Search

Ben M. Rifkin

Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )

Most Active Art Unit
2122
Art Unit(s)
2122, 2129, 2198, 2124, 2123
Total Applications
534
Issued Applications
224
Pending Applications
86
Abandoned Applications
235

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5300765 [patent_doc_number] => 20090295417 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-03 [patent_title] => 'TEST SYSTEM, ELECTRONIC DEVICE, AND TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/257396 [patent_app_country] => US [patent_app_date] => 2008-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 9160 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20090295417.pdf [firstpage_image] =>[orig_patent_app_number] => 12257396 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/257396
Test system, electronic device, and test apparatus Oct 23, 2008 Issued
Array ( [id] => 5282802 [patent_doc_number] => 20090096476 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-16 [patent_title] => 'Method of inspecting semiconductor circuit having logic circuit as inspection circuit' [patent_app_type] => utility [patent_app_number] => 12/285597 [patent_app_country] => US [patent_app_date] => 2008-10-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8252 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0096/20090096476.pdf [firstpage_image] =>[orig_patent_app_number] => 12285597 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/285597
Method of inspecting semiconductor circuit having logic circuit as inspection circuit Oct 8, 2008 Abandoned
Array ( [id] => 6361543 [patent_doc_number] => 20100079160 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-01 [patent_title] => 'Probe Interface for electrostatic discharge testing of an integrated circuit' [patent_app_type] => utility [patent_app_number] => 12/240393 [patent_app_country] => US [patent_app_date] => 2008-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7590 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20100079160.pdf [firstpage_image] =>[orig_patent_app_number] => 12240393 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/240393
Probe interface for electrostatic discharge testing of an integrated circuit Sep 28, 2008 Issued
Array ( [id] => 5395515 [patent_doc_number] => 20090315578 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-24 [patent_title] => 'PROBE AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/237698 [patent_app_country] => US [patent_app_date] => 2008-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2297 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20090315578.pdf [firstpage_image] =>[orig_patent_app_number] => 12237698 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/237698
PROBE AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAME Sep 24, 2008 Abandoned
Array ( [id] => 4554492 [patent_doc_number] => 07960984 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-06-14 [patent_title] => 'Semiconductor device having ESD protection circuit and method of testing the same' [patent_app_type] => utility [patent_app_number] => 12/232592 [patent_app_country] => US [patent_app_date] => 2008-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 5192 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/960/07960984.pdf [firstpage_image] =>[orig_patent_app_number] => 12232592 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/232592
Semiconductor device having ESD protection circuit and method of testing the same Sep 18, 2008 Issued
Array ( [id] => 5269076 [patent_doc_number] => 20090072851 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-19 [patent_title] => 'Multi-Pivot Probe Card For Testing Semiconductor Devices' [patent_app_type] => utility [patent_app_number] => 12/208223 [patent_app_country] => US [patent_app_date] => 2008-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2999 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20090072851.pdf [firstpage_image] =>[orig_patent_app_number] => 12208223 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/208223
Multi-Pivot Probe Card For Testing Semiconductor Devices Sep 9, 2008 Abandoned
Array ( [id] => 6378355 [patent_doc_number] => 20100301836 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-02 [patent_title] => 'DEVICE FOR MEASURING THE INTENSITY OF AN ELECTRIC CURRENT AND ELECTRIC APPLIANCE INCLUDING SUCH DEVICE' [patent_app_type] => utility [patent_app_number] => 12/676751 [patent_app_country] => US [patent_app_date] => 2008-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3470 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0301/20100301836.pdf [firstpage_image] =>[orig_patent_app_number] => 12676751 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/676751
Device for measuring the intensity of an electric current and electric appliance including such device Sep 8, 2008 Issued
Array ( [id] => 4630027 [patent_doc_number] => 08008929 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-30 [patent_title] => 'Method and apparatus for measuring a lifetime of charge carriers' [patent_app_type] => utility [patent_app_number] => 12/670080 [patent_app_country] => US [patent_app_date] => 2008-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 11299 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/008/08008929.pdf [firstpage_image] =>[orig_patent_app_number] => 12670080 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/670080
Method and apparatus for measuring a lifetime of charge carriers Sep 7, 2008 Issued
Array ( [id] => 8921695 [patent_doc_number] => 08487636 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-07-16 [patent_title] => 'Malfunction determining apparatus and malfunction determining method for charging system' [patent_app_type] => utility [patent_app_number] => 12/674588 [patent_app_country] => US [patent_app_date] => 2008-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9311 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12674588 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/674588
Malfunction determining apparatus and malfunction determining method for charging system Sep 1, 2008 Issued
Array ( [id] => 8178643 [patent_doc_number] => 08179122 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-05-15 [patent_title] => 'Current/voltage detection printed board and current/voltage detector' [patent_app_type] => utility [patent_app_number] => 12/201295 [patent_app_country] => US [patent_app_date] => 2008-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 80 [patent_no_of_words] => 17416 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/179/08179122.pdf [firstpage_image] =>[orig_patent_app_number] => 12201295 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/201295
Current/voltage detection printed board and current/voltage detector Aug 28, 2008 Issued
Array ( [id] => 5320457 [patent_doc_number] => 20090058447 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-05 [patent_title] => 'FAULT ANALYZER' [patent_app_type] => utility [patent_app_number] => 12/199497 [patent_app_country] => US [patent_app_date] => 2008-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4794 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0058/20090058447.pdf [firstpage_image] =>[orig_patent_app_number] => 12199497 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/199497
FAULT ANALYZER Aug 26, 2008 Abandoned
Array ( [id] => 4947415 [patent_doc_number] => 20080303541 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-11 [patent_title] => 'Method and Apparatus For Increasing Operating Frequency Of A System For Testing Electronic Devices' [patent_app_type] => utility [patent_app_number] => 12/194423 [patent_app_country] => US [patent_app_date] => 2008-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7076 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0303/20080303541.pdf [firstpage_image] =>[orig_patent_app_number] => 12194423 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/194423
Method and apparatus for increasing operating frequency of a system for testing electronic devices Aug 18, 2008 Issued
Array ( [id] => 6131559 [patent_doc_number] => 20110006757 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-13 [patent_title] => 'LINEAR SEGMENT OR REVOLUTION COUNTER WITH A FERROMAGNETIC ELEMENT' [patent_app_type] => utility [patent_app_number] => 12/673581 [patent_app_country] => US [patent_app_date] => 2008-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4083 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20110006757.pdf [firstpage_image] =>[orig_patent_app_number] => 12673581 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/673581
Linear segment or revolution counter with a ferromagnetic element Aug 6, 2008 Issued
Array ( [id] => 9704815 [patent_doc_number] => 08829889 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-09-09 [patent_title] => 'Laser-protective wall element for a housing in laser machining stations' [patent_app_type] => utility [patent_app_number] => 12/672428 [patent_app_country] => US [patent_app_date] => 2008-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2964 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12672428 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/672428
Laser-protective wall element for a housing in laser machining stations Aug 6, 2008 Issued
Array ( [id] => 5413993 [patent_doc_number] => 20090039880 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-12 [patent_title] => 'Electric current detector having detector element holder coupled to magnetic core casing' [patent_app_type] => utility [patent_app_number] => 12/222194 [patent_app_country] => US [patent_app_date] => 2008-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2512 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20090039880.pdf [firstpage_image] =>[orig_patent_app_number] => 12222194 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/222194
Electric current detector having detector element holder coupled to magnetic core casing Aug 4, 2008 Abandoned
Array ( [id] => 4776464 [patent_doc_number] => 20080284462 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-20 [patent_title] => 'MECHANICAL STRESS CHARACTERIZATION IN SEMICONDUCTOR DEVICE' [patent_app_type] => utility [patent_app_number] => 12/181566 [patent_app_country] => US [patent_app_date] => 2008-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 3151 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20080284462.pdf [firstpage_image] =>[orig_patent_app_number] => 12181566 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/181566
Mechanical stress characterization in semiconductor device Jul 28, 2008 Issued
Array ( [id] => 212030 [patent_doc_number] => 07622937 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-24 [patent_title] => 'Electrical signal connector' [patent_app_type] => utility [patent_app_number] => 12/180695 [patent_app_country] => US [patent_app_date] => 2008-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 4782 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 450 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/622/07622937.pdf [firstpage_image] =>[orig_patent_app_number] => 12180695 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/180695
Electrical signal connector Jul 27, 2008 Issued
Array ( [id] => 6265312 [patent_doc_number] => 20100253376 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-07 [patent_title] => 'LEAK DETECTOR COMPRISING A POSITION DETERMINING SYSTEM FOR THE HAND-OPERATED PROBE' [patent_app_type] => utility [patent_app_number] => 12/670939 [patent_app_country] => US [patent_app_date] => 2008-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2400 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0253/20100253376.pdf [firstpage_image] =>[orig_patent_app_number] => 12670939 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/670939
Leak detector comprising a position determining system for the hand-operated probe Jul 27, 2008 Issued
Array ( [id] => 6457671 [patent_doc_number] => 20100280815 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-04 [patent_title] => 'CIRCUIT AND METHOD FOR TESTING ELECTRICALLY CONTROLLABLE POWER SWITCHES FOR ACTIVATING OCCUPANT PROTECTION MEANS' [patent_app_type] => utility [patent_app_number] => 12/733712 [patent_app_country] => US [patent_app_date] => 2008-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2550 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0280/20100280815.pdf [firstpage_image] =>[orig_patent_app_number] => 12733712 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/733712
CIRCUIT AND METHOD FOR TESTING ELECTRICALLY CONTROLLABLE POWER SWITCHES FOR ACTIVATING OCCUPANT PROTECTION MEANS Jul 21, 2008 Abandoned
Array ( [id] => 4500677 [patent_doc_number] => 07948252 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-24 [patent_title] => 'Multilayered probe card' [patent_app_type] => utility [patent_app_number] => 12/173695 [patent_app_country] => US [patent_app_date] => 2008-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 47 [patent_no_of_words] => 14864 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/948/07948252.pdf [firstpage_image] =>[orig_patent_app_number] => 12173695 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/173695
Multilayered probe card Jul 14, 2008 Issued
Menu