Search

Barry Bowser

Examiner (ID: 1051)

Most Active Art Unit
2213
Art Unit(s)
2607, 2899, 2213, 2858
Total Applications
268
Issued Applications
248
Pending Applications
4
Abandoned Applications
16

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3120907 [patent_doc_number] => 05410259 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-25 [patent_title] => 'Probing device setting a probe card parallel' [patent_app_type] => 1 [patent_app_number] => 8/069839 [patent_app_country] => US [patent_app_date] => 1993-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 14 [patent_no_of_words] => 5012 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/410/05410259.pdf [firstpage_image] =>[orig_patent_app_number] => 069839 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/069839
Probing device setting a probe card parallel May 31, 1993 Issued
Array ( [id] => 3039430 [patent_doc_number] => 05329227 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-07-12 [patent_title] => 'Test socket assembly for testing LCC packages of both rectangular and square configuration' [patent_app_type] => 1 [patent_app_number] => 8/063528 [patent_app_country] => US [patent_app_date] => 1993-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 5694 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 304 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/329/05329227.pdf [firstpage_image] =>[orig_patent_app_number] => 063528 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/063528
Test socket assembly for testing LCC packages of both rectangular and square configuration May 17, 1993 Issued
Array ( [id] => 3426444 [patent_doc_number] => 05389873 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-02-14 [patent_title] => 'Pressure contact chip and wafer testing device' [patent_app_type] => 1 [patent_app_number] => 8/062538 [patent_app_country] => US [patent_app_date] => 1993-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 14 [patent_no_of_words] => 4460 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/389/05389873.pdf [firstpage_image] =>[orig_patent_app_number] => 062538 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/062538
Pressure contact chip and wafer testing device May 17, 1993 Issued
08/056659 SEMICONDUCTOR WAFER TESTING APPARATUS USING INTERMEDIATE SEMICONDUCTOR WAFER May 2, 1993 Pending
Array ( [id] => 3077055 [patent_doc_number] => 05336991 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-08-09 [patent_title] => 'Apparatus and method for measuring electrical energy and quadergy and for performing line frequency compensation' [patent_app_type] => 1 [patent_app_number] => 8/049039 [patent_app_country] => US [patent_app_date] => 1993-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 4986 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/336/05336991.pdf [firstpage_image] =>[orig_patent_app_number] => 049039 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/049039
Apparatus and method for measuring electrical energy and quadergy and for performing line frequency compensation Apr 15, 1993 Issued
Array ( [id] => 3421644 [patent_doc_number] => 05394102 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-02-28 [patent_title] => 'Non-repeatable run-out measuring instrument using encoder signals based upon the back EMF of a motor as trigger signals' [patent_app_type] => 1 [patent_app_number] => 8/044398 [patent_app_country] => US [patent_app_date] => 1993-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2937 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/394/05394102.pdf [firstpage_image] =>[orig_patent_app_number] => 044398 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/044398
Non-repeatable run-out measuring instrument using encoder signals based upon the back EMF of a motor as trigger signals Apr 7, 1993 Issued
Array ( [id] => 3466604 [patent_doc_number] => 05469049 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-21 [patent_title] => 'System checking and troubleshooting package for an electronic metering device' [patent_app_type] => 1 [patent_app_number] => 8/037938 [patent_app_country] => US [patent_app_date] => 1993-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 10260 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/469/05469049.pdf [firstpage_image] =>[orig_patent_app_number] => 037938 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/037938
System checking and troubleshooting package for an electronic metering device Mar 25, 1993 Issued
08/030798 APPARATUS FOR MEASURING CHARACTERISTICS OF ELECTRONIC PARTS Mar 11, 1993 Pending
Array ( [id] => 3464710 [patent_doc_number] => 05382896 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-17 [patent_title] => 'Measuring assembly with current sensor and supply transformer' [patent_app_type] => 1 [patent_app_number] => 8/027099 [patent_app_country] => US [patent_app_date] => 1993-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1096 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/382/05382896.pdf [firstpage_image] =>[orig_patent_app_number] => 027099 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/027099
Measuring assembly with current sensor and supply transformer Mar 4, 1993 Issued
Array ( [id] => 3415196 [patent_doc_number] => 05461326 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-24 [patent_title] => 'Self leveling and self tensioning membrane test probe' [patent_app_type] => 1 [patent_app_number] => 8/023189 [patent_app_country] => US [patent_app_date] => 1993-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 3194 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/461/05461326.pdf [firstpage_image] =>[orig_patent_app_number] => 023189 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/023189
Self leveling and self tensioning membrane test probe Feb 24, 1993 Issued
Array ( [id] => 3459053 [patent_doc_number] => 05378982 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-03 [patent_title] => 'Test probe for panel having an overlying protective member adjacent panel contacts' [patent_app_type] => 1 [patent_app_number] => 8/023019 [patent_app_country] => US [patent_app_date] => 1993-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3091 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/378/05378982.pdf [firstpage_image] =>[orig_patent_app_number] => 023019 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/023019
Test probe for panel having an overlying protective member adjacent panel contacts Feb 24, 1993 Issued
Array ( [id] => 3125528 [patent_doc_number] => 05381105 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-10 [patent_title] => 'Method of testing a semiconductor device having a first circuit electrically isolated from a second circuit' [patent_app_type] => 1 [patent_app_number] => 8/017159 [patent_app_country] => US [patent_app_date] => 1993-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 1451 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/381/05381105.pdf [firstpage_image] =>[orig_patent_app_number] => 017159 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/017159
Method of testing a semiconductor device having a first circuit electrically isolated from a second circuit Feb 11, 1993 Issued
Array ( [id] => 3486856 [patent_doc_number] => 05406210 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-11 [patent_title] => 'Apparatus and method for testing bare dies with low contact resistance between the die and testing station' [patent_app_type] => 1 [patent_app_number] => 8/012998 [patent_app_country] => US [patent_app_date] => 1993-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2645 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/406/05406210.pdf [firstpage_image] =>[orig_patent_app_number] => 012998 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/012998
Apparatus and method for testing bare dies with low contact resistance between the die and testing station Feb 2, 1993 Issued
Array ( [id] => 3446881 [patent_doc_number] => 05430369 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-04 [patent_title] => 'Device for measuring, at a plurality of points of a surface, the microwave field radiated by a source' [patent_app_type] => 1 [patent_app_number] => 7/962788 [patent_app_country] => US [patent_app_date] => 1993-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4716 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 295 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/430/05430369.pdf [firstpage_image] =>[orig_patent_app_number] => 962788 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/962788
Device for measuring, at a plurality of points of a surface, the microwave field radiated by a source Jan 10, 1993 Issued
Array ( [id] => 3113706 [patent_doc_number] => 05408188 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-18 [patent_title] => 'High frequency wafer probe including open end waveguide' [patent_app_type] => 1 [patent_app_number] => 7/995695 [patent_app_country] => US [patent_app_date] => 1992-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 31 [patent_no_of_words] => 5877 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/408/05408188.pdf [firstpage_image] =>[orig_patent_app_number] => 995695 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/995695
High frequency wafer probe including open end waveguide Dec 22, 1992 Issued
Array ( [id] => 3450897 [patent_doc_number] => 05420502 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-30 [patent_title] => 'Fault indicator with optically-isolated remote readout circuit' [patent_app_type] => 1 [patent_app_number] => 7/994558 [patent_app_country] => US [patent_app_date] => 1992-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 15 [patent_no_of_words] => 4680 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/420/05420502.pdf [firstpage_image] =>[orig_patent_app_number] => 994558 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/994558
Fault indicator with optically-isolated remote readout circuit Dec 20, 1992 Issued
Array ( [id] => 3486644 [patent_doc_number] => 05406195 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-11 [patent_title] => 'Phase-to-phase voltage monitor for three-phase power distribution system' [patent_app_type] => 1 [patent_app_number] => 7/994625 [patent_app_country] => US [patent_app_date] => 1992-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 4505 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/406/05406195.pdf [firstpage_image] =>[orig_patent_app_number] => 994625 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/994625
Phase-to-phase voltage monitor for three-phase power distribution system Dec 20, 1992 Issued
Array ( [id] => 3619647 [patent_doc_number] => 05510722 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-23 [patent_title] => 'Test fixture for printed circuit boards' [patent_app_type] => 1 [patent_app_number] => 7/992578 [patent_app_country] => US [patent_app_date] => 1992-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3264 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 325 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/510/05510722.pdf [firstpage_image] =>[orig_patent_app_number] => 992578 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/992578
Test fixture for printed circuit boards Dec 17, 1992 Issued
07/991917 INTEGRATED CIRCUIT TEST JIG Dec 16, 1992 Abandoned
Array ( [id] => 3113725 [patent_doc_number] => 05408189 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-18 [patent_title] => 'Test fixture alignment system for printed circuit boards' [patent_app_type] => 1 [patent_app_number] => 7/990573 [patent_app_country] => US [patent_app_date] => 1992-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 24 [patent_no_of_words] => 12582 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 251 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/408/05408189.pdf [firstpage_image] =>[orig_patent_app_number] => 990573 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/990573
Test fixture alignment system for printed circuit boards Dec 13, 1992 Issued
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