Search

Ben M. Rifkin

Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )

Most Active Art Unit
2122
Art Unit(s)
2122, 2129, 2198, 2124, 2123
Total Applications
534
Issued Applications
224
Pending Applications
86
Abandoned Applications
235

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6200191 [patent_doc_number] => 20110062977 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-17 [patent_title] => 'PROBE CIRCUIT, MULTI-PROBE CIRCUIT, TEST APPARATUS, AND ELECTRIC DEVICE' [patent_app_type] => utility [patent_app_number] => 12/830938 [patent_app_country] => US [patent_app_date] => 2010-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7606 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20110062977.pdf [firstpage_image] =>[orig_patent_app_number] => 12830938 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/830938
Probe circuit, multi-probe circuit, test apparatus, and electric device Jul 5, 2010 Issued
Array ( [id] => 6091434 [patent_doc_number] => 20110001483 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-06 [patent_title] => 'Subsea Electronic Modules' [patent_app_type] => utility [patent_app_number] => 12/827687 [patent_app_country] => US [patent_app_date] => 2010-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 836 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20110001483.pdf [firstpage_image] =>[orig_patent_app_number] => 12827687 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/827687
Subsea electronic modules Jun 29, 2010 Issued
Array ( [id] => 6231920 [patent_doc_number] => 20100264951 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-21 [patent_title] => 'INTERCONNECTION CARD FOR INSPECTION, MANUFACTURE METHOD FOR INTERCONNECTION CARD, AND INSPECTION METHOD USING INTERCONNECTION CARD' [patent_app_type] => utility [patent_app_number] => 12/824896 [patent_app_country] => US [patent_app_date] => 2010-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4112 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0264/20100264951.pdf [firstpage_image] =>[orig_patent_app_number] => 12824896 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/824896
Interconnection card for inspection, manufacture method for interconnection card, and inspection method using interconnection card Jun 27, 2010 Issued
Array ( [id] => 9300383 [patent_doc_number] => 08648615 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-02-11 [patent_title] => 'Testing die-to-die bonding and rework' [patent_app_type] => utility [patent_app_number] => 12/824536 [patent_app_country] => US [patent_app_date] => 2010-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 8222 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12824536 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/824536
Testing die-to-die bonding and rework Jun 27, 2010 Issued
Array ( [id] => 8116059 [patent_doc_number] => 08159251 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-17 [patent_title] => 'Probe card for semiconductor wafer' [patent_app_type] => utility [patent_app_number] => 12/801790 [patent_app_country] => US [patent_app_date] => 2010-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8144 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/159/08159251.pdf [firstpage_image] =>[orig_patent_app_number] => 12801790 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/801790
Probe card for semiconductor wafer Jun 24, 2010 Issued
Array ( [id] => 10864827 [patent_doc_number] => 08890536 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-11-18 [patent_title] => 'Secondary battery with apparatus for checking the state of a service plug' [patent_app_type] => utility [patent_app_number] => 12/819982 [patent_app_country] => US [patent_app_date] => 2010-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3271 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12819982 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/819982
Secondary battery with apparatus for checking the state of a service plug Jun 20, 2010 Issued
Array ( [id] => 7507431 [patent_doc_number] => 20110254540 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-10-20 [patent_title] => 'Micro-Magnetic Sensor for Acceleration, Position, Tilt, and Vibration' [patent_app_type] => utility [patent_app_number] => 12/819193 [patent_app_country] => US [patent_app_date] => 2010-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3321 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0254/20110254540.pdf [firstpage_image] =>[orig_patent_app_number] => 12819193 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/819193
Micro-Magnetic Sensor for Acceleration, Position, Tilt, and Vibration Jun 18, 2010 Abandoned
Array ( [id] => 5990257 [patent_doc_number] => 20110012625 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-20 [patent_title] => 'ZINC OXIDE SULFUR SENSOR' [patent_app_type] => utility [patent_app_number] => 12/817936 [patent_app_country] => US [patent_app_date] => 2010-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2306 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20110012625.pdf [firstpage_image] =>[orig_patent_app_number] => 12817936 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/817936
Zinc oxide sulfur sensor Jun 16, 2010 Issued
Array ( [id] => 9141107 [patent_doc_number] => 08581575 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-11-12 [patent_title] => 'Conductivity sensor with switching between transmitting and receiving coil' [patent_app_type] => utility [patent_app_number] => 12/801557 [patent_app_country] => US [patent_app_date] => 2010-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 5457 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12801557 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/801557
Conductivity sensor with switching between transmitting and receiving coil Jun 14, 2010 Issued
Array ( [id] => 8166150 [patent_doc_number] => 08174277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-05-08 [patent_title] => 'Compensation for voltage drop in automatic test equipment' [patent_app_type] => utility [patent_app_number] => 12/815233 [patent_app_country] => US [patent_app_date] => 2010-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3448 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/174/08174277.pdf [firstpage_image] =>[orig_patent_app_number] => 12815233 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/815233
Compensation for voltage drop in automatic test equipment Jun 13, 2010 Issued
Array ( [id] => 6324312 [patent_doc_number] => 20100244873 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-30 [patent_title] => 'APPARATUS AND METHOD OF TESTING SINGULATED DIES' [patent_app_type] => utility [patent_app_number] => 12/796457 [patent_app_country] => US [patent_app_date] => 2010-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 16832 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0244/20100244873.pdf [firstpage_image] =>[orig_patent_app_number] => 12796457 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/796457
Apparatus and method of testing singulated dies Jun 7, 2010 Issued
Array ( [id] => 5988372 [patent_doc_number] => 20110011844 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-20 [patent_title] => 'CONDUCTIVE HEATING' [patent_app_type] => utility [patent_app_number] => 12/760164 [patent_app_country] => US [patent_app_date] => 2010-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 41 [patent_no_of_words] => 7619 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20110011844.pdf [firstpage_image] =>[orig_patent_app_number] => 12760164 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/760164
Individually heating storage devices in a testing system Apr 13, 2010 Issued
Array ( [id] => 9504465 [patent_doc_number] => 08742784 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-06-03 [patent_title] => 'Organic light emitting display device' [patent_app_type] => utility [patent_app_number] => 12/759593 [patent_app_country] => US [patent_app_date] => 2010-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3073 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 25 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12759593 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/759593
Organic light emitting display device Apr 12, 2010 Issued
Array ( [id] => 7480713 [patent_doc_number] => 20110248711 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-10-13 [patent_title] => 'MAGNETIC FIELD CURRENT SENSORS' [patent_app_type] => utility [patent_app_number] => 12/756652 [patent_app_country] => US [patent_app_date] => 2010-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 7280 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0248/20110248711.pdf [firstpage_image] =>[orig_patent_app_number] => 12756652 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/756652
Magnetic field current sensors Apr 7, 2010 Issued
Array ( [id] => 9763284 [patent_doc_number] => 08847615 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-09-30 [patent_title] => 'Method, apparatus and system of parallel IC test' [patent_app_type] => utility [patent_app_number] => 12/659768 [patent_app_country] => US [patent_app_date] => 2010-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 28 [patent_figures_cnt] => 47 [patent_no_of_words] => 13745 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12659768 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/659768
Method, apparatus and system of parallel IC test Mar 18, 2010 Issued
Array ( [id] => 6609682 [patent_doc_number] => 20100171519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-08 [patent_title] => 'PROBE AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/724046 [patent_app_country] => US [patent_app_date] => 2010-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2410 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0171/20100171519.pdf [firstpage_image] =>[orig_patent_app_number] => 12724046 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/724046
Vertical probe comprising slots and probe card for integrated circuit devices using the same Mar 14, 2010 Issued
Array ( [id] => 6482921 [patent_doc_number] => 20100213959 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-26 [patent_title] => 'Test section unit, test head and electronic device testing apparatus' [patent_app_type] => utility [patent_app_number] => 12/659033 [patent_app_country] => US [patent_app_date] => 2010-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2794 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0213/20100213959.pdf [firstpage_image] =>[orig_patent_app_number] => 12659033 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/659033
Test section unit, test head and electronic device testing apparatus Feb 22, 2010 Issued
Array ( [id] => 6036912 [patent_doc_number] => 20110089961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-21 [patent_title] => 'Interface test device and method' [patent_app_type] => utility [patent_app_number] => 12/660042 [patent_app_country] => US [patent_app_date] => 2010-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 7343 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0089/20110089961.pdf [firstpage_image] =>[orig_patent_app_number] => 12660042 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/660042
Interface test device and method for using the interface Feb 19, 2010 Issued
Array ( [id] => 6618804 [patent_doc_number] => 20100225343 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-09 [patent_title] => 'Probe card, semiconductor testing device including the same, and fuse checking method for probe card' [patent_app_type] => utility [patent_app_number] => 12/656726 [patent_app_country] => US [patent_app_date] => 2010-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5100 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20100225343.pdf [firstpage_image] =>[orig_patent_app_number] => 12656726 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/656726
Probe card, semiconductor testing device including the same, and fuse checking method for probe card Feb 15, 2010 Abandoned
Array ( [id] => 6414240 [patent_doc_number] => 20100141286 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-10 [patent_title] => 'INTEGRATED CIRCUIT WITH IMPROVED TEST CAPABILITY VIA REDUCED PIN COUNT' [patent_app_type] => utility [patent_app_number] => 12/704717 [patent_app_country] => US [patent_app_date] => 2010-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5314 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0141/20100141286.pdf [firstpage_image] =>[orig_patent_app_number] => 12704717 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/704717
Integrated circuit with improved test capability via reduced pin count Feb 11, 2010 Issued
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