Benny T Lee
Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )
Most Active Art Unit | 2502 |
Art Unit(s) | 2502, 2817, 2506, 2842, 2843, 3621 |
Total Applications | 3332 |
Issued Applications | 2750 |
Pending Applications | 172 |
Abandoned Applications | 410 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 18527132
[patent_doc_number] => 11714122
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-08-01
[patent_title] => Semiconductor device and method of testing the same
[patent_app_type] => utility
[patent_app_number] => 17/338868
[patent_app_country] => US
[patent_app_date] => 2021-06-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5101
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 103
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17338868
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/338868 | Semiconductor device and method of testing the same | Jun 3, 2021 | Issued |
Array
(
[id] => 17387104
[patent_doc_number] => 20220034956
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-02-03
[patent_title] => WAFER INSPECTION SYSTEM AND WAFER INSPECTION EQUIPMENT THEREOF
[patent_app_type] => utility
[patent_app_number] => 17/337954
[patent_app_country] => US
[patent_app_date] => 2021-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4258
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17337954
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/337954 | Wafer inspection system and wafer inspection equipment thereof | Jun 2, 2021 | Issued |
Array
(
[id] => 18997168
[patent_doc_number] => 11914004
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-02-27
[patent_title] => Current transformer with embedded voltage field detection and thermal sensing
[patent_app_type] => utility
[patent_app_number] => 17/334605
[patent_app_country] => US
[patent_app_date] => 2021-05-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 11
[patent_no_of_words] => 5592
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17334605
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/334605 | Current transformer with embedded voltage field detection and thermal sensing | May 27, 2021 | Issued |
Array
(
[id] => 18037600
[patent_doc_number] => 20220381816
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-01
[patent_title] => TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) HETEROSTRUCTURE ON INSULATING AND SEMI-INSULATING SUBSTRATES
[patent_app_type] => utility
[patent_app_number] => 17/332952
[patent_app_country] => US
[patent_app_date] => 2021-05-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5778
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17332952
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/332952 | Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates | May 26, 2021 | Issued |
Array
(
[id] => 17337472
[patent_doc_number] => 20220003803
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-01-06
[patent_title] => METHOD FOR MONITORING POLARIZATION QUALITY OF PIEZOELECTRIC FILM
[patent_app_type] => utility
[patent_app_number] => 17/329172
[patent_app_country] => US
[patent_app_date] => 2021-05-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6142
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17329172
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/329172 | Method for monitoring polarization quality of piezoelectric film | May 24, 2021 | Issued |
Array
(
[id] => 17229962
[patent_doc_number] => 20210356519
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2021-11-18
[patent_title] => STRUCTURE AND METHOD FOR TESTING OF PIC WITH AN UPTURNED MIRROR
[patent_app_type] => utility
[patent_app_number] => 17/242701
[patent_app_country] => US
[patent_app_date] => 2021-04-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 38381
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 179
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17242701
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/242701 | Structure and method for testing of PIC with an upturned mirror | Apr 27, 2021 | Issued |
Array
(
[id] => 17853175
[patent_doc_number] => 20220283217
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-09-08
[patent_title] => EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF
[patent_app_type] => utility
[patent_app_number] => 17/226460
[patent_app_country] => US
[patent_app_date] => 2021-04-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3169
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17226460
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/226460 | EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF | Apr 8, 2021 | Abandoned |
Array
(
[id] => 18275538
[patent_doc_number] => 11614478
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-03-28
[patent_title] => Fault detection circuits and methods for drivers
[patent_app_type] => utility
[patent_app_number] => 17/226924
[patent_app_country] => US
[patent_app_date] => 2021-04-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4826
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17226924
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/226924 | Fault detection circuits and methods for drivers | Apr 8, 2021 | Issued |
Array
(
[id] => 18437532
[patent_doc_number] => 20230184827
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-06-15
[patent_title] => SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/926376
[patent_app_country] => US
[patent_app_date] => 2021-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8869
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 205
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17926376
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/926376 | SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION APPARATUS | Apr 4, 2021 | Pending |
Array
(
[id] => 17808797
[patent_doc_number] => 20220260632
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-08-18
[patent_title] => SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR DIE PACKAGES
[patent_app_type] => utility
[patent_app_number] => 17/212877
[patent_app_country] => US
[patent_app_date] => 2021-03-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10220
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -35
[patent_words_short_claim] => 122
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17212877
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/212877 | Systems and methods for evaluating the reliability of semiconductor die packages | Mar 24, 2021 | Issued |
Array
(
[id] => 18029973
[patent_doc_number] => 11513151
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-11-29
[patent_title] => Test handler and semiconductor device equipment including same
[patent_app_type] => utility
[patent_app_number] => 17/211385
[patent_app_country] => US
[patent_app_date] => 2021-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 8034
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 153
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17211385
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/211385 | Test handler and semiconductor device equipment including same | Mar 23, 2021 | Issued |
Array
(
[id] => 17900799
[patent_doc_number] => 20220310461
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-09-29
[patent_title] => IN-WAFER TESTING DEVICE
[patent_app_type] => utility
[patent_app_number] => 17/210550
[patent_app_country] => US
[patent_app_date] => 2021-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3545
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17210550
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/210550 | IN-WAFER TESTING DEVICE | Mar 23, 2021 | Abandoned |
Array
(
[id] => 18045947
[patent_doc_number] => 11519896
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-12-06
[patent_title] => Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus
[patent_app_type] => utility
[patent_app_number] => 17/210396
[patent_app_country] => US
[patent_app_date] => 2021-03-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 14
[patent_no_of_words] => 12644
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 127
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17210396
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/210396 | Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus | Mar 22, 2021 | Issued |
Array
(
[id] => 17564477
[patent_doc_number] => 20220128626
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-04-28
[patent_title] => CHIP TRAY KIT AND CHIP TESTING APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/195557
[patent_app_country] => US
[patent_app_date] => 2021-03-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10014
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 455
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17195557
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/195557 | Chip tray kit and chip testing apparatus | Mar 7, 2021 | Issued |
Array
(
[id] => 18359961
[patent_doc_number] => 20230141552
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-05-11
[patent_title] => SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
[patent_app_type] => utility
[patent_app_number] => 17/912880
[patent_app_country] => US
[patent_app_date] => 2021-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11998
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 162
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17912880
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/912880 | SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE | Feb 24, 2021 | Pending |
Array
(
[id] => 18342482
[patent_doc_number] => 11639959
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-05-02
[patent_title] => Defect localization in embedded memory
[patent_app_type] => utility
[patent_app_number] => 17/179133
[patent_app_country] => US
[patent_app_date] => 2021-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 4329
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17179133
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/179133 | Defect localization in embedded memory | Feb 17, 2021 | Issued |
Array
(
[id] => 17860940
[patent_doc_number] => 11442096
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-09-13
[patent_title] => Testing apparatus
[patent_app_type] => utility
[patent_app_number] => 17/168422
[patent_app_country] => US
[patent_app_date] => 2021-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 7822
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 290
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17168422
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/168422 | Testing apparatus | Feb 4, 2021 | Issued |
Array
(
[id] => 17628455
[patent_doc_number] => 20220163470
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-05-26
[patent_title] => METHOD FOR CALCULATING LIQUID-SOLID INTERFACE MORPHOLOGY DURING GROWTH OF INGOT
[patent_app_type] => utility
[patent_app_number] => 17/167417
[patent_app_country] => US
[patent_app_date] => 2021-02-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4909
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 67
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17167417
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/167417 | Method for calculating liquid-solid interface morphology during growth of ingot | Feb 3, 2021 | Issued |
Array
(
[id] => 16993309
[patent_doc_number] => 20210231729
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2021-07-29
[patent_title] => HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY
[patent_app_type] => utility
[patent_app_number] => 17/158994
[patent_app_country] => US
[patent_app_date] => 2021-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6750
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17158994
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/158994 | HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY | Jan 25, 2021 | Pending |
Array
(
[id] => 17618695
[patent_doc_number] => 11337718
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-05-24
[patent_title] => System and method for controlling an ultrasonic tool
[patent_app_type] => utility
[patent_app_number] => 17/154324
[patent_app_country] => US
[patent_app_date] => 2021-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 19
[patent_no_of_words] => 8869
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 182
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17154324
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/154324 | System and method for controlling an ultrasonic tool | Jan 20, 2021 | Issued |