Barry Bowser

Array ( [id] => 3494537 [patent_doc_number] => 05471137 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-28 [patent_title] => 'System checking and troubleshooting package for an electronic metering device' [patent_app_type] => 1 [patent_app_number] => 8/333660 [patent_app_country] => US [patent_app_date] => 1994-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 10276 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/471/05471137.pdf [firstpage_image] =>[orig_patent_app_number] => 333660 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3672963 [patent_doc_number] => 05600236 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-02-04 [patent_title] => 'Converter and digital channel selector' [patent_app_type] => 1 [patent_app_number] => 8/333009 [patent_app_country] => US [patent_app_date] => 1994-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3944 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 389 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/600/05600236.pdf [firstpage_image] =>[orig_patent_app_number] => 333009 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3520998 [patent_doc_number] => 05576629 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-11-19 [patent_title] => 'Plasma monitoring and control method and system' [patent_app_type] => 1 [patent_app_number] => 8/328069 [patent_app_country] => US [patent_app_date] => 1994-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 36 [patent_no_of_words] => 10850 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/576/05576629.pdf [firstpage_image] =>[orig_patent_app_number] => 328069 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3423528 [patent_doc_number] => 05434513 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-18 [patent_title] => 'Semiconductor wafer testing apparatus using intermediate semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 8/323054 [patent_app_country] => US [patent_app_date] => 1994-10-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2099 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/434/05434513.pdf [firstpage_image] =>[orig_patent_app_number] => 323054 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3510500 [patent_doc_number] => 05514974 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-07 [patent_title] => 'Test device and method for signalling metal failure of semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 8/321938 [patent_app_country] => US [patent_app_date] => 1994-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 3246 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/514/05514974.pdf [firstpage_image] =>[orig_patent_app_number] => 321938 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3530136 [patent_doc_number] => 05528136 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-18 [patent_title] => 'VLSI component tester with average current measuring capability' [patent_app_type] => 1 [patent_app_number] => 8/319208 [patent_app_country] => US [patent_app_date] => 1994-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4965 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/528/05528136.pdf [firstpage_image] =>[orig_patent_app_number] => 319208 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3660882 [patent_doc_number] => 05623202 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-04-22 [patent_title] => 'Testing multiple IC in parallel by a single IC tester' [patent_app_type] => 1 [patent_app_number] => 8/311809 [patent_app_country] => US [patent_app_date] => 1994-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 1933 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/623/05623202.pdf [firstpage_image] =>[orig_patent_app_number] => 311809 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3569186 [patent_doc_number] => 05483155 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-09 [patent_title] => 'Test system and method for dynamic testing of a plurality of packaged same-type charge coupled device image sensors' [patent_app_type] => 1 [patent_app_number] => 8/306348 [patent_app_country] => US [patent_app_date] => 1994-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 8325 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 334 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/483/05483155.pdf [firstpage_image] =>[orig_patent_app_number] => 306348 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3584451 [patent_doc_number] => 05491406 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-02-13 [patent_title] => 'Measuring range adapter' [patent_app_type] => 1 [patent_app_number] => 8/295889 [patent_app_country] => US [patent_app_date] => 1994-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 12 [patent_no_of_words] => 1137 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/491/05491406.pdf [firstpage_image] =>[orig_patent_app_number] => 295889 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3522795 [patent_doc_number] => 05506516 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-09 [patent_title] => 'Method of inspecting an active matrix substrate' [patent_app_type] => 1 [patent_app_number] => 8/300540 [patent_app_country] => US [patent_app_date] => 1994-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 21 [patent_no_of_words] => 5108 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/506/05506516.pdf [firstpage_image] =>[orig_patent_app_number] => 300540 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3561686 [patent_doc_number] => 05500603 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-19 [patent_title] => 'Methodology to quickly isolate functional failures associated with integrated circuit manufacturing defects' [patent_app_type] => 1 [patent_app_number] => 8/299238 [patent_app_country] => US [patent_app_date] => 1994-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3224 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/500/05500603.pdf [firstpage_image] =>[orig_patent_app_number] => 299238 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3525485 [patent_doc_number] => 05530370 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-25 [patent_title] => 'Testing apparatus for testing and handling a multiplicity of devices' [patent_app_type] => 1 [patent_app_number] => 8/298439 [patent_app_country] => US [patent_app_date] => 1994-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4169 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/530/05530370.pdf [firstpage_image] =>[orig_patent_app_number] => 298439 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3462701 [patent_doc_number] => 05473258 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-05 [patent_title] => 'Probe apparatus for carrying away dust created by probe testing' [patent_app_type] => 1 [patent_app_number] => 8/294613 [patent_app_country] => US [patent_app_date] => 1994-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3830 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/473/05473258.pdf [firstpage_image] =>[orig_patent_app_number] => 294613 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3447954 [patent_doc_number] => 05467023 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-14 [patent_title] => 'Connector inspecting apparatus having size regulating member for retainer test fitting probes external to the connetor for retainer integrity detection' [patent_app_type] => 1 [patent_app_number] => 8/294728 [patent_app_country] => US [patent_app_date] => 1994-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 6253 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/467/05467023.pdf [firstpage_image] =>[orig_patent_app_number] => 294728 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3428236 [patent_doc_number] => 05459396 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-17 [patent_title] => 'Test fixture with integrated clamp for and sensor of printed circuit board type' [patent_app_type] => 1 [patent_app_number] => 8/289719 [patent_app_country] => US [patent_app_date] => 1994-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 5074 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/459/05459396.pdf [firstpage_image] =>[orig_patent_app_number] => 289719 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3477524 [patent_doc_number] => 05477163 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-19 [patent_title] => 'Turn fault detection' [patent_app_type] => 1 [patent_app_number] => 8/285469 [patent_app_country] => US [patent_app_date] => 1994-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3078 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/477/05477163.pdf [firstpage_image] =>[orig_patent_app_number] => 285469 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3530539 [patent_doc_number] => 05528164 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-18 [patent_title] => 'Modification to a Y-scan monitor circuit' [patent_app_type] => 1 [patent_app_number] => 8/283459 [patent_app_country] => US [patent_app_date] => 1994-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3258 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/528/05528164.pdf [firstpage_image] =>[orig_patent_app_number] => 283459 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3434242 [patent_doc_number] => 05463325 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-31 [patent_title] => 'Apparatus for measuring characteristics of electronic parts' [patent_app_type] => 1 [patent_app_number] => 8/282817 [patent_app_country] => US [patent_app_date] => 1994-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2451 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/463/05463325.pdf [firstpage_image] =>[orig_patent_app_number] => 282817 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3116894 [patent_doc_number] => 05414347 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-09 [patent_title] => 'Method and apparatus for missile interface testing' [patent_app_type] => 1 [patent_app_number] => 8/272441 [patent_app_country] => US [patent_app_date] => 1994-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 5141 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 245 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/414/05414347.pdf [firstpage_image] =>[orig_patent_app_number] => 272441 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3479525 [patent_doc_number] => 05428298 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-06-27 [patent_title] => 'Probe structure for testing a semiconductor chip and a press member for same' [patent_app_type] => 1 [patent_app_number] => 8/272106 [patent_app_country] => US [patent_app_date] => 1994-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 1926 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/428/05428298.pdf [firstpage_image] =>[orig_patent_app_number] => 272106 [rel_patent_id] =>[rel_patent_doc_number] =>)