
Ben M. Rifkin
Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )
| Most Active Art Unit | 2122 |
| Art Unit(s) | 2122, 2129, 2198, 2124, 2123 |
| Total Applications | 534 |
| Issued Applications | 224 |
| Pending Applications | 86 |
| Abandoned Applications | 235 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6200191
[patent_doc_number] => 20110062977
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-17
[patent_title] => 'PROBE CIRCUIT, MULTI-PROBE CIRCUIT, TEST APPARATUS, AND ELECTRIC DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/830938
[patent_app_country] => US
[patent_app_date] => 2010-07-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 7606
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0062/20110062977.pdf
[firstpage_image] =>[orig_patent_app_number] => 12830938
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/830938 | Probe circuit, multi-probe circuit, test apparatus, and electric device | Jul 5, 2010 | Issued |
Array
(
[id] => 6091434
[patent_doc_number] => 20110001483
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-01-06
[patent_title] => 'Subsea Electronic Modules'
[patent_app_type] => utility
[patent_app_number] => 12/827687
[patent_app_country] => US
[patent_app_date] => 2010-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 836
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[pdf_file] => publications/A1/0001/20110001483.pdf
[firstpage_image] =>[orig_patent_app_number] => 12827687
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/827687 | Subsea electronic modules | Jun 29, 2010 | Issued |
Array
(
[id] => 6231920
[patent_doc_number] => 20100264951
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-10-21
[patent_title] => 'INTERCONNECTION CARD FOR INSPECTION, MANUFACTURE METHOD FOR INTERCONNECTION CARD, AND INSPECTION METHOD USING INTERCONNECTION CARD'
[patent_app_type] => utility
[patent_app_number] => 12/824896
[patent_app_country] => US
[patent_app_date] => 2010-06-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4112
[patent_no_of_claims] => 11
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[pdf_file] => publications/A1/0264/20100264951.pdf
[firstpage_image] =>[orig_patent_app_number] => 12824896
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/824896 | Interconnection card for inspection, manufacture method for interconnection card, and inspection method using interconnection card | Jun 27, 2010 | Issued |
Array
(
[id] => 9300383
[patent_doc_number] => 08648615
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-02-11
[patent_title] => 'Testing die-to-die bonding and rework'
[patent_app_type] => utility
[patent_app_number] => 12/824536
[patent_app_country] => US
[patent_app_date] => 2010-06-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/824536 | Testing die-to-die bonding and rework | Jun 27, 2010 | Issued |
Array
(
[id] => 8116059
[patent_doc_number] => 08159251
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-17
[patent_title] => 'Probe card for semiconductor wafer'
[patent_app_type] => utility
[patent_app_number] => 12/801790
[patent_app_country] => US
[patent_app_date] => 2010-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[patent_no_of_words] => 8144
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/159/08159251.pdf
[firstpage_image] =>[orig_patent_app_number] => 12801790
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/801790 | Probe card for semiconductor wafer | Jun 24, 2010 | Issued |
Array
(
[id] => 10864827
[patent_doc_number] => 08890536
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-11-18
[patent_title] => 'Secondary battery with apparatus for checking the state of a service plug'
[patent_app_type] => utility
[patent_app_number] => 12/819982
[patent_app_country] => US
[patent_app_date] => 2010-06-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12819982
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/819982 | Secondary battery with apparatus for checking the state of a service plug | Jun 20, 2010 | Issued |
Array
(
[id] => 7507431
[patent_doc_number] => 20110254540
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-10-20
[patent_title] => 'Micro-Magnetic Sensor for Acceleration, Position, Tilt, and Vibration'
[patent_app_type] => utility
[patent_app_number] => 12/819193
[patent_app_country] => US
[patent_app_date] => 2010-06-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 3321
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[pdf_file] => publications/A1/0254/20110254540.pdf
[firstpage_image] =>[orig_patent_app_number] => 12819193
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/819193 | Micro-Magnetic Sensor for Acceleration, Position, Tilt, and Vibration | Jun 18, 2010 | Abandoned |
Array
(
[id] => 5990257
[patent_doc_number] => 20110012625
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-01-20
[patent_title] => 'ZINC OXIDE SULFUR SENSOR'
[patent_app_type] => utility
[patent_app_number] => 12/817936
[patent_app_country] => US
[patent_app_date] => 2010-06-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => publications/A1/0012/20110012625.pdf
[firstpage_image] =>[orig_patent_app_number] => 12817936
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/817936 | Zinc oxide sulfur sensor | Jun 16, 2010 | Issued |
Array
(
[id] => 9141107
[patent_doc_number] => 08581575
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-11-12
[patent_title] => 'Conductivity sensor with switching between transmitting and receiving coil'
[patent_app_type] => utility
[patent_app_number] => 12/801557
[patent_app_country] => US
[patent_app_date] => 2010-06-15
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/801557 | Conductivity sensor with switching between transmitting and receiving coil | Jun 14, 2010 | Issued |
Array
(
[id] => 8166150
[patent_doc_number] => 08174277
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-05-08
[patent_title] => 'Compensation for voltage drop in automatic test equipment'
[patent_app_type] => utility
[patent_app_number] => 12/815233
[patent_app_country] => US
[patent_app_date] => 2010-06-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/08/174/08174277.pdf
[firstpage_image] =>[orig_patent_app_number] => 12815233
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/815233 | Compensation for voltage drop in automatic test equipment | Jun 13, 2010 | Issued |
Array
(
[id] => 6324312
[patent_doc_number] => 20100244873
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-30
[patent_title] => 'APPARATUS AND METHOD OF TESTING SINGULATED DIES'
[patent_app_type] => utility
[patent_app_number] => 12/796457
[patent_app_country] => US
[patent_app_date] => 2010-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
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[pdf_file] => publications/A1/0244/20100244873.pdf
[firstpage_image] =>[orig_patent_app_number] => 12796457
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/796457 | Apparatus and method of testing singulated dies | Jun 7, 2010 | Issued |
Array
(
[id] => 5988372
[patent_doc_number] => 20110011844
[patent_country] => US
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[patent_issue_date] => 2011-01-20
[patent_title] => 'CONDUCTIVE HEATING'
[patent_app_type] => utility
[patent_app_number] => 12/760164
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/760164 | Individually heating storage devices in a testing system | Apr 13, 2010 | Issued |
Array
(
[id] => 9504465
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[patent_kind] => B2
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[patent_title] => 'Organic light emitting display device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/759593 | Organic light emitting display device | Apr 12, 2010 | Issued |
Array
(
[id] => 7480713
[patent_doc_number] => 20110248711
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[patent_title] => 'MAGNETIC FIELD CURRENT SENSORS'
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[firstpage_image] =>[orig_patent_app_number] => 12756652
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/756652 | Magnetic field current sensors | Apr 7, 2010 | Issued |
Array
(
[id] => 9763284
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[patent_title] => 'Method, apparatus and system of parallel IC test'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/659768 | Method, apparatus and system of parallel IC test | Mar 18, 2010 | Issued |
Array
(
[id] => 6609682
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[patent_title] => 'PROBE AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAME'
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[firstpage_image] =>[orig_patent_app_number] => 12724046
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/724046 | Vertical probe comprising slots and probe card for integrated circuit devices using the same | Mar 14, 2010 | Issued |
Array
(
[id] => 6482921
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[patent_title] => 'Test section unit, test head and electronic device testing apparatus'
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/704717 | Integrated circuit with improved test capability via reduced pin count | Feb 11, 2010 | Issued |