
Ben M. Rifkin
Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )
| Most Active Art Unit | 2122 |
| Art Unit(s) | 2122, 2129, 2198, 2124, 2123 |
| Total Applications | 534 |
| Issued Applications | 224 |
| Pending Applications | 86 |
| Abandoned Applications | 235 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5300765
[patent_doc_number] => 20090295417
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-12-03
[patent_title] => 'TEST SYSTEM, ELECTRONIC DEVICE, AND TEST APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/257396
[patent_app_country] => US
[patent_app_date] => 2008-10-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 9160
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0295/20090295417.pdf
[firstpage_image] =>[orig_patent_app_number] => 12257396
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/257396 | Test system, electronic device, and test apparatus | Oct 23, 2008 | Issued |
Array
(
[id] => 5282802
[patent_doc_number] => 20090096476
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-16
[patent_title] => 'Method of inspecting semiconductor circuit having logic circuit as inspection circuit'
[patent_app_type] => utility
[patent_app_number] => 12/285597
[patent_app_country] => US
[patent_app_date] => 2008-10-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 8252
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[pdf_file] => publications/A1/0096/20090096476.pdf
[firstpage_image] =>[orig_patent_app_number] => 12285597
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/285597 | Method of inspecting semiconductor circuit having logic circuit as inspection circuit | Oct 8, 2008 | Abandoned |
Array
(
[id] => 6361543
[patent_doc_number] => 20100079160
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-04-01
[patent_title] => 'Probe Interface for electrostatic discharge testing of an integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 12/240393
[patent_app_country] => US
[patent_app_date] => 2008-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 7590
[patent_no_of_claims] => 27
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[pdf_file] => publications/A1/0079/20100079160.pdf
[firstpage_image] =>[orig_patent_app_number] => 12240393
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/240393 | Probe interface for electrostatic discharge testing of an integrated circuit | Sep 28, 2008 | Issued |
Array
(
[id] => 5395515
[patent_doc_number] => 20090315578
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-12-24
[patent_title] => 'PROBE AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/237698
[patent_app_country] => US
[patent_app_date] => 2008-09-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2297
[patent_no_of_claims] => 23
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[pdf_file] => publications/A1/0315/20090315578.pdf
[firstpage_image] =>[orig_patent_app_number] => 12237698
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/237698 | PROBE AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAME | Sep 24, 2008 | Abandoned |
Array
(
[id] => 4554492
[patent_doc_number] => 07960984
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-06-14
[patent_title] => 'Semiconductor device having ESD protection circuit and method of testing the same'
[patent_app_type] => utility
[patent_app_number] => 12/232592
[patent_app_country] => US
[patent_app_date] => 2008-09-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 5192
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/960/07960984.pdf
[firstpage_image] =>[orig_patent_app_number] => 12232592
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/232592 | Semiconductor device having ESD protection circuit and method of testing the same | Sep 18, 2008 | Issued |
Array
(
[id] => 5269076
[patent_doc_number] => 20090072851
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-19
[patent_title] => 'Multi-Pivot Probe Card For Testing Semiconductor Devices'
[patent_app_type] => utility
[patent_app_number] => 12/208223
[patent_app_country] => US
[patent_app_date] => 2008-09-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 2999
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[pdf_file] => publications/A1/0072/20090072851.pdf
[firstpage_image] =>[orig_patent_app_number] => 12208223
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/208223 | Multi-Pivot Probe Card For Testing Semiconductor Devices | Sep 9, 2008 | Abandoned |
Array
(
[id] => 6378355
[patent_doc_number] => 20100301836
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-12-02
[patent_title] => 'DEVICE FOR MEASURING THE INTENSITY OF AN ELECTRIC CURRENT AND ELECTRIC APPLIANCE INCLUDING SUCH DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/676751
[patent_app_country] => US
[patent_app_date] => 2008-09-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3470
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
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[pdf_file] => publications/A1/0301/20100301836.pdf
[firstpage_image] =>[orig_patent_app_number] => 12676751
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/676751 | Device for measuring the intensity of an electric current and electric appliance including such device | Sep 8, 2008 | Issued |
Array
(
[id] => 4630027
[patent_doc_number] => 08008929
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-08-30
[patent_title] => 'Method and apparatus for measuring a lifetime of charge carriers'
[patent_app_type] => utility
[patent_app_number] => 12/670080
[patent_app_country] => US
[patent_app_date] => 2008-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 11299
[patent_no_of_claims] => 23
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/008/08008929.pdf
[firstpage_image] =>[orig_patent_app_number] => 12670080
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/670080 | Method and apparatus for measuring a lifetime of charge carriers | Sep 7, 2008 | Issued |
Array
(
[id] => 8921695
[patent_doc_number] => 08487636
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-07-16
[patent_title] => 'Malfunction determining apparatus and malfunction determining method for charging system'
[patent_app_type] => utility
[patent_app_number] => 12/674588
[patent_app_country] => US
[patent_app_date] => 2008-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[patent_no_of_words] => 9311
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12674588
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/674588 | Malfunction determining apparatus and malfunction determining method for charging system | Sep 1, 2008 | Issued |
Array
(
[id] => 8178643
[patent_doc_number] => 08179122
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-05-15
[patent_title] => 'Current/voltage detection printed board and current/voltage detector'
[patent_app_type] => utility
[patent_app_number] => 12/201295
[patent_app_country] => US
[patent_app_date] => 2008-08-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 80
[patent_no_of_words] => 17416
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 5
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/179/08179122.pdf
[firstpage_image] =>[orig_patent_app_number] => 12201295
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/201295 | Current/voltage detection printed board and current/voltage detector | Aug 28, 2008 | Issued |
Array
(
[id] => 5320457
[patent_doc_number] => 20090058447
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-05
[patent_title] => 'FAULT ANALYZER'
[patent_app_type] => utility
[patent_app_number] => 12/199497
[patent_app_country] => US
[patent_app_date] => 2008-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => publications/A1/0058/20090058447.pdf
[firstpage_image] =>[orig_patent_app_number] => 12199497
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/199497 | FAULT ANALYZER | Aug 26, 2008 | Abandoned |
Array
(
[id] => 4947415
[patent_doc_number] => 20080303541
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-11
[patent_title] => 'Method and Apparatus For Increasing Operating Frequency Of A System For Testing Electronic Devices'
[patent_app_type] => utility
[patent_app_number] => 12/194423
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[pdf_file] => publications/A1/0303/20080303541.pdf
[firstpage_image] =>[orig_patent_app_number] => 12194423
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/194423 | Method and apparatus for increasing operating frequency of a system for testing electronic devices | Aug 18, 2008 | Issued |
Array
(
[id] => 6131559
[patent_doc_number] => 20110006757
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-01-13
[patent_title] => 'LINEAR SEGMENT OR REVOLUTION COUNTER WITH A FERROMAGNETIC ELEMENT'
[patent_app_type] => utility
[patent_app_number] => 12/673581
[patent_app_country] => US
[patent_app_date] => 2008-08-07
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[pdf_file] => publications/A1/0006/20110006757.pdf
[firstpage_image] =>[orig_patent_app_number] => 12673581
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/673581 | Linear segment or revolution counter with a ferromagnetic element | Aug 6, 2008 | Issued |
Array
(
[id] => 9704815
[patent_doc_number] => 08829889
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-09-09
[patent_title] => 'Laser-protective wall element for a housing in laser machining stations'
[patent_app_type] => utility
[patent_app_number] => 12/672428
[patent_app_country] => US
[patent_app_date] => 2008-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12672428
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/672428 | Laser-protective wall element for a housing in laser machining stations | Aug 6, 2008 | Issued |
Array
(
[id] => 5413993
[patent_doc_number] => 20090039880
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-12
[patent_title] => 'Electric current detector having detector element holder coupled to magnetic core casing'
[patent_app_type] => utility
[patent_app_number] => 12/222194
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[firstpage_image] =>[orig_patent_app_number] => 12222194
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/222194 | Electric current detector having detector element holder coupled to magnetic core casing | Aug 4, 2008 | Abandoned |
Array
(
[id] => 4776464
[patent_doc_number] => 20080284462
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-11-20
[patent_title] => 'MECHANICAL STRESS CHARACTERIZATION IN SEMICONDUCTOR DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/181566
[patent_app_country] => US
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[pdf_file] => publications/A1/0284/20080284462.pdf
[firstpage_image] =>[orig_patent_app_number] => 12181566
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/181566 | Mechanical stress characterization in semiconductor device | Jul 28, 2008 | Issued |
Array
(
[id] => 212030
[patent_doc_number] => 07622937
[patent_country] => US
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[patent_issue_date] => 2009-11-24
[patent_title] => 'Electrical signal connector'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/180695 | Electrical signal connector | Jul 27, 2008 | Issued |
Array
(
[id] => 6265312
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[patent_issue_date] => 2010-10-07
[patent_title] => 'LEAK DETECTOR COMPRISING A POSITION DETERMINING SYSTEM FOR THE HAND-OPERATED PROBE'
[patent_app_type] => utility
[patent_app_number] => 12/670939
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/670939 | Leak detector comprising a position determining system for the hand-operated probe | Jul 27, 2008 | Issued |
Array
(
[id] => 6457671
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[patent_title] => 'CIRCUIT AND METHOD FOR TESTING ELECTRICALLY CONTROLLABLE POWER SWITCHES FOR ACTIVATING OCCUPANT PROTECTION MEANS'
[patent_app_type] => utility
[patent_app_number] => 12/733712
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[patent_app_date] => 2008-07-22
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/733712 | CIRCUIT AND METHOD FOR TESTING ELECTRICALLY CONTROLLABLE POWER SWITCHES FOR ACTIVATING OCCUPANT PROTECTION MEANS | Jul 21, 2008 | Abandoned |
Array
(
[id] => 4500677
[patent_doc_number] => 07948252
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[patent_issue_date] => 2011-05-24
[patent_title] => 'Multilayered probe card'
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[pdf_file] => patents/07/948/07948252.pdf
[firstpage_image] =>[orig_patent_app_number] => 12173695
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/173695 | Multilayered probe card | Jul 14, 2008 | Issued |