Search

Ben M. Rifkin

Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )

Most Active Art Unit
2122
Art Unit(s)
2122, 2129, 2198, 2124, 2123
Total Applications
534
Issued Applications
224
Pending Applications
86
Abandoned Applications
235

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8602710 [patent_doc_number] => 20130008022 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-01-10 [patent_title] => 'ELECTRICAL CURRENT SENSOR DEVICE' [patent_app_type] => utility [patent_app_number] => 13/245955 [patent_app_country] => US [patent_app_date] => 2011-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4083 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13245955 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/245955
Electrical current sensor device Sep 26, 2011 Issued
Array ( [id] => 8681493 [patent_doc_number] => 20130049777 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-02-28 [patent_title] => 'DEVICE IDENTIFICATION AND TEMPERATURE SENSOR CIRCUIT' [patent_app_type] => utility [patent_app_number] => 13/238010 [patent_app_country] => US [patent_app_date] => 2011-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6171 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13238010 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/238010
Device identification and temperature sensor circuit Sep 20, 2011 Issued
Array ( [id] => 8345240 [patent_doc_number] => 20120206157 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-08-16 [patent_title] => 'Structure of burn-in oven' [patent_app_type] => utility [patent_app_number] => 13/137802 [patent_app_country] => US [patent_app_date] => 2011-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2420 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13137802 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/137802
Structure of burn-in oven Sep 13, 2011 Abandoned
Array ( [id] => 10893488 [patent_doc_number] => 08917104 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-12-23 [patent_title] => 'Analyzing EM performance during IC manufacturing' [patent_app_type] => utility [patent_app_number] => 13/222306 [patent_app_country] => US [patent_app_date] => 2011-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2644 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13222306 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/222306
Analyzing EM performance during IC manufacturing Aug 30, 2011 Issued
Array ( [id] => 9027306 [patent_doc_number] => 08536891 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-09-17 [patent_title] => 'Inspection method for inspecting electric characteristics of devices formed on target object' [patent_app_type] => utility [patent_app_number] => 13/218914 [patent_app_country] => US [patent_app_date] => 2011-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 5386 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13218914 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/218914
Inspection method for inspecting electric characteristics of devices formed on target object Aug 25, 2011 Issued
Array ( [id] => 10899009 [patent_doc_number] => 08922232 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-12-30 [patent_title] => 'Test-use individual substrate, probe, and semiconductor wafer testing apparatus' [patent_app_type] => utility [patent_app_number] => 13/212585 [patent_app_country] => US [patent_app_date] => 2011-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 6247 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13212585 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/212585
Test-use individual substrate, probe, and semiconductor wafer testing apparatus Aug 17, 2011 Issued
Array ( [id] => 7773728 [patent_doc_number] => 20120038380 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-02-16 [patent_title] => 'ELECTRICAL TESTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/210750 [patent_app_country] => US [patent_app_date] => 2011-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2129 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0038/20120038380.pdf [firstpage_image] =>[orig_patent_app_number] => 13210750 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/210750
Probe test equipment for testing a semiconductor device Aug 15, 2011 Issued
Array ( [id] => 8881391 [patent_doc_number] => 20130154575 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-06-20 [patent_title] => 'CHARGING DEVICE' [patent_app_type] => utility [patent_app_number] => 13/819686 [patent_app_country] => US [patent_app_date] => 2011-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5909 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13819686 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/819686
CHARGING DEVICE Aug 9, 2011 Abandoned
Array ( [id] => 9324284 [patent_doc_number] => 08659311 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-02-25 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 13/205646 [patent_app_country] => US [patent_app_date] => 2011-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 18 [patent_no_of_words] => 9391 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 279 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13205646 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/205646
Test apparatus and test method Aug 8, 2011 Issued
Array ( [id] => 9000782 [patent_doc_number] => 20130221906 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-08-29 [patent_title] => 'Lithium Polymer Battery Charger and Methods Therefor' [patent_app_type] => utility [patent_app_number] => 13/814720 [patent_app_country] => US [patent_app_date] => 2011-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3886 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13814720 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/814720
Lithium Polymer Battery Charger and Methods Therefor Aug 7, 2011 Abandoned
Array ( [id] => 7559372 [patent_doc_number] => 20110273204 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-10 [patent_title] => 'PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 13/185895 [patent_app_country] => US [patent_app_date] => 2011-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7026 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0273/20110273204.pdf [firstpage_image] =>[orig_patent_app_number] => 13185895 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/185895
Logic applying serial test bits to scan paths in parallel Jul 18, 2011 Issued
Array ( [id] => 9609128 [patent_doc_number] => 08786302 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-07-22 [patent_title] => 'Test circuit for use in a semiconductor apparatus' [patent_app_type] => utility [patent_app_number] => 13/159178 [patent_app_country] => US [patent_app_date] => 2011-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 4793 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13159178 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/159178
Test circuit for use in a semiconductor apparatus Jun 12, 2011 Issued
Array ( [id] => 7788324 [patent_doc_number] => 20120049880 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-03-01 [patent_title] => 'SIMULTANEOUS QE SCANNING SYSTEM AND METHODS FOR PHOTOVOLTAIC DEVICES' [patent_app_type] => utility [patent_app_number] => 13/149100 [patent_app_country] => US [patent_app_date] => 2011-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2829 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0049/20120049880.pdf [firstpage_image] =>[orig_patent_app_number] => 13149100 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/149100
Simultaneous QE scanning system and methods for photovoltaic devices May 30, 2011 Issued
Array ( [id] => 9649520 [patent_doc_number] => 08803542 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-08-12 [patent_title] => 'Method and apparatus for verifying stitching accuracy of stitched chips on a wafer' [patent_app_type] => utility [patent_app_number] => 13/112745 [patent_app_country] => US [patent_app_date] => 2011-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 2312 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 262 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13112745 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/112745
Method and apparatus for verifying stitching accuracy of stitched chips on a wafer May 19, 2011 Issued
Array ( [id] => 7586870 [patent_doc_number] => 20110281380 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-17 [patent_title] => 'PROBE CARD AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE' [patent_app_type] => utility [patent_app_number] => 13/107317 [patent_app_country] => US [patent_app_date] => 2011-05-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9509 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0281/20110281380.pdf [firstpage_image] =>[orig_patent_app_number] => 13107317 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/107317
PROBE CARD AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE May 12, 2011 Abandoned
Array ( [id] => 8418871 [patent_doc_number] => 20120246371 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-09-27 [patent_title] => 'TEST APPARATUS FOR PCI CARD' [patent_app_type] => utility [patent_app_number] => 13/097105 [patent_app_country] => US [patent_app_date] => 2011-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 807 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13097105 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/097105
TEST APPARATUS FOR PCI CARD Apr 28, 2011 Abandoned
Array ( [id] => 8414861 [patent_doc_number] => 20120242362 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-09-27 [patent_title] => 'TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/093869 [patent_app_country] => US [patent_app_date] => 2011-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 713 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13093869 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/093869
TEST APPARATUS Apr 25, 2011 Abandoned
Array ( [id] => 10165849 [patent_doc_number] => 09197085 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-11-24 [patent_title] => 'Control device for vehicle' [patent_app_type] => utility [patent_app_number] => 14/112506 [patent_app_country] => US [patent_app_date] => 2011-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5332 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 210 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14112506 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/112506
Control device for vehicle Apr 19, 2011 Issued
Array ( [id] => 8306502 [patent_doc_number] => 08228054 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-24 [patent_title] => 'Method and apparatus for amplifying a signal and test device using same' [patent_app_type] => utility [patent_app_number] => 13/088150 [patent_app_country] => US [patent_app_date] => 2011-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2487 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13088150 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/088150
Method and apparatus for amplifying a signal and test device using same Apr 14, 2011 Issued
Array ( [id] => 7569661 [patent_doc_number] => 20110265316 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-03 [patent_title] => 'OPENER FOR TEST HANDLER' [patent_app_type] => utility [patent_app_number] => 13/083829 [patent_app_country] => US [patent_app_date] => 2011-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3400 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0265/20110265316.pdf [firstpage_image] =>[orig_patent_app_number] => 13083829 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/083829
Opener for test handler Apr 10, 2011 Issued
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