
Barry Bowser
Examiner (ID: 19002)
| Most Active Art Unit | 2213 |
| Art Unit(s) | 2858, 2607, 2213, 2899 |
| Total Applications | 268 |
| Issued Applications | 248 |
| Pending Applications | 4 |
| Abandoned Applications | 16 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3703313
[patent_doc_number] => 05677632
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-10-14
[patent_title] => 'Automatic calibration for a capacitive pickup circuit'
[patent_app_type] => 1
[patent_app_number] => 8/394489
[patent_app_country] => US
[patent_app_date] => 1995-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 5008
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 121
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/677/05677632.pdf
[firstpage_image] =>[orig_patent_app_number] => 394489
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/394489 | Automatic calibration for a capacitive pickup circuit | Feb 26, 1995 | Issued |
Array
(
[id] => 3549534
[patent_doc_number] => 05554938
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-09-10
[patent_title] => 'Method of evaluating current-driven conductive material'
[patent_app_type] => 1
[patent_app_number] => 8/387920
[patent_app_country] => US
[patent_app_date] => 1995-02-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 5083
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 170
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/554/05554938.pdf
[firstpage_image] =>[orig_patent_app_number] => 387920
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/387920 | Method of evaluating current-driven conductive material | Feb 20, 1995 | Issued |
Array
(
[id] => 3627523
[patent_doc_number] => 05594328
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-14
[patent_title] => 'Passive probe employing cluster of charge monitors for determining simultaneous charging characteristics of wafer environment inside IC process equipment'
[patent_app_type] => 1
[patent_app_number] => 8/389699
[patent_app_country] => US
[patent_app_date] => 1995-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 2361
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/594/05594328.pdf
[firstpage_image] =>[orig_patent_app_number] => 389699
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/389699 | Passive probe employing cluster of charge monitors for determining simultaneous charging characteristics of wafer environment inside IC process equipment | Feb 13, 1995 | Issued |
Array
(
[id] => 3666549
[patent_doc_number] => 05656941
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-12
[patent_title] => 'Tab tape-based bare chip test and burn-in carrier'
[patent_app_type] => 1
[patent_app_number] => 8/388641
[patent_app_country] => US
[patent_app_date] => 1995-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 2579
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 65
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/656/05656941.pdf
[firstpage_image] =>[orig_patent_app_number] => 388641
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/388641 | Tab tape-based bare chip test and burn-in carrier | Feb 13, 1995 | Issued |
Array
(
[id] => 3664048
[patent_doc_number] => 05592077
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-07
[patent_title] => 'Circuits, systems and methods for testing ASIC and RAM memory devices'
[patent_app_type] => 1
[patent_app_number] => 8/387218
[patent_app_country] => US
[patent_app_date] => 1995-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 3678
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/592/05592077.pdf
[firstpage_image] =>[orig_patent_app_number] => 387218
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/387218 | Circuits, systems and methods for testing ASIC and RAM memory devices | Feb 12, 1995 | Issued |
Array
(
[id] => 3593342
[patent_doc_number] => 05550481
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-08-27
[patent_title] => 'Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making'
[patent_app_type] => 1
[patent_app_number] => 8/385639
[patent_app_country] => US
[patent_app_date] => 1995-02-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 9
[patent_no_of_words] => 3908
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 202
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/550/05550481.pdf
[firstpage_image] =>[orig_patent_app_number] => 385639
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/385639 | Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making | Feb 7, 1995 | Issued |
Array
(
[id] => 3586747
[patent_doc_number] => 05498970
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-12
[patent_title] => 'Top load socket for ball grid array devices'
[patent_app_type] => 1
[patent_app_number] => 8/384663
[patent_app_country] => US
[patent_app_date] => 1995-02-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1924
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/498/05498970.pdf
[firstpage_image] =>[orig_patent_app_number] => 384663
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/384663 | Top load socket for ball grid array devices | Feb 5, 1995 | Issued |
Array
(
[id] => 3535588
[patent_doc_number] => 05583447
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-10
[patent_title] => 'Voltage probe with reverse impedance matching'
[patent_app_type] => 1
[patent_app_number] => 8/383803
[patent_app_country] => US
[patent_app_date] => 1995-02-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5570
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/583/05583447.pdf
[firstpage_image] =>[orig_patent_app_number] => 383803
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/383803 | Voltage probe with reverse impedance matching | Feb 2, 1995 | Issued |
Array
(
[id] => 3558773
[patent_doc_number] => 05574383
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-11-12
[patent_title] => 'IC tester and measuring method'
[patent_app_type] => 1
[patent_app_number] => 8/382808
[patent_app_country] => US
[patent_app_date] => 1995-02-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 27
[patent_no_of_words] => 5899
[patent_no_of_claims] => 5
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[patent_words_short_claim] => 166
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/574/05574383.pdf
[firstpage_image] =>[orig_patent_app_number] => 382808
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/382808 | IC tester and measuring method | Feb 1, 1995 | Issued |
Array
(
[id] => 3499815
[patent_doc_number] => 05508628
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-16
[patent_title] => 'Automated closure test socket'
[patent_app_type] => 1
[patent_app_number] => 8/382488
[patent_app_country] => US
[patent_app_date] => 1995-02-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 11
[patent_no_of_words] => 2581
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 197
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/508/05508628.pdf
[firstpage_image] =>[orig_patent_app_number] => 382488
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/382488 | Automated closure test socket | Jan 31, 1995 | Issued |
Array
(
[id] => 3512413
[patent_doc_number] => 05570035
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-29
[patent_title] => 'Built-in self test indicator for an integrated circuit package'
[patent_app_type] => 1
[patent_app_number] => 8/426261
[patent_app_country] => US
[patent_app_date] => 1995-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[patent_no_of_words] => 1457
[patent_no_of_claims] => 12
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/570/05570035.pdf
[firstpage_image] =>[orig_patent_app_number] => 426261
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/426261 | Built-in self test indicator for an integrated circuit package | Jan 30, 1995 | Issued |
Array
(
[id] => 3593587
[patent_doc_number] => 05517109
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-05-14
[patent_title] => 'Apparatus within an integrated circuit for automatically detecting a test mode of operation of the integrated circuit and selecting a test clock signal'
[patent_app_type] => 1
[patent_app_number] => 8/378765
[patent_app_country] => US
[patent_app_date] => 1995-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 2702
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/517/05517109.pdf
[firstpage_image] =>[orig_patent_app_number] => 378765
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/378765 | Apparatus within an integrated circuit for automatically detecting a test mode of operation of the integrated circuit and selecting a test clock signal | Jan 25, 1995 | Issued |
Array
(
[id] => 3666506
[patent_doc_number] => 05656938
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-12
[patent_title] => 'Temperature compensation in mass flow sensors employing the hot-wire anemometer principle'
[patent_app_type] => 1
[patent_app_number] => 8/378259
[patent_app_country] => US
[patent_app_date] => 1995-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[patent_no_of_words] => 1862
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/656/05656938.pdf
[firstpage_image] =>[orig_patent_app_number] => 378259
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/378259 | Temperature compensation in mass flow sensors employing the hot-wire anemometer principle | Jan 25, 1995 | Issued |
Array
(
[id] => 3594359
[patent_doc_number] => 05497103
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-05
[patent_title] => 'Test apparatus for circuitized substrate'
[patent_app_type] => 1
[patent_app_number] => 8/378348
[patent_app_country] => US
[patent_app_date] => 1995-01-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/497/05497103.pdf
[firstpage_image] =>[orig_patent_app_number] => 378348
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/378348 | Test apparatus for circuitized substrate | Jan 24, 1995 | Issued |
Array
(
[id] => 3530150
[patent_doc_number] => 05528137
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-18
[patent_title] => 'Network sensitive pulse generator'
[patent_app_type] => 1
[patent_app_number] => 8/377547
[patent_app_country] => US
[patent_app_date] => 1995-01-24
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[pdf_file] => patents/05/528/05528137.pdf
[firstpage_image] =>[orig_patent_app_number] => 377547
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/377547 | Network sensitive pulse generator | Jan 23, 1995 | Issued |
Array
(
[id] => 3607931
[patent_doc_number] => 05578936
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-11-26
[patent_title] => 'Method and apparatus for automatically testing semiconductor diodes'
[patent_app_type] => 1
[patent_app_number] => 8/376602
[patent_app_country] => US
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/578/05578936.pdf
[firstpage_image] =>[orig_patent_app_number] => 376602
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/376602 | Method and apparatus for automatically testing semiconductor diodes | Jan 22, 1995 | Issued |
Array
(
[id] => 3525538
[patent_doc_number] => 05530373
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-25
[patent_title] => 'Method and apparatus for determining and selectively displaying valid measurement information'
[patent_app_type] => 1
[patent_app_number] => 8/376942
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[patent_app_date] => 1995-01-20
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[pdf_file] => patents/05/530/05530373.pdf
[firstpage_image] =>[orig_patent_app_number] => 376942
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/376942 | Method and apparatus for determining and selectively displaying valid measurement information | Jan 19, 1995 | Issued |
Array
(
[id] => 3628889
[patent_doc_number] => 05602484
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-11
[patent_title] => 'Delay-spread sensor and detection switching circuit using the same'
[patent_app_type] => 1
[patent_app_number] => 8/373219
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[pdf_file] => patents/05/602/05602484.pdf
[firstpage_image] =>[orig_patent_app_number] => 373219
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/373219 | Delay-spread sensor and detection switching circuit using the same | Jan 17, 1995 | Issued |
Array
(
[id] => 3522741
[patent_doc_number] => 05506513
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-09
[patent_title] => 'Microwave circuit test fixture'
[patent_app_type] => 1
[patent_app_number] => 8/372293
[patent_app_country] => US
[patent_app_date] => 1995-01-13
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/506/05506513.pdf
[firstpage_image] =>[orig_patent_app_number] => 372293
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/372293 | Microwave circuit test fixture | Jan 12, 1995 | Issued |
| 08/372619 | TEST FOR DETERMINING POLARITY OF ELECTROLYTIC CAPACITORS WITHIN ELECTRONIC ASSEMBLIES | Jan 10, 1995 | Abandoned |