Benny T Lee
Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )
Most Active Art Unit | 2502 |
Art Unit(s) | 2502, 2817, 2506, 2842, 2843, 3621 |
Total Applications | 3332 |
Issued Applications | 2750 |
Pending Applications | 172 |
Abandoned Applications | 410 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 11845738
[patent_doc_number] => 09733289
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[patent_issue_date] => 2017-08-15
[patent_title] => 'Devices, systems, and methods for sychronizing a remote receiver to a master signal for measuring scattering parameters'
[patent_app_type] => utility
[patent_app_number] => 14/022442
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Array
(
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[patent_doc_number] => 09588212
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[patent_issue_date] => 2017-03-07
[patent_title] => 'Method of calibrating a measurement instrument for determining direction and distance to a source of passive intermodulation (PIM)'
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Array
(
[id] => 9381468
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[patent_issue_date] => 2014-03-27
[patent_title] => 'SURFACE IMPEDANCE SYSTEMS AND METHODS'
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Array
(
[id] => 11453965
[patent_doc_number] => 09577623
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[patent_kind] => B2
[patent_issue_date] => 2017-02-21
[patent_title] => 'Capacitive parametric zero crossing detector device, circuit and method'
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Array
(
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[patent_title] => 'SEMICONDUCTOR DEVICE TESTING APPARATUS'
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Array
(
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[patent_issue_date] => 2014-11-06
[patent_title] => 'ENERGY TRACKING SYSTEM'
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Array
(
[id] => 9790231
[patent_doc_number] => 20150002176
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[patent_kind] => A1
[patent_issue_date] => 2015-01-01
[patent_title] => 'TOUCH SENSING DEVICE AND TOUCHSCREEN APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 14/019694
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/019694 | TOUCH SENSING DEVICE AND TOUCHSCREEN APPARATUS | Sep 5, 2013 | Abandoned |
Array
(
[id] => 10917136
[patent_doc_number] => 20140320156
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-10-30
[patent_title] => 'APPARATUS FOR DETECTING MISALIGNMENT OF TEST PAD'
[patent_app_type] => utility
[patent_app_number] => 14/019179
[patent_app_country] => US
[patent_app_date] => 2013-09-05
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/019179 | APPARATUS FOR DETECTING MISALIGNMENT OF TEST PAD | Sep 4, 2013 | Abandoned |
Array
(
[id] => 9906518
[patent_doc_number] => 20150061718
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-03-05
[patent_title] => 'WAFER-LEVEL TESTING METHOD FOR SINGULATED 3D-STACKED CHIP CUBES'
[patent_app_type] => utility
[patent_app_number] => 14/018697
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/018697 | Wafer-level testing method for singulated 3D-stacked chip cubes | Sep 4, 2013 | Issued |
Array
(
[id] => 11466575
[patent_doc_number] => 09583214
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-02-28
[patent_title] => 'Semiconductor circuit and leakage current test system'
[patent_app_type] => utility
[patent_app_number] => 14/018046
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[patent_app_date] => 2013-09-04
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Array
(
[id] => 9394380
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[patent_issue_date] => 2014-04-03
[patent_title] => 'METHOD OF MANUFACTURING AN INDUCTIVE PROXIMITY SWITCH'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/014971 | METHOD OF MANUFACTURING AN INDUCTIVE PROXIMITY SWITCH | Aug 29, 2013 | Abandoned |
Array
(
[id] => 9394423
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[patent_country] => US
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[patent_issue_date] => 2014-04-03
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/013573 | SEMICONDUCTOR DEVICE, APPARATUS OF ESTIMATING LIFETIME, METHOD OF ESTIMATING LIFETIME | Aug 28, 2013 | Abandoned |
Array
(
[id] => 11358448
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[patent_title] => 'Anti-rotation for wire probes in a probe head of a die tester'
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Array
(
[id] => 9543158
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Array
(
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Array
(
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Array
(
[id] => 10615931
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Array
(
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Array
(
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Array
(
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