Search

Benny T Lee

Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )

Most Active Art Unit
2502
Art Unit(s)
2502, 2817, 2506, 2842, 2843, 3621
Total Applications
3332
Issued Applications
2750
Pending Applications
172
Abandoned Applications
410

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18527132 [patent_doc_number] => 11714122 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-01 [patent_title] => Semiconductor device and method of testing the same [patent_app_type] => utility [patent_app_number] => 17/338868 [patent_app_country] => US [patent_app_date] => 2021-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5101 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17338868 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/338868
Semiconductor device and method of testing the same Jun 3, 2021 Issued
Array ( [id] => 17387104 [patent_doc_number] => 20220034956 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-03 [patent_title] => WAFER INSPECTION SYSTEM AND WAFER INSPECTION EQUIPMENT THEREOF [patent_app_type] => utility [patent_app_number] => 17/337954 [patent_app_country] => US [patent_app_date] => 2021-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4258 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17337954 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/337954
Wafer inspection system and wafer inspection equipment thereof Jun 2, 2021 Issued
Array ( [id] => 18997168 [patent_doc_number] => 11914004 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-27 [patent_title] => Current transformer with embedded voltage field detection and thermal sensing [patent_app_type] => utility [patent_app_number] => 17/334605 [patent_app_country] => US [patent_app_date] => 2021-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 5592 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17334605 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/334605
Current transformer with embedded voltage field detection and thermal sensing May 27, 2021 Issued
Array ( [id] => 18037600 [patent_doc_number] => 20220381816 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-01 [patent_title] => TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) HETEROSTRUCTURE ON INSULATING AND SEMI-INSULATING SUBSTRATES [patent_app_type] => utility [patent_app_number] => 17/332952 [patent_app_country] => US [patent_app_date] => 2021-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5778 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17332952 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/332952
Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates May 26, 2021 Issued
Array ( [id] => 17337472 [patent_doc_number] => 20220003803 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-06 [patent_title] => METHOD FOR MONITORING POLARIZATION QUALITY OF PIEZOELECTRIC FILM [patent_app_type] => utility [patent_app_number] => 17/329172 [patent_app_country] => US [patent_app_date] => 2021-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6142 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17329172 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/329172
Method for monitoring polarization quality of piezoelectric film May 24, 2021 Issued
Array ( [id] => 17229962 [patent_doc_number] => 20210356519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-11-18 [patent_title] => STRUCTURE AND METHOD FOR TESTING OF PIC WITH AN UPTURNED MIRROR [patent_app_type] => utility [patent_app_number] => 17/242701 [patent_app_country] => US [patent_app_date] => 2021-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 38381 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17242701 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/242701
Structure and method for testing of PIC with an upturned mirror Apr 27, 2021 Issued
Array ( [id] => 17853175 [patent_doc_number] => 20220283217 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-08 [patent_title] => EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 17/226460 [patent_app_country] => US [patent_app_date] => 2021-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3169 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17226460 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/226460
EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF Apr 8, 2021 Abandoned
Array ( [id] => 18275538 [patent_doc_number] => 11614478 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-03-28 [patent_title] => Fault detection circuits and methods for drivers [patent_app_type] => utility [patent_app_number] => 17/226924 [patent_app_country] => US [patent_app_date] => 2021-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4826 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17226924 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/226924
Fault detection circuits and methods for drivers Apr 8, 2021 Issued
Array ( [id] => 18437532 [patent_doc_number] => 20230184827 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-15 [patent_title] => SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION APPARATUS [patent_app_type] => utility [patent_app_number] => 17/926376 [patent_app_country] => US [patent_app_date] => 2021-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8869 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17926376 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/926376
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION APPARATUS Apr 4, 2021 Pending
Array ( [id] => 17808797 [patent_doc_number] => 20220260632 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-18 [patent_title] => SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR DIE PACKAGES [patent_app_type] => utility [patent_app_number] => 17/212877 [patent_app_country] => US [patent_app_date] => 2021-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10220 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -35 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17212877 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/212877
Systems and methods for evaluating the reliability of semiconductor die packages Mar 24, 2021 Issued
Array ( [id] => 18029973 [patent_doc_number] => 11513151 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-11-29 [patent_title] => Test handler and semiconductor device equipment including same [patent_app_type] => utility [patent_app_number] => 17/211385 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 8034 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17211385 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/211385
Test handler and semiconductor device equipment including same Mar 23, 2021 Issued
Array ( [id] => 17900799 [patent_doc_number] => 20220310461 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-29 [patent_title] => IN-WAFER TESTING DEVICE [patent_app_type] => utility [patent_app_number] => 17/210550 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3545 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17210550 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/210550
IN-WAFER TESTING DEVICE Mar 23, 2021 Abandoned
Array ( [id] => 18045947 [patent_doc_number] => 11519896 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-12-06 [patent_title] => Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus [patent_app_type] => utility [patent_app_number] => 17/210396 [patent_app_country] => US [patent_app_date] => 2021-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 14 [patent_no_of_words] => 12644 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17210396 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/210396
Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus Mar 22, 2021 Issued
Array ( [id] => 17564477 [patent_doc_number] => 20220128626 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-28 [patent_title] => CHIP TRAY KIT AND CHIP TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 17/195557 [patent_app_country] => US [patent_app_date] => 2021-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10014 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 455 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17195557 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/195557
Chip tray kit and chip testing apparatus Mar 7, 2021 Issued
Array ( [id] => 18359961 [patent_doc_number] => 20230141552 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-11 [patent_title] => SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 17/912880 [patent_app_country] => US [patent_app_date] => 2021-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11998 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17912880 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/912880
SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE Feb 24, 2021 Pending
Array ( [id] => 18342482 [patent_doc_number] => 11639959 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-02 [patent_title] => Defect localization in embedded memory [patent_app_type] => utility [patent_app_number] => 17/179133 [patent_app_country] => US [patent_app_date] => 2021-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4329 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17179133 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/179133
Defect localization in embedded memory Feb 17, 2021 Issued
Array ( [id] => 17860940 [patent_doc_number] => 11442096 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-09-13 [patent_title] => Testing apparatus [patent_app_type] => utility [patent_app_number] => 17/168422 [patent_app_country] => US [patent_app_date] => 2021-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7822 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 290 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17168422 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/168422
Testing apparatus Feb 4, 2021 Issued
Array ( [id] => 17628455 [patent_doc_number] => 20220163470 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-26 [patent_title] => METHOD FOR CALCULATING LIQUID-SOLID INTERFACE MORPHOLOGY DURING GROWTH OF INGOT [patent_app_type] => utility [patent_app_number] => 17/167417 [patent_app_country] => US [patent_app_date] => 2021-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4909 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17167417 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/167417
Method for calculating liquid-solid interface morphology during growth of ingot Feb 3, 2021 Issued
Array ( [id] => 16993309 [patent_doc_number] => 20210231729 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-29 [patent_title] => HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY [patent_app_type] => utility [patent_app_number] => 17/158994 [patent_app_country] => US [patent_app_date] => 2021-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6750 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17158994 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/158994
HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY Jan 25, 2021 Pending
Array ( [id] => 17618695 [patent_doc_number] => 11337718 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-24 [patent_title] => System and method for controlling an ultrasonic tool [patent_app_type] => utility [patent_app_number] => 17/154324 [patent_app_country] => US [patent_app_date] => 2021-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 8869 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17154324 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/154324
System and method for controlling an ultrasonic tool Jan 20, 2021 Issued
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