
Barry Bowser
Examiner (ID: 19002)
| Most Active Art Unit | 2213 |
| Art Unit(s) | 2858, 2607, 2213, 2899 |
| Total Applications | 268 |
| Issued Applications | 248 |
| Pending Applications | 4 |
| Abandoned Applications | 16 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3653023
[patent_doc_number] => 05629616
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-13
[patent_title] => 'Circuit for measuring current in class-d amplifiers'
[patent_app_type] => 1
[patent_app_number] => 8/501957
[patent_app_country] => US
[patent_app_date] => 1995-07-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 2681
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/629/05629616.pdf
[firstpage_image] =>[orig_patent_app_number] => 501957
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/501957 | Circuit for measuring current in class-d amplifiers | Jul 12, 1995 | Issued |
Array
(
[id] => 3530525
[patent_doc_number] => 05528163
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-18
[patent_title] => 'Method of inspecting cells of liquid crystal display'
[patent_app_type] => 1
[patent_app_number] => 8/501554
[patent_app_country] => US
[patent_app_date] => 1995-07-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 2864
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 220
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/528/05528163.pdf
[firstpage_image] =>[orig_patent_app_number] => 501554
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/501554 | Method of inspecting cells of liquid crystal display | Jul 11, 1995 | Issued |
Array
(
[id] => 3597512
[patent_doc_number] => 05521517
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-05-28
[patent_title] => 'Method and apparatus for detecting an IC defect using a charged particle beam'
[patent_app_type] => 1
[patent_app_number] => 8/500059
[patent_app_country] => US
[patent_app_date] => 1995-07-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 5339
[patent_no_of_claims] => 10
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[patent_words_short_claim] => 153
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/521/05521517.pdf
[firstpage_image] =>[orig_patent_app_number] => 500059
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/500059 | Method and apparatus for detecting an IC defect using a charged particle beam | Jul 9, 1995 | Issued |
Array
(
[id] => 3625537
[patent_doc_number] => 05614817
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-03-25
[patent_title] => 'Method and device for determining the real power of a DC electrical drive'
[patent_app_type] => 1
[patent_app_number] => 8/494052
[patent_app_country] => US
[patent_app_date] => 1995-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 2918
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/614/05614817.pdf
[firstpage_image] =>[orig_patent_app_number] => 494052
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/494052 | Method and device for determining the real power of a DC electrical drive | Jun 22, 1995 | Issued |
Array
(
[id] => 3653175
[patent_doc_number] => 05638005
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-10
[patent_title] => 'Predictive waveform acquisition'
[patent_app_type] => 1
[patent_app_number] => 8/488650
[patent_app_country] => US
[patent_app_date] => 1995-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 17
[patent_no_of_words] => 6324
[patent_no_of_claims] => 30
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/638/05638005.pdf
[firstpage_image] =>[orig_patent_app_number] => 488650
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/488650 | Predictive waveform acquisition | Jun 7, 1995 | Issued |
Array
(
[id] => 3630133
[patent_doc_number] => 05608337
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-03-04
[patent_title] => 'Method and apparatus of testing an integrated circuit device'
[patent_app_type] => 1
[patent_app_number] => 8/481744
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 4046
[patent_no_of_claims] => 33
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/608/05608337.pdf
[firstpage_image] =>[orig_patent_app_number] => 481744
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/481744 | Method and apparatus of testing an integrated circuit device | Jun 6, 1995 | Issued |
Array
(
[id] => 3627547
[patent_doc_number] => 05594330
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-14
[patent_title] => 'Movement actuator/sensor systems'
[patent_app_type] => 1
[patent_app_number] => 8/480018
[patent_app_country] => US
[patent_app_date] => 1995-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 14
[patent_no_of_words] => 3963
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/594/05594330.pdf
[firstpage_image] =>[orig_patent_app_number] => 480018
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/480018 | Movement actuator/sensor systems | Jun 6, 1995 | Issued |
Array
(
[id] => 3558816
[patent_doc_number] => 05574386
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-11-12
[patent_title] => 'Apparatus and method for creating detachable solder connections'
[patent_app_type] => 1
[patent_app_number] => 8/462345
[patent_app_country] => US
[patent_app_date] => 1995-06-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 6514
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/574/05574386.pdf
[firstpage_image] =>[orig_patent_app_number] => 462345
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/462345 | Apparatus and method for creating detachable solder connections | Jun 4, 1995 | Issued |
Array
(
[id] => 3522516
[patent_doc_number] => 05506499
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-09
[patent_title] => 'Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad'
[patent_app_type] => 1
[patent_app_number] => 8/460847
[patent_app_country] => US
[patent_app_date] => 1995-06-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 6727
[patent_no_of_claims] => 19
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/506/05506499.pdf
[firstpage_image] =>[orig_patent_app_number] => 460847
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/460847 | Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad | Jun 4, 1995 | Issued |
Array
(
[id] => 3617715
[patent_doc_number] => 05565787
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-15
[patent_title] => 'Testing contactor for small-size semiconductor devices'
[patent_app_type] => 1
[patent_app_number] => 8/462517
[patent_app_country] => US
[patent_app_date] => 1995-06-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 1896
[patent_no_of_claims] => 24
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/565/05565787.pdf
[firstpage_image] =>[orig_patent_app_number] => 462517
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/462517 | Testing contactor for small-size semiconductor devices | Jun 4, 1995 | Issued |
Array
(
[id] => 3530552
[patent_doc_number] => 05504435
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-02
[patent_title] => 'Testing contactor for small-size semiconductor devices'
[patent_app_type] => 1
[patent_app_number] => 8/461022
[patent_app_country] => US
[patent_app_date] => 1995-06-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/504/05504435.pdf
[firstpage_image] =>[orig_patent_app_number] => 461022
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/461022 | Testing contactor for small-size semiconductor devices | Jun 4, 1995 | Issued |
Array
(
[id] => 3497344
[patent_doc_number] => 05537031
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-16
[patent_title] => 'Integrated circuit test jig'
[patent_app_type] => 1
[patent_app_number] => 8/486405
[patent_app_country] => US
[patent_app_date] => 1995-06-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[pdf_file] => patents/05/537/05537031.pdf
[firstpage_image] =>[orig_patent_app_number] => 486405
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/486405 | Integrated circuit test jig | Jun 4, 1995 | Issued |
Array
(
[id] => 3530579
[patent_doc_number] => 05504437
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-02
[patent_title] => 'Apparatus and method for electrical measurement of semiconductor wafers'
[patent_app_type] => 1
[patent_app_number] => 8/460053
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[pdf_file] => patents/05/504/05504437.pdf
[firstpage_image] =>[orig_patent_app_number] => 460053
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/460053 | Apparatus and method for electrical measurement of semiconductor wafers | Jun 1, 1995 | Issued |
Array
(
[id] => 3576622
[patent_doc_number] => 05539306
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-23
[patent_title] => 'Method and apparatus for testing electrical and electronic circuits'
[patent_app_type] => 1
[patent_app_number] => 8/451966
[patent_app_country] => US
[patent_app_date] => 1995-05-26
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/539/05539306.pdf
[firstpage_image] =>[orig_patent_app_number] => 451966
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/451966 | Method and apparatus for testing electrical and electronic circuits | May 25, 1995 | Issued |
Array
(
[id] => 3695268
[patent_doc_number] => 05604443
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-18
[patent_title] => 'Probe test apparatus'
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[pdf_file] => patents/05/604/05604443.pdf
[firstpage_image] =>[orig_patent_app_number] => 448264
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/448264 | Probe test apparatus | May 22, 1995 | Issued |
Array
(
[id] => 3557606
[patent_doc_number] => 05493212
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-02-20
[patent_title] => 'Electricity meter with variable gain sigma-delta converter'
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[patent_app_number] => 8/446965
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[pdf_file] => patents/05/493/05493212.pdf
[firstpage_image] =>[orig_patent_app_number] => 446965
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/446965 | Electricity meter with variable gain sigma-delta converter | May 21, 1995 | Issued |
Array
(
[id] => 3591702
[patent_doc_number] => 05552701
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-09-03
[patent_title] => 'Docking system for an electronic circuit tester'
[patent_app_type] => 1
[patent_app_number] => 8/441563
[patent_app_country] => US
[patent_app_date] => 1995-05-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/552/05552701.pdf
[firstpage_image] =>[orig_patent_app_number] => 441563
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/441563 | Docking system for an electronic circuit tester | May 14, 1995 | Issued |
Array
(
[id] => 3737310
[patent_doc_number] => 05666064
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-09-09
[patent_title] => 'Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device'
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[patent_app_number] => 8/441462
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[pdf_file] => patents/05/666/05666064.pdf
[firstpage_image] =>[orig_patent_app_number] => 441462
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/441462 | Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device | May 14, 1995 | Issued |
Array
(
[id] => 3531690
[patent_doc_number] => 05541504
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[patent_title] => 'Sequential connecting apparatus for automatic testing'
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[pdf_file] => patents/05/541/05541504.pdf
[firstpage_image] =>[orig_patent_app_number] => 431724
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/431724 | Sequential connecting apparatus for automatic testing | Apr 30, 1995 | Issued |
Array
(
[id] => 3522757
[patent_doc_number] => 05506514
[patent_country] => US
[patent_kind] => NA
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[patent_title] => 'Electrical interconnect using particle enhanced joining of metal surfaces'
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[pdf_file] => patents/05/506/05506514.pdf
[firstpage_image] =>[orig_patent_app_number] => 422546
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/422546 | Electrical interconnect using particle enhanced joining of metal surfaces | Apr 11, 1995 | Issued |