
Barry Bowser
Examiner (ID: 19002)
| Most Active Art Unit | 2213 |
| Art Unit(s) | 2858, 2607, 2213, 2899 |
| Total Applications | 268 |
| Issued Applications | 248 |
| Pending Applications | 4 |
| Abandoned Applications | 16 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3734285
[patent_doc_number] => 05703492
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-12-30
[patent_title] => 'System and method for fault analysis of semiconductor integrated circuit'
[patent_app_type] => 1
[patent_app_number] => 8/370888
[patent_app_country] => US
[patent_app_date] => 1995-01-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 5162
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 161
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/703/05703492.pdf
[firstpage_image] =>[orig_patent_app_number] => 370888
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/370888 | System and method for fault analysis of semiconductor integrated circuit | Jan 9, 1995 | Issued |
Array
(
[id] => 3687922
[patent_doc_number] => 05633596
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-27
[patent_title] => 'Fixtureless automatic test equipment and a method for registration for use therewith'
[patent_app_type] => 1
[patent_app_number] => 8/370067
[patent_app_country] => US
[patent_app_date] => 1995-01-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 4106
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 65
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/633/05633596.pdf
[firstpage_image] =>[orig_patent_app_number] => 370067
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/370067 | Fixtureless automatic test equipment and a method for registration for use therewith | Jan 8, 1995 | Issued |
Array
(
[id] => 3593835
[patent_doc_number] => 05517127
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-05-14
[patent_title] => 'Additive structure and method for testing semiconductor wire bond dies'
[patent_app_type] => 1
[patent_app_number] => 8/370278
[patent_app_country] => US
[patent_app_date] => 1995-01-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 3238
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 197
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/517/05517127.pdf
[firstpage_image] =>[orig_patent_app_number] => 370278
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/370278 | Additive structure and method for testing semiconductor wire bond dies | Jan 8, 1995 | Issued |
Array
(
[id] => 3653037
[patent_doc_number] => 05629617
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-13
[patent_title] => 'Multiplexing electronic test probe'
[patent_app_type] => 1
[patent_app_number] => 8/369607
[patent_app_country] => US
[patent_app_date] => 1995-01-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 14549
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 16
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/629/05629617.pdf
[firstpage_image] =>[orig_patent_app_number] => 369607
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/369607 | Multiplexing electronic test probe | Jan 5, 1995 | Issued |
Array
(
[id] => 3492432
[patent_doc_number] => 05475303
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-12
[patent_title] => 'Electronic watthour meter'
[patent_app_type] => 1
[patent_app_number] => 8/369398
[patent_app_country] => US
[patent_app_date] => 1995-01-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 2833
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/475/05475303.pdf
[firstpage_image] =>[orig_patent_app_number] => 369398
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/369398 | Electronic watthour meter | Jan 5, 1995 | Issued |
Array
(
[id] => 3516318
[patent_doc_number] => 05563523
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-08
[patent_title] => 'Circuit configuration for preparing analog signals for a boundary scan test process'
[patent_app_type] => 1
[patent_app_number] => 8/369181
[patent_app_country] => US
[patent_app_date] => 1995-01-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 699
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/563/05563523.pdf
[firstpage_image] =>[orig_patent_app_number] => 369181
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/369181 | Circuit configuration for preparing analog signals for a boundary scan test process | Jan 4, 1995 | Issued |
Array
(
[id] => 3613371
[patent_doc_number] => 05589765
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-31
[patent_title] => 'Method for final testing of semiconductor devices'
[patent_app_type] => 1
[patent_app_number] => 8/368683
[patent_app_country] => US
[patent_app_date] => 1995-01-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 5313
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 325
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/589/05589765.pdf
[firstpage_image] =>[orig_patent_app_number] => 368683
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/368683 | Method for final testing of semiconductor devices | Jan 3, 1995 | Issued |
Array
(
[id] => 3587330
[patent_doc_number] => 05581193
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-03
[patent_title] => 'Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra'
[patent_app_type] => 1
[patent_app_number] => 8/368228
[patent_app_country] => US
[patent_app_date] => 1994-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 16
[patent_no_of_words] => 9458
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 121
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/581/05581193.pdf
[firstpage_image] =>[orig_patent_app_number] => 368228
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/368228 | Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra | Dec 29, 1994 | Issued |
Array
(
[id] => 3700480
[patent_doc_number] => 05619141
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-08
[patent_title] => 'Thermopower mapping of superconducting cuprates'
[patent_app_type] => 1
[patent_app_number] => 8/313260
[patent_app_country] => US
[patent_app_date] => 1994-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 3896
[patent_no_of_claims] => 7
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[patent_words_short_claim] => 23
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/619/05619141.pdf
[firstpage_image] =>[orig_patent_app_number] => 313260
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/313260 | Thermopower mapping of superconducting cuprates | Dec 29, 1994 | Issued |
Array
(
[id] => 3521023
[patent_doc_number] => 05486755
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-23
[patent_title] => 'Electronic meter having anti-tampering magnetic shield'
[patent_app_type] => 1
[patent_app_number] => 8/364109
[patent_app_country] => US
[patent_app_date] => 1994-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 2423
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 145
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/486/05486755.pdf
[firstpage_image] =>[orig_patent_app_number] => 364109
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/364109 | Electronic meter having anti-tampering magnetic shield | Dec 26, 1994 | Issued |
Array
(
[id] => 3415182
[patent_doc_number] => 05461325
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-24
[patent_title] => 'Probe clamp assembly'
[patent_app_type] => 1
[patent_app_number] => 8/363388
[patent_app_country] => US
[patent_app_date] => 1994-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 13
[patent_no_of_words] => 2865
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/461/05461325.pdf
[firstpage_image] =>[orig_patent_app_number] => 363388
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/363388 | Probe clamp assembly | Dec 22, 1994 | Issued |
Array
(
[id] => 3521251
[patent_doc_number] => 05486771
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-23
[patent_title] => 'Burn-in socket testing apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/363559
[patent_app_country] => US
[patent_app_date] => 1994-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 2008
[patent_no_of_claims] => 21
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/486/05486771.pdf
[firstpage_image] =>[orig_patent_app_number] => 363559
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/363559 | Burn-in socket testing apparatus | Dec 22, 1994 | Issued |
Array
(
[id] => 3586787
[patent_doc_number] => 05498973
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-12
[patent_title] => 'Apparatus for testing semiconductor laser devices'
[patent_app_type] => 1
[patent_app_number] => 8/362682
[patent_app_country] => US
[patent_app_date] => 1994-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 10198
[patent_no_of_claims] => 29
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/498/05498973.pdf
[firstpage_image] =>[orig_patent_app_number] => 362682
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/362682 | Apparatus for testing semiconductor laser devices | Dec 21, 1994 | Issued |
Array
(
[id] => 3695295
[patent_doc_number] => 05604445
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-18
[patent_title] => 'Apparatus, and corresponding method, for stress testing semiconductor chips'
[patent_app_type] => 1
[patent_app_number] => 8/360919
[patent_app_country] => US
[patent_app_date] => 1994-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 3637
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/604/05604445.pdf
[firstpage_image] =>[orig_patent_app_number] => 360919
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/360919 | Apparatus, and corresponding method, for stress testing semiconductor chips | Dec 20, 1994 | Issued |
Array
(
[id] => 3554405
[patent_doc_number] => 05548208
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-08-20
[patent_title] => 'Terminal for connecting live conductors'
[patent_app_type] => 1
[patent_app_number] => 8/360656
[patent_app_country] => US
[patent_app_date] => 1994-12-19
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/548/05548208.pdf
[firstpage_image] =>[orig_patent_app_number] => 360656
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/360656 | Terminal for connecting live conductors | Dec 18, 1994 | Issued |
Array
(
[id] => 3736535
[patent_doc_number] => 05635850
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-03
[patent_title] => 'Intelligent test line system'
[patent_app_type] => 1
[patent_app_number] => 8/355538
[patent_app_country] => US
[patent_app_date] => 1994-12-14
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/635/05635850.pdf
[firstpage_image] =>[orig_patent_app_number] => 355538
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/355538 | Intelligent test line system | Dec 13, 1994 | Issued |
Array
(
[id] => 3597499
[patent_doc_number] => 05521516
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-05-28
[patent_title] => 'Semiconductor integrated circuit fault analyzing apparatus and method therefor'
[patent_app_type] => 1
[patent_app_number] => 8/354088
[patent_app_country] => US
[patent_app_date] => 1994-12-06
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/521/05521516.pdf
[firstpage_image] =>[orig_patent_app_number] => 354088
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/354088 | Semiconductor integrated circuit fault analyzing apparatus and method therefor | Dec 5, 1994 | Issued |
Array
(
[id] => 3628979
[patent_doc_number] => 05602489
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-11
[patent_title] => 'Switch potential electron beam substrate tester'
[patent_app_type] => 1
[patent_app_number] => 8/349508
[patent_app_country] => US
[patent_app_date] => 1994-12-02
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[pdf_file] => patents/05/602/05602489.pdf
[firstpage_image] =>[orig_patent_app_number] => 349508
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/349508 | Switch potential electron beam substrate tester | Dec 1, 1994 | Issued |
Array
(
[id] => 3538927
[patent_doc_number] => 05557198
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-09-17
[patent_title] => 'Onboard digital locomotive multimeter'
[patent_app_type] => 1
[patent_app_number] => 8/337859
[patent_app_country] => US
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[pdf_file] => patents/05/557/05557198.pdf
[firstpage_image] =>[orig_patent_app_number] => 337859
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/337859 | Onboard digital locomotive multimeter | Nov 13, 1994 | Issued |
Array
(
[id] => 3586571
[patent_doc_number] => 05498957
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-12
[patent_title] => 'Appliance and method for the coulometric measurement of the thickness of metallic coatings'
[patent_app_type] => 1
[patent_app_number] => 8/333953
[patent_app_country] => US
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/498/05498957.pdf
[firstpage_image] =>[orig_patent_app_number] => 333953
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/333953 | Appliance and method for the coulometric measurement of the thickness of metallic coatings | Nov 2, 1994 | Issued |