| Application number | Title of the application | Filing Date | Status |
|---|
Array
(
[id] => 3017623
[patent_doc_number] => 05332962
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-07-26
[patent_title] => 'Peak voltage detector with ferroelectric element'
[patent_app_type] => 1
[patent_app_number] => 7/956102
[patent_app_country] => US
[patent_app_date] => 1992-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 21
[patent_no_of_words] => 2892
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[pdf_file] => patents/05/332/05332962.pdf
[firstpage_image] =>[orig_patent_app_number] => 956102
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/956102 | Peak voltage detector with ferroelectric element | Oct 1, 1992 | Issued |
Array
(
[id] => 3617419
[patent_doc_number] => 05565766
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-15
[patent_title] => 'Semiconductor circuit element device with arrangement for testing the device and method of test'
[patent_app_type] => 1
[patent_app_number] => 7/952651
[patent_app_country] => US
[patent_app_date] => 1992-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 34
[patent_figures_cnt] => 38
[patent_no_of_words] => 6238
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 12
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/565/05565766.pdf
[firstpage_image] =>[orig_patent_app_number] => 952651
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/952651 | Semiconductor circuit element device with arrangement for testing the device and method of test | Sep 27, 1992 | Issued |
Array
(
[id] => 3117223
[patent_doc_number] => 05414365
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-09
[patent_title] => 'Diagnostic apparatus for testing an analog circuit'
[patent_app_type] => 1
[patent_app_number] => 7/950693
[patent_app_country] => US
[patent_app_date] => 1992-09-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 8409
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 224
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/414/05414365.pdf
[firstpage_image] =>[orig_patent_app_number] => 950693
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/950693 | Diagnostic apparatus for testing an analog circuit | Sep 24, 1992 | Issued |
| 07/951502 | WIRELESS TEST FIXTURE FOR HIGH FREQUENCY TESTING | Sep 23, 1992 | Abandoned |
Array
(
[id] => 3099182
[patent_doc_number] => 05369359
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-11-29
[patent_title] => 'Particle beam testing method with countervoltage or retarding voltage follow-up or feedback'
[patent_app_type] => 1
[patent_app_number] => 7/947520
[patent_app_country] => US
[patent_app_date] => 1992-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3491
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 195
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/369/05369359.pdf
[firstpage_image] =>[orig_patent_app_number] => 947520
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/947520 | Particle beam testing method with countervoltage or retarding voltage follow-up or feedback | Sep 20, 1992 | Issued |
Array
(
[id] => 3432296
[patent_doc_number] => 05404112
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-04
[patent_title] => 'Test method and device for diodes with exposed junction assembled in parallel'
[patent_app_type] => 1
[patent_app_number] => 7/930394
[patent_app_country] => US
[patent_app_date] => 1992-09-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 1939
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/404/05404112.pdf
[firstpage_image] =>[orig_patent_app_number] => 930394
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/930394 | Test method and device for diodes with exposed junction assembled in parallel | Sep 13, 1992 | Issued |
Array
(
[id] => 3034352
[patent_doc_number] => 05349288
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-09-20
[patent_title] => 'Radial planar current detection device having an extended frequency range of response'
[patent_app_type] => 1
[patent_app_number] => 7/940643
[patent_app_country] => US
[patent_app_date] => 1992-09-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 3127
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/349/05349288.pdf
[firstpage_image] =>[orig_patent_app_number] => 940643
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/940643 | Radial planar current detection device having an extended frequency range of response | Sep 3, 1992 | Issued |
Array
(
[id] => 3458885
[patent_doc_number] => 05378970
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-01-03
[patent_title] => 'IC carrier capable of loading ICs of different sizes thereon'
[patent_app_type] => 1
[patent_app_number] => 7/939722
[patent_app_country] => US
[patent_app_date] => 1992-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 5121
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 312
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/378/05378970.pdf
[firstpage_image] =>[orig_patent_app_number] => 939722
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/939722 | IC carrier capable of loading ICs of different sizes thereon | Sep 1, 1992 | Issued |
Array
(
[id] => 3076207
[patent_doc_number] => 05361026
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-11-01
[patent_title] => 'Load indicating socket tester'
[patent_app_type] => 1
[patent_app_number] => 7/939611
[patent_app_country] => US
[patent_app_date] => 1992-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 4145
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 318
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/361/05361026.pdf
[firstpage_image] =>[orig_patent_app_number] => 939611
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/939611 | Load indicating socket tester | Sep 1, 1992 | Issued |
Array
(
[id] => 3010359
[patent_doc_number] => 05374888
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-12-20
[patent_title] => 'Electrical characteristics measurement method and measurement apparatus therefor'
[patent_app_type] => 1
[patent_app_number] => 7/937790
[patent_app_country] => US
[patent_app_date] => 1992-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 12
[patent_no_of_words] => 3897
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/374/05374888.pdf
[firstpage_image] =>[orig_patent_app_number] => 937790
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/937790 | Electrical characteristics measurement method and measurement apparatus therefor | Sep 1, 1992 | Issued |
| 07/937474 | PULSE DETECTION AND CONDITIONING CIRCUIT | Aug 27, 1992 | Abandoned |
Array
(
[id] => 3000994
[patent_doc_number] => 05363038
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-11-08
[patent_title] => 'Method and apparatus for testing an unpopulated chip carrier using a module test card'
[patent_app_type] => 1
[patent_app_number] => 7/929000
[patent_app_country] => US
[patent_app_date] => 1992-08-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 3423
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 190
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/363/05363038.pdf
[firstpage_image] =>[orig_patent_app_number] => 929000
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/929000 | Method and apparatus for testing an unpopulated chip carrier using a module test card | Aug 11, 1992 | Issued |
| 07/924972 | PROBE APPARATUS | Aug 4, 1992 | Abandoned |
Array
(
[id] => 2889891
[patent_doc_number] => 05268635
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-12-07
[patent_title] => 'Intelligent self-diagnosing and sparing light emitting diodes'
[patent_app_type] => 1
[patent_app_number] => 7/922895
[patent_app_country] => US
[patent_app_date] => 1992-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 2392
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 109
[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/268/05268635.pdf
[firstpage_image] =>[orig_patent_app_number] => 922895
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/922895 | Intelligent self-diagnosing and sparing light emitting diodes | Jul 30, 1992 | Issued |
Array
(
[id] => 3084647
[patent_doc_number] => 05321352
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-06-14
[patent_title] => 'Probe apparatus and method of alignment for the same'
[patent_app_type] => 1
[patent_app_number] => 7/922791
[patent_app_country] => US
[patent_app_date] => 1992-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[pdf_file] => patents/05/321/05321352.pdf
[firstpage_image] =>[orig_patent_app_number] => 922791
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/922791 | Probe apparatus and method of alignment for the same | Jul 30, 1992 | Issued |
| 07/922384 | PROBE APPARATUS | Jul 30, 1992 | Abandoned |
Array
(
[id] => 3486968
[patent_doc_number] => 05406217
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-11
[patent_title] => 'Method of measuring the current-voltage characteristics of a DUT'
[patent_app_type] => 1
[patent_app_number] => 7/919711
[patent_app_country] => US
[patent_app_date] => 1992-07-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => patents/05/406/05406217.pdf
[firstpage_image] =>[orig_patent_app_number] => 919711
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/919711 | Method of measuring the current-voltage characteristics of a DUT | Jul 23, 1992 | Issued |
Array
(
[id] => 3039449
[patent_doc_number] => 05329228
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-07-12
[patent_title] => 'Test chip for semiconductor fault analysis'
[patent_app_type] => 1
[patent_app_number] => 7/910029
[patent_app_country] => US
[patent_app_date] => 1992-07-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 4018
[patent_no_of_claims] => 17
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/329/05329228.pdf
[firstpage_image] =>[orig_patent_app_number] => 910029
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/910029 | Test chip for semiconductor fault analysis | Jul 22, 1992 | Issued |
Array
(
[id] => 3486882
[patent_doc_number] => 05406212
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-11
[patent_title] => 'Burn-in apparatus and method for self-heating semiconductor devices having built-in temperature sensors'
[patent_app_type] => 1
[patent_app_number] => 7/914563
[patent_app_country] => US
[patent_app_date] => 1992-07-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 16
[patent_no_of_words] => 5638
[patent_no_of_claims] => 23
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[patent_words_short_claim] => 266
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/406/05406212.pdf
[firstpage_image] =>[orig_patent_app_number] => 914563
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/914563 | Burn-in apparatus and method for self-heating semiconductor devices having built-in temperature sensors | Jul 16, 1992 | Issued |
| 07/913722 | TESTER FOR SEMICONDUCTOR CHIPS | Jul 15, 1992 | Abandoned |