Search

Ben M. Rifkin

Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )

Most Active Art Unit
2122
Art Unit(s)
2122, 2129, 2198, 2124, 2123
Total Applications
534
Issued Applications
224
Pending Applications
86
Abandoned Applications
235

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8352764 [patent_doc_number] => 08248089 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-21 [patent_title] => 'Apparatus for testing a semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/656588 [patent_app_country] => US [patent_app_date] => 2010-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 5626 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 247 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12656588 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/656588
Apparatus for testing a semiconductor device Feb 3, 2010 Issued
Array ( [id] => 8702179 [patent_doc_number] => 08395403 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-12 [patent_title] => 'Semiconductor device and defect analysis method for a semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/656604 [patent_app_country] => US [patent_app_date] => 2010-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5463 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12656604 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/656604
Semiconductor device and defect analysis method for a semiconductor device Feb 3, 2010 Issued
Array ( [id] => 8714003 [patent_doc_number] => 08400146 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-19 [patent_title] => 'Stray field collector pad, and bio-molecule sensing module or biochip using the same' [patent_app_type] => utility [patent_app_number] => 12/699383 [patent_app_country] => US [patent_app_date] => 2010-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3375 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12699383 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/699383
Stray field collector pad, and bio-molecule sensing module or biochip using the same Feb 2, 2010 Issued
Array ( [id] => 8714030 [patent_doc_number] => 08400174 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-19 [patent_title] => 'Method of correcting a position of a prober' [patent_app_type] => utility [patent_app_number] => 12/656520 [patent_app_country] => US [patent_app_date] => 2010-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3377 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12656520 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/656520
Method of correcting a position of a prober Feb 1, 2010 Issued
Array ( [id] => 8528525 [patent_doc_number] => 08305102 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-06 [patent_title] => 'Probe card, method for manufacturing probe card, and prober apparatus' [patent_app_type] => utility [patent_app_number] => 12/692917 [patent_app_country] => US [patent_app_date] => 2010-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 6806 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12692917 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/692917
Probe card, method for manufacturing probe card, and prober apparatus Jan 24, 2010 Issued
Array ( [id] => 6609350 [patent_doc_number] => 20100171492 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-08 [patent_title] => 'DEGRADATION AND INTEGRITY MEASURING DEVICE FOR ABSORBABLE METAL IMPLANTS' [patent_app_type] => utility [patent_app_number] => 12/691329 [patent_app_country] => US [patent_app_date] => 2010-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2473 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0171/20100171492.pdf [firstpage_image] =>[orig_patent_app_number] => 12691329 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/691329
Degradation and integrity measuring device for absorbable metal implants Jan 20, 2010 Issued
Array ( [id] => 5981169 [patent_doc_number] => 20110095775 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-28 [patent_title] => 'FORK ASSEMBLY FOR PROTECTION CIRCUIT OF TEST SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/690238 [patent_app_country] => US [patent_app_date] => 2010-01-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1792 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0095/20110095775.pdf [firstpage_image] =>[orig_patent_app_number] => 12690238 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/690238
Fork assembly for protection circuit of test system Jan 19, 2010 Issued
Array ( [id] => 6115709 [patent_doc_number] => 20110074457 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-31 [patent_title] => 'System For Testing Electronic Components' [patent_app_type] => utility [patent_app_number] => 12/688903 [patent_app_country] => US [patent_app_date] => 2010-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4437 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20110074457.pdf [firstpage_image] =>[orig_patent_app_number] => 12688903 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/688903
System for testing electronic components Jan 16, 2010 Issued
Array ( [id] => 9060692 [patent_doc_number] => 08547131 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-01 [patent_title] => 'System and method for observing threshold voltage variations' [patent_app_type] => utility [patent_app_number] => 12/688025 [patent_app_country] => US [patent_app_date] => 2010-01-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 20 [patent_no_of_words] => 6309 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12688025 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/688025
System and method for observing threshold voltage variations Jan 14, 2010 Issued
Array ( [id] => 8578521 [patent_doc_number] => 08344737 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-01 [patent_title] => 'Relay circuit tester device' [patent_app_type] => utility [patent_app_number] => 12/688639 [patent_app_country] => US [patent_app_date] => 2010-01-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 3732 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12688639 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/688639
Relay circuit tester device Jan 14, 2010 Issued
Array ( [id] => 6170942 [patent_doc_number] => 20110175597 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-21 [patent_title] => 'SIGNAL TESTING APPARATUS FOR LOAD CONTROL SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/688678 [patent_app_country] => US [patent_app_date] => 2010-01-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3799 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0175/20110175597.pdf [firstpage_image] =>[orig_patent_app_number] => 12688678 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/688678
Signal testing apparatus for load control system Jan 14, 2010 Issued
Array ( [id] => 6184790 [patent_doc_number] => 20110169520 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-14 [patent_title] => 'APPARATUS FOR MEASURING MINORITY CARRIER LIFETIME AND METHOD FOR USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/687855 [patent_app_country] => US [patent_app_date] => 2010-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6892 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20110169520.pdf [firstpage_image] =>[orig_patent_app_number] => 12687855 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/687855
APPARATUS FOR MEASURING MINORITY CARRIER LIFETIME AND METHOD FOR USING THE SAME Jan 13, 2010 Abandoned
Array ( [id] => 6386056 [patent_doc_number] => 20100176839 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-15 [patent_title] => 'POWER SUPPLY VOLTAGE MONITORING CIRCUIT AND ELECTRONIC CIRCUIT INCLUDING THE POWER SUPPLY VOLTAGE MONITORING CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/686684 [patent_app_country] => US [patent_app_date] => 2010-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 21818 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0176/20100176839.pdf [firstpage_image] =>[orig_patent_app_number] => 12686684 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/686684
Power supply voltage monitoring circuit and electronic circuit including the power supply voltage monitoring circuit Jan 12, 2010 Issued
Array ( [id] => 6184780 [patent_doc_number] => 20110169516 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-14 [patent_title] => 'PROBE ELEMENT HAVING A SUBSTANTIALLY ZERO STIFFNESS AND APPLICATIONS THEREOF' [patent_app_type] => utility [patent_app_number] => 12/686196 [patent_app_country] => US [patent_app_date] => 2010-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8690 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20110169516.pdf [firstpage_image] =>[orig_patent_app_number] => 12686196 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/686196
Probe element having a substantially zero stiffness and applications thereof Jan 11, 2010 Issued
Array ( [id] => 9128001 [patent_doc_number] => 08575952 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-11-05 [patent_title] => 'Semiconductor device and test method' [patent_app_type] => utility [patent_app_number] => 12/685035 [patent_app_country] => US [patent_app_date] => 2010-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 32 [patent_no_of_words] => 5832 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12685035 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/685035
Semiconductor device and test method Jan 10, 2010 Issued
Array ( [id] => 4518673 [patent_doc_number] => 07932713 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-26 [patent_title] => 'Method and apparatus for amplifying a signal and test device using same' [patent_app_type] => utility [patent_app_number] => 12/684734 [patent_app_country] => US [patent_app_date] => 2010-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2593 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/932/07932713.pdf [firstpage_image] =>[orig_patent_app_number] => 12684734 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/684734
Method and apparatus for amplifying a signal and test device using same Jan 7, 2010 Issued
Array ( [id] => 5997723 [patent_doc_number] => 20110115472 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-19 [patent_title] => 'CONTROL CIRCUIT FOR CURRENT DETECTION' [patent_app_type] => utility [patent_app_number] => 12/683788 [patent_app_country] => US [patent_app_date] => 2010-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2246 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0115/20110115472.pdf [firstpage_image] =>[orig_patent_app_number] => 12683788 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/683788
CONTROL CIRCUIT FOR CURRENT DETECTION Jan 6, 2010 Abandoned
Array ( [id] => 7698992 [patent_doc_number] => 20110227598 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-09-22 [patent_title] => 'APPARATUS AND METHOD FOR INSPECTING HOMOGENEITY OF SOLAR CELL QUANTUM EFFICIENCY USING IMAGING DEVICE' [patent_app_type] => utility [patent_app_number] => 13/131171 [patent_app_country] => US [patent_app_date] => 2009-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3730 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0227/20110227598.pdf [firstpage_image] =>[orig_patent_app_number] => 13131171 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/131171
Apparatus and method for inspecting homogeneity of solar cell quantum efficiency using imaging device Dec 29, 2009 Issued
Array ( [id] => 6629385 [patent_doc_number] => 20100100782 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 12/642070 [patent_app_country] => US [patent_app_date] => 2009-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6981 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0100/20100100782.pdf [firstpage_image] =>[orig_patent_app_number] => 12642070 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/642070
Parallel scan distributors and collectors and process of testing integrated circuits Dec 17, 2009 Issued
Array ( [id] => 4446349 [patent_doc_number] => 07863913 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-04 [patent_title] => 'Parallel scan distributors and collectors and process of testing integrated circuits' [patent_app_type] => utility [patent_app_number] => 12/642139 [patent_app_country] => US [patent_app_date] => 2009-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 6957 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/863/07863913.pdf [firstpage_image] =>[orig_patent_app_number] => 12642139 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/642139
Parallel scan distributors and collectors and process of testing integrated circuits Dec 17, 2009 Issued
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