| Application number | Title of the application | Filing Date | Status |
|---|
Array
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[patent_kind] => NA
[patent_issue_date] => 1995-10-10
[patent_title] => 'Microwave monolithic integrated circuit fabrication, test method and test probes'
[patent_app_type] => 1
[patent_app_number] => 7/993767
[patent_app_country] => US
[patent_app_date] => 1992-12-14
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Array
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[patent_doc_number] => 05399965
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-21
[patent_title] => 'Floating data interface'
[patent_app_type] => 1
[patent_app_number] => 7/989318
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[patent_app_date] => 1992-12-11
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[firstpage_image] =>[orig_patent_app_number] => 989318
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/989318 | Floating data interface | Dec 10, 1992 | Issued |
Array
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[id] => 3451240
[patent_doc_number] => 05420523
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-30
[patent_title] => 'Apparatus and method for measuring performance parameters of electric motors'
[patent_app_type] => 1
[patent_app_number] => 7/986149
[patent_app_country] => US
[patent_app_date] => 1992-12-04
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/420/05420523.pdf
[firstpage_image] =>[orig_patent_app_number] => 986149
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/986149 | Apparatus and method for measuring performance parameters of electric motors | Dec 3, 1992 | Issued |
Array
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[id] => 3424422
[patent_doc_number] => 05479108
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-26
[patent_title] => 'Method and apparatus for handling wafers'
[patent_app_type] => 1
[patent_app_number] => 7/981801
[patent_app_country] => US
[patent_app_date] => 1992-11-25
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[firstpage_image] =>[orig_patent_app_number] => 981801
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/981801 | Method and apparatus for handling wafers | Nov 24, 1992 | Issued |
Array
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[id] => 3459009
[patent_doc_number] => 05378979
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-01-03
[patent_title] => 'Method and apparatus for efficiently computing symmetric sequence signals in a three phase power system'
[patent_app_type] => 1
[patent_app_number] => 7/981573
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[patent_app_date] => 1992-11-25
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[firstpage_image] =>[orig_patent_app_number] => 981573
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/981573 | Method and apparatus for efficiently computing symmetric sequence signals in a three phase power system | Nov 24, 1992 | Issued |
Array
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[id] => 3494491
[patent_doc_number] => 05471134
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[patent_kind] => NA
[patent_issue_date] => 1995-11-28
[patent_title] => 'Measuring apparatus with adjustable indicator for measuring the real load factor on an electricity source'
[patent_app_type] => 1
[patent_app_number] => 7/980970
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/980970 | Measuring apparatus with adjustable indicator for measuring the real load factor on an electricity source | Nov 23, 1992 | Issued |
Array
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[patent_issue_date] => 1996-07-23
[patent_title] => 'Universal wafer carrier for wafer level die burn-in'
[patent_app_type] => 1
[patent_app_number] => 7/981956
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[pdf_file] => patents/05/539/05539324.pdf
[firstpage_image] =>[orig_patent_app_number] => 981956
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/981956 | Universal wafer carrier for wafer level die burn-in | Nov 23, 1992 | Issued |
Array
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[id] => 3033089
[patent_doc_number] => 05317251
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-05-31
[patent_title] => 'Peak magnetic field detector with non-volatile storage'
[patent_app_type] => 1
[patent_app_number] => 7/979950
[patent_app_country] => US
[patent_app_date] => 1992-11-23
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[pdf_file] => patents/05/317/05317251.pdf
[firstpage_image] =>[orig_patent_app_number] => 979950
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/979950 | Peak magnetic field detector with non-volatile storage | Nov 22, 1992 | Issued |
Array
(
[id] => 3116932
[patent_doc_number] => 05414349
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-09
[patent_title] => 'Electronic watthour meter'
[patent_app_type] => 1
[patent_app_number] => 7/979214
[patent_app_country] => US
[patent_app_date] => 1992-11-20
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[pdf_file] => patents/05/414/05414349.pdf
[firstpage_image] =>[orig_patent_app_number] => 979214
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/979214 | Electronic watthour meter | Nov 19, 1992 | Issued |
| 07/979713 | CIRCUITRY FOR AUTOMATED TESTING OF A PLURALITY OF SEMICONDUCTOR DEVICES | Nov 19, 1992 | Abandoned |
Array
(
[id] => 3462089
[patent_doc_number] => 05402077
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-28
[patent_title] => 'Bare die carrier'
[patent_app_type] => 1
[patent_app_number] => 7/979719
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[patent_app_date] => 1992-11-20
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[firstpage_image] =>[orig_patent_app_number] => 979719
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/979719 | Bare die carrier | Nov 19, 1992 | Issued |
Array
(
[id] => 3111458
[patent_doc_number] => 05418451
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-23
[patent_title] => 'Apparatus for measuring at least one state variable of a brushless direct-current motor'
[patent_app_type] => 1
[patent_app_number] => 7/977110
[patent_app_country] => US
[patent_app_date] => 1992-11-16
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[pdf_file] => patents/05/418/05418451.pdf
[firstpage_image] =>[orig_patent_app_number] => 977110
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/977110 | Apparatus for measuring at least one state variable of a brushless direct-current motor | Nov 15, 1992 | Issued |
| 07/971183 | AUTOMATIC TEST CLOCK SELECTION APPARATUS | Nov 2, 1992 | Abandoned |
| 07/968331 | CONTINUOUS TESTING APPARATUS | Oct 28, 1992 | Abandoned |
Array
(
[id] => 3099162
[patent_doc_number] => 05369358
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[patent_issue_date] => 1994-11-29
[patent_title] => 'Method of ensuring electrical contact between test probes and chip pads through the use of vibration and nondestructive deformation'
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Array
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[patent_issue_date] => 1996-10-01
[patent_title] => 'Current sensor system and detection method comprising magetoresistance element, biasing conductor and current measurement conductor on insulating substrate'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/964891 | Current sensor system and detection method comprising magetoresistance element, biasing conductor and current measurement conductor on insulating substrate | Oct 21, 1992 | Issued |
Array
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[patent_doc_number] => 05371458
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-12-06
[patent_title] => 'Method for determining the stator flux of an asynchronous machine'
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[patent_app_number] => 7/963761
[patent_app_country] => US
[patent_app_date] => 1992-10-20
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/963761 | Method for determining the stator flux of an asynchronous machine | Oct 19, 1992 | Issued |
Array
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[id] => 3125494
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/959714 | System and method for accelerated degradation testing of semiconductor devices | Oct 12, 1992 | Issued |
Array
(
[id] => 3119397
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[patent_kind] => NA
[patent_issue_date] => 1995-03-07
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[patent_app_type] => 1
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[patent_app_date] => 1992-10-05
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/956252 | Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits | Oct 4, 1992 | Issued |
Array
(
[id] => 3119683
[patent_doc_number] => 05396182
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[patent_kind] => NA
[patent_issue_date] => 1995-03-07
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/955573 | Low signal margin detect circuit | Oct 1, 1992 | Issued |