
Ben M. Rifkin
Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )
| Most Active Art Unit | 2122 |
| Art Unit(s) | 2122, 2129, 2198, 2124, 2123 |
| Total Applications | 534 |
| Issued Applications | 224 |
| Pending Applications | 86 |
| Abandoned Applications | 235 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5499848
[patent_doc_number] => 20090160536
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-06-25
[patent_title] => 'ELECTRONIC DEVICE, LOAD FLUCTUATION COMPENSATION CIRCUIT, POWER SUPPLY, AND TEST APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/049394
[patent_app_country] => US
[patent_app_date] => 2008-03-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 9923
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 4
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0160/20090160536.pdf
[firstpage_image] =>[orig_patent_app_number] => 12049394
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/049394 | Electronic device, load fluctuation compensation circuit, power supply, and test apparatus | Mar 16, 2008 | Issued |
Array
(
[id] => 5328385
[patent_doc_number] => 20090108862
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-30
[patent_title] => 'Testing system module'
[patent_app_type] => utility
[patent_app_number] => 12/045711
[patent_app_country] => US
[patent_app_date] => 2008-03-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2252
[patent_no_of_claims] => 23
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[pdf_file] => publications/A1/0108/20090108862.pdf
[firstpage_image] =>[orig_patent_app_number] => 12045711
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/045711 | Testing system module | Mar 10, 2008 | Abandoned |
Array
(
[id] => 4466188
[patent_doc_number] => 07936177
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-05-03
[patent_title] => 'Providing an electrically conductive wall structure adjacent a contact structure of an electronic device'
[patent_app_type] => utility
[patent_app_number] => 12/044893
[patent_app_country] => US
[patent_app_date] => 2008-03-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 20
[patent_no_of_words] => 13571
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 3
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/936/07936177.pdf
[firstpage_image] =>[orig_patent_app_number] => 12044893
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/044893 | Providing an electrically conductive wall structure adjacent a contact structure of an electronic device | Mar 6, 2008 | Issued |
Array
(
[id] => 349338
[patent_doc_number] => 07495457
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-02-24
[patent_title] => 'Semiconductor device evaluation method and apparatus using the same'
[patent_app_type] => utility
[patent_app_number] => 12/042195
[patent_app_country] => US
[patent_app_date] => 2008-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 6901
[patent_no_of_claims] => 6
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[pdf_file] => patents/07/495/07495457.pdf
[firstpage_image] =>[orig_patent_app_number] => 12042195
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/042195 | Semiconductor device evaluation method and apparatus using the same | Mar 3, 2008 | Issued |
Array
(
[id] => 4815896
[patent_doc_number] => 20080223155
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-09-18
[patent_title] => 'Probe assembly for lapping bar using patterned probe'
[patent_app_type] => utility
[patent_app_number] => 12/073174
[patent_app_country] => US
[patent_app_date] => 2008-02-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 4913
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[pdf_file] => publications/A1/0223/20080223155.pdf
[firstpage_image] =>[orig_patent_app_number] => 12073174
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/073174 | Probe assembly for lapping a bar using a patterned probe | Feb 28, 2008 | Issued |
Array
(
[id] => 4554480
[patent_doc_number] => 07960982
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-06-14
[patent_title] => 'Supply current based testing of CMOS output stages'
[patent_app_type] => utility
[patent_app_number] => 12/074081
[patent_app_country] => US
[patent_app_date] => 2008-02-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 2299
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/960/07960982.pdf
[firstpage_image] =>[orig_patent_app_number] => 12074081
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/074081 | Supply current based testing of CMOS output stages | Feb 28, 2008 | Issued |
Array
(
[id] => 54435
[patent_doc_number] => 07772867
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-08-10
[patent_title] => 'Structures for testing and locating defects in integrated circuits'
[patent_app_type] => utility
[patent_app_number] => 12/037687
[patent_app_country] => US
[patent_app_date] => 2008-02-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 7434
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/772/07772867.pdf
[firstpage_image] =>[orig_patent_app_number] => 12037687
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/037687 | Structures for testing and locating defects in integrated circuits | Feb 25, 2008 | Issued |
Array
(
[id] => 5282799
[patent_doc_number] => 20090096473
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-16
[patent_title] => 'TESTING PROBE AND ELECTRICAL CONNECTION METHOD USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/032699
[patent_app_country] => US
[patent_app_date] => 2008-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2778
[patent_no_of_claims] => 11
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[pdf_file] => publications/A1/0096/20090096473.pdf
[firstpage_image] =>[orig_patent_app_number] => 12032699
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/032699 | TESTING PROBE AND ELECTRICAL CONNECTION METHOD USING THE SAME | Feb 17, 2008 | Abandoned |
Array
(
[id] => 5833
[patent_doc_number] => 07812595
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-10-12
[patent_title] => 'Electronic device identifying method'
[patent_app_type] => utility
[patent_app_number] => 12/032998
[patent_app_country] => US
[patent_app_date] => 2008-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/812/07812595.pdf
[firstpage_image] =>[orig_patent_app_number] => 12032998
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/032998 | Electronic device identifying method | Feb 17, 2008 | Issued |
Array
(
[id] => 5389556
[patent_doc_number] => 20090206868
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-20
[patent_title] => 'METHODOLOGIES AND TOOL SET FOR IDDQ VERIFICATION, DEBUGGING AND FAILURE DIAGNOSIS'
[patent_app_type] => utility
[patent_app_number] => 12/032492
[patent_app_country] => US
[patent_app_date] => 2008-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
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[patent_no_of_words] => 11281
[patent_no_of_claims] => 75
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0206/20090206868.pdf
[firstpage_image] =>[orig_patent_app_number] => 12032492
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/032492 | Methodologies and tool set for IDDQ verification, debugging and failure diagnosis | Feb 14, 2008 | Issued |
Array
(
[id] => 5478086
[patent_doc_number] => 20090201043
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-13
[patent_title] => 'Crack Sensors for Semiconductor Devices'
[patent_app_type] => utility
[patent_app_number] => 12/030799
[patent_app_country] => US
[patent_app_date] => 2008-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 7790
[patent_no_of_claims] => 25
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0201/20090201043.pdf
[firstpage_image] =>[orig_patent_app_number] => 12030799
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/030799 | Crack sensors for semiconductor devices | Feb 12, 2008 | Issued |
Array
(
[id] => 4783106
[patent_doc_number] => 20080136435
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-12
[patent_title] => 'CLAMPING TOP PLATE USING MAGNETIC FORCE'
[patent_app_type] => utility
[patent_app_number] => 12/030475
[patent_app_country] => US
[patent_app_date] => 2008-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[pdf_file] => publications/A1/0136/20080136435.pdf
[firstpage_image] =>[orig_patent_app_number] => 12030475
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/030475 | Clamping top plate using magnetic force | Feb 12, 2008 | Issued |
Array
(
[id] => 5377758
[patent_doc_number] => 20090189597
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-07-30
[patent_title] => 'INSTRUMENT FOR TESTING AN ELECTRICAL CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 12/022793
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[patent_app_date] => 2008-01-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0189/20090189597.pdf
[firstpage_image] =>[orig_patent_app_number] => 12022793
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/022793 | INSTRUMENT FOR TESTING AN ELECTRICAL CIRCUIT | Jan 29, 2008 | Abandoned |
Array
(
[id] => 4811096
[patent_doc_number] => 20080191727
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-08-14
[patent_title] => 'PROBE AND PROBE ASSEMBLY'
[patent_app_type] => utility
[patent_app_number] => 12/017295
[patent_app_country] => US
[patent_app_date] => 2008-01-21
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[firstpage_image] =>[orig_patent_app_number] => 12017295
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/017295 | PROBE AND PROBE ASSEMBLY | Jan 20, 2008 | Abandoned |
Array
(
[id] => 6178632
[patent_doc_number] => 20110121851
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-05-26
[patent_title] => 'PROBE CARD'
[patent_app_type] => utility
[patent_app_number] => 12/674277
[patent_app_country] => US
[patent_app_date] => 2008-01-08
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0121/20110121851.pdf
[firstpage_image] =>[orig_patent_app_number] => 12674277
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/674277 | Probe card having a plurality of space transformers | Jan 7, 2008 | Issued |
Array
(
[id] => 6324326
[patent_doc_number] => 20100244878
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-30
[patent_title] => 'PLL BURN-IN CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 12/521192
[patent_app_country] => US
[patent_app_date] => 2007-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
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[pdf_file] => publications/A1/0244/20100244878.pdf
[firstpage_image] =>[orig_patent_app_number] => 12521192
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/521192 | PLL BURN-IN CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT | Dec 19, 2007 | Abandoned |
Array
(
[id] => 253190
[patent_doc_number] => 07579826
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-08-25
[patent_title] => 'Test socket for semiconductor'
[patent_app_type] => utility
[patent_app_number] => 11/960993
[patent_app_country] => US
[patent_app_date] => 2007-12-20
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[pdf_file] => patents/07/579/07579826.pdf
[firstpage_image] =>[orig_patent_app_number] => 11960993
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/960993 | Test socket for semiconductor | Dec 19, 2007 | Issued |
Array
(
[id] => 4635154
[patent_doc_number] => 08013610
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[patent_issue_date] => 2011-09-06
[patent_title] => 'High-Q self tuning locating transmitter'
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[firstpage_image] =>[orig_patent_app_number] => 11961858
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/961858 | High-Q self tuning locating transmitter | Dec 19, 2007 | Issued |
Array
(
[id] => 43992
[patent_doc_number] => 07782071
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-08-24
[patent_title] => 'Probe card analysis system and method'
[patent_app_type] => utility
[patent_app_number] => 11/960597
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[pdf_file] => patents/07/782/07782071.pdf
[firstpage_image] =>[orig_patent_app_number] => 11960597
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/960597 | Probe card analysis system and method | Dec 18, 2007 | Issued |
Array
(
[id] => 6241483
[patent_doc_number] => 20100134137
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-03
[patent_title] => 'LIQUID CRYSTAL DISPLAY PANEL AND ITS INSPECTING METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/597444
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0134/20100134137.pdf
[firstpage_image] =>[orig_patent_app_number] => 12597444
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/597444 | LIQUID CRYSTAL DISPLAY PANEL AND ITS INSPECTING METHOD | Dec 12, 2007 | Abandoned |