Benny T Lee
Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )
Most Active Art Unit | 2502 |
Art Unit(s) | 2502, 2817, 2506, 2842, 2843, 3621 |
Total Applications | 3332 |
Issued Applications | 2750 |
Pending Applications | 172 |
Abandoned Applications | 410 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 9304359
[patent_doc_number] => 20140043033
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[patent_title] => 'APPARATUS AND METHOD FOR INSPECTING PCB-MOUNTED INTEGRATED CIRCUITS'
[patent_app_type] => utility
[patent_app_number] => 13/988468
[patent_app_country] => US
[patent_app_date] => 2011-11-18
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/988468 | Apparatus and method for inspecting PCB-mounted integrated circuits | Nov 17, 2011 | Issued |
Array
(
[id] => 8050435
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[patent_kind] => A1
[patent_issue_date] => 2012-03-29
[patent_title] => 'ELECTRICAL CONNECTOR WITH CORROSION PREVENTION'
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[patent_app_number] => 13/246119
[patent_app_country] => US
[patent_app_date] => 2011-09-27
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[firstpage_image] =>[orig_patent_app_number] => 13246119
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Array
(
[id] => 9824234
[patent_doc_number] => 08933722
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-01-13
[patent_title] => 'Measuring device and a method for measuring a chip-to-chip-carrier connection'
[patent_app_type] => utility
[patent_app_number] => 13/222121
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Array
(
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[patent_doc_number] => 20120293161
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[patent_issue_date] => 2012-11-22
[patent_title] => 'ALTERNATING CURRENT VOLTAGE DETECTION CIRCUIT'
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Array
(
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Array
(
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[patent_issue_date] => 2014-11-04
[patent_title] => 'Apparatus and method for quickly determining fault in electric power system'
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Array
(
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[patent_doc_number] => 20120049839
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[patent_title] => 'CIRCUIT-BREAKER WITH ROGOWSKI CURRENT TRANSFORMERS FOR MEASURING THE CURRENT IN THE CONDUCTORS OF THE CIRCUIT-BREAKER'
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Array
(
[id] => 8635264
[patent_doc_number] => 20130027068
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[patent_kind] => A1
[patent_issue_date] => 2013-01-31
[patent_title] => 'APPARATUS AND METHOD FOR TESTING OPERATION PERFORMANCE OF AN ELECTRONIC MODULE UNDER SPECIFIED TEMPERATURE'
[patent_app_type] => utility
[patent_app_number] => 13/218347
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Array
(
[id] => 7788298
[patent_doc_number] => 20120049854
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[patent_kind] => A1
[patent_issue_date] => 2012-03-01
[patent_title] => 'NANOWIRE BASED GAS IONIZATION SENSOR'
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[patent_app_number] => 13/217165
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/217165 | NANOWIRE BASED GAS IONIZATION SENSOR | Aug 23, 2011 | Abandoned |
Array
(
[id] => 7815642
[patent_doc_number] => 20120062262
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-03-15
[patent_title] => 'Test Handlers For Semiconductor Packages and Test Methods Using the Same'
[patent_app_type] => utility
[patent_app_number] => 13/215624
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Array
(
[id] => 10838821
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Array
(
[id] => 8368602
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/215184 | Test apparatus and test method | Aug 21, 2011 | Issued |
Array
(
[id] => 8681456
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[patent_title] => 'L.E.D. test leads'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/215035 | Power supply circuit and apparatus including the circuit | Aug 21, 2011 | Issued |
Array
(
[id] => 8261605
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/213264 | TESTING DEVICE FOR AMBIENT LIGHT SENSOR | Aug 18, 2011 | Abandoned |
Array
(
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Array
(
[id] => 9609114
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Array
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Array
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Array
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