Search

Barry Bowser

Examiner (ID: 19002)

Most Active Art Unit
2213
Art Unit(s)
2858, 2607, 2213, 2899
Total Applications
268
Issued Applications
248
Pending Applications
4
Abandoned Applications
16

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3653023 [patent_doc_number] => 05629616 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-13 [patent_title] => 'Circuit for measuring current in class-d amplifiers' [patent_app_type] => 1 [patent_app_number] => 8/501957 [patent_app_country] => US [patent_app_date] => 1995-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2681 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/629/05629616.pdf [firstpage_image] =>[orig_patent_app_number] => 501957 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/501957
Circuit for measuring current in class-d amplifiers Jul 12, 1995 Issued
Array ( [id] => 3530525 [patent_doc_number] => 05528163 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-18 [patent_title] => 'Method of inspecting cells of liquid crystal display' [patent_app_type] => 1 [patent_app_number] => 8/501554 [patent_app_country] => US [patent_app_date] => 1995-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 2864 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 220 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/528/05528163.pdf [firstpage_image] =>[orig_patent_app_number] => 501554 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/501554
Method of inspecting cells of liquid crystal display Jul 11, 1995 Issued
Array ( [id] => 3597512 [patent_doc_number] => 05521517 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-28 [patent_title] => 'Method and apparatus for detecting an IC defect using a charged particle beam' [patent_app_type] => 1 [patent_app_number] => 8/500059 [patent_app_country] => US [patent_app_date] => 1995-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 5339 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/521/05521517.pdf [firstpage_image] =>[orig_patent_app_number] => 500059 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/500059
Method and apparatus for detecting an IC defect using a charged particle beam Jul 9, 1995 Issued
Array ( [id] => 3625537 [patent_doc_number] => 05614817 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-03-25 [patent_title] => 'Method and device for determining the real power of a DC electrical drive' [patent_app_type] => 1 [patent_app_number] => 8/494052 [patent_app_country] => US [patent_app_date] => 1995-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2918 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/614/05614817.pdf [firstpage_image] =>[orig_patent_app_number] => 494052 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/494052
Method and device for determining the real power of a DC electrical drive Jun 22, 1995 Issued
Array ( [id] => 3653175 [patent_doc_number] => 05638005 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-06-10 [patent_title] => 'Predictive waveform acquisition' [patent_app_type] => 1 [patent_app_number] => 8/488650 [patent_app_country] => US [patent_app_date] => 1995-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 17 [patent_no_of_words] => 6324 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/638/05638005.pdf [firstpage_image] =>[orig_patent_app_number] => 488650 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/488650
Predictive waveform acquisition Jun 7, 1995 Issued
Array ( [id] => 3630133 [patent_doc_number] => 05608337 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-03-04 [patent_title] => 'Method and apparatus of testing an integrated circuit device' [patent_app_type] => 1 [patent_app_number] => 8/481744 [patent_app_country] => US [patent_app_date] => 1995-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4046 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/608/05608337.pdf [firstpage_image] =>[orig_patent_app_number] => 481744 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/481744
Method and apparatus of testing an integrated circuit device Jun 6, 1995 Issued
Array ( [id] => 3627547 [patent_doc_number] => 05594330 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-01-14 [patent_title] => 'Movement actuator/sensor systems' [patent_app_type] => 1 [patent_app_number] => 8/480018 [patent_app_country] => US [patent_app_date] => 1995-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 14 [patent_no_of_words] => 3963 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/594/05594330.pdf [firstpage_image] =>[orig_patent_app_number] => 480018 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/480018
Movement actuator/sensor systems Jun 6, 1995 Issued
Array ( [id] => 3558816 [patent_doc_number] => 05574386 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-11-12 [patent_title] => 'Apparatus and method for creating detachable solder connections' [patent_app_type] => 1 [patent_app_number] => 8/462345 [patent_app_country] => US [patent_app_date] => 1995-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 6514 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/574/05574386.pdf [firstpage_image] =>[orig_patent_app_number] => 462345 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/462345
Apparatus and method for creating detachable solder connections Jun 4, 1995 Issued
Array ( [id] => 3522516 [patent_doc_number] => 05506499 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-09 [patent_title] => 'Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad' [patent_app_type] => 1 [patent_app_number] => 8/460847 [patent_app_country] => US [patent_app_date] => 1995-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 17 [patent_no_of_words] => 6727 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/506/05506499.pdf [firstpage_image] =>[orig_patent_app_number] => 460847 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/460847
Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad Jun 4, 1995 Issued
Array ( [id] => 3617715 [patent_doc_number] => 05565787 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-15 [patent_title] => 'Testing contactor for small-size semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 8/462517 [patent_app_country] => US [patent_app_date] => 1995-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1896 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/565/05565787.pdf [firstpage_image] =>[orig_patent_app_number] => 462517 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/462517
Testing contactor for small-size semiconductor devices Jun 4, 1995 Issued
Array ( [id] => 3530552 [patent_doc_number] => 05504435 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-02 [patent_title] => 'Testing contactor for small-size semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 8/461022 [patent_app_country] => US [patent_app_date] => 1995-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1895 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/504/05504435.pdf [firstpage_image] =>[orig_patent_app_number] => 461022 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/461022
Testing contactor for small-size semiconductor devices Jun 4, 1995 Issued
Array ( [id] => 3497344 [patent_doc_number] => 05537031 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-16 [patent_title] => 'Integrated circuit test jig' [patent_app_type] => 1 [patent_app_number] => 8/486405 [patent_app_country] => US [patent_app_date] => 1995-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1616 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/537/05537031.pdf [firstpage_image] =>[orig_patent_app_number] => 486405 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/486405
Integrated circuit test jig Jun 4, 1995 Issued
Array ( [id] => 3530579 [patent_doc_number] => 05504437 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-02 [patent_title] => 'Apparatus and method for electrical measurement of semiconductor wafers' [patent_app_type] => 1 [patent_app_number] => 8/460053 [patent_app_country] => US [patent_app_date] => 1995-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 20 [patent_no_of_words] => 7471 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/504/05504437.pdf [firstpage_image] =>[orig_patent_app_number] => 460053 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/460053
Apparatus and method for electrical measurement of semiconductor wafers Jun 1, 1995 Issued
Array ( [id] => 3576622 [patent_doc_number] => 05539306 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-23 [patent_title] => 'Method and apparatus for testing electrical and electronic circuits' [patent_app_type] => 1 [patent_app_number] => 8/451966 [patent_app_country] => US [patent_app_date] => 1995-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 8141 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/539/05539306.pdf [firstpage_image] =>[orig_patent_app_number] => 451966 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/451966
Method and apparatus for testing electrical and electronic circuits May 25, 1995 Issued
Array ( [id] => 3695268 [patent_doc_number] => 05604443 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-02-18 [patent_title] => 'Probe test apparatus' [patent_app_type] => 1 [patent_app_number] => 8/448264 [patent_app_country] => US [patent_app_date] => 1995-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 25 [patent_no_of_words] => 6102 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/604/05604443.pdf [firstpage_image] =>[orig_patent_app_number] => 448264 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/448264
Probe test apparatus May 22, 1995 Issued
Array ( [id] => 3557606 [patent_doc_number] => 05493212 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-02-20 [patent_title] => 'Electricity meter with variable gain sigma-delta converter' [patent_app_type] => 1 [patent_app_number] => 8/446965 [patent_app_country] => US [patent_app_date] => 1995-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3463 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/493/05493212.pdf [firstpage_image] =>[orig_patent_app_number] => 446965 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/446965
Electricity meter with variable gain sigma-delta converter May 21, 1995 Issued
Array ( [id] => 3591702 [patent_doc_number] => 05552701 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-03 [patent_title] => 'Docking system for an electronic circuit tester' [patent_app_type] => 1 [patent_app_number] => 8/441563 [patent_app_country] => US [patent_app_date] => 1995-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4352 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/552/05552701.pdf [firstpage_image] =>[orig_patent_app_number] => 441563 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/441563
Docking system for an electronic circuit tester May 14, 1995 Issued
Array ( [id] => 3737310 [patent_doc_number] => 05666064 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-09-09 [patent_title] => 'Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device' [patent_app_type] => 1 [patent_app_number] => 8/441462 [patent_app_country] => US [patent_app_date] => 1995-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 32 [patent_figures_cnt] => 45 [patent_no_of_words] => 14506 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/666/05666064.pdf [firstpage_image] =>[orig_patent_app_number] => 441462 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/441462
Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device May 14, 1995 Issued
Array ( [id] => 3531690 [patent_doc_number] => 05541504 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-30 [patent_title] => 'Sequential connecting apparatus for automatic testing' [patent_app_type] => 1 [patent_app_number] => 8/431724 [patent_app_country] => US [patent_app_date] => 1995-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2599 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/541/05541504.pdf [firstpage_image] =>[orig_patent_app_number] => 431724 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/431724
Sequential connecting apparatus for automatic testing Apr 30, 1995 Issued
Array ( [id] => 3522757 [patent_doc_number] => 05506514 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-09 [patent_title] => 'Electrical interconnect using particle enhanced joining of metal surfaces' [patent_app_type] => 1 [patent_app_number] => 8/422546 [patent_app_country] => US [patent_app_date] => 1995-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 7562 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/506/05506514.pdf [firstpage_image] =>[orig_patent_app_number] => 422546 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/422546
Electrical interconnect using particle enhanced joining of metal surfaces Apr 11, 1995 Issued
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