Search

Barry Bowser

Examiner (ID: 19002)

Most Active Art Unit
2213
Art Unit(s)
2858, 2607, 2213, 2899
Total Applications
268
Issued Applications
248
Pending Applications
4
Abandoned Applications
16

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3693427 [patent_doc_number] => 05691635 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-11-25 [patent_title] => 'Probe identification system for a measurement instrument' [patent_app_type] => 1 [patent_app_number] => 8/593760 [patent_app_country] => US [patent_app_date] => 1996-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2606 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/691/05691635.pdf [firstpage_image] =>[orig_patent_app_number] => 593760 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/593760
Probe identification system for a measurement instrument Jan 28, 1996 Issued
Array ( [id] => 3700309 [patent_doc_number] => 05619129 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-04-08 [patent_title] => 'Multimeter having an erroneous input prevention mechanism' [patent_app_type] => 1 [patent_app_number] => 8/588377 [patent_app_country] => US [patent_app_date] => 1996-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 20 [patent_no_of_words] => 10884 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/619/05619129.pdf [firstpage_image] =>[orig_patent_app_number] => 588377 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/588377
Multimeter having an erroneous input prevention mechanism Jan 17, 1996 Issued
Array ( [id] => 3695324 [patent_doc_number] => 05604447 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-02-18 [patent_title] => 'Prescaler IC testing method and test probe card' [patent_app_type] => 1 [patent_app_number] => 8/580365 [patent_app_country] => US [patent_app_date] => 1995-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 5091 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 285 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/604/05604447.pdf [firstpage_image] =>[orig_patent_app_number] => 580365 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/580365
Prescaler IC testing method and test probe card Dec 27, 1995 Issued
Array ( [id] => 3654109 [patent_doc_number] => 05640102 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-06-17 [patent_title] => 'Pin test circuit for semiconductor test system' [patent_app_type] => 1 [patent_app_number] => 8/577269 [patent_app_country] => US [patent_app_date] => 1995-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2143 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/640/05640102.pdf [firstpage_image] =>[orig_patent_app_number] => 577269 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/577269
Pin test circuit for semiconductor test system Dec 21, 1995 Issued
Array ( [id] => 3625844 [patent_doc_number] => 05614838 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-03-25 [patent_title] => 'Reduced power apparatus and method for testing high speed components' [patent_app_type] => 1 [patent_app_number] => 8/552661 [patent_app_country] => US [patent_app_date] => 1995-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3035 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/614/05614838.pdf [firstpage_image] =>[orig_patent_app_number] => 552661 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/552661
Reduced power apparatus and method for testing high speed components Nov 2, 1995 Issued
Array ( [id] => 3722742 [patent_doc_number] => 05617035 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-04-01 [patent_title] => 'Method for testing integrated devices' [patent_app_type] => 1 [patent_app_number] => 8/552518 [patent_app_country] => US [patent_app_date] => 1995-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4263 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/617/05617035.pdf [firstpage_image] =>[orig_patent_app_number] => 552518 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/552518
Method for testing integrated devices Nov 1, 1995 Issued
Array ( [id] => 3666384 [patent_doc_number] => 05656929 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-08-12 [patent_title] => 'Method and apparatus for measuring RF power in a test set' [patent_app_type] => 1 [patent_app_number] => 8/548067 [patent_app_country] => US [patent_app_date] => 1995-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3424 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 226 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/656/05656929.pdf [firstpage_image] =>[orig_patent_app_number] => 548067 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/548067
Method and apparatus for measuring RF power in a test set Oct 24, 1995 Issued
Array ( [id] => 3639245 [patent_doc_number] => 05631555 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-20 [patent_title] => 'Voltage measurement system' [patent_app_type] => 1 [patent_app_number] => 8/535669 [patent_app_country] => US [patent_app_date] => 1995-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 21 [patent_no_of_words] => 4473 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/631/05631555.pdf [firstpage_image] =>[orig_patent_app_number] => 535669 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/535669
Voltage measurement system Sep 27, 1995 Issued
Array ( [id] => 3730783 [patent_doc_number] => 05701088 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-12-23 [patent_title] => 'Method of evaluating a MIS-type semiconductor device' [patent_app_type] => 1 [patent_app_number] => 8/534460 [patent_app_country] => US [patent_app_date] => 1995-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3415 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/701/05701088.pdf [firstpage_image] =>[orig_patent_app_number] => 534460 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/534460
Method of evaluating a MIS-type semiconductor device Sep 26, 1995 Issued
Array ( [id] => 3630145 [patent_doc_number] => 05608338 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-03-04 [patent_title] => 'Evaluating the lifetime and reliability of a TFT in a stress test using gate voltage and temperature measurements' [patent_app_type] => 1 [patent_app_number] => 8/533659 [patent_app_country] => US [patent_app_date] => 1995-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 7919 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 343 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/608/05608338.pdf [firstpage_image] =>[orig_patent_app_number] => 533659 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/533659
Evaluating the lifetime and reliability of a TFT in a stress test using gate voltage and temperature measurements Sep 24, 1995 Issued
Array ( [id] => 3666827 [patent_doc_number] => 05648725 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-07-15 [patent_title] => 'Pulse width modulation simulator for testing insulating materials' [patent_app_type] => 1 [patent_app_number] => 8/526264 [patent_app_country] => US [patent_app_date] => 1995-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2501 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/648/05648725.pdf [firstpage_image] =>[orig_patent_app_number] => 526264 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/526264
Pulse width modulation simulator for testing insulating materials Sep 11, 1995 Issued
Array ( [id] => 3627537 [patent_doc_number] => 05594329 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-01-14 [patent_title] => 'Method and apparatus for obtaining voltage-isolated measurement channels with an isolation transformer and multiplier' [patent_app_type] => 1 [patent_app_number] => 8/526650 [patent_app_country] => US [patent_app_date] => 1995-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3387 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/594/05594329.pdf [firstpage_image] =>[orig_patent_app_number] => 526650 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/526650
Method and apparatus for obtaining voltage-isolated measurement channels with an isolation transformer and multiplier Sep 10, 1995 Issued
Array ( [id] => 3663145 [patent_doc_number] => 05627462 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-06 [patent_title] => 'Apparatus and method for measuring power demand from conventional watt-hour utility meters' [patent_app_type] => 1 [patent_app_number] => 8/522549 [patent_app_country] => US [patent_app_date] => 1995-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3676 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/627/05627462.pdf [firstpage_image] =>[orig_patent_app_number] => 522549 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/522549
Apparatus and method for measuring power demand from conventional watt-hour utility meters Aug 31, 1995 Issued
Array ( [id] => 3663388 [patent_doc_number] => 05627479 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-06 [patent_title] => 'Method and apparatus for determining characteristic electrical material parameters of semi-conducting materials' [patent_app_type] => 1 [patent_app_number] => 8/446857 [patent_app_country] => US [patent_app_date] => 1995-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 22 [patent_no_of_words] => 12237 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 324 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/627/05627479.pdf [firstpage_image] =>[orig_patent_app_number] => 446857 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/446857
Method and apparatus for determining characteristic electrical material parameters of semi-conducting materials Aug 31, 1995 Issued
Array ( [id] => 3673284 [patent_doc_number] => 05600257 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-02-04 [patent_title] => 'Semiconductor wafer test and burn-in' [patent_app_type] => 1 [patent_app_number] => 8/513057 [patent_app_country] => US [patent_app_date] => 1995-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 9843 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/600/05600257.pdf [firstpage_image] =>[orig_patent_app_number] => 513057 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/513057
Semiconductor wafer test and burn-in Aug 8, 1995 Issued
Array ( [id] => 3639231 [patent_doc_number] => 05631554 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-20 [patent_title] => 'Electronic metering device including automatic service sensing' [patent_app_type] => 1 [patent_app_number] => 8/509367 [patent_app_country] => US [patent_app_date] => 1995-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 13793 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/631/05631554.pdf [firstpage_image] =>[orig_patent_app_number] => 509367 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/509367
Electronic metering device including automatic service sensing Jul 30, 1995 Issued
Array ( [id] => 3595363 [patent_doc_number] => 05585739 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-17 [patent_title] => 'Doubled ended spring probe ring interface for multiple pin test heads and method therefor' [patent_app_type] => 1 [patent_app_number] => 8/506154 [patent_app_country] => US [patent_app_date] => 1995-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 1566 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/585/05585739.pdf [firstpage_image] =>[orig_patent_app_number] => 506154 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/506154
Doubled ended spring probe ring interface for multiple pin test heads and method therefor Jul 23, 1995 Issued
Array ( [id] => 3512386 [patent_doc_number] => 05570033 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-29 [patent_title] => 'Spring probe BGA (ball grid array) contactor with device stop and method therefor' [patent_app_type] => 1 [patent_app_number] => 8/504944 [patent_app_country] => US [patent_app_date] => 1995-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 1353 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/570/05570033.pdf [firstpage_image] =>[orig_patent_app_number] => 504944 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/504944
Spring probe BGA (ball grid array) contactor with device stop and method therefor Jul 19, 1995 Issued
Array ( [id] => 3627042 [patent_doc_number] => 05689193 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-11-18 [patent_title] => 'Probe head, method for manufacturing the same, and inspecting method using the same' [patent_app_type] => 1 [patent_app_number] => 8/504558 [patent_app_country] => US [patent_app_date] => 1995-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 25 [patent_no_of_words] => 9351 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/689/05689193.pdf [firstpage_image] =>[orig_patent_app_number] => 504558 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/504558
Probe head, method for manufacturing the same, and inspecting method using the same Jul 19, 1995 Issued
Array ( [id] => 3777657 [patent_doc_number] => 05773989 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-06-30 [patent_title] => 'Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 8/502660 [patent_app_country] => US [patent_app_date] => 1995-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 18 [patent_no_of_words] => 5461 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/773/05773989.pdf [firstpage_image] =>[orig_patent_app_number] => 502660 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/502660
Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer Jul 13, 1995 Issued
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