Search

Ben M. Rifkin

Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )

Most Active Art Unit
2122
Art Unit(s)
2122, 2129, 2198, 2124, 2123
Total Applications
534
Issued Applications
224
Pending Applications
86
Abandoned Applications
235

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4544304 [patent_doc_number] => 07876112 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-25 [patent_title] => 'Parallel scan distributors and collectors and process of testing integrated circuits' [patent_app_type] => utility [patent_app_number] => 12/642190 [patent_app_country] => US [patent_app_date] => 2009-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 6951 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 219 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/876/07876112.pdf [firstpage_image] =>[orig_patent_app_number] => 12642190 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/642190
Parallel scan distributors and collectors and process of testing integrated circuits Dec 17, 2009 Issued
Array ( [id] => 5962302 [patent_doc_number] => 20110147191 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-23 [patent_title] => 'METHODS OF USING A CONDUCTIVE COMPOSITE MATERIAL' [patent_app_type] => utility [patent_app_number] => 12/641793 [patent_app_country] => US [patent_app_date] => 2009-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 6314 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0147/20110147191.pdf [firstpage_image] =>[orig_patent_app_number] => 12641793 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/641793
Methods of using a conductive composite material Dec 17, 2009 Issued
Array ( [id] => 6562016 [patent_doc_number] => 20100289518 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-18 [patent_title] => 'CIRCUIT AND METHOD FOR DETECTING FAULTY DIODE' [patent_app_type] => utility [patent_app_number] => 12/631992 [patent_app_country] => US [patent_app_date] => 2009-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2355 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0289/20100289518.pdf [firstpage_image] =>[orig_patent_app_number] => 12631992 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/631992
Circuit and method for detecting faulty diode Dec 6, 2009 Issued
Array ( [id] => 6115704 [patent_doc_number] => 20110074454 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-31 [patent_title] => 'TEST DEVICE AND INSPECTION APPARATUS USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/631794 [patent_app_country] => US [patent_app_date] => 2009-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3328 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20110074454.pdf [firstpage_image] =>[orig_patent_app_number] => 12631794 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/631794
Testing apparatus having tips of different heights Dec 3, 2009 Issued
Array ( [id] => 6287250 [patent_doc_number] => 20100237895 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-23 [patent_title] => 'System and method for characterizing solar cell conversion performance and detecting defects in a solar cell' [patent_app_type] => utility [patent_app_number] => 12/592798 [patent_app_country] => US [patent_app_date] => 2009-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5631 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20100237895.pdf [firstpage_image] =>[orig_patent_app_number] => 12592798 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/592798
System and method for characterizing solar cell conversion performance and detecting defects in a solar cell Dec 1, 2009 Abandoned
Array ( [id] => 9010223 [patent_doc_number] => 08525527 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-09-03 [patent_title] => 'Helical sensor for testing a composite medium' [patent_app_type] => utility [patent_app_number] => 12/627788 [patent_app_country] => US [patent_app_date] => 2009-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 8714 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12627788 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/627788
Helical sensor for testing a composite medium Nov 29, 2009 Issued
Array ( [id] => 8116043 [patent_doc_number] => 08159243 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-17 [patent_title] => 'Probe tip to device pad alignment in obscured view probing applications' [patent_app_type] => utility [patent_app_number] => 12/617619 [patent_app_country] => US [patent_app_date] => 2009-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 4526 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/159/08159243.pdf [firstpage_image] =>[orig_patent_app_number] => 12617619 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/617619
Probe tip to device pad alignment in obscured view probing applications Nov 11, 2009 Issued
Array ( [id] => 8702148 [patent_doc_number] => 08395372 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-12 [patent_title] => 'Method for measuring current in an electric power distribution system' [patent_app_type] => utility [patent_app_number] => 12/612894 [patent_app_country] => US [patent_app_date] => 2009-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 5776 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 219 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12612894 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/612894
Method for measuring current in an electric power distribution system Nov 4, 2009 Issued
Array ( [id] => 5941392 [patent_doc_number] => 20110102012 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-05 [patent_title] => 'PARAMETER ESTIMATION SYSTEM AND METHOD FOR AN INDUCTION MOTOR' [patent_app_type] => utility [patent_app_number] => 12/611719 [patent_app_country] => US [patent_app_date] => 2009-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4664 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0102/20110102012.pdf [firstpage_image] =>[orig_patent_app_number] => 12611719 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/611719
Parameter estimation system and method for an induction motor Nov 2, 2009 Issued
Array ( [id] => 6241470 [patent_doc_number] => 20100134135 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-03 [patent_title] => 'Semiconductor device test apparatus' [patent_app_type] => utility [patent_app_number] => 12/588901 [patent_app_country] => US [patent_app_date] => 2009-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5067 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0134/20100134135.pdf [firstpage_image] =>[orig_patent_app_number] => 12588901 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/588901
Semiconductor device test apparatus Nov 1, 2009 Abandoned
Array ( [id] => 6426113 [patent_doc_number] => 20100102841 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-29 [patent_title] => 'DEVICE, METHOD AND PROBE FOR INSPECTING SUBSTRATE' [patent_app_type] => utility [patent_app_number] => 12/605859 [patent_app_country] => US [patent_app_date] => 2009-10-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7472 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0102/20100102841.pdf [firstpage_image] =>[orig_patent_app_number] => 12605859 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/605859
DEVICE, METHOD AND PROBE FOR INSPECTING SUBSTRATE Oct 25, 2009 Abandoned
Array ( [id] => 6553982 [patent_doc_number] => 20100127722 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-27 [patent_title] => 'CIS Circuit Test Probe Card' [patent_app_type] => utility [patent_app_number] => 12/579326 [patent_app_country] => US [patent_app_date] => 2009-10-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2622 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0127/20100127722.pdf [firstpage_image] =>[orig_patent_app_number] => 12579326 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/579326
CMOS image sensor test probe card Oct 13, 2009 Issued
Array ( [id] => 6248177 [patent_doc_number] => 20100026330 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-04 [patent_title] => 'TESTBOARD WITH ZIF CONNECTORS, METHOD OF ASSEMBLING, INTEGRATED CIRCUIT TEST SYSTEM AND TEST METHOD INTRODUCED BY THE SAME' [patent_app_type] => utility [patent_app_number] => 12/577195 [patent_app_country] => US [patent_app_date] => 2009-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5261 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0026/20100026330.pdf [firstpage_image] =>[orig_patent_app_number] => 12577195 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/577195
TESTBOARD WITH ZIF CONNECTORS, METHOD OF ASSEMBLING, INTEGRATED CIRCUIT TEST SYSTEM AND TEST METHOD INTRODUCED BY THE SAME Oct 10, 2009 Abandoned
Array ( [id] => 6027791 [patent_doc_number] => 20110080189 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-07 [patent_title] => 'YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING-INTERPOSER' [patent_app_type] => utility [patent_app_number] => 12/574264 [patent_app_country] => US [patent_app_date] => 2009-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5468 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0080/20110080189.pdf [firstpage_image] =>[orig_patent_app_number] => 12574264 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/574264
Yield enhancement for stacked chips through rotationally-connecting-interposer Oct 5, 2009 Issued
Array ( [id] => 6339152 [patent_doc_number] => 20100019790 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'TEST HANDLER HAVING SIZE-CHANGEABLE TEST SITE' [patent_app_type] => utility [patent_app_number] => 12/574395 [patent_app_country] => US [patent_app_date] => 2009-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4509 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019790.pdf [firstpage_image] =>[orig_patent_app_number] => 12574395 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/574395
Test handler having size-changeable test site Oct 5, 2009 Issued
Array ( [id] => 8630682 [patent_doc_number] => 08362759 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-29 [patent_title] => 'Method to predict phase current' [patent_app_type] => utility [patent_app_number] => 12/588095 [patent_app_country] => US [patent_app_date] => 2009-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 6281 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12588095 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/588095
Method to predict phase current Oct 1, 2009 Issued
Array ( [id] => 8306531 [patent_doc_number] => 08228084 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2012-07-24 [patent_title] => 'Systems and methods for self-testing of integrated devices during production' [patent_app_type] => utility [patent_app_number] => 12/569097 [patent_app_country] => US [patent_app_date] => 2009-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2310 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 348 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12569097 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/569097
Systems and methods for self-testing of integrated devices during production Sep 28, 2009 Issued
Array ( [id] => 8283536 [patent_doc_number] => 08217641 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-10 [patent_title] => 'Device and method for reading electric currents resulting from an electromagnetic signal detector' [patent_app_type] => utility [patent_app_number] => 12/568096 [patent_app_country] => US [patent_app_date] => 2009-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 8 [patent_no_of_words] => 5114 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 277 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12568096 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/568096
Device and method for reading electric currents resulting from an electromagnetic signal detector Sep 27, 2009 Issued
Array ( [id] => 6596103 [patent_doc_number] => 20100001756 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-07 [patent_title] => 'ARRAY SUBSTRATE HAVING INCREASED INSPECTION EFFICINCY AND DISPLAY APPARATUS HAVING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/560699 [patent_app_country] => US [patent_app_date] => 2009-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 8526 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20100001756.pdf [firstpage_image] =>[orig_patent_app_number] => 12560699 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/560699
Array substrate having increased inspection efficiency and display apparatus having the same Sep 15, 2009 Issued
Array ( [id] => 8528529 [patent_doc_number] => 08305107 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-06 [patent_title] => 'System for testing a power supply unit' [patent_app_type] => utility [patent_app_number] => 12/557531 [patent_app_country] => US [patent_app_date] => 2009-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2444 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12557531 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/557531
System for testing a power supply unit Sep 10, 2009 Issued
Menu