Search

Benny T Lee

Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )

Most Active Art Unit
2502
Art Unit(s)
2502, 2817, 2506, 2842, 2843, 3621
Total Applications
3332
Issued Applications
2750
Pending Applications
172
Abandoned Applications
410

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18222405 [patent_doc_number] => 20230061399 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSIS METHOD [patent_app_type] => utility [patent_app_number] => 17/799009 [patent_app_country] => US [patent_app_date] => 2021-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 24875 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17799009 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/799009
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSIS METHOD Jan 12, 2021 Pending
Array ( [id] => 18046009 [patent_doc_number] => 11519958 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-12-06 [patent_title] => Semiconductor module inspection device with robot [patent_app_type] => utility [patent_app_number] => 17/142438 [patent_app_country] => US [patent_app_date] => 2021-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 6529 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17142438 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/142438
Semiconductor module inspection device with robot Jan 5, 2021 Issued
Array ( [id] => 18255380 [patent_doc_number] => 20230082419 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-16 [patent_title] => SEMICONDUCTOR DEVICE AND TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 17/904723 [patent_app_country] => US [patent_app_date] => 2021-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13183 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17904723 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/904723
Semiconductor device and test system Jan 4, 2021 Issued
Array ( [id] => 16949506 [patent_doc_number] => 20210208197 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-08 [patent_title] => ON-CHIP CURRENT SENSOR [patent_app_type] => utility [patent_app_number] => 17/139246 [patent_app_country] => US [patent_app_date] => 2020-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6814 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17139246 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/139246
ON-CHIP CURRENT SENSOR Dec 30, 2020 Pending
Array ( [id] => 16933825 [patent_doc_number] => 20210199714 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-01 [patent_title] => Correlation between Emission Spots Utilizing CAD Data in Combination with Emission Microscope Images [patent_app_type] => utility [patent_app_number] => 17/135240 [patent_app_country] => US [patent_app_date] => 2020-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10083 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17135240 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/135240
Correlation between emission spots utilizing CAD data in combination with emission microscope images Dec 27, 2020 Issued
Array ( [id] => 17801330 [patent_doc_number] => 11415626 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-16 [patent_title] => Method and apparatus comprising a semiconductor device and test apparatus [patent_app_type] => utility [patent_app_number] => 17/118828 [patent_app_country] => US [patent_app_date] => 2020-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 7687 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17118828 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/118828
Method and apparatus comprising a semiconductor device and test apparatus Dec 10, 2020 Issued
Array ( [id] => 18330229 [patent_doc_number] => 11635461 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-25 [patent_title] => Test apparatus and method for testing a semiconductor device [patent_app_type] => utility [patent_app_number] => 17/115236 [patent_app_country] => US [patent_app_date] => 2020-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 7932 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17115236 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/115236
Test apparatus and method for testing a semiconductor device Dec 7, 2020 Issued
Array ( [id] => 19565842 [patent_doc_number] => 12140608 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-11-12 [patent_title] => Systems and methods for starting a sensorless motor [patent_app_type] => utility [patent_app_number] => 17/783486 [patent_app_country] => US [patent_app_date] => 2020-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5809 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17783486 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/783486
Systems and methods for starting a sensorless motor Dec 6, 2020 Issued
Array ( [id] => 17588849 [patent_doc_number] => 11327111 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-10 [patent_title] => Environment control apparatus and chip testing system [patent_app_type] => utility [patent_app_number] => 17/106186 [patent_app_country] => US [patent_app_date] => 2020-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 12576 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 452 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17106186 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/106186
Environment control apparatus and chip testing system Nov 29, 2020 Issued
Array ( [id] => 18014416 [patent_doc_number] => 11506708 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-11-22 [patent_title] => On-wafer tuner system and method [patent_app_type] => utility [patent_app_number] => 17/102936 [patent_app_country] => US [patent_app_date] => 2020-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 14 [patent_no_of_words] => 4320 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17102936 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/102936
On-wafer tuner system and method Nov 23, 2020 Issued
Array ( [id] => 19506064 [patent_doc_number] => 12117480 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-15 [patent_title] => Semiconductor failure analysis device and semiconductor failure analysis method [patent_app_type] => utility [patent_app_number] => 17/798980 [patent_app_country] => US [patent_app_date] => 2020-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9661 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 308 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17798980 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/798980
Semiconductor failure analysis device and semiconductor failure analysis method Nov 16, 2020 Issued
Array ( [id] => 18110913 [patent_doc_number] => 20230003793 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-05 [patent_title] => APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TESTING DEVICE HAVING FINE PITCH, AND DEVICE ALIGNMENT METHOD [patent_app_type] => utility [patent_app_number] => 17/783942 [patent_app_country] => US [patent_app_date] => 2020-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4549 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17783942 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/783942
Apparatus for aligning device having fine pitch, apparatus for testing device having fine pitch, and device alignment method Nov 2, 2020 Issued
Array ( [id] => 17816568 [patent_doc_number] => 11422175 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-23 [patent_title] => Live measurement method for three-winding transformer loss based on windowed frequency shift [patent_app_type] => utility [patent_app_number] => 17/081726 [patent_app_country] => US [patent_app_date] => 2020-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4538 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 551 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17081726 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/081726
Live measurement method for three-winding transformer loss based on windowed frequency shift Oct 26, 2020 Issued
Array ( [id] => 17400962 [patent_doc_number] => 20220043052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-10 [patent_title] => SEMICONDUCTOR COMPONENT BURN-IN TEST MODULE AND BURN-IN TEST EQUIPMENT [patent_app_type] => utility [patent_app_number] => 17/078126 [patent_app_country] => US [patent_app_date] => 2020-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4849 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17078126 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/078126
Semiconductor component burn-in test module and burn-in test equipment Oct 22, 2020 Issued
Array ( [id] => 16729059 [patent_doc_number] => 20210096206 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-01 [patent_title] => PROBE SYSTEMS AND METHODS FOR CHARACTERIZING OPTICAL COUPLING BETWEEN AN OPTICAL PROBE OF A PROBE SYSTEM AND A CALIBRATION STRUCTURE [patent_app_type] => utility [patent_app_number] => 17/028102 [patent_app_country] => US [patent_app_date] => 2020-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14463 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17028102 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/028102
Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure Sep 21, 2020 Issued
Array ( [id] => 17038257 [patent_doc_number] => 20210255216 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-08-19 [patent_title] => PROBE SHEET FOR NON-INVASIVE NANOSCALE ELECTRICAL CHARACTERIZATION [patent_app_type] => utility [patent_app_number] => 17/023085 [patent_app_country] => US [patent_app_date] => 2020-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4891 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17023085 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/023085
PROBE SHEET FOR NON-INVASIVE NANOSCALE ELECTRICAL CHARACTERIZATION Sep 15, 2020 Abandoned
Array ( [id] => 16538773 [patent_doc_number] => 20200405186 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-12-31 [patent_title] => CAPACITANCE MEASURING AND IMAGING SENSOR SYSTEM [patent_app_type] => utility [patent_app_number] => 17/021509 [patent_app_country] => US [patent_app_date] => 2020-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7625 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17021509 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/021509
Capacitance measuring and imaging sensor system Sep 14, 2020 Issued
Array ( [id] => 17898446 [patent_doc_number] => 20220308108 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-29 [patent_title] => SEMICONDUCTOR SAMPLE INSPECTION DEVICE AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 17/641504 [patent_app_country] => US [patent_app_date] => 2020-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14973 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17641504 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/641504
Semiconductor sample inspection device and inspection method Aug 26, 2020 Issued
Array ( [id] => 16438404 [patent_doc_number] => 20200355730 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-11-12 [patent_title] => THRU-LINE DIRECTIONAL POWER SENSOR HAVING MICROSTRIP COUPLER [patent_app_type] => utility [patent_app_number] => 16/941520 [patent_app_country] => US [patent_app_date] => 2020-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16969 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16941520 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/941520
Thru-line directional power sensor having microstrip coupler Jul 27, 2020 Issued
Array ( [id] => 16599403 [patent_doc_number] => 20210025934 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-01-28 [patent_title] => Combined Transmitted and Reflected Light Imaging of Internal Cracks in Semiconductor Devices [patent_app_type] => utility [patent_app_number] => 16/926757 [patent_app_country] => US [patent_app_date] => 2020-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7129 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16926757 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/926757
Combined transmitted and reflected light imaging of internal cracks in semiconductor devices Jul 11, 2020 Issued
Menu