
Ben M. Rifkin
Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )
| Most Active Art Unit | 2122 |
| Art Unit(s) | 2122, 2129, 2198, 2124, 2123 |
| Total Applications | 534 |
| Issued Applications | 224 |
| Pending Applications | 86 |
| Abandoned Applications | 235 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8876614
[patent_doc_number] => 08471582
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-06-25
[patent_title] => 'Circuit for detecting tier-to-tier couplings in stacked integrated circuit devices'
[patent_app_type] => utility
[patent_app_number] => 12/360244
[patent_app_country] => US
[patent_app_date] => 2009-01-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4463
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12360244
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/360244 | Circuit for detecting tier-to-tier couplings in stacked integrated circuit devices | Jan 26, 2009 | Issued |
Array
(
[id] => 4635165
[patent_doc_number] => 08013621
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-09-06
[patent_title] => 'Inspection method and program for inspecting electrical characteristics of a semiconductor wafer'
[patent_app_type] => utility
[patent_app_number] => 12/358796
[patent_app_country] => US
[patent_app_date] => 2009-01-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 30
[patent_no_of_words] => 12335
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 309
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/013/08013621.pdf
[firstpage_image] =>[orig_patent_app_number] => 12358796
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/358796 | Inspection method and program for inspecting electrical characteristics of a semiconductor wafer | Jan 22, 2009 | Issued |
Array
(
[id] => 8933374
[patent_doc_number] => 08493079
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-07-23
[patent_title] => 'Vehicle seat with capacitive occupant detection system'
[patent_app_type] => utility
[patent_app_number] => 12/865137
[patent_app_country] => US
[patent_app_date] => 2009-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5623
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 541
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12865137
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/865137 | Vehicle seat with capacitive occupant detection system | Jan 20, 2009 | Issued |
Array
(
[id] => 4580116
[patent_doc_number] => 07825677
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-11-02
[patent_title] => 'Test jig for testing a packaged high frequency semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 12/353298
[patent_app_country] => US
[patent_app_date] => 2009-01-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 14
[patent_no_of_words] => 6959
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 370
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/825/07825677.pdf
[firstpage_image] =>[orig_patent_app_number] => 12353298
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/353298 | Test jig for testing a packaged high frequency semiconductor device | Jan 13, 2009 | Issued |
Array
(
[id] => 6636158
[patent_doc_number] => 20100004892
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-07
[patent_title] => 'Method for Measuring PN-Junction Temperature of Light-Emitting Diode (LED)'
[patent_app_type] => utility
[patent_app_number] => 12/353294
[patent_app_country] => US
[patent_app_date] => 2009-01-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 22
[patent_no_of_words] => 6711
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0004/20100004892.pdf
[firstpage_image] =>[orig_patent_app_number] => 12353294
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/353294 | Method for measuring PN-junction temperature of light-emitting diode (LED) | Jan 13, 2009 | Issued |
Array
(
[id] => 6395974
[patent_doc_number] => 20100164533
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-01
[patent_title] => 'METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF OSCILLATOR'
[patent_app_type] => utility
[patent_app_number] => 12/352795
[patent_app_country] => US
[patent_app_date] => 2009-01-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5600
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0164/20100164533.pdf
[firstpage_image] =>[orig_patent_app_number] => 12352795
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/352795 | Method and apparatus for evaluating the effects of stress on an RF oscillator | Jan 12, 2009 | Issued |
Array
(
[id] => 6385989
[patent_doc_number] => 20100176828
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-15
[patent_title] => 'REVERSIBLE TEST PROBE AND TEST PROBE TIP'
[patent_app_type] => utility
[patent_app_number] => 12/351696
[patent_app_country] => US
[patent_app_date] => 2009-01-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3196
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0176/20100176828.pdf
[firstpage_image] =>[orig_patent_app_number] => 12351696
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/351696 | Reversible test probe and test probe tip | Jan 8, 2009 | Issued |
Array
(
[id] => 4640212
[patent_doc_number] => 08018240
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-09-13
[patent_title] => 'Apparatus, circuit and method of monitoring leakage current characteristics'
[patent_app_type] => utility
[patent_app_number] => 12/318799
[patent_app_country] => US
[patent_app_date] => 2009-01-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5674
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/018/08018240.pdf
[firstpage_image] =>[orig_patent_app_number] => 12318799
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/318799 | Apparatus, circuit and method of monitoring leakage current characteristics | Jan 7, 2009 | Issued |
Array
(
[id] => 6521980
[patent_doc_number] => 20100123471
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-05-20
[patent_title] => 'Digital Communications Test System for Multiple Input, Multiple Output (MIMO) Systems'
[patent_app_type] => utility
[patent_app_number] => 12/348992
[patent_app_country] => US
[patent_app_date] => 2009-01-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 8099
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0123/20100123471.pdf
[firstpage_image] =>[orig_patent_app_number] => 12348992
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/348992 | Digital communications test system for multiple input, multiple output (MIMO) systems | Jan 5, 2009 | Issued |
Array
(
[id] => 8115971
[patent_doc_number] => 08159208
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-17
[patent_title] => 'Hand-held microwave spectrum analyzer with operation range from 9 KHz to over 20 GHz'
[patent_app_type] => utility
[patent_app_number] => 12/341758
[patent_app_country] => US
[patent_app_date] => 2008-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 11
[patent_no_of_words] => 8006
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/159/08159208.pdf
[firstpage_image] =>[orig_patent_app_number] => 12341758
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/341758 | Hand-held microwave spectrum analyzer with operation range from 9 KHz to over 20 GHz | Dec 21, 2008 | Issued |
Array
(
[id] => 8933358
[patent_doc_number] => 08493063
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-07-23
[patent_title] => 'Gearbox position sensor and corresponding gearbox'
[patent_app_type] => utility
[patent_app_number] => 12/808198
[patent_app_country] => US
[patent_app_date] => 2008-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 1652
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12808198
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/808198 | Gearbox position sensor and corresponding gearbox | Dec 14, 2008 | Issued |
Array
(
[id] => 8105333
[patent_doc_number] => 08154316
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-10
[patent_title] => 'Method and apparatus for indexing an adjustable test probe tip'
[patent_app_type] => utility
[patent_app_number] => 12/333096
[patent_app_country] => US
[patent_app_date] => 2008-12-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 11
[patent_no_of_words] => 3962
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 118
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/154/08154316.pdf
[firstpage_image] =>[orig_patent_app_number] => 12333096
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/333096 | Method and apparatus for indexing an adjustable test probe tip | Dec 10, 2008 | Issued |
Array
(
[id] => 4528169
[patent_doc_number] => 07952364
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-05-31
[patent_title] => 'Power noise detecting device and power noise control device using the same'
[patent_app_type] => utility
[patent_app_number] => 12/332294
[patent_app_country] => US
[patent_app_date] => 2008-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 2846
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/952/07952364.pdf
[firstpage_image] =>[orig_patent_app_number] => 12332294
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/332294 | Power noise detecting device and power noise control device using the same | Dec 9, 2008 | Issued |
Array
(
[id] => 4533721
[patent_doc_number] => 07924037
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-12
[patent_title] => 'Inspection apparatus comprising means for removing flux'
[patent_app_type] => utility
[patent_app_number] => 12/330092
[patent_app_country] => US
[patent_app_date] => 2008-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 45
[patent_no_of_words] => 6470
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 354
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/924/07924037.pdf
[firstpage_image] =>[orig_patent_app_number] => 12330092
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/330092 | Inspection apparatus comprising means for removing flux | Dec 7, 2008 | Issued |
Array
(
[id] => 8116045
[patent_doc_number] => 08159244
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-17
[patent_title] => 'Method and system for testing a semiconductor package'
[patent_app_type] => utility
[patent_app_number] => 12/276496
[patent_app_country] => US
[patent_app_date] => 2008-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 2817
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 175
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/159/08159244.pdf
[firstpage_image] =>[orig_patent_app_number] => 12276496
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/276496 | Method and system for testing a semiconductor package | Nov 23, 2008 | Issued |
Array
(
[id] => 8375994
[patent_doc_number] => 08258790
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-09-04
[patent_title] => 'Oscillator sensor for determining a property of an earth formation'
[patent_app_type] => utility
[patent_app_number] => 12/274414
[patent_app_country] => US
[patent_app_date] => 2008-11-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 23
[patent_no_of_words] => 5399
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 128
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12274414
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/274414 | Oscillator sensor for determining a property of an earth formation | Nov 19, 2008 | Issued |
Array
(
[id] => 5562011
[patent_doc_number] => 20090134863
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-05-28
[patent_title] => 'ELECTRICITY METER'
[patent_app_type] => utility
[patent_app_number] => 12/274693
[patent_app_country] => US
[patent_app_date] => 2008-11-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4273
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0134/20090134863.pdf
[firstpage_image] =>[orig_patent_app_number] => 12274693
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/274693 | Electricity meter capable of minimizing the risk of data destruction from lightning or surge | Nov 19, 2008 | Issued |
Array
(
[id] => 4533719
[patent_doc_number] => 07924036
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-12
[patent_title] => 'Contactor assembly for integrated circuit testing'
[patent_app_type] => utility
[patent_app_number] => 12/269894
[patent_app_country] => US
[patent_app_date] => 2008-11-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 3292
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 173
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/924/07924036.pdf
[firstpage_image] =>[orig_patent_app_number] => 12269894
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/269894 | Contactor assembly for integrated circuit testing | Nov 12, 2008 | Issued |
Array
(
[id] => 5320458
[patent_doc_number] => 20090058448
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-05
[patent_title] => 'PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS'
[patent_app_type] => utility
[patent_app_number] => 12/265493
[patent_app_country] => US
[patent_app_date] => 2008-11-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 6932
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0058/20090058448.pdf
[firstpage_image] =>[orig_patent_app_number] => 12265493
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/265493 | Parallel scan distributors and collectors and process of testing integrated circuits | Nov 4, 2008 | Issued |
Array
(
[id] => 5276009
[patent_doc_number] => 20090128141
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-05-21
[patent_title] => 'Position Sensor for a Downhole Completion Device'
[patent_app_type] => utility
[patent_app_number] => 12/264318
[patent_app_country] => US
[patent_app_date] => 2008-11-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 6170
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0128/20090128141.pdf
[firstpage_image] =>[orig_patent_app_number] => 12264318
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/264318 | Position sensor for a downhole completion device | Nov 3, 2008 | Issued |