Search

Benny T Lee

Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )

Most Active Art Unit
2502
Art Unit(s)
2502, 2817, 2506, 2842, 2843, 3621
Total Applications
3332
Issued Applications
2750
Pending Applications
172
Abandoned Applications
410

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19121948 [patent_doc_number] => 11965923 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-23 [patent_title] => Self-test for electrostatic charge variation sensors [patent_app_type] => utility [patent_app_number] => 17/581553 [patent_app_country] => US [patent_app_date] => 2022-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 8548 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17581553 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/581553
Self-test for electrostatic charge variation sensors Jan 20, 2022 Issued
Array ( [id] => 17750900 [patent_doc_number] => 20220229105 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-21 [patent_title] => INSPECTION APPARATUS, CONTROL METHOD, AND STORAGE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/573680 [patent_app_country] => US [patent_app_date] => 2022-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6233 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17573680 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/573680
Inspection apparatus, control method, and storage medium Jan 11, 2022 Issued
Array ( [id] => 18284333 [patent_doc_number] => 20230099805 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-30 [patent_title] => LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT CHIPS [patent_app_type] => utility [patent_app_number] => 17/571271 [patent_app_country] => US [patent_app_date] => 2022-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8317 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17571271 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/571271
LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT CHIPS Jan 6, 2022 Abandoned
Array ( [id] => 18316072 [patent_doc_number] => 11630147 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-18 [patent_title] => Low-thermal resistance pressing device for a socket [patent_app_type] => utility [patent_app_number] => 17/551246 [patent_app_country] => US [patent_app_date] => 2021-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 5296 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17551246 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/551246
Low-thermal resistance pressing device for a socket Dec 14, 2021 Issued
Array ( [id] => 17521512 [patent_doc_number] => 20220107361 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-07 [patent_title] => Two-Port On-Wafer Calibration Piece Circuit Model and Method for Determining Parameters [patent_app_type] => utility [patent_app_number] => 17/550930 [patent_app_country] => US [patent_app_date] => 2021-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6294 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17550930 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/550930
Two-port on-wafer calibration piece circuit model and method for determining parameters Dec 13, 2021 Issued
Array ( [id] => 18749503 [patent_doc_number] => 11808808 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-11-07 [patent_title] => Testing a single chip in a wafer probing system [patent_app_type] => utility [patent_app_number] => 17/643216 [patent_app_country] => US [patent_app_date] => 2021-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 11095 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 331 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17643216 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/643216
Testing a single chip in a wafer probing system Dec 7, 2021 Issued
Array ( [id] => 18702562 [patent_doc_number] => 11789069 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-17 [patent_title] => Mixed high-resolution and low-resolution inspection for tamper detection [patent_app_type] => utility [patent_app_number] => 17/541708 [patent_app_country] => US [patent_app_date] => 2021-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8394 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17541708 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/541708
Mixed high-resolution and low-resolution inspection for tamper detection Dec 2, 2021 Issued
Array ( [id] => 18826024 [patent_doc_number] => 11841296 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-12 [patent_title] => Semiconductor substrates for electrical resistivity measurements [patent_app_type] => utility [patent_app_number] => 17/457426 [patent_app_country] => US [patent_app_date] => 2021-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4423 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17457426 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/457426
Semiconductor substrates for electrical resistivity measurements Dec 1, 2021 Issued
Array ( [id] => 18644172 [patent_doc_number] => 11768236 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-09-26 [patent_title] => Test device control method and test device [patent_app_type] => utility [patent_app_number] => 17/539951 [patent_app_country] => US [patent_app_date] => 2021-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 3742 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17539951 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/539951
Test device control method and test device Nov 30, 2021 Issued
Array ( [id] => 18479305 [patent_doc_number] => 11693039 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-04 [patent_title] => Electrostatic charge sensor with high impedance contact pads [patent_app_type] => utility [patent_app_number] => 17/537069 [patent_app_country] => US [patent_app_date] => 2021-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 4451 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17537069 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/537069
Electrostatic charge sensor with high impedance contact pads Nov 28, 2021 Issued
Array ( [id] => 17613085 [patent_doc_number] => 20220155365 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-19 [patent_title] => SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD [patent_app_type] => utility [patent_app_number] => 17/524788 [patent_app_country] => US [patent_app_date] => 2021-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3450 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17524788 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/524788
Semiconductor inspecting method for ensuring scrubbing length on pad Nov 11, 2021 Issued
Array ( [id] => 19035687 [patent_doc_number] => 20240085502 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-14 [patent_title] => LOW-COST MODULAR LIQUID NITROGEN LOW-TEMPERATURE MULTI-NUCLEAR MAGNETIC RESONANCE PROBE [patent_app_type] => utility [patent_app_number] => 18/284549 [patent_app_country] => US [patent_app_date] => 2021-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3862 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284549 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/284549
Low-cost modular liquid nitrogen low-temperature multi-nuclear magnetic resonance probe Nov 9, 2021 Issued
Array ( [id] => 17596990 [patent_doc_number] => 20220146564 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-12 [patent_title] => SEMICONDUCTOR WAFER EVALUATION APPARATUS AND SEMICONDUCTOR WAFER MANUFACTURING METHOD [patent_app_type] => utility [patent_app_number] => 17/519679 [patent_app_country] => US [patent_app_date] => 2021-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5902 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17519679 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/519679
Semiconductor wafer evaluation apparatus and semiconductor wafer manufacturing method Nov 4, 2021 Issued
Array ( [id] => 18857320 [patent_doc_number] => 11854915 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-26 [patent_title] => Electrical test structure, semiconductor structure and electrical test method [patent_app_type] => utility [patent_app_number] => 17/453205 [patent_app_country] => US [patent_app_date] => 2021-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 7764 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 314 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17453205 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/453205
Electrical test structure, semiconductor structure and electrical test method Nov 1, 2021 Issued
Array ( [id] => 19046677 [patent_doc_number] => 11935797 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-19 [patent_title] => Test method, adjustment method, test system, and storage medium for alignment error [patent_app_type] => utility [patent_app_number] => 17/452570 [patent_app_country] => US [patent_app_date] => 2021-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4788 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17452570 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/452570
Test method, adjustment method, test system, and storage medium for alignment error Oct 26, 2021 Issued
Array ( [id] => 17750898 [patent_doc_number] => 20220229103 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-21 [patent_title] => ELECTRICAL CHARACTERISTIC INSPECTION DEVICE FOR SEMICONDUCTOR DEVICE AND ELECTRICAL CHARACTERISTIC INSPECTION METHOD FOR SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 17/499607 [patent_app_country] => US [patent_app_date] => 2021-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3768 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17499607 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/499607
Electrical characteristic inspection device for semiconductor device and electrical characteristic inspection method for semiconductor device Oct 11, 2021 Issued
Array ( [id] => 17983921 [patent_doc_number] => 20220349957 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-03 [patent_title] => SYSTEM FOR PERCEIVING OPERATING STATE OF LARGE POWER TRANSFORMER BASED ON VIBRO-ACOUSTIC INTEGRATION [patent_app_type] => utility [patent_app_number] => 17/616310 [patent_app_country] => US [patent_app_date] => 2021-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3482 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17616310 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/616310
System for perceiving operating state of large power transformer based on vibro-acoustic integration Oct 7, 2021 Issued
Array ( [id] => 17371430 [patent_doc_number] => 20220026482 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-27 [patent_title] => TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 17/495399 [patent_app_country] => US [patent_app_date] => 2021-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11347 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17495399 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/495399
Test system Oct 5, 2021 Issued
Array ( [id] => 18621611 [patent_doc_number] => 11754641 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-09-12 [patent_title] => Transformer test system and method [patent_app_type] => utility [patent_app_number] => 17/494586 [patent_app_country] => US [patent_app_date] => 2021-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8851 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17494586 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/494586
Transformer test system and method Oct 4, 2021 Issued
Array ( [id] => 17416719 [patent_doc_number] => 20220051623 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-17 [patent_title] => CHARGE-BASED COMPENSATION AND PARAMETER EXTRACTION IN AMOLED DISPLAYS [patent_app_type] => utility [patent_app_number] => 17/487112 [patent_app_country] => US [patent_app_date] => 2021-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 17794 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17487112 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/487112
Charge-based compensation and parameter extraction in AMOLED displays Sep 27, 2021 Issued
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