Search

Benny T Lee

Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )

Most Active Art Unit
2502
Art Unit(s)
2502, 2817, 2506, 2842, 2843, 3621
Total Applications
3332
Issued Applications
2750
Pending Applications
172
Abandoned Applications
410

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18356105 [patent_doc_number] => 11644500 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-09 [patent_title] => Adjustable anchor for printed circuit board environmental sensor [patent_app_type] => utility [patent_app_number] => 17/480773 [patent_app_country] => US [patent_app_date] => 2021-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 27 [patent_no_of_words] => 5695 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17480773 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/480773
Adjustable anchor for printed circuit board environmental sensor Sep 20, 2021 Issued
Array ( [id] => 19292672 [patent_doc_number] => 12032022 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-07-09 [patent_title] => Power consumption measurement assembly and method, and chip power consumption measurement device [patent_app_type] => utility [patent_app_number] => 17/447428 [patent_app_country] => US [patent_app_date] => 2021-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7473 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17447428 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/447428
Power consumption measurement assembly and method, and chip power consumption measurement device Sep 11, 2021 Issued
Array ( [id] => 19077626 [patent_doc_number] => 11946983 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-02 [patent_title] => Current transformer with test wire [patent_app_type] => utility [patent_app_number] => 17/471787 [patent_app_country] => US [patent_app_date] => 2021-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 2736 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17471787 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/471787
Current transformer with test wire Sep 9, 2021 Issued
Array ( [id] => 18203455 [patent_doc_number] => 11585844 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-02-21 [patent_title] => Systems, circuits, and methods to detect gate-open failures in MOS based insulated gate transistors [patent_app_type] => utility [patent_app_number] => 17/470064 [patent_app_country] => US [patent_app_date] => 2021-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 28 [patent_no_of_words] => 10122 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17470064 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/470064
Systems, circuits, and methods to detect gate-open failures in MOS based insulated gate transistors Sep 8, 2021 Issued
Array ( [id] => 18721381 [patent_doc_number] => 11798733 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-24 [patent_title] => Transformer apparatus [patent_app_type] => utility [patent_app_number] => 17/465987 [patent_app_country] => US [patent_app_date] => 2021-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 5217 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17465987 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/465987
Transformer apparatus Sep 2, 2021 Issued
Array ( [id] => 18479309 [patent_doc_number] => 11693043 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-04 [patent_title] => Test head assembly for semiconductor device [patent_app_type] => utility [patent_app_number] => 17/467045 [patent_app_country] => US [patent_app_date] => 2021-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2232 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17467045 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/467045
Test head assembly for semiconductor device Sep 2, 2021 Issued
Array ( [id] => 18227911 [patent_doc_number] => 20230066905 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => TEST CIRCUIT AND METHOD FOR OPERATING THE SAME [patent_app_type] => utility [patent_app_number] => 17/459989 [patent_app_country] => US [patent_app_date] => 2021-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6350 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17459989 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/459989
Test circuit and method for operating the same Aug 26, 2021 Issued
Array ( [id] => 18735671 [patent_doc_number] => 11804412 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-31 [patent_title] => Circuit for detecting crack damage of a die, method for detecting crack, and memory [patent_app_type] => utility [patent_app_number] => 17/458970 [patent_app_country] => US [patent_app_date] => 2021-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 5871 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 307 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17458970 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/458970
Circuit for detecting crack damage of a die, method for detecting crack, and memory Aug 26, 2021 Issued
Array ( [id] => 19537972 [patent_doc_number] => 12130524 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-29 [patent_title] => Display panel [patent_app_type] => utility [patent_app_number] => 17/598294 [patent_app_country] => US [patent_app_date] => 2021-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3355 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 208 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17598294 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/598294
Display panel Aug 9, 2021 Issued
Array ( [id] => 18719273 [patent_doc_number] => 11796611 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-24 [patent_title] => Systems and methods for magnetic resonance scanning [patent_app_type] => utility [patent_app_number] => 17/444196 [patent_app_country] => US [patent_app_date] => 2021-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 13334 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17444196 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/444196
Systems and methods for magnetic resonance scanning Aug 1, 2021 Issued
Array ( [id] => 18209889 [patent_doc_number] => 20230056149 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-02-23 [patent_title] => CHIP DETECTION METHOD AND CHIP DETECTION APPARATUS [patent_app_type] => utility [patent_app_number] => 17/603493 [patent_app_country] => US [patent_app_date] => 2021-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5002 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17603493 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/603493
Chip detection method and chip detection apparatus Jul 28, 2021 Issued
Array ( [id] => 18302869 [patent_doc_number] => 11624767 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-11 [patent_title] => Semiconductor test apparatus and semiconductor test method [patent_app_type] => utility [patent_app_number] => 17/386032 [patent_app_country] => US [patent_app_date] => 2021-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 3101 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17386032 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/386032
Semiconductor test apparatus and semiconductor test method Jul 26, 2021 Issued
Array ( [id] => 18414209 [patent_doc_number] => 11668747 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-06-06 [patent_title] => Control method of inspection apparatus and inspection apparatus [patent_app_type] => utility [patent_app_number] => 17/443359 [patent_app_country] => US [patent_app_date] => 2021-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4704 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17443359 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/443359
Control method of inspection apparatus and inspection apparatus Jul 25, 2021 Issued
Array ( [id] => 17402863 [patent_doc_number] => 20220044954 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-10 [patent_title] => Alignment Platform and Electronic Component Transmission Apparatus [patent_app_type] => utility [patent_app_number] => 17/380180 [patent_app_country] => US [patent_app_date] => 2021-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3867 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17380180 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/380180
Alignment platform and electronic component transmission apparatus Jul 19, 2021 Issued
Array ( [id] => 18086639 [patent_doc_number] => 11536768 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-12-27 [patent_title] => Inspection apparatus [patent_app_type] => utility [patent_app_number] => 17/374660 [patent_app_country] => US [patent_app_date] => 2021-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2862 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17374660 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/374660
Inspection apparatus Jul 12, 2021 Issued
Array ( [id] => 17371434 [patent_doc_number] => 20220026486 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-27 [patent_title] => ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 17/358414 [patent_app_country] => US [patent_app_date] => 2021-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12952 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17358414 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/358414
Electronic component handling apparatus and electronic component testing apparatus Jun 24, 2021 Issued
Array ( [id] => 18188613 [patent_doc_number] => 11579189 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-02-14 [patent_title] => Electronic component handling apparatus and electronic component testing apparatus [patent_app_type] => utility [patent_app_number] => 17/358528 [patent_app_country] => US [patent_app_date] => 2021-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 13443 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17358528 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/358528
Electronic component handling apparatus and electronic component testing apparatus Jun 24, 2021 Issued
Array ( [id] => 18874673 [patent_doc_number] => 11862495 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-01-02 [patent_title] => Monitor wafer measuring method and measuring apparatus [patent_app_type] => utility [patent_app_number] => 17/598807 [patent_app_country] => US [patent_app_date] => 2021-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3517 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17598807 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/598807
Monitor wafer measuring method and measuring apparatus Jun 15, 2021 Issued
Array ( [id] => 17947148 [patent_doc_number] => 20220334167 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-20 [patent_title] => METHOD FOR DETECTING DEFECTS IN GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR [patent_app_type] => utility [patent_app_number] => 17/343804 [patent_app_country] => US [patent_app_date] => 2021-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2480 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17343804 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/343804
METHOD FOR DETECTING DEFECTS IN GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR Jun 9, 2021 Abandoned
Array ( [id] => 17293915 [patent_doc_number] => 20210389754 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-12-16 [patent_title] => System for Optimizing Semiconductor Yield and enabling Product Traceability throughout Product Life [patent_app_type] => utility [patent_app_number] => 17/339992 [patent_app_country] => US [patent_app_date] => 2021-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4413 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17339992 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/339992
System for Optimizing Semiconductor Yield and enabling Product Traceability throughout Product Life Jun 4, 2021 Abandoned
Menu