
Benjamin A. Schiffman
Examiner (ID: 12059)
| Most Active Art Unit | 1742 |
| Art Unit(s) | 1742, 1791, 4191 |
| Total Applications | 1236 |
| Issued Applications | 807 |
| Pending Applications | 77 |
| Abandoned Applications | 367 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4368313
[patent_doc_number] => 06287889
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-09-11
[patent_title] => 'Diamond thin film or the like, method for forming and modifying the thin film, and method for processing the thin film'
[patent_app_type] => 1
[patent_app_number] => 9/490991
[patent_app_country] => US
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[pdf_file] => patents/06/287/06287889.pdf
[firstpage_image] =>[orig_patent_app_number] => 490991
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/490991 | Diamond thin film or the like, method for forming and modifying the thin film, and method for processing the thin film | Jan 25, 2000 | Issued |
Array
(
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[patent_doc_number] => 06864143
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-03-08
[patent_title] => 'Eliminate bridging between gate and source/drain in cobalt salicidation'
[patent_app_type] => utility
[patent_app_number] => 09/489970
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[patent_app_date] => 2000-01-24
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Array
(
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[patent_doc_number] => 06197610
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[patent_kind] => NA
[patent_issue_date] => 2001-03-06
[patent_title] => 'Method of making small gaps for small electrical/mechanical devices'
[patent_app_type] => 1
[patent_app_number] => 9/483640
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[patent_app_date] => 2000-01-14
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Array
(
[id] => 1585118
[patent_doc_number] => 06449750
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[patent_kind] => B1
[patent_issue_date] => 2002-09-10
[patent_title] => 'Design verification device, method and memory media for integrated circuits'
[patent_app_type] => B1
[patent_app_number] => 09/482935
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Array
(
[id] => 4348189
[patent_doc_number] => 06214698
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[patent_kind] => NA
[patent_issue_date] => 2001-04-10
[patent_title] => 'Shallow trench isolation methods employing gap filling doped silicon oxide dielectric layer'
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[patent_app_number] => 9/480270
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Array
(
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[patent_doc_number] => 06557157
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[patent_issue_date] => 2003-04-29
[patent_title] => 'Method for designing complex digital and integrated circuits as well as a circuit structure'
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Array
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[patent_title] => 'Fabrication of photonic band gap materials'
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Array
(
[id] => 4289358
[patent_doc_number] => 06235566
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[patent_kind] => NA
[patent_issue_date] => 2001-05-22
[patent_title] => 'Two-step silicidation process for fabricating a semiconductor device'
[patent_app_type] => 1
[patent_app_number] => 9/472131
[patent_app_country] => US
[patent_app_date] => 1999-12-23
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[firstpage_image] =>[orig_patent_app_number] => 472131
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/472131 | Two-step silicidation process for fabricating a semiconductor device | Dec 22, 1999 | Issued |
Array
(
[id] => 4420683
[patent_doc_number] => 06225219
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[patent_issue_date] => 2001-05-01
[patent_title] => 'Method of stabilizing anti-reflection coating layer'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/467260 | Method of stabilizing anti-reflection coating layer | Dec 19, 1999 | Issued |
Array
(
[id] => 1561060
[patent_doc_number] => 06362034
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[patent_issue_date] => 2002-03-26
[patent_title] => 'Method of forming MOSFET gate electrodes having reduced depletion region growth sensitivity to applied electric field'
[patent_app_type] => B1
[patent_app_number] => 09/471815
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Array
(
[id] => 4313110
[patent_doc_number] => 06242356
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[patent_title] => 'Etchback method for forming microelectronic layer with enhanced surface smoothness'
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Array
(
[id] => 4302593
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[patent_title] => 'Method for using CMP process in a salicide process'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/452410 | Method for using CMP process in a salicide process | Nov 30, 1999 | Issued |
Array
(
[id] => 4286363
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Array
(
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Array
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Array
(
[id] => 4131681
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Array
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