Search

Barry Bowser

Examiner (ID: 1051)

Most Active Art Unit
2213
Art Unit(s)
2607, 2899, 2213, 2858
Total Applications
268
Issued Applications
248
Pending Applications
4
Abandoned Applications
16

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3485489 [patent_doc_number] => 05457399 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-10 [patent_title] => 'Microwave monolithic integrated circuit fabrication, test method and test probes' [patent_app_type] => 1 [patent_app_number] => 7/993767 [patent_app_country] => US [patent_app_date] => 1992-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2830 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/457/05457399.pdf [firstpage_image] =>[orig_patent_app_number] => 993767 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/993767
Microwave monolithic integrated circuit fabrication, test method and test probes Dec 13, 1992 Issued
Array ( [id] => 3485000 [patent_doc_number] => 05399965 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-03-21 [patent_title] => 'Floating data interface' [patent_app_type] => 1 [patent_app_number] => 7/989318 [patent_app_country] => US [patent_app_date] => 1992-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 1971 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/399/05399965.pdf [firstpage_image] =>[orig_patent_app_number] => 989318 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/989318
Floating data interface Dec 10, 1992 Issued
Array ( [id] => 3451240 [patent_doc_number] => 05420523 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-30 [patent_title] => 'Apparatus and method for measuring performance parameters of electric motors' [patent_app_type] => 1 [patent_app_number] => 7/986149 [patent_app_country] => US [patent_app_date] => 1992-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 8622 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/420/05420523.pdf [firstpage_image] =>[orig_patent_app_number] => 986149 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/986149
Apparatus and method for measuring performance parameters of electric motors Dec 3, 1992 Issued
Array ( [id] => 3424422 [patent_doc_number] => 05479108 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-26 [patent_title] => 'Method and apparatus for handling wafers' [patent_app_type] => 1 [patent_app_number] => 7/981801 [patent_app_country] => US [patent_app_date] => 1992-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 5324 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/479/05479108.pdf [firstpage_image] =>[orig_patent_app_number] => 981801 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/981801
Method and apparatus for handling wafers Nov 24, 1992 Issued
Array ( [id] => 3459009 [patent_doc_number] => 05378979 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-03 [patent_title] => 'Method and apparatus for efficiently computing symmetric sequence signals in a three phase power system' [patent_app_type] => 1 [patent_app_number] => 7/981573 [patent_app_country] => US [patent_app_date] => 1992-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 4940 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/378/05378979.pdf [firstpage_image] =>[orig_patent_app_number] => 981573 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/981573
Method and apparatus for efficiently computing symmetric sequence signals in a three phase power system Nov 24, 1992 Issued
Array ( [id] => 3494491 [patent_doc_number] => 05471134 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-28 [patent_title] => 'Measuring apparatus with adjustable indicator for measuring the real load factor on an electricity source' [patent_app_type] => 1 [patent_app_number] => 7/980970 [patent_app_country] => US [patent_app_date] => 1992-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2665 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/471/05471134.pdf [firstpage_image] =>[orig_patent_app_number] => 980970 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/980970
Measuring apparatus with adjustable indicator for measuring the real load factor on an electricity source Nov 23, 1992 Issued
Array ( [id] => 3576871 [patent_doc_number] => 05539324 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-23 [patent_title] => 'Universal wafer carrier for wafer level die burn-in' [patent_app_type] => 1 [patent_app_number] => 7/981956 [patent_app_country] => US [patent_app_date] => 1992-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3532 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/539/05539324.pdf [firstpage_image] =>[orig_patent_app_number] => 981956 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/981956
Universal wafer carrier for wafer level die burn-in Nov 23, 1992 Issued
Array ( [id] => 3033089 [patent_doc_number] => 05317251 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-05-31 [patent_title] => 'Peak magnetic field detector with non-volatile storage' [patent_app_type] => 1 [patent_app_number] => 7/979950 [patent_app_country] => US [patent_app_date] => 1992-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2379 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/317/05317251.pdf [firstpage_image] =>[orig_patent_app_number] => 979950 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/979950
Peak magnetic field detector with non-volatile storage Nov 22, 1992 Issued
Array ( [id] => 3116932 [patent_doc_number] => 05414349 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-09 [patent_title] => 'Electronic watthour meter' [patent_app_type] => 1 [patent_app_number] => 7/979214 [patent_app_country] => US [patent_app_date] => 1992-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2832 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/414/05414349.pdf [firstpage_image] =>[orig_patent_app_number] => 979214 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/979214
Electronic watthour meter Nov 19, 1992 Issued
07/979713 CIRCUITRY FOR AUTOMATED TESTING OF A PLURALITY OF SEMICONDUCTOR DEVICES Nov 19, 1992 Abandoned
Array ( [id] => 3462089 [patent_doc_number] => 05402077 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-03-28 [patent_title] => 'Bare die carrier' [patent_app_type] => 1 [patent_app_number] => 7/979719 [patent_app_country] => US [patent_app_date] => 1992-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 18 [patent_no_of_words] => 5573 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 20 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/402/05402077.pdf [firstpage_image] =>[orig_patent_app_number] => 979719 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/979719
Bare die carrier Nov 19, 1992 Issued
Array ( [id] => 3111458 [patent_doc_number] => 05418451 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-23 [patent_title] => 'Apparatus for measuring at least one state variable of a brushless direct-current motor' [patent_app_type] => 1 [patent_app_number] => 7/977110 [patent_app_country] => US [patent_app_date] => 1992-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 17 [patent_no_of_words] => 4433 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/418/05418451.pdf [firstpage_image] =>[orig_patent_app_number] => 977110 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/977110
Apparatus for measuring at least one state variable of a brushless direct-current motor Nov 15, 1992 Issued
07/971183 AUTOMATIC TEST CLOCK SELECTION APPARATUS Nov 2, 1992 Abandoned
07/968331 CONTINUOUS TESTING APPARATUS Oct 28, 1992 Abandoned
Array ( [id] => 3099162 [patent_doc_number] => 05369358 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-11-29 [patent_title] => 'Method of ensuring electrical contact between test probes and chip pads through the use of vibration and nondestructive deformation' [patent_app_type] => 1 [patent_app_number] => 7/965472 [patent_app_country] => US [patent_app_date] => 1992-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2965 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/369/05369358.pdf [firstpage_image] =>[orig_patent_app_number] => 965472 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/965472
Method of ensuring electrical contact between test probes and chip pads through the use of vibration and nondestructive deformation Oct 22, 1992 Issued
Array ( [id] => 3497007 [patent_doc_number] => 05561366 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-01 [patent_title] => 'Current sensor system and detection method comprising magetoresistance element, biasing conductor and current measurement conductor on insulating substrate' [patent_app_type] => 1 [patent_app_number] => 7/964891 [patent_app_country] => US [patent_app_date] => 1992-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 16 [patent_no_of_words] => 3782 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/561/05561366.pdf [firstpage_image] =>[orig_patent_app_number] => 964891 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/964891
Current sensor system and detection method comprising magetoresistance element, biasing conductor and current measurement conductor on insulating substrate Oct 21, 1992 Issued
Array ( [id] => 3007870 [patent_doc_number] => 05371458 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-12-06 [patent_title] => 'Method for determining the stator flux of an asynchronous machine' [patent_app_type] => 1 [patent_app_number] => 7/963761 [patent_app_country] => US [patent_app_date] => 1992-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 5389 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/371/05371458.pdf [firstpage_image] =>[orig_patent_app_number] => 963761 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/963761
Method for determining the stator flux of an asynchronous machine Oct 19, 1992 Issued
Array ( [id] => 3125494 [patent_doc_number] => 05381103 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-10 [patent_title] => 'System and method for accelerated degradation testing of semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 7/959714 [patent_app_country] => US [patent_app_date] => 1992-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2375 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/381/05381103.pdf [firstpage_image] =>[orig_patent_app_number] => 959714 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/959714
System and method for accelerated degradation testing of semiconductor devices Oct 12, 1992 Issued
Array ( [id] => 3119397 [patent_doc_number] => 05396169 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-03-07 [patent_title] => 'Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits' [patent_app_type] => 1 [patent_app_number] => 7/956252 [patent_app_country] => US [patent_app_date] => 1992-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 6294 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 263 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/396/05396169.pdf [firstpage_image] =>[orig_patent_app_number] => 956252 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/956252
Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits Oct 4, 1992 Issued
Array ( [id] => 3119683 [patent_doc_number] => 05396182 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-03-07 [patent_title] => 'Low signal margin detect circuit' [patent_app_type] => 1 [patent_app_number] => 7/955573 [patent_app_country] => US [patent_app_date] => 1992-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 1512 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/396/05396182.pdf [firstpage_image] =>[orig_patent_app_number] => 955573 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/955573
Low signal margin detect circuit Oct 1, 1992 Issued
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