| Application number | Title of the application | Filing Date | Status |
|---|
Array
(
[id] => 3120907
[patent_doc_number] => 05410259
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-25
[patent_title] => 'Probing device setting a probe card parallel'
[patent_app_type] => 1
[patent_app_number] => 8/069839
[patent_app_country] => US
[patent_app_date] => 1993-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 14
[patent_no_of_words] => 5012
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 197
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/410/05410259.pdf
[firstpage_image] =>[orig_patent_app_number] => 069839
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/069839 | Probing device setting a probe card parallel | May 31, 1993 | Issued |
Array
(
[id] => 3039430
[patent_doc_number] => 05329227
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-07-12
[patent_title] => 'Test socket assembly for testing LCC packages of both rectangular and square configuration'
[patent_app_type] => 1
[patent_app_number] => 8/063528
[patent_app_country] => US
[patent_app_date] => 1993-05-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 13
[patent_no_of_words] => 5694
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 304
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/329/05329227.pdf
[firstpage_image] =>[orig_patent_app_number] => 063528
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/063528 | Test socket assembly for testing LCC packages of both rectangular and square configuration | May 17, 1993 | Issued |
Array
(
[id] => 3426444
[patent_doc_number] => 05389873
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-02-14
[patent_title] => 'Pressure contact chip and wafer testing device'
[patent_app_type] => 1
[patent_app_number] => 8/062538
[patent_app_country] => US
[patent_app_date] => 1993-05-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 14
[patent_no_of_words] => 4460
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 144
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/389/05389873.pdf
[firstpage_image] =>[orig_patent_app_number] => 062538
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/062538 | Pressure contact chip and wafer testing device | May 17, 1993 | Issued |
| 08/056659 | SEMICONDUCTOR WAFER TESTING APPARATUS USING INTERMEDIATE SEMICONDUCTOR WAFER | May 2, 1993 | Pending |
Array
(
[id] => 3077055
[patent_doc_number] => 05336991
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-08-09
[patent_title] => 'Apparatus and method for measuring electrical energy and quadergy and for performing line frequency compensation'
[patent_app_type] => 1
[patent_app_number] => 8/049039
[patent_app_country] => US
[patent_app_date] => 1993-04-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 4986
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/336/05336991.pdf
[firstpage_image] =>[orig_patent_app_number] => 049039
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/049039 | Apparatus and method for measuring electrical energy and quadergy and for performing line frequency compensation | Apr 15, 1993 | Issued |
Array
(
[id] => 3421644
[patent_doc_number] => 05394102
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-02-28
[patent_title] => 'Non-repeatable run-out measuring instrument using encoder signals based upon the back EMF of a motor as trigger signals'
[patent_app_type] => 1
[patent_app_number] => 8/044398
[patent_app_country] => US
[patent_app_date] => 1993-04-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 2937
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 24
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/394/05394102.pdf
[firstpage_image] =>[orig_patent_app_number] => 044398
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/044398 | Non-repeatable run-out measuring instrument using encoder signals based upon the back EMF of a motor as trigger signals | Apr 7, 1993 | Issued |
Array
(
[id] => 3466604
[patent_doc_number] => 05469049
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-21
[patent_title] => 'System checking and troubleshooting package for an electronic metering device'
[patent_app_type] => 1
[patent_app_number] => 8/037938
[patent_app_country] => US
[patent_app_date] => 1993-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 10260
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 126
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/469/05469049.pdf
[firstpage_image] =>[orig_patent_app_number] => 037938
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/037938 | System checking and troubleshooting package for an electronic metering device | Mar 25, 1993 | Issued |
| 08/030798 | APPARATUS FOR MEASURING CHARACTERISTICS OF ELECTRONIC PARTS | Mar 11, 1993 | Pending |
Array
(
[id] => 3464710
[patent_doc_number] => 05382896
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-01-17
[patent_title] => 'Measuring assembly with current sensor and supply transformer'
[patent_app_type] => 1
[patent_app_number] => 8/027099
[patent_app_country] => US
[patent_app_date] => 1993-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 1096
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 170
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/382/05382896.pdf
[firstpage_image] =>[orig_patent_app_number] => 027099
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/027099 | Measuring assembly with current sensor and supply transformer | Mar 4, 1993 | Issued |
Array
(
[id] => 3415196
[patent_doc_number] => 05461326
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-24
[patent_title] => 'Self leveling and self tensioning membrane test probe'
[patent_app_type] => 1
[patent_app_number] => 8/023189
[patent_app_country] => US
[patent_app_date] => 1993-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 3194
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 221
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/461/05461326.pdf
[firstpage_image] =>[orig_patent_app_number] => 023189
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/023189 | Self leveling and self tensioning membrane test probe | Feb 24, 1993 | Issued |
Array
(
[id] => 3459053
[patent_doc_number] => 05378982
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-01-03
[patent_title] => 'Test probe for panel having an overlying protective member adjacent panel contacts'
[patent_app_type] => 1
[patent_app_number] => 8/023019
[patent_app_country] => US
[patent_app_date] => 1993-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 3091
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 188
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/378/05378982.pdf
[firstpage_image] =>[orig_patent_app_number] => 023019
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/023019 | Test probe for panel having an overlying protective member adjacent panel contacts | Feb 24, 1993 | Issued |
Array
(
[id] => 3125528
[patent_doc_number] => 05381105
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-01-10
[patent_title] => 'Method of testing a semiconductor device having a first circuit electrically isolated from a second circuit'
[patent_app_type] => 1
[patent_app_number] => 8/017159
[patent_app_country] => US
[patent_app_date] => 1993-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 1451
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 67
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/381/05381105.pdf
[firstpage_image] =>[orig_patent_app_number] => 017159
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/017159 | Method of testing a semiconductor device having a first circuit electrically isolated from a second circuit | Feb 11, 1993 | Issued |
Array
(
[id] => 3486856
[patent_doc_number] => 05406210
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-11
[patent_title] => 'Apparatus and method for testing bare dies with low contact resistance between the die and testing station'
[patent_app_type] => 1
[patent_app_number] => 8/012998
[patent_app_country] => US
[patent_app_date] => 1993-02-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 2645
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/406/05406210.pdf
[firstpage_image] =>[orig_patent_app_number] => 012998
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/012998 | Apparatus and method for testing bare dies with low contact resistance between the die and testing station | Feb 2, 1993 | Issued |
Array
(
[id] => 3446881
[patent_doc_number] => 05430369
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-04
[patent_title] => 'Device for measuring, at a plurality of points of a surface, the microwave field radiated by a source'
[patent_app_type] => 1
[patent_app_number] => 7/962788
[patent_app_country] => US
[patent_app_date] => 1993-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 4716
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 295
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/430/05430369.pdf
[firstpage_image] =>[orig_patent_app_number] => 962788
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/962788 | Device for measuring, at a plurality of points of a surface, the microwave field radiated by a source | Jan 10, 1993 | Issued |
Array
(
[id] => 3113706
[patent_doc_number] => 05408188
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-18
[patent_title] => 'High frequency wafer probe including open end waveguide'
[patent_app_type] => 1
[patent_app_number] => 7/995695
[patent_app_country] => US
[patent_app_date] => 1992-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 31
[patent_no_of_words] => 5877
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 176
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/408/05408188.pdf
[firstpage_image] =>[orig_patent_app_number] => 995695
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/995695 | High frequency wafer probe including open end waveguide | Dec 22, 1992 | Issued |
Array
(
[id] => 3450897
[patent_doc_number] => 05420502
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-30
[patent_title] => 'Fault indicator with optically-isolated remote readout circuit'
[patent_app_type] => 1
[patent_app_number] => 7/994558
[patent_app_country] => US
[patent_app_date] => 1992-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 15
[patent_no_of_words] => 4680
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 234
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/420/05420502.pdf
[firstpage_image] =>[orig_patent_app_number] => 994558
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/994558 | Fault indicator with optically-isolated remote readout circuit | Dec 20, 1992 | Issued |
Array
(
[id] => 3486644
[patent_doc_number] => 05406195
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-11
[patent_title] => 'Phase-to-phase voltage monitor for three-phase power distribution system'
[patent_app_type] => 1
[patent_app_number] => 7/994625
[patent_app_country] => US
[patent_app_date] => 1992-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 13
[patent_no_of_words] => 4505
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 213
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/406/05406195.pdf
[firstpage_image] =>[orig_patent_app_number] => 994625
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/994625 | Phase-to-phase voltage monitor for three-phase power distribution system | Dec 20, 1992 | Issued |
Array
(
[id] => 3619647
[patent_doc_number] => 05510722
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-23
[patent_title] => 'Test fixture for printed circuit boards'
[patent_app_type] => 1
[patent_app_number] => 7/992578
[patent_app_country] => US
[patent_app_date] => 1992-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 3264
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 325
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/510/05510722.pdf
[firstpage_image] =>[orig_patent_app_number] => 992578
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/992578 | Test fixture for printed circuit boards | Dec 17, 1992 | Issued |
| 07/991917 | INTEGRATED CIRCUIT TEST JIG | Dec 16, 1992 | Abandoned |
Array
(
[id] => 3113725
[patent_doc_number] => 05408189
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-18
[patent_title] => 'Test fixture alignment system for printed circuit boards'
[patent_app_type] => 1
[patent_app_number] => 7/990573
[patent_app_country] => US
[patent_app_date] => 1992-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 24
[patent_no_of_words] => 12582
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 251
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/408/05408189.pdf
[firstpage_image] =>[orig_patent_app_number] => 990573
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/990573 | Test fixture alignment system for printed circuit boards | Dec 13, 1992 | Issued |