_date] => 1993-07-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 3946
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 165
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/459/05459395.pdf
[firstpage_image] =>[orig_patent_app_number] => 085789
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/085789 | Reduced flux current sensor | Jul 5, 1993 | Issued |
Array
(
[id] => 3451235
[patent_doc_number] => 05387872
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-02-07
[patent_title] => 'Positioning aid for a hand-held electrical test probe'
[patent_app_type] => 1
[patent_app_number] => 8/086698
[patent_app_country] => US
[patent_app_date] => 1993-07-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/387/05387872.pdf
[firstpage_image] =>[orig_patent_app_number] => 086698
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/086698 | Positioning aid for a hand-held electrical test probe | Jul 1, 1993 | Issued |
| 08/081769 | BURN-IN SOCKET TESTING APPARATUS | Jun 22, 1993 | Pending |
Array
(
[id] => 3451078
[patent_doc_number] => 05387861
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-02-07
[patent_title] => 'Programmable low profile universally selectable burn-in board assembly'
[patent_app_type] => 1
[patent_app_number] => 8/078428
[patent_app_country] => US
[patent_app_date] => 1993-06-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 2723
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/387/05387861.pdf
[firstpage_image] =>[orig_patent_app_number] => 078428
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/078428 | Programmable low profile universally selectable burn-in board assembly | Jun 15, 1993 | Issued |
Array
(
[id] => 3479508
[patent_doc_number] => 05428297
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-06-27
[patent_title] => 'Precision integrated resistors'
[patent_app_type] => 1
[patent_app_number] => 8/077189
[patent_app_country] => US
[patent_app_date] => 1993-06-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/428/05428297.pdf
[firstpage_image] =>[orig_patent_app_number] => 077189
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/077189 | Precision integrated resistors | Jun 14, 1993 | Issued |
Array
(
[id] => 3557579
[patent_doc_number] => 05493210
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-02-20
[patent_title] => 'Combined signal level meter and leakage detector'
[patent_app_type] => 1
[patent_app_number] => 8/074888
[patent_app_country] => US
[patent_app_date] => 1993-06-10
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/493/05493210.pdf
[firstpage_image] =>[orig_patent_app_number] => 074888
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/074888 | Combined signal level meter and leakage detector | Jun 9, 1993 | Issued |
Array
(
[id] => 3041954
[patent_doc_number] => 05373231
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-12-13
[patent_title] => 'Integrated circuit probing apparatus including a capacitor bypass structure'
[patent_app_type] => 1
[patent_app_number] => 8/075139
[patent_app_country] => US
[patent_app_date] => 1993-06-10
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/373/05373231.pdf
[firstpage_image] =>[orig_patent_app_number] => 075139
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/075139 | Integrated circuit probing apparatus including a capacitor bypass structure | Jun 9, 1993 | Issued |
Array
(
[id] => 3042068
[patent_doc_number] => 05373237
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-12-13
[patent_title] => 'Radio frequency power measurement system'
[patent_app_type] => 1
[patent_app_number] => 8/071439
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[pdf_file] => patents/05/373/05373237.pdf
[firstpage_image] =>[orig_patent_app_number] => 071439
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/071439 | Radio frequency power measurement system | Jun 1, 1993 | Issued |