
Ben M. Rifkin
Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )
| Most Active Art Unit | 2122 |
| Art Unit(s) | 2122, 2129, 2198, 2124, 2123 |
| Total Applications | 534 |
| Issued Applications | 224 |
| Pending Applications | 86 |
| Abandoned Applications | 235 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4544304
[patent_doc_number] => 07876112
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-01-25
[patent_title] => 'Parallel scan distributors and collectors and process of testing integrated circuits'
[patent_app_type] => utility
[patent_app_number] => 12/642190
[patent_app_country] => US
[patent_app_date] => 2009-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 12
[patent_no_of_words] => 6951
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 219
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/876/07876112.pdf
[firstpage_image] =>[orig_patent_app_number] => 12642190
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/642190 | Parallel scan distributors and collectors and process of testing integrated circuits | Dec 17, 2009 | Issued |
Array
(
[id] => 5962302
[patent_doc_number] => 20110147191
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-06-23
[patent_title] => 'METHODS OF USING A CONDUCTIVE COMPOSITE MATERIAL'
[patent_app_type] => utility
[patent_app_number] => 12/641793
[patent_app_country] => US
[patent_app_date] => 2009-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 6314
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0147/20110147191.pdf
[firstpage_image] =>[orig_patent_app_number] => 12641793
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/641793 | Methods of using a conductive composite material | Dec 17, 2009 | Issued |
Array
(
[id] => 6562016
[patent_doc_number] => 20100289518
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-11-18
[patent_title] => 'CIRCUIT AND METHOD FOR DETECTING FAULTY DIODE'
[patent_app_type] => utility
[patent_app_number] => 12/631992
[patent_app_country] => US
[patent_app_date] => 2009-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2355
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0289/20100289518.pdf
[firstpage_image] =>[orig_patent_app_number] => 12631992
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/631992 | Circuit and method for detecting faulty diode | Dec 6, 2009 | Issued |
Array
(
[id] => 6115704
[patent_doc_number] => 20110074454
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-31
[patent_title] => 'TEST DEVICE AND INSPECTION APPARATUS USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/631794
[patent_app_country] => US
[patent_app_date] => 2009-12-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3328
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0074/20110074454.pdf
[firstpage_image] =>[orig_patent_app_number] => 12631794
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/631794 | Testing apparatus having tips of different heights | Dec 3, 2009 | Issued |
Array
(
[id] => 6287250
[patent_doc_number] => 20100237895
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-23
[patent_title] => 'System and method for characterizing solar cell conversion performance and detecting defects in a solar cell'
[patent_app_type] => utility
[patent_app_number] => 12/592798
[patent_app_country] => US
[patent_app_date] => 2009-12-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5631
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0237/20100237895.pdf
[firstpage_image] =>[orig_patent_app_number] => 12592798
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/592798 | System and method for characterizing solar cell conversion performance and detecting defects in a solar cell | Dec 1, 2009 | Abandoned |
Array
(
[id] => 9010223
[patent_doc_number] => 08525527
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-09-03
[patent_title] => 'Helical sensor for testing a composite medium'
[patent_app_type] => utility
[patent_app_number] => 12/627788
[patent_app_country] => US
[patent_app_date] => 2009-11-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 6
[patent_no_of_words] => 8714
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 91
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12627788
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/627788 | Helical sensor for testing a composite medium | Nov 29, 2009 | Issued |
Array
(
[id] => 8116043
[patent_doc_number] => 08159243
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-17
[patent_title] => 'Probe tip to device pad alignment in obscured view probing applications'
[patent_app_type] => utility
[patent_app_number] => 12/617619
[patent_app_country] => US
[patent_app_date] => 2009-11-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 16
[patent_no_of_words] => 4526
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/159/08159243.pdf
[firstpage_image] =>[orig_patent_app_number] => 12617619
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/617619 | Probe tip to device pad alignment in obscured view probing applications | Nov 11, 2009 | Issued |
Array
(
[id] => 8702148
[patent_doc_number] => 08395372
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-03-12
[patent_title] => 'Method for measuring current in an electric power distribution system'
[patent_app_type] => utility
[patent_app_number] => 12/612894
[patent_app_country] => US
[patent_app_date] => 2009-11-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 13
[patent_no_of_words] => 5776
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 219
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12612894
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/612894 | Method for measuring current in an electric power distribution system | Nov 4, 2009 | Issued |
Array
(
[id] => 5941392
[patent_doc_number] => 20110102012
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-05-05
[patent_title] => 'PARAMETER ESTIMATION SYSTEM AND METHOD FOR AN INDUCTION MOTOR'
[patent_app_type] => utility
[patent_app_number] => 12/611719
[patent_app_country] => US
[patent_app_date] => 2009-11-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4664
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0102/20110102012.pdf
[firstpage_image] =>[orig_patent_app_number] => 12611719
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/611719 | Parameter estimation system and method for an induction motor | Nov 2, 2009 | Issued |
Array
(
[id] => 6241470
[patent_doc_number] => 20100134135
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-03
[patent_title] => 'Semiconductor device test apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/588901
[patent_app_country] => US
[patent_app_date] => 2009-11-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5067
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0134/20100134135.pdf
[firstpage_image] =>[orig_patent_app_number] => 12588901
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/588901 | Semiconductor device test apparatus | Nov 1, 2009 | Abandoned |
Array
(
[id] => 6426113
[patent_doc_number] => 20100102841
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-04-29
[patent_title] => 'DEVICE, METHOD AND PROBE FOR INSPECTING SUBSTRATE'
[patent_app_type] => utility
[patent_app_number] => 12/605859
[patent_app_country] => US
[patent_app_date] => 2009-10-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 7472
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0102/20100102841.pdf
[firstpage_image] =>[orig_patent_app_number] => 12605859
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/605859 | DEVICE, METHOD AND PROBE FOR INSPECTING SUBSTRATE | Oct 25, 2009 | Abandoned |
Array
(
[id] => 6553982
[patent_doc_number] => 20100127722
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-05-27
[patent_title] => 'CIS Circuit Test Probe Card'
[patent_app_type] => utility
[patent_app_number] => 12/579326
[patent_app_country] => US
[patent_app_date] => 2009-10-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 2622
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0127/20100127722.pdf
[firstpage_image] =>[orig_patent_app_number] => 12579326
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/579326 | CMOS image sensor test probe card | Oct 13, 2009 | Issued |
Array
(
[id] => 6248177
[patent_doc_number] => 20100026330
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-02-04
[patent_title] => 'TESTBOARD WITH ZIF CONNECTORS, METHOD OF ASSEMBLING, INTEGRATED CIRCUIT TEST SYSTEM AND TEST METHOD INTRODUCED BY THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/577195
[patent_app_country] => US
[patent_app_date] => 2009-10-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5261
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0026/20100026330.pdf
[firstpage_image] =>[orig_patent_app_number] => 12577195
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/577195 | TESTBOARD WITH ZIF CONNECTORS, METHOD OF ASSEMBLING, INTEGRATED CIRCUIT TEST SYSTEM AND TEST METHOD INTRODUCED BY THE SAME | Oct 10, 2009 | Abandoned |
Array
(
[id] => 6027791
[patent_doc_number] => 20110080189
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-04-07
[patent_title] => 'YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING-INTERPOSER'
[patent_app_type] => utility
[patent_app_number] => 12/574264
[patent_app_country] => US
[patent_app_date] => 2009-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5468
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0080/20110080189.pdf
[firstpage_image] =>[orig_patent_app_number] => 12574264
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/574264 | Yield enhancement for stacked chips through rotationally-connecting-interposer | Oct 5, 2009 | Issued |
Array
(
[id] => 6339152
[patent_doc_number] => 20100019790
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-28
[patent_title] => 'TEST HANDLER HAVING SIZE-CHANGEABLE TEST SITE'
[patent_app_type] => utility
[patent_app_number] => 12/574395
[patent_app_country] => US
[patent_app_date] => 2009-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4509
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0019/20100019790.pdf
[firstpage_image] =>[orig_patent_app_number] => 12574395
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/574395 | Test handler having size-changeable test site | Oct 5, 2009 | Issued |
Array
(
[id] => 8630682
[patent_doc_number] => 08362759
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-01-29
[patent_title] => 'Method to predict phase current'
[patent_app_type] => utility
[patent_app_number] => 12/588095
[patent_app_country] => US
[patent_app_date] => 2009-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 6281
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 102
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12588095
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/588095 | Method to predict phase current | Oct 1, 2009 | Issued |
Array
(
[id] => 8306531
[patent_doc_number] => 08228084
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2012-07-24
[patent_title] => 'Systems and methods for self-testing of integrated devices during production'
[patent_app_type] => utility
[patent_app_number] => 12/569097
[patent_app_country] => US
[patent_app_date] => 2009-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2310
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 348
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12569097
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/569097 | Systems and methods for self-testing of integrated devices during production | Sep 28, 2009 | Issued |
Array
(
[id] => 8283536
[patent_doc_number] => 08217641
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-07-10
[patent_title] => 'Device and method for reading electric currents resulting from an electromagnetic signal detector'
[patent_app_type] => utility
[patent_app_number] => 12/568096
[patent_app_country] => US
[patent_app_date] => 2009-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 8
[patent_no_of_words] => 5114
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 277
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12568096
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/568096 | Device and method for reading electric currents resulting from an electromagnetic signal detector | Sep 27, 2009 | Issued |
Array
(
[id] => 6596103
[patent_doc_number] => 20100001756
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-07
[patent_title] => 'ARRAY SUBSTRATE HAVING INCREASED INSPECTION EFFICINCY AND DISPLAY APPARATUS HAVING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/560699
[patent_app_country] => US
[patent_app_date] => 2009-09-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 8526
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0001/20100001756.pdf
[firstpage_image] =>[orig_patent_app_number] => 12560699
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/560699 | Array substrate having increased inspection efficiency and display apparatus having the same | Sep 15, 2009 | Issued |
Array
(
[id] => 8528529
[patent_doc_number] => 08305107
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-11-06
[patent_title] => 'System for testing a power supply unit'
[patent_app_type] => utility
[patent_app_number] => 12/557531
[patent_app_country] => US
[patent_app_date] => 2009-09-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2444
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12557531
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/557531 | System for testing a power supply unit | Sep 10, 2009 | Issued |