
Ben M. Rifkin
Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )
| Most Active Art Unit | 2122 |
| Art Unit(s) | 2122, 2129, 2198, 2124, 2123 |
| Total Applications | 534 |
| Issued Applications | 224 |
| Pending Applications | 86 |
| Abandoned Applications | 235 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8352764
[patent_doc_number] => 08248089
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-08-21
[patent_title] => 'Apparatus for testing a semiconductor device'
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[patent_app_number] => 12/656588
[patent_app_country] => US
[patent_app_date] => 2010-02-04
[patent_effective_date] => 0000-00-00
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Array
(
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[patent_doc_number] => 08395403
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[patent_kind] => B2
[patent_issue_date] => 2013-03-12
[patent_title] => 'Semiconductor device and defect analysis method for a semiconductor device'
[patent_app_type] => utility
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Array
(
[id] => 8714003
[patent_doc_number] => 08400146
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[patent_kind] => B2
[patent_issue_date] => 2013-03-19
[patent_title] => 'Stray field collector pad, and bio-molecule sensing module or biochip using the same'
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[patent_app_number] => 12/699383
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[patent_app_date] => 2010-02-03
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Array
(
[id] => 8714030
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[patent_issue_date] => 2013-03-19
[patent_title] => 'Method of correcting a position of a prober'
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[patent_app_country] => US
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Array
(
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[patent_issue_date] => 2012-11-06
[patent_title] => 'Probe card, method for manufacturing probe card, and prober apparatus'
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Array
(
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[patent_issue_date] => 2010-07-08
[patent_title] => 'DEGRADATION AND INTEGRITY MEASURING DEVICE FOR ABSORBABLE METAL IMPLANTS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/691329 | Degradation and integrity measuring device for absorbable metal implants | Jan 20, 2010 | Issued |
Array
(
[id] => 5981169
[patent_doc_number] => 20110095775
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[patent_issue_date] => 2011-04-28
[patent_title] => 'FORK ASSEMBLY FOR PROTECTION CIRCUIT OF TEST SYSTEM'
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[patent_app_number] => 12/690238
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[patent_app_date] => 2010-01-20
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/690238 | Fork assembly for protection circuit of test system | Jan 19, 2010 | Issued |
Array
(
[id] => 6115709
[patent_doc_number] => 20110074457
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[patent_issue_date] => 2011-03-31
[patent_title] => 'System For Testing Electronic Components'
[patent_app_type] => utility
[patent_app_number] => 12/688903
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[patent_app_date] => 2010-01-17
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/688903 | System for testing electronic components | Jan 16, 2010 | Issued |
Array
(
[id] => 9060692
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[patent_issue_date] => 2013-10-01
[patent_title] => 'System and method for observing threshold voltage variations'
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Array
(
[id] => 8578521
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[patent_issue_date] => 2013-01-01
[patent_title] => 'Relay circuit tester device'
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[patent_app_number] => 12/688639
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Array
(
[id] => 6170942
[patent_doc_number] => 20110175597
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[patent_issue_date] => 2011-07-21
[patent_title] => 'SIGNAL TESTING APPARATUS FOR LOAD CONTROL SYSTEM'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/688678 | Signal testing apparatus for load control system | Jan 14, 2010 | Issued |
Array
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Array
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Array
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[patent_title] => 'PROBE ELEMENT HAVING A SUBSTANTIALLY ZERO STIFFNESS AND APPLICATIONS THEREOF'
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/131171 | Apparatus and method for inspecting homogeneity of solar cell quantum efficiency using imaging device | Dec 29, 2009 | Issued |
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