Ben M. Rifkin

Array ( [id] => 7480720 [patent_doc_number] => 20110248716 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-10-13 [patent_title] => 'CURRENT MEASUREMENT FOR WATER-BASED MUD GALVANIC ELECTRICAL IMAGING AND LATEROLOG TOOLS' [patent_app_type] => utility [patent_app_number] => 13/080242 [patent_app_country] => US [patent_app_date] => 2011-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4011 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0248/20110248716.pdf [firstpage_image] =>[orig_patent_app_number] => 13080242 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8777756 [patent_doc_number] => 20130099731 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-04-25 [patent_title] => 'METHOD AND ARRANGEMENT OF ELECTRICAL CONDUCTORS FOR CHARGING A VEHICLE BATTERY' [patent_app_type] => utility [patent_app_number] => 13/637450 [patent_app_country] => US [patent_app_date] => 2011-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3219 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13637450 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9711744 [patent_doc_number] => 08836320 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-09-16 [patent_title] => 'Apparatus for decoupling a radio-frequency signal transmitted on a data transmission line' [patent_app_type] => utility [patent_app_number] => 13/637475 [patent_app_country] => US [patent_app_date] => 2011-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 7146 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13637475 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6011422 [patent_doc_number] => 20110221437 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-09-15 [patent_title] => 'WIDEBAND TRANSDUCER FOR MEASURING A BROAD RANGE OF CURRENTS IN HIGH VOLTAGE CONDUCTORS' [patent_app_type] => utility [patent_app_number] => 13/042919 [patent_app_country] => US [patent_app_date] => 2011-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 7732 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0221/20110221437.pdf [firstpage_image] =>[orig_patent_app_number] => 13042919 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9075156 [patent_doc_number] => 08552737 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-08 [patent_title] => 'High-voltage transformer' [patent_app_type] => utility [patent_app_number] => 13/039612 [patent_app_country] => US [patent_app_date] => 2011-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4750 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13039612 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8859316 [patent_doc_number] => 08461857 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-11 [patent_title] => 'Distance adjustment system for use in solar wafer inspection machine and inspection machine provided with same' [patent_app_type] => utility [patent_app_number] => 13/030134 [patent_app_country] => US [patent_app_date] => 2011-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 3573 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 255 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13030134 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9583150 [patent_doc_number] => 08773153 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-07-08 [patent_title] => 'Method of correcting overlay and semiconductor device manufacturing method using the same' [patent_app_type] => utility [patent_app_number] => 13/029633 [patent_app_country] => US [patent_app_date] => 2011-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6033 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13029633 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6052975 [patent_doc_number] => 20110109342 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-12 [patent_title] => 'CROSSTALK SUPPRESSION IN WIRELESS TESTING OF SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 13/006942 [patent_app_country] => US [patent_app_date] => 2011-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4610 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20110109342.pdf [firstpage_image] =>[orig_patent_app_number] => 13006942 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5941422 [patent_doc_number] => 20110102042 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-05 [patent_title] => 'APPARATUS AND METHOD FOR HARDENING LATCHES IN SOI CMOS DEVICES' [patent_app_type] => utility [patent_app_number] => 12/987106 [patent_app_country] => US [patent_app_date] => 2011-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5169 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0102/20110102042.pdf [firstpage_image] =>[orig_patent_app_number] => 12987106 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8306544 [patent_doc_number] => 08228087 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-24 [patent_title] => 'Digital communications test system for multiple input, multiple output (MIMO) systems' [patent_app_type] => utility [patent_app_number] => 12/985848 [patent_app_country] => US [patent_app_date] => 2011-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 8120 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12985848 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5941393 [patent_doc_number] => 20110102013 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-05 [patent_title] => 'PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 12/984981 [patent_app_country] => US [patent_app_date] => 2011-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7015 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0102/20110102013.pdf [firstpage_image] =>[orig_patent_app_number] => 12984981 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9828254 [patent_doc_number] => 08937485 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-01-20 [patent_title] => 'Liquid crystal display' [patent_app_type] => utility [patent_app_number] => 12/981006 [patent_app_country] => US [patent_app_date] => 2010-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6087 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12981006 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9167450 [patent_doc_number] => 08593133 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-11-26 [patent_title] => 'Current measuring systems and methods of assembling the same' [patent_app_type] => utility [patent_app_number] => 12/981149 [patent_app_country] => US [patent_app_date] => 2010-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6317 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12981149 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5941340 [patent_doc_number] => 20110101960 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-05 [patent_title] => 'CLAMP JAW ASSEMBLY' [patent_app_type] => utility [patent_app_number] => 12/979216 [patent_app_country] => US [patent_app_date] => 2010-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2505 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0101/20110101960.pdf [firstpage_image] =>[orig_patent_app_number] => 12979216 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6036917 [patent_doc_number] => 20110089966 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-21 [patent_title] => 'APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A PLURALITY OF DEVICES UNDER TEST' [patent_app_type] => utility [patent_app_number] => 12/974950 [patent_app_country] => US [patent_app_date] => 2010-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2892 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0089/20110089966.pdf [firstpage_image] =>[orig_patent_app_number] => 12974950 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5973110 [patent_doc_number] => 20110068785 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-24 [patent_title] => 'HALL SENSOR WITH TEMPERATURE DRIFT CONTROL' [patent_app_type] => utility [patent_app_number] => 12/957545 [patent_app_country] => US [patent_app_date] => 2010-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6866 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0068/20110068785.pdf [firstpage_image] =>[orig_patent_app_number] => 12957545 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5973143 [patent_doc_number] => 20110068814 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-24 [patent_title] => 'PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 12/952773 [patent_app_country] => US [patent_app_date] => 2010-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6980 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0068/20110068814.pdf [firstpage_image] =>[orig_patent_app_number] => 12952773 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8665237 [patent_doc_number] => 08378700 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-02-19 [patent_title] => 'Wafer unit for testing semiconductor chips and test system' [patent_app_type] => utility [patent_app_number] => 12/953362 [patent_app_country] => US [patent_app_date] => 2010-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 10910 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 286 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12953362 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8132953 [patent_doc_number] => 20120091029 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-04-19 [patent_title] => 'BATTERY DISPOSAL UNIT' [patent_app_type] => utility [patent_app_number] => 13/320591 [patent_app_country] => US [patent_app_date] => 2010-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3034 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20120091029.pdf [firstpage_image] =>[orig_patent_app_number] => 13320591 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9750442 [patent_doc_number] => 08841925 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-09-23 [patent_title] => 'Method for testing a laboratory device and correspondingly equipped laboratory device' [patent_app_type] => utility [patent_app_number] => 12/917015 [patent_app_country] => US [patent_app_date] => 2010-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 6358 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12917015 [rel_patent_id] =>[rel_patent_doc_number] =>)