Search

Barry Bowser

Examiner (ID: 19002)

Most Active Art Unit
2213
Art Unit(s)
2858, 2607, 2213, 2899
Total Applications
268
Issued Applications
248
Pending Applications
4
Abandoned Applications
16

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3734285 [patent_doc_number] => 05703492 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-12-30 [patent_title] => 'System and method for fault analysis of semiconductor integrated circuit' [patent_app_type] => 1 [patent_app_number] => 8/370888 [patent_app_country] => US [patent_app_date] => 1995-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 5162 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/703/05703492.pdf [firstpage_image] =>[orig_patent_app_number] => 370888 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/370888
System and method for fault analysis of semiconductor integrated circuit Jan 9, 1995 Issued
Array ( [id] => 3687922 [patent_doc_number] => 05633596 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-27 [patent_title] => 'Fixtureless automatic test equipment and a method for registration for use therewith' [patent_app_type] => 1 [patent_app_number] => 8/370067 [patent_app_country] => US [patent_app_date] => 1995-01-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 4106 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/633/05633596.pdf [firstpage_image] =>[orig_patent_app_number] => 370067 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/370067
Fixtureless automatic test equipment and a method for registration for use therewith Jan 8, 1995 Issued
Array ( [id] => 3593835 [patent_doc_number] => 05517127 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-14 [patent_title] => 'Additive structure and method for testing semiconductor wire bond dies' [patent_app_type] => 1 [patent_app_number] => 8/370278 [patent_app_country] => US [patent_app_date] => 1995-01-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3238 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/517/05517127.pdf [firstpage_image] =>[orig_patent_app_number] => 370278 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/370278
Additive structure and method for testing semiconductor wire bond dies Jan 8, 1995 Issued
Array ( [id] => 3653037 [patent_doc_number] => 05629617 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-13 [patent_title] => 'Multiplexing electronic test probe' [patent_app_type] => 1 [patent_app_number] => 8/369607 [patent_app_country] => US [patent_app_date] => 1995-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 14549 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/629/05629617.pdf [firstpage_image] =>[orig_patent_app_number] => 369607 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/369607
Multiplexing electronic test probe Jan 5, 1995 Issued
Array ( [id] => 3492432 [patent_doc_number] => 05475303 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-12 [patent_title] => 'Electronic watthour meter' [patent_app_type] => 1 [patent_app_number] => 8/369398 [patent_app_country] => US [patent_app_date] => 1995-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2833 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/475/05475303.pdf [firstpage_image] =>[orig_patent_app_number] => 369398 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/369398
Electronic watthour meter Jan 5, 1995 Issued
Array ( [id] => 3516318 [patent_doc_number] => 05563523 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-08 [patent_title] => 'Circuit configuration for preparing analog signals for a boundary scan test process' [patent_app_type] => 1 [patent_app_number] => 8/369181 [patent_app_country] => US [patent_app_date] => 1995-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 699 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/563/05563523.pdf [firstpage_image] =>[orig_patent_app_number] => 369181 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/369181
Circuit configuration for preparing analog signals for a boundary scan test process Jan 4, 1995 Issued
Array ( [id] => 3613371 [patent_doc_number] => 05589765 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-31 [patent_title] => 'Method for final testing of semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 8/368683 [patent_app_country] => US [patent_app_date] => 1995-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 5313 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 325 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/589/05589765.pdf [firstpage_image] =>[orig_patent_app_number] => 368683 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/368683
Method for final testing of semiconductor devices Jan 3, 1995 Issued
Array ( [id] => 3587330 [patent_doc_number] => 05581193 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-03 [patent_title] => 'Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra' [patent_app_type] => 1 [patent_app_number] => 8/368228 [patent_app_country] => US [patent_app_date] => 1994-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 16 [patent_no_of_words] => 9458 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/581/05581193.pdf [firstpage_image] =>[orig_patent_app_number] => 368228 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/368228
Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra Dec 29, 1994 Issued
Array ( [id] => 3700480 [patent_doc_number] => 05619141 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-04-08 [patent_title] => 'Thermopower mapping of superconducting cuprates' [patent_app_type] => 1 [patent_app_number] => 8/313260 [patent_app_country] => US [patent_app_date] => 1994-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3896 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 23 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/619/05619141.pdf [firstpage_image] =>[orig_patent_app_number] => 313260 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/313260
Thermopower mapping of superconducting cuprates Dec 29, 1994 Issued
Array ( [id] => 3521023 [patent_doc_number] => 05486755 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-23 [patent_title] => 'Electronic meter having anti-tampering magnetic shield' [patent_app_type] => 1 [patent_app_number] => 8/364109 [patent_app_country] => US [patent_app_date] => 1994-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2423 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/486/05486755.pdf [firstpage_image] =>[orig_patent_app_number] => 364109 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/364109
Electronic meter having anti-tampering magnetic shield Dec 26, 1994 Issued
Array ( [id] => 3415182 [patent_doc_number] => 05461325 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-24 [patent_title] => 'Probe clamp assembly' [patent_app_type] => 1 [patent_app_number] => 8/363388 [patent_app_country] => US [patent_app_date] => 1994-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 2865 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/461/05461325.pdf [firstpage_image] =>[orig_patent_app_number] => 363388 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/363388
Probe clamp assembly Dec 22, 1994 Issued
Array ( [id] => 3521251 [patent_doc_number] => 05486771 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-23 [patent_title] => 'Burn-in socket testing apparatus' [patent_app_type] => 1 [patent_app_number] => 8/363559 [patent_app_country] => US [patent_app_date] => 1994-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 2008 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/486/05486771.pdf [firstpage_image] =>[orig_patent_app_number] => 363559 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/363559
Burn-in socket testing apparatus Dec 22, 1994 Issued
Array ( [id] => 3586787 [patent_doc_number] => 05498973 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-12 [patent_title] => 'Apparatus for testing semiconductor laser devices' [patent_app_type] => 1 [patent_app_number] => 8/362682 [patent_app_country] => US [patent_app_date] => 1994-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 10198 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 576 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/498/05498973.pdf [firstpage_image] =>[orig_patent_app_number] => 362682 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/362682
Apparatus for testing semiconductor laser devices Dec 21, 1994 Issued
Array ( [id] => 3695295 [patent_doc_number] => 05604445 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-02-18 [patent_title] => 'Apparatus, and corresponding method, for stress testing semiconductor chips' [patent_app_type] => 1 [patent_app_number] => 8/360919 [patent_app_country] => US [patent_app_date] => 1994-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3637 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/604/05604445.pdf [firstpage_image] =>[orig_patent_app_number] => 360919 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/360919
Apparatus, and corresponding method, for stress testing semiconductor chips Dec 20, 1994 Issued
Array ( [id] => 3554405 [patent_doc_number] => 05548208 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-08-20 [patent_title] => 'Terminal for connecting live conductors' [patent_app_type] => 1 [patent_app_number] => 8/360656 [patent_app_country] => US [patent_app_date] => 1994-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 874 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/548/05548208.pdf [firstpage_image] =>[orig_patent_app_number] => 360656 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/360656
Terminal for connecting live conductors Dec 18, 1994 Issued
Array ( [id] => 3736535 [patent_doc_number] => 05635850 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-06-03 [patent_title] => 'Intelligent test line system' [patent_app_type] => 1 [patent_app_number] => 8/355538 [patent_app_country] => US [patent_app_date] => 1994-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3254 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/635/05635850.pdf [firstpage_image] =>[orig_patent_app_number] => 355538 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/355538
Intelligent test line system Dec 13, 1994 Issued
Array ( [id] => 3597499 [patent_doc_number] => 05521516 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-28 [patent_title] => 'Semiconductor integrated circuit fault analyzing apparatus and method therefor' [patent_app_type] => 1 [patent_app_number] => 8/354088 [patent_app_country] => US [patent_app_date] => 1994-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 21 [patent_no_of_words] => 3817 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/521/05521516.pdf [firstpage_image] =>[orig_patent_app_number] => 354088 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/354088
Semiconductor integrated circuit fault analyzing apparatus and method therefor Dec 5, 1994 Issued
Array ( [id] => 3628979 [patent_doc_number] => 05602489 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-02-11 [patent_title] => 'Switch potential electron beam substrate tester' [patent_app_type] => 1 [patent_app_number] => 8/349508 [patent_app_country] => US [patent_app_date] => 1994-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 8038 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/602/05602489.pdf [firstpage_image] =>[orig_patent_app_number] => 349508 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/349508
Switch potential electron beam substrate tester Dec 1, 1994 Issued
Array ( [id] => 3538927 [patent_doc_number] => 05557198 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-17 [patent_title] => 'Onboard digital locomotive multimeter' [patent_app_type] => 1 [patent_app_number] => 8/337859 [patent_app_country] => US [patent_app_date] => 1994-11-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1996 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/557/05557198.pdf [firstpage_image] =>[orig_patent_app_number] => 337859 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/337859
Onboard digital locomotive multimeter Nov 13, 1994 Issued
Array ( [id] => 3586571 [patent_doc_number] => 05498957 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-12 [patent_title] => 'Appliance and method for the coulometric measurement of the thickness of metallic coatings' [patent_app_type] => 1 [patent_app_number] => 8/333953 [patent_app_country] => US [patent_app_date] => 1994-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2867 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/498/05498957.pdf [firstpage_image] =>[orig_patent_app_number] => 333953 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/333953
Appliance and method for the coulometric measurement of the thickness of metallic coatings Nov 2, 1994 Issued
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