
Barry Bowser
Examiner (ID: 19002)
| Most Active Art Unit | 2213 |
| Art Unit(s) | 2858, 2607, 2213, 2899 |
| Total Applications | 268 |
| Issued Applications | 248 |
| Pending Applications | 4 |
| Abandoned Applications | 16 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3693427
[patent_doc_number] => 05691635
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-11-25
[patent_title] => 'Probe identification system for a measurement instrument'
[patent_app_type] => 1
[patent_app_number] => 8/593760
[patent_app_country] => US
[patent_app_date] => 1996-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 2606
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 121
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/691/05691635.pdf
[firstpage_image] =>[orig_patent_app_number] => 593760
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/593760 | Probe identification system for a measurement instrument | Jan 28, 1996 | Issued |
Array
(
[id] => 3700309
[patent_doc_number] => 05619129
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-08
[patent_title] => 'Multimeter having an erroneous input prevention mechanism'
[patent_app_type] => 1
[patent_app_number] => 8/588377
[patent_app_country] => US
[patent_app_date] => 1996-01-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 20
[patent_no_of_words] => 10884
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/619/05619129.pdf
[firstpage_image] =>[orig_patent_app_number] => 588377
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/588377 | Multimeter having an erroneous input prevention mechanism | Jan 17, 1996 | Issued |
Array
(
[id] => 3695324
[patent_doc_number] => 05604447
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-18
[patent_title] => 'Prescaler IC testing method and test probe card'
[patent_app_type] => 1
[patent_app_number] => 8/580365
[patent_app_country] => US
[patent_app_date] => 1995-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 5091
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 285
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/604/05604447.pdf
[firstpage_image] =>[orig_patent_app_number] => 580365
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/580365 | Prescaler IC testing method and test probe card | Dec 27, 1995 | Issued |
Array
(
[id] => 3654109
[patent_doc_number] => 05640102
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-17
[patent_title] => 'Pin test circuit for semiconductor test system'
[patent_app_type] => 1
[patent_app_number] => 8/577269
[patent_app_country] => US
[patent_app_date] => 1995-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2143
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 126
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/640/05640102.pdf
[firstpage_image] =>[orig_patent_app_number] => 577269
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/577269 | Pin test circuit for semiconductor test system | Dec 21, 1995 | Issued |
Array
(
[id] => 3625844
[patent_doc_number] => 05614838
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-03-25
[patent_title] => 'Reduced power apparatus and method for testing high speed components'
[patent_app_type] => 1
[patent_app_number] => 8/552661
[patent_app_country] => US
[patent_app_date] => 1995-11-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 3035
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/614/05614838.pdf
[firstpage_image] =>[orig_patent_app_number] => 552661
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/552661 | Reduced power apparatus and method for testing high speed components | Nov 2, 1995 | Issued |
Array
(
[id] => 3722742
[patent_doc_number] => 05617035
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-01
[patent_title] => 'Method for testing integrated devices'
[patent_app_type] => 1
[patent_app_number] => 8/552518
[patent_app_country] => US
[patent_app_date] => 1995-11-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 4263
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 106
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/617/05617035.pdf
[firstpage_image] =>[orig_patent_app_number] => 552518
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/552518 | Method for testing integrated devices | Nov 1, 1995 | Issued |
Array
(
[id] => 3666384
[patent_doc_number] => 05656929
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-12
[patent_title] => 'Method and apparatus for measuring RF power in a test set'
[patent_app_type] => 1
[patent_app_number] => 8/548067
[patent_app_country] => US
[patent_app_date] => 1995-10-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 3424
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 226
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/656/05656929.pdf
[firstpage_image] =>[orig_patent_app_number] => 548067
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/548067 | Method and apparatus for measuring RF power in a test set | Oct 24, 1995 | Issued |
Array
(
[id] => 3639245
[patent_doc_number] => 05631555
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-20
[patent_title] => 'Voltage measurement system'
[patent_app_type] => 1
[patent_app_number] => 8/535669
[patent_app_country] => US
[patent_app_date] => 1995-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 21
[patent_no_of_words] => 4473
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/631/05631555.pdf
[firstpage_image] =>[orig_patent_app_number] => 535669
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/535669 | Voltage measurement system | Sep 27, 1995 | Issued |
Array
(
[id] => 3730783
[patent_doc_number] => 05701088
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-12-23
[patent_title] => 'Method of evaluating a MIS-type semiconductor device'
[patent_app_type] => 1
[patent_app_number] => 8/534460
[patent_app_country] => US
[patent_app_date] => 1995-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 3415
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 141
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/701/05701088.pdf
[firstpage_image] =>[orig_patent_app_number] => 534460
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/534460 | Method of evaluating a MIS-type semiconductor device | Sep 26, 1995 | Issued |
Array
(
[id] => 3630145
[patent_doc_number] => 05608338
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-03-04
[patent_title] => 'Evaluating the lifetime and reliability of a TFT in a stress test using gate voltage and temperature measurements'
[patent_app_type] => 1
[patent_app_number] => 8/533659
[patent_app_country] => US
[patent_app_date] => 1995-09-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 17
[patent_no_of_words] => 7919
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 343
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/608/05608338.pdf
[firstpage_image] =>[orig_patent_app_number] => 533659
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/533659 | Evaluating the lifetime and reliability of a TFT in a stress test using gate voltage and temperature measurements | Sep 24, 1995 | Issued |
Array
(
[id] => 3666827
[patent_doc_number] => 05648725
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-07-15
[patent_title] => 'Pulse width modulation simulator for testing insulating materials'
[patent_app_type] => 1
[patent_app_number] => 8/526264
[patent_app_country] => US
[patent_app_date] => 1995-09-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 2501
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/648/05648725.pdf
[firstpage_image] =>[orig_patent_app_number] => 526264
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/526264 | Pulse width modulation simulator for testing insulating materials | Sep 11, 1995 | Issued |
Array
(
[id] => 3627537
[patent_doc_number] => 05594329
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-14
[patent_title] => 'Method and apparatus for obtaining voltage-isolated measurement channels with an isolation transformer and multiplier'
[patent_app_type] => 1
[patent_app_number] => 8/526650
[patent_app_country] => US
[patent_app_date] => 1995-09-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3387
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/594/05594329.pdf
[firstpage_image] =>[orig_patent_app_number] => 526650
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/526650 | Method and apparatus for obtaining voltage-isolated measurement channels with an isolation transformer and multiplier | Sep 10, 1995 | Issued |
Array
(
[id] => 3663145
[patent_doc_number] => 05627462
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-06
[patent_title] => 'Apparatus and method for measuring power demand from conventional watt-hour utility meters'
[patent_app_type] => 1
[patent_app_number] => 8/522549
[patent_app_country] => US
[patent_app_date] => 1995-09-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 3676
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 140
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/627/05627462.pdf
[firstpage_image] =>[orig_patent_app_number] => 522549
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/522549 | Apparatus and method for measuring power demand from conventional watt-hour utility meters | Aug 31, 1995 | Issued |
Array
(
[id] => 3663388
[patent_doc_number] => 05627479
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-06
[patent_title] => 'Method and apparatus for determining characteristic electrical material parameters of semi-conducting materials'
[patent_app_type] => 1
[patent_app_number] => 8/446857
[patent_app_country] => US
[patent_app_date] => 1995-09-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 22
[patent_no_of_words] => 12237
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 324
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/627/05627479.pdf
[firstpage_image] =>[orig_patent_app_number] => 446857
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/446857 | Method and apparatus for determining characteristic electrical material parameters of semi-conducting materials | Aug 31, 1995 | Issued |
Array
(
[id] => 3673284
[patent_doc_number] => 05600257
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-04
[patent_title] => 'Semiconductor wafer test and burn-in'
[patent_app_type] => 1
[patent_app_number] => 8/513057
[patent_app_country] => US
[patent_app_date] => 1995-08-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 12
[patent_no_of_words] => 9843
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 128
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/600/05600257.pdf
[firstpage_image] =>[orig_patent_app_number] => 513057
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/513057 | Semiconductor wafer test and burn-in | Aug 8, 1995 | Issued |
Array
(
[id] => 3639231
[patent_doc_number] => 05631554
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-20
[patent_title] => 'Electronic metering device including automatic service sensing'
[patent_app_type] => 1
[patent_app_number] => 8/509367
[patent_app_country] => US
[patent_app_date] => 1995-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 25
[patent_no_of_words] => 13793
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/631/05631554.pdf
[firstpage_image] =>[orig_patent_app_number] => 509367
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/509367 | Electronic metering device including automatic service sensing | Jul 30, 1995 | Issued |
Array
(
[id] => 3595363
[patent_doc_number] => 05585739
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-17
[patent_title] => 'Doubled ended spring probe ring interface for multiple pin test heads and method therefor'
[patent_app_type] => 1
[patent_app_number] => 8/506154
[patent_app_country] => US
[patent_app_date] => 1995-07-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 4
[patent_no_of_words] => 1566
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/585/05585739.pdf
[firstpage_image] =>[orig_patent_app_number] => 506154
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/506154 | Doubled ended spring probe ring interface for multiple pin test heads and method therefor | Jul 23, 1995 | Issued |
Array
(
[id] => 3512386
[patent_doc_number] => 05570033
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-29
[patent_title] => 'Spring probe BGA (ball grid array) contactor with device stop and method therefor'
[patent_app_type] => 1
[patent_app_number] => 8/504944
[patent_app_country] => US
[patent_app_date] => 1995-07-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 1353
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 192
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/570/05570033.pdf
[firstpage_image] =>[orig_patent_app_number] => 504944
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/504944 | Spring probe BGA (ball grid array) contactor with device stop and method therefor | Jul 19, 1995 | Issued |
Array
(
[id] => 3627042
[patent_doc_number] => 05689193
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-11-18
[patent_title] => 'Probe head, method for manufacturing the same, and inspecting method using the same'
[patent_app_type] => 1
[patent_app_number] => 8/504558
[patent_app_country] => US
[patent_app_date] => 1995-07-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 25
[patent_no_of_words] => 9351
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/689/05689193.pdf
[firstpage_image] =>[orig_patent_app_number] => 504558
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/504558 | Probe head, method for manufacturing the same, and inspecting method using the same | Jul 19, 1995 | Issued |
Array
(
[id] => 3777657
[patent_doc_number] => 05773989
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-06-30
[patent_title] => 'Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer'
[patent_app_type] => 1
[patent_app_number] => 8/502660
[patent_app_country] => US
[patent_app_date] => 1995-07-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 18
[patent_no_of_words] => 5461
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/773/05773989.pdf
[firstpage_image] =>[orig_patent_app_number] => 502660
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/502660 | Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer | Jul 13, 1995 | Issued |