Search

Benny T Lee

Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )

Most Active Art Unit
2502
Art Unit(s)
2502, 2817, 2506, 2842, 2843, 3621
Total Applications
3332
Issued Applications
2750
Pending Applications
172
Abandoned Applications
410

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 9304359 [patent_doc_number] => 20140043033 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-02-13 [patent_title] => 'APPARATUS AND METHOD FOR INSPECTING PCB-MOUNTED INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 13/988468 [patent_app_country] => US [patent_app_date] => 2011-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7757 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13988468 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/988468
Apparatus and method for inspecting PCB-mounted integrated circuits Nov 17, 2011 Issued
Array ( [id] => 8050435 [patent_doc_number] => 20120074954 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-03-29 [patent_title] => 'ELECTRICAL CONNECTOR WITH CORROSION PREVENTION' [patent_app_type] => utility [patent_app_number] => 13/246119 [patent_app_country] => US [patent_app_date] => 2011-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2930 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20120074954.pdf [firstpage_image] =>[orig_patent_app_number] => 13246119 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/246119
ELECTRICAL CONNECTOR WITH CORROSION PREVENTION Sep 26, 2011 Abandoned
Array ( [id] => 9824234 [patent_doc_number] => 08933722 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-01-13 [patent_title] => 'Measuring device and a method for measuring a chip-to-chip-carrier connection' [patent_app_type] => utility [patent_app_number] => 13/222121 [patent_app_country] => US [patent_app_date] => 2011-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 20 [patent_no_of_words] => 12316 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13222121 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/222121
Measuring device and a method for measuring a chip-to-chip-carrier connection Aug 30, 2011 Issued
Array ( [id] => 8493753 [patent_doc_number] => 20120293161 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-11-22 [patent_title] => 'ALTERNATING CURRENT VOLTAGE DETECTION CIRCUIT' [patent_app_type] => utility [patent_app_number] => 13/221921 [patent_app_country] => US [patent_app_date] => 2011-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1464 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13221921 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/221921
Alternating current voltage detection circuit Aug 30, 2011 Issued
Array ( [id] => 10899014 [patent_doc_number] => 08922238 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-12-30 [patent_title] => 'Test circuit for bipolar junction transistor' [patent_app_type] => utility [patent_app_number] => 13/217257 [patent_app_country] => US [patent_app_date] => 2011-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1647 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 246 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13217257 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/217257
Test circuit for bipolar junction transistor Aug 24, 2011 Issued
Array ( [id] => 10851858 [patent_doc_number] => 08878546 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-11-04 [patent_title] => 'Apparatus and method for quickly determining fault in electric power system' [patent_app_type] => utility [patent_app_number] => 13/218323 [patent_app_country] => US [patent_app_date] => 2011-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6623 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13218323 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/218323
Apparatus and method for quickly determining fault in electric power system Aug 24, 2011 Issued
Array ( [id] => 7788283 [patent_doc_number] => 20120049839 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-03-01 [patent_title] => 'CIRCUIT-BREAKER WITH ROGOWSKI CURRENT TRANSFORMERS FOR MEASURING THE CURRENT IN THE CONDUCTORS OF THE CIRCUIT-BREAKER' [patent_app_type] => utility [patent_app_number] => 13/217346 [patent_app_country] => US [patent_app_date] => 2011-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5272 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0049/20120049839.pdf [firstpage_image] =>[orig_patent_app_number] => 13217346 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/217346
CIRCUIT-BREAKER WITH ROGOWSKI CURRENT TRANSFORMERS FOR MEASURING THE CURRENT IN THE CONDUCTORS OF THE CIRCUIT-BREAKER Aug 24, 2011 Abandoned
Array ( [id] => 8635264 [patent_doc_number] => 20130027068 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-01-31 [patent_title] => 'APPARATUS AND METHOD FOR TESTING OPERATION PERFORMANCE OF AN ELECTRONIC MODULE UNDER SPECIFIED TEMPERATURE' [patent_app_type] => utility [patent_app_number] => 13/218347 [patent_app_country] => US [patent_app_date] => 2011-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3757 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13218347 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/218347
APPARATUS AND METHOD FOR TESTING OPERATION PERFORMANCE OF AN ELECTRONIC MODULE UNDER SPECIFIED TEMPERATURE Aug 24, 2011 Abandoned
Array ( [id] => 7788298 [patent_doc_number] => 20120049854 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-03-01 [patent_title] => 'NANOWIRE BASED GAS IONIZATION SENSOR' [patent_app_type] => utility [patent_app_number] => 13/217165 [patent_app_country] => US [patent_app_date] => 2011-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4790 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0049/20120049854.pdf [firstpage_image] =>[orig_patent_app_number] => 13217165 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/217165
NANOWIRE BASED GAS IONIZATION SENSOR Aug 23, 2011 Abandoned
Array ( [id] => 7815642 [patent_doc_number] => 20120062262 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-03-15 [patent_title] => 'Test Handlers For Semiconductor Packages and Test Methods Using the Same' [patent_app_type] => utility [patent_app_number] => 13/215624 [patent_app_country] => US [patent_app_date] => 2011-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 6726 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20120062262.pdf [firstpage_image] =>[orig_patent_app_number] => 13215624 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/215624
Test Handlers For Semiconductor Packages and Test Methods Using the Same Aug 22, 2011 Abandoned
Array ( [id] => 10838821 [patent_doc_number] => 08866501 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-10-21 [patent_title] => 'Method and apparatus for testing integrated circuits' [patent_app_type] => utility [patent_app_number] => 13/215447 [patent_app_country] => US [patent_app_date] => 2011-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6496 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13215447 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/215447
Method and apparatus for testing integrated circuits Aug 22, 2011 Issued
Array ( [id] => 8368602 [patent_doc_number] => 20120217985 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-08-30 [patent_title] => 'TEST APPARATUS AND TEST METHOD' [patent_app_type] => utility [patent_app_number] => 13/215184 [patent_app_country] => US [patent_app_date] => 2011-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8340 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13215184 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/215184
Test apparatus and test method Aug 21, 2011 Issued
Array ( [id] => 8681456 [patent_doc_number] => 20130049740 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-02-28 [patent_title] => 'L.E.D. test leads' [patent_app_type] => utility [patent_app_number] => 13/199147 [patent_app_country] => US [patent_app_date] => 2011-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 684 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13199147 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/199147
L.E.D. test leads Aug 21, 2011 Abandoned
Array ( [id] => 7788798 [patent_doc_number] => 20120050354 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-03-01 [patent_title] => 'POWER SUPPLY CIRCUIT AND APPARATUS INCLUDING THE CIRCUIT' [patent_app_type] => utility [patent_app_number] => 13/215035 [patent_app_country] => US [patent_app_date] => 2011-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7091 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20120050354.pdf [firstpage_image] =>[orig_patent_app_number] => 13215035 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/215035
Power supply circuit and apparatus including the circuit Aug 21, 2011 Issued
Array ( [id] => 8261605 [patent_doc_number] => 20120161036 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-06-28 [patent_title] => 'TESTING DEVICE FOR AMBIENT LIGHT SENSOR' [patent_app_type] => utility [patent_app_number] => 13/213264 [patent_app_country] => US [patent_app_date] => 2011-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1376 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13213264 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/213264
TESTING DEVICE FOR AMBIENT LIGHT SENSOR Aug 18, 2011 Abandoned
Array ( [id] => 9711762 [patent_doc_number] => 08836339 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-09-16 [patent_title] => 'Switching device' [patent_app_type] => utility [patent_app_number] => 13/212664 [patent_app_country] => US [patent_app_date] => 2011-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 5991 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13212664 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/212664
Switching device Aug 17, 2011 Issued
Array ( [id] => 9609114 [patent_doc_number] => 08786288 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-07-22 [patent_title] => 'Concentric buttons of different sizes for imaging and standoff correction' [patent_app_type] => utility [patent_app_number] => 13/212624 [patent_app_country] => US [patent_app_date] => 2011-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 28 [patent_no_of_words] => 6371 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13212624 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/212624
Concentric buttons of different sizes for imaging and standoff correction Aug 17, 2011 Issued
Array ( [id] => 7782427 [patent_doc_number] => 20120043983 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-02-23 [patent_title] => 'INSPECTION DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT, INSPECTION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND CONTROL PROGRAM OF INSPECTION DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT' [patent_app_type] => utility [patent_app_number] => 13/212800 [patent_app_country] => US [patent_app_date] => 2011-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 33 [patent_figures_cnt] => 33 [patent_no_of_words] => 12652 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20120043983.pdf [firstpage_image] =>[orig_patent_app_number] => 13212800 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/212800
INSPECTION DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT, INSPECTION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND CONTROL PROGRAM OF INSPECTION DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT Aug 17, 2011 Abandoned
Array ( [id] => 10535849 [patent_doc_number] => 09261475 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-02-16 [patent_title] => 'Inspection equipment and inspection method' [patent_app_type] => utility [patent_app_number] => 13/701678 [patent_app_country] => US [patent_app_date] => 2011-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 3902 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13701678 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/701678
Inspection equipment and inspection method Jun 16, 2011 Issued
Array ( [id] => 9260303 [patent_doc_number] => 20130342232 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-12-26 [patent_title] => 'PROBE CARD AND MANUFACTURING METHOD' [patent_app_type] => utility [patent_app_number] => 14/003310 [patent_app_country] => US [patent_app_date] => 2011-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5011 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14003310 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/003310
Probe card and manufacturing method Apr 27, 2011 Issued
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