
Ben M. Rifkin
Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )
| Most Active Art Unit | 2122 |
| Art Unit(s) | 2122, 2129, 2198, 2124, 2123 |
| Total Applications | 534 |
| Issued Applications | 224 |
| Pending Applications | 86 |
| Abandoned Applications | 235 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 203666
[patent_doc_number] => 07633304
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-12-15
[patent_title] => 'Device for testing electronic components, in particular ICs, having a sealing board arranged inside a pressure test chamber'
[patent_app_type] => utility
[patent_app_number] => 12/169899
[patent_app_country] => US
[patent_app_date] => 2008-07-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3762
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 228
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/633/07633304.pdf
[firstpage_image] =>[orig_patent_app_number] => 12169899
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/169899 | Device for testing electronic components, in particular ICs, having a sealing board arranged inside a pressure test chamber | Jul 8, 2008 | Issued |
Array
(
[id] => 5489
[patent_doc_number] => 07816933
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-10-19
[patent_title] => 'Semi-generic in-circuit test fixture'
[patent_app_type] => utility
[patent_app_number] => 12/168397
[patent_app_country] => US
[patent_app_date] => 2008-07-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4381
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 613
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/816/07816933.pdf
[firstpage_image] =>[orig_patent_app_number] => 12168397
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/168397 | Semi-generic in-circuit test fixture | Jul 6, 2008 | Issued |
Array
(
[id] => 6419487
[patent_doc_number] => 20100277158
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-11-04
[patent_title] => 'DELAY TIME MEASUREMENT CIRCUIT AND METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/664807
[patent_app_country] => US
[patent_app_date] => 2008-06-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 8071
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0277/20100277158.pdf
[firstpage_image] =>[orig_patent_app_number] => 12664807
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/664807 | DELAY TIME MEASUREMENT CIRCUIT AND METHOD | Jun 16, 2008 | Abandoned |
Array
(
[id] => 9649489
[patent_doc_number] => 08803511
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-08-12
[patent_title] => 'Gearbox position detection'
[patent_app_type] => utility
[patent_app_number] => 12/664508
[patent_app_country] => US
[patent_app_date] => 2008-06-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 2588
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12664508
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/664508 | Gearbox position detection | Jun 11, 2008 | Issued |
Array
(
[id] => 212005
[patent_doc_number] => 07622912
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-11-24
[patent_title] => 'Method for enabling monitoring of power consumption'
[patent_app_type] => utility
[patent_app_number] => 12/136698
[patent_app_country] => US
[patent_app_date] => 2008-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 15
[patent_no_of_words] => 3018
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 157
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/622/07622912.pdf
[firstpage_image] =>[orig_patent_app_number] => 12136698
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/136698 | Method for enabling monitoring of power consumption | Jun 9, 2008 | Issued |
Array
(
[id] => 5365271
[patent_doc_number] => 20090302830
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-12-10
[patent_title] => 'INTEGRATED POWER DETECTOR WITH TEMPERATURE COMPENSATION FOR FULLY-CLOSED LOOP CONTROL'
[patent_app_type] => utility
[patent_app_number] => 12/133297
[patent_app_country] => US
[patent_app_date] => 2008-06-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3081
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0302/20090302830.pdf
[firstpage_image] =>[orig_patent_app_number] => 12133297
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/133297 | Integrated power detector with temperature compensation for fully-closed loop control | Jun 3, 2008 | Issued |
Array
(
[id] => 4497084
[patent_doc_number] => 07956637
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-06-07
[patent_title] => 'System and method to determine electric motor efficiency using an equivalent circuit'
[patent_app_type] => utility
[patent_app_number] => 12/132194
[patent_app_country] => US
[patent_app_date] => 2008-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 7357
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 175
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/956/07956637.pdf
[firstpage_image] =>[orig_patent_app_number] => 12132194
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/132194 | System and method to determine electric motor efficiency using an equivalent circuit | Jun 2, 2008 | Issued |
Array
(
[id] => 4789914
[patent_doc_number] => 20080290887
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-11-27
[patent_title] => 'Testing method for semiconductor device having ball-shaped external electrode'
[patent_app_type] => utility
[patent_app_number] => 12/154196
[patent_app_country] => US
[patent_app_date] => 2008-05-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 3383
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0290/20080290887.pdf
[firstpage_image] =>[orig_patent_app_number] => 12154196
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/154196 | Testing method for semiconductor device having ball-shaped external electrode | May 20, 2008 | Issued |
Array
(
[id] => 10864800
[patent_doc_number] => 08890508
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-11-18
[patent_title] => 'Adaptive filters for fiber optic sensors'
[patent_app_type] => utility
[patent_app_number] => 12/598651
[patent_app_country] => US
[patent_app_date] => 2008-05-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 5412
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12598651
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/598651 | Adaptive filters for fiber optic sensors | May 1, 2008 | Issued |
Array
(
[id] => 9497426
[patent_doc_number] => 08736248
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-05-27
[patent_title] => 'Detection circuit and a method for detecting a wrong supply voltage'
[patent_app_type] => utility
[patent_app_number] => 12/677371
[patent_app_country] => US
[patent_app_date] => 2008-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 3164
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12677371
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/677371 | Detection circuit and a method for detecting a wrong supply voltage | Apr 29, 2008 | Issued |
Array
(
[id] => 8116037
[patent_doc_number] => 08159241
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2012-04-17
[patent_title] => 'Method and apparatus for on-chip adjustment of chip characteristics'
[patent_app_type] => utility
[patent_app_number] => 12/107466
[patent_app_country] => US
[patent_app_date] => 2008-04-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 3732
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 184
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/159/08159241.pdf
[firstpage_image] =>[orig_patent_app_number] => 12107466
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/107466 | Method and apparatus for on-chip adjustment of chip characteristics | Apr 21, 2008 | Issued |
Array
(
[id] => 6106845
[patent_doc_number] => 20110187400
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-08-04
[patent_title] => 'SEMICONDUCTOR TEST APPARATUS AND TEST METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/599957
[patent_app_country] => US
[patent_app_date] => 2008-04-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 7479
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0187/20110187400.pdf
[firstpage_image] =>[orig_patent_app_number] => 12599957
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/599957 | Semiconductor test apparatus and test method | Apr 13, 2008 | Issued |
Array
(
[id] => 4857070
[patent_doc_number] => 20080265920
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-10-30
[patent_title] => 'PROBE CARD'
[patent_app_type] => utility
[patent_app_number] => 12/102192
[patent_app_country] => US
[patent_app_date] => 2008-04-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3351
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0265/20080265920.pdf
[firstpage_image] =>[orig_patent_app_number] => 12102192
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/102192 | PROBE CARD | Apr 13, 2008 | Abandoned |
Array
(
[id] => 4958372
[patent_doc_number] => 20080272796
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-11-06
[patent_title] => 'PROBE ASSEMBLY'
[patent_app_type] => utility
[patent_app_number] => 12/101798
[patent_app_country] => US
[patent_app_date] => 2008-04-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4027
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0272/20080272796.pdf
[firstpage_image] =>[orig_patent_app_number] => 12101798
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/101798 | PROBE ASSEMBLY | Apr 10, 2008 | Abandoned |
Array
(
[id] => 4680277
[patent_doc_number] => 20080246503
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-10-09
[patent_title] => 'Method of testing a semiconductor integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 12/078699
[patent_app_country] => US
[patent_app_date] => 2008-04-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4376
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0246/20080246503.pdf
[firstpage_image] =>[orig_patent_app_number] => 12078699
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/078699 | Method of testing a semiconductor integrated circuit | Apr 2, 2008 | Abandoned |
Array
(
[id] => 5443
[patent_doc_number] => 07816906
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-10-19
[patent_title] => 'Method for determining anisotropy of 1-D conductor or semiconductor synthesis'
[patent_app_type] => utility
[patent_app_number] => 12/060777
[patent_app_country] => US
[patent_app_date] => 2008-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2615
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/816/07816906.pdf
[firstpage_image] =>[orig_patent_app_number] => 12060777
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/060777 | Method for determining anisotropy of 1-D conductor or semiconductor synthesis | Mar 31, 2008 | Issued |
Array
(
[id] => 83110
[patent_doc_number] => 07746057
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-06-29
[patent_title] => 'Power meter having complex quadrature output current and voltage filters'
[patent_app_type] => utility
[patent_app_number] => 12/057498
[patent_app_country] => US
[patent_app_date] => 2008-03-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2884
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 156
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/746/07746057.pdf
[firstpage_image] =>[orig_patent_app_number] => 12057498
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/057498 | Power meter having complex quadrature output current and voltage filters | Mar 27, 2008 | Issued |
Array
(
[id] => 8653656
[patent_doc_number] => 08373407
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-02-12
[patent_title] => 'Intelligent electronic device having improved analog output resolution'
[patent_app_type] => utility
[patent_app_number] => 12/055493
[patent_app_country] => US
[patent_app_date] => 2008-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 13
[patent_no_of_words] => 5758
[patent_no_of_claims] => 40
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 168
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12055493
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/055493 | Intelligent electronic device having improved analog output resolution | Mar 25, 2008 | Issued |
Array
(
[id] => 6146193
[patent_doc_number] => 20110018561
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-01-27
[patent_title] => 'CAPACITIVE SENSOR HAVING CYCLIC AND ABSOLUTE ELECTRODE SETS'
[patent_app_type] => utility
[patent_app_number] => 12/922315
[patent_app_country] => US
[patent_app_date] => 2008-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5899
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0018/20110018561.pdf
[firstpage_image] =>[orig_patent_app_number] => 12922315
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/922315 | CAPACITIVE SENSOR HAVING CYCLIC AND ABSOLUTE ELECTRODE SETS | Mar 25, 2008 | Abandoned |
Array
(
[id] => 4763117
[patent_doc_number] => 20080174327
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-24
[patent_title] => 'ELECTRIC SIGNAL CONNECTING DEVICE AND PROBE ASSEMBLY AND PROBING DEVICE USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/053282
[patent_app_country] => US
[patent_app_date] => 2008-03-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 58
[patent_figures_cnt] => 58
[patent_no_of_words] => 23199
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0174/20080174327.pdf
[firstpage_image] =>[orig_patent_app_number] => 12053282
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/053282 | Electric signal connecting device and probe assembly and probing device using the same | Mar 20, 2008 | Issued |