
Ben M. Rifkin
Examiner (ID: 13211, Phone: (571)272-9768 , Office: P/2122 )
| Most Active Art Unit | 2122 |
| Art Unit(s) | 2122, 2129, 2198, 2124, 2123 |
| Total Applications | 534 |
| Issued Applications | 224 |
| Pending Applications | 86 |
| Abandoned Applications | 235 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8602710
[patent_doc_number] => 20130008022
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-01-10
[patent_title] => 'ELECTRICAL CURRENT SENSOR DEVICE'
[patent_app_type] => utility
[patent_app_number] => 13/245955
[patent_app_country] => US
[patent_app_date] => 2011-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/245955 | Electrical current sensor device | Sep 26, 2011 | Issued |
Array
(
[id] => 8681493
[patent_doc_number] => 20130049777
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-02-28
[patent_title] => 'DEVICE IDENTIFICATION AND TEMPERATURE SENSOR CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 13/238010
[patent_app_country] => US
[patent_app_date] => 2011-09-21
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/238010 | Device identification and temperature sensor circuit | Sep 20, 2011 | Issued |
Array
(
[id] => 8345240
[patent_doc_number] => 20120206157
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[patent_kind] => A1
[patent_issue_date] => 2012-08-16
[patent_title] => 'Structure of burn-in oven'
[patent_app_type] => utility
[patent_app_number] => 13/137802
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/137802 | Structure of burn-in oven | Sep 13, 2011 | Abandoned |
Array
(
[id] => 10893488
[patent_doc_number] => 08917104
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-12-23
[patent_title] => 'Analyzing EM performance during IC manufacturing'
[patent_app_type] => utility
[patent_app_number] => 13/222306
[patent_app_country] => US
[patent_app_date] => 2011-08-31
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Array
(
[id] => 9027306
[patent_doc_number] => 08536891
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[patent_kind] => B2
[patent_issue_date] => 2013-09-17
[patent_title] => 'Inspection method for inspecting electric characteristics of devices formed on target object'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/218914 | Inspection method for inspecting electric characteristics of devices formed on target object | Aug 25, 2011 | Issued |
Array
(
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[patent_doc_number] => 08922232
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[patent_issue_date] => 2014-12-30
[patent_title] => 'Test-use individual substrate, probe, and semiconductor wafer testing apparatus'
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Array
(
[id] => 7773728
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[patent_title] => 'ELECTRICAL TESTING APPARATUS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/210750 | Probe test equipment for testing a semiconductor device | Aug 15, 2011 | Issued |
Array
(
[id] => 8881391
[patent_doc_number] => 20130154575
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[patent_kind] => A1
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[patent_title] => 'CHARGING DEVICE'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/819686 | CHARGING DEVICE | Aug 9, 2011 | Abandoned |
Array
(
[id] => 9324284
[patent_doc_number] => 08659311
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/205646 | Test apparatus and test method | Aug 8, 2011 | Issued |
Array
(
[id] => 9000782
[patent_doc_number] => 20130221906
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[patent_kind] => A1
[patent_issue_date] => 2013-08-29
[patent_title] => 'Lithium Polymer Battery Charger and Methods Therefor'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/814720 | Lithium Polymer Battery Charger and Methods Therefor | Aug 7, 2011 | Abandoned |
Array
(
[id] => 7559372
[patent_doc_number] => 20110273204
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[patent_kind] => A1
[patent_issue_date] => 2011-11-10
[patent_title] => 'PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS'
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[pdf_file] => publications/A1/0273/20110273204.pdf
[firstpage_image] =>[orig_patent_app_number] => 13185895
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/185895 | Logic applying serial test bits to scan paths in parallel | Jul 18, 2011 | Issued |
Array
(
[id] => 9609128
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[patent_title] => 'Test circuit for use in a semiconductor apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/159178 | Test circuit for use in a semiconductor apparatus | Jun 12, 2011 | Issued |
Array
(
[id] => 7788324
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Array
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[patent_title] => 'Method and apparatus for verifying stitching accuracy of stitched chips on a wafer'
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Array
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Array
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Array
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Array
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