
Benjamin M. Baldridge
Examiner (ID: 10748)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 4158, 2831, 2858, 2866 |
| Total Applications | 461 |
| Issued Applications | 351 |
| Pending Applications | 0 |
| Abandoned Applications | 113 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
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[id] => 5282788
[patent_doc_number] => 20090096462
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[patent_title] => 'Wafer testing method'
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Array
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[patent_title] => 'Large signal scattering functions from orthogonal phase measurements'
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Array
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Array
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Array
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Array
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Array
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Array
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Array
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[patent_title] => 'Capacitive Fingerprint Sensor and the Panel Thereof'
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Array
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