Search

Barry Bowser

Examiner (ID: 19002)

Most Active Art Unit
2213
Art Unit(s)
2858, 2607, 2213, 2899
Total Applications
268
Issued Applications
248
Pending Applications
4
Abandoned Applications
16

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3703313 [patent_doc_number] => 05677632 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-10-14 [patent_title] => 'Automatic calibration for a capacitive pickup circuit' [patent_app_type] => 1 [patent_app_number] => 8/394489 [patent_app_country] => US [patent_app_date] => 1995-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 5008 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/677/05677632.pdf [firstpage_image] =>[orig_patent_app_number] => 394489 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/394489
Automatic calibration for a capacitive pickup circuit Feb 26, 1995 Issued
Array ( [id] => 3549534 [patent_doc_number] => 05554938 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-10 [patent_title] => 'Method of evaluating current-driven conductive material' [patent_app_type] => 1 [patent_app_number] => 8/387920 [patent_app_country] => US [patent_app_date] => 1995-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 5083 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/554/05554938.pdf [firstpage_image] =>[orig_patent_app_number] => 387920 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/387920
Method of evaluating current-driven conductive material Feb 20, 1995 Issued
Array ( [id] => 3627523 [patent_doc_number] => 05594328 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-01-14 [patent_title] => 'Passive probe employing cluster of charge monitors for determining simultaneous charging characteristics of wafer environment inside IC process equipment' [patent_app_type] => 1 [patent_app_number] => 8/389699 [patent_app_country] => US [patent_app_date] => 1995-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2361 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/594/05594328.pdf [firstpage_image] =>[orig_patent_app_number] => 389699 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/389699
Passive probe employing cluster of charge monitors for determining simultaneous charging characteristics of wafer environment inside IC process equipment Feb 13, 1995 Issued
Array ( [id] => 3666549 [patent_doc_number] => 05656941 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-08-12 [patent_title] => 'Tab tape-based bare chip test and burn-in carrier' [patent_app_type] => 1 [patent_app_number] => 8/388641 [patent_app_country] => US [patent_app_date] => 1995-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2579 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/656/05656941.pdf [firstpage_image] =>[orig_patent_app_number] => 388641 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/388641
Tab tape-based bare chip test and burn-in carrier Feb 13, 1995 Issued
Array ( [id] => 3664048 [patent_doc_number] => 05592077 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-01-07 [patent_title] => 'Circuits, systems and methods for testing ASIC and RAM memory devices' [patent_app_type] => 1 [patent_app_number] => 8/387218 [patent_app_country] => US [patent_app_date] => 1995-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3678 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/592/05592077.pdf [firstpage_image] =>[orig_patent_app_number] => 387218 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/387218
Circuits, systems and methods for testing ASIC and RAM memory devices Feb 12, 1995 Issued
Array ( [id] => 3593342 [patent_doc_number] => 05550481 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-08-27 [patent_title] => 'Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making' [patent_app_type] => 1 [patent_app_number] => 8/385639 [patent_app_country] => US [patent_app_date] => 1995-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 3908 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/550/05550481.pdf [firstpage_image] =>[orig_patent_app_number] => 385639 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/385639
Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making Feb 7, 1995 Issued
Array ( [id] => 3586747 [patent_doc_number] => 05498970 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-12 [patent_title] => 'Top load socket for ball grid array devices' [patent_app_type] => 1 [patent_app_number] => 8/384663 [patent_app_country] => US [patent_app_date] => 1995-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1924 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/498/05498970.pdf [firstpage_image] =>[orig_patent_app_number] => 384663 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/384663
Top load socket for ball grid array devices Feb 5, 1995 Issued
Array ( [id] => 3535588 [patent_doc_number] => 05583447 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-10 [patent_title] => 'Voltage probe with reverse impedance matching' [patent_app_type] => 1 [patent_app_number] => 8/383803 [patent_app_country] => US [patent_app_date] => 1995-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5570 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/583/05583447.pdf [firstpage_image] =>[orig_patent_app_number] => 383803 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/383803
Voltage probe with reverse impedance matching Feb 2, 1995 Issued
Array ( [id] => 3558773 [patent_doc_number] => 05574383 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-11-12 [patent_title] => 'IC tester and measuring method' [patent_app_type] => 1 [patent_app_number] => 8/382808 [patent_app_country] => US [patent_app_date] => 1995-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 27 [patent_no_of_words] => 5899 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/574/05574383.pdf [firstpage_image] =>[orig_patent_app_number] => 382808 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/382808
IC tester and measuring method Feb 1, 1995 Issued
Array ( [id] => 3499815 [patent_doc_number] => 05508628 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-16 [patent_title] => 'Automated closure test socket' [patent_app_type] => 1 [patent_app_number] => 8/382488 [patent_app_country] => US [patent_app_date] => 1995-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 2581 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/508/05508628.pdf [firstpage_image] =>[orig_patent_app_number] => 382488 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/382488
Automated closure test socket Jan 31, 1995 Issued
Array ( [id] => 3512413 [patent_doc_number] => 05570035 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-29 [patent_title] => 'Built-in self test indicator for an integrated circuit package' [patent_app_type] => 1 [patent_app_number] => 8/426261 [patent_app_country] => US [patent_app_date] => 1995-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 1457 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/570/05570035.pdf [firstpage_image] =>[orig_patent_app_number] => 426261 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/426261
Built-in self test indicator for an integrated circuit package Jan 30, 1995 Issued
Array ( [id] => 3593587 [patent_doc_number] => 05517109 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-14 [patent_title] => 'Apparatus within an integrated circuit for automatically detecting a test mode of operation of the integrated circuit and selecting a test clock signal' [patent_app_type] => 1 [patent_app_number] => 8/378765 [patent_app_country] => US [patent_app_date] => 1995-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2702 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/517/05517109.pdf [firstpage_image] =>[orig_patent_app_number] => 378765 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/378765
Apparatus within an integrated circuit for automatically detecting a test mode of operation of the integrated circuit and selecting a test clock signal Jan 25, 1995 Issued
Array ( [id] => 3666506 [patent_doc_number] => 05656938 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-08-12 [patent_title] => 'Temperature compensation in mass flow sensors employing the hot-wire anemometer principle' [patent_app_type] => 1 [patent_app_number] => 8/378259 [patent_app_country] => US [patent_app_date] => 1995-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1862 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/656/05656938.pdf [firstpage_image] =>[orig_patent_app_number] => 378259 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/378259
Temperature compensation in mass flow sensors employing the hot-wire anemometer principle Jan 25, 1995 Issued
Array ( [id] => 3594359 [patent_doc_number] => 05497103 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-05 [patent_title] => 'Test apparatus for circuitized substrate' [patent_app_type] => 1 [patent_app_number] => 8/378348 [patent_app_country] => US [patent_app_date] => 1995-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3898 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/497/05497103.pdf [firstpage_image] =>[orig_patent_app_number] => 378348 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/378348
Test apparatus for circuitized substrate Jan 24, 1995 Issued
Array ( [id] => 3530150 [patent_doc_number] => 05528137 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-18 [patent_title] => 'Network sensitive pulse generator' [patent_app_type] => 1 [patent_app_number] => 8/377547 [patent_app_country] => US [patent_app_date] => 1995-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 4949 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/528/05528137.pdf [firstpage_image] =>[orig_patent_app_number] => 377547 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/377547
Network sensitive pulse generator Jan 23, 1995 Issued
Array ( [id] => 3607931 [patent_doc_number] => 05578936 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-11-26 [patent_title] => 'Method and apparatus for automatically testing semiconductor diodes' [patent_app_type] => 1 [patent_app_number] => 8/376602 [patent_app_country] => US [patent_app_date] => 1995-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4498 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/578/05578936.pdf [firstpage_image] =>[orig_patent_app_number] => 376602 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/376602
Method and apparatus for automatically testing semiconductor diodes Jan 22, 1995 Issued
Array ( [id] => 3525538 [patent_doc_number] => 05530373 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-25 [patent_title] => 'Method and apparatus for determining and selectively displaying valid measurement information' [patent_app_type] => 1 [patent_app_number] => 8/376942 [patent_app_country] => US [patent_app_date] => 1995-01-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7738 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/530/05530373.pdf [firstpage_image] =>[orig_patent_app_number] => 376942 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/376942
Method and apparatus for determining and selectively displaying valid measurement information Jan 19, 1995 Issued
Array ( [id] => 3628889 [patent_doc_number] => 05602484 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-02-11 [patent_title] => 'Delay-spread sensor and detection switching circuit using the same' [patent_app_type] => 1 [patent_app_number] => 8/373219 [patent_app_country] => US [patent_app_date] => 1995-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 6703 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/602/05602484.pdf [firstpage_image] =>[orig_patent_app_number] => 373219 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/373219
Delay-spread sensor and detection switching circuit using the same Jan 17, 1995 Issued
Array ( [id] => 3522741 [patent_doc_number] => 05506513 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-09 [patent_title] => 'Microwave circuit test fixture' [patent_app_type] => 1 [patent_app_number] => 8/372293 [patent_app_country] => US [patent_app_date] => 1995-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 6509 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/506/05506513.pdf [firstpage_image] =>[orig_patent_app_number] => 372293 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/372293
Microwave circuit test fixture Jan 12, 1995 Issued
08/372619 TEST FOR DETERMINING POLARITY OF ELECTROLYTIC CAPACITORS WITHIN ELECTRONIC ASSEMBLIES Jan 10, 1995 Abandoned
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