Search

Barry Bowser

Examiner (ID: 1051)

Most Active Art Unit
2213
Art Unit(s)
2607, 2899, 2213, 2858
Total Applications
268
Issued Applications
248
Pending Applications
4
Abandoned Applications
16

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3017623 [patent_doc_number] => 05332962 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-07-26 [patent_title] => 'Peak voltage detector with ferroelectric element' [patent_app_type] => 1 [patent_app_number] => 7/956102 [patent_app_country] => US [patent_app_date] => 1992-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 21 [patent_no_of_words] => 2892 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/332/05332962.pdf [firstpage_image] =>[orig_patent_app_number] => 956102 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/956102
Peak voltage detector with ferroelectric element Oct 1, 1992 Issued
Array ( [id] => 3617419 [patent_doc_number] => 05565766 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-15 [patent_title] => 'Semiconductor circuit element device with arrangement for testing the device and method of test' [patent_app_type] => 1 [patent_app_number] => 7/952651 [patent_app_country] => US [patent_app_date] => 1992-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 34 [patent_figures_cnt] => 38 [patent_no_of_words] => 6238 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/565/05565766.pdf [firstpage_image] =>[orig_patent_app_number] => 952651 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/952651
Semiconductor circuit element device with arrangement for testing the device and method of test Sep 27, 1992 Issued
Array ( [id] => 3117223 [patent_doc_number] => 05414365 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-09 [patent_title] => 'Diagnostic apparatus for testing an analog circuit' [patent_app_type] => 1 [patent_app_number] => 7/950693 [patent_app_country] => US [patent_app_date] => 1992-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 8409 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/414/05414365.pdf [firstpage_image] =>[orig_patent_app_number] => 950693 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/950693
Diagnostic apparatus for testing an analog circuit Sep 24, 1992 Issued
07/951502 WIRELESS TEST FIXTURE FOR HIGH FREQUENCY TESTING Sep 23, 1992 Abandoned
Array ( [id] => 3099182 [patent_doc_number] => 05369359 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-11-29 [patent_title] => 'Particle beam testing method with countervoltage or retarding voltage follow-up or feedback' [patent_app_type] => 1 [patent_app_number] => 7/947520 [patent_app_country] => US [patent_app_date] => 1992-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3491 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/369/05369359.pdf [firstpage_image] =>[orig_patent_app_number] => 947520 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/947520
Particle beam testing method with countervoltage or retarding voltage follow-up or feedback Sep 20, 1992 Issued
Array ( [id] => 3432296 [patent_doc_number] => 05404112 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-04 [patent_title] => 'Test method and device for diodes with exposed junction assembled in parallel' [patent_app_type] => 1 [patent_app_number] => 7/930394 [patent_app_country] => US [patent_app_date] => 1992-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 1939 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/404/05404112.pdf [firstpage_image] =>[orig_patent_app_number] => 930394 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/930394
Test method and device for diodes with exposed junction assembled in parallel Sep 13, 1992 Issued
Array ( [id] => 3034352 [patent_doc_number] => 05349288 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-09-20 [patent_title] => 'Radial planar current detection device having an extended frequency range of response' [patent_app_type] => 1 [patent_app_number] => 7/940643 [patent_app_country] => US [patent_app_date] => 1992-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3127 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/349/05349288.pdf [firstpage_image] =>[orig_patent_app_number] => 940643 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/940643
Radial planar current detection device having an extended frequency range of response Sep 3, 1992 Issued
Array ( [id] => 3458885 [patent_doc_number] => 05378970 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-03 [patent_title] => 'IC carrier capable of loading ICs of different sizes thereon' [patent_app_type] => 1 [patent_app_number] => 7/939722 [patent_app_country] => US [patent_app_date] => 1992-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 5121 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 312 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/378/05378970.pdf [firstpage_image] =>[orig_patent_app_number] => 939722 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/939722
IC carrier capable of loading ICs of different sizes thereon Sep 1, 1992 Issued
Array ( [id] => 3076207 [patent_doc_number] => 05361026 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-11-01 [patent_title] => 'Load indicating socket tester' [patent_app_type] => 1 [patent_app_number] => 7/939611 [patent_app_country] => US [patent_app_date] => 1992-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4145 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 318 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/361/05361026.pdf [firstpage_image] =>[orig_patent_app_number] => 939611 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/939611
Load indicating socket tester Sep 1, 1992 Issued
Array ( [id] => 3010359 [patent_doc_number] => 05374888 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-12-20 [patent_title] => 'Electrical characteristics measurement method and measurement apparatus therefor' [patent_app_type] => 1 [patent_app_number] => 7/937790 [patent_app_country] => US [patent_app_date] => 1992-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 3897 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 309 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/374/05374888.pdf [firstpage_image] =>[orig_patent_app_number] => 937790 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/937790
Electrical characteristics measurement method and measurement apparatus therefor Sep 1, 1992 Issued
07/937474 PULSE DETECTION AND CONDITIONING CIRCUIT Aug 27, 1992 Abandoned
Array ( [id] => 3000994 [patent_doc_number] => 05363038 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-11-08 [patent_title] => 'Method and apparatus for testing an unpopulated chip carrier using a module test card' [patent_app_type] => 1 [patent_app_number] => 7/929000 [patent_app_country] => US [patent_app_date] => 1992-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 3423 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/363/05363038.pdf [firstpage_image] =>[orig_patent_app_number] => 929000 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/929000
Method and apparatus for testing an unpopulated chip carrier using a module test card Aug 11, 1992 Issued
07/924972 PROBE APPARATUS Aug 4, 1992 Abandoned
Array ( [id] => 2889891 [patent_doc_number] => 05268635 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-12-07 [patent_title] => 'Intelligent self-diagnosing and sparing light emitting diodes' [patent_app_type] => 1 [patent_app_number] => 7/922895 [patent_app_country] => US [patent_app_date] => 1992-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2392 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/268/05268635.pdf [firstpage_image] =>[orig_patent_app_number] => 922895 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/922895
Intelligent self-diagnosing and sparing light emitting diodes Jul 30, 1992 Issued
Array ( [id] => 3084647 [patent_doc_number] => 05321352 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-06-14 [patent_title] => 'Probe apparatus and method of alignment for the same' [patent_app_type] => 1 [patent_app_number] => 7/922791 [patent_app_country] => US [patent_app_date] => 1992-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 4367 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 321 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/321/05321352.pdf [firstpage_image] =>[orig_patent_app_number] => 922791 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/922791
Probe apparatus and method of alignment for the same Jul 30, 1992 Issued
07/922384 PROBE APPARATUS Jul 30, 1992 Abandoned
Array ( [id] => 3486968 [patent_doc_number] => 05406217 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-11 [patent_title] => 'Method of measuring the current-voltage characteristics of a DUT' [patent_app_type] => 1 [patent_app_number] => 7/919711 [patent_app_country] => US [patent_app_date] => 1992-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3259 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 33 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/406/05406217.pdf [firstpage_image] =>[orig_patent_app_number] => 919711 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/919711
Method of measuring the current-voltage characteristics of a DUT Jul 23, 1992 Issued
Array ( [id] => 3039449 [patent_doc_number] => 05329228 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-07-12 [patent_title] => 'Test chip for semiconductor fault analysis' [patent_app_type] => 1 [patent_app_number] => 7/910029 [patent_app_country] => US [patent_app_date] => 1992-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4018 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/329/05329228.pdf [firstpage_image] =>[orig_patent_app_number] => 910029 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/910029
Test chip for semiconductor fault analysis Jul 22, 1992 Issued
Array ( [id] => 3486882 [patent_doc_number] => 05406212 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-11 [patent_title] => 'Burn-in apparatus and method for self-heating semiconductor devices having built-in temperature sensors' [patent_app_type] => 1 [patent_app_number] => 7/914563 [patent_app_country] => US [patent_app_date] => 1992-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 16 [patent_no_of_words] => 5638 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 266 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/406/05406212.pdf [firstpage_image] =>[orig_patent_app_number] => 914563 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/914563
Burn-in apparatus and method for self-heating semiconductor devices having built-in temperature sensors Jul 16, 1992 Issued
07/913722 TESTER FOR SEMICONDUCTOR CHIPS Jul 15, 1992 Abandoned
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