
Bernard E. Souw
Examiner (ID: 882)
| Most Active Art Unit | 2881 |
| Art Unit(s) | 2881, 2814 |
| Total Applications | 1406 |
| Issued Applications | 1262 |
| Pending Applications | 36 |
| Abandoned Applications | 111 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 10321726
[patent_doc_number] => 20150206730
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-07-23
[patent_title] => 'APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYSTEMS'
[patent_app_type] => utility
[patent_app_number] => 14/589687
[patent_app_country] => US
[patent_app_date] => 2015-01-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 25
[patent_no_of_words] => 11932
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14589687
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/589687 | Apparatus and method for thermal assisted desorption ionization systems | Jan 4, 2015 | Issued |
Array
(
[id] => 10112147
[patent_doc_number] => 09147565
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2015-09-29
[patent_title] => 'Ion mobility spectrometer and method of using the same'
[patent_app_type] => utility
[patent_app_number] => 14/586503
[patent_app_country] => US
[patent_app_date] => 2014-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5525
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 152
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14586503
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/586503 | Ion mobility spectrometer and method of using the same | Dec 29, 2014 | Issued |
Array
(
[id] => 10306632
[patent_doc_number] => 20150191633
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-07-09
[patent_title] => 'Article, Compositions, Systems, and Methods Using Selectively Detackified Adhesives'
[patent_app_type] => utility
[patent_app_number] => 14/585365
[patent_app_country] => US
[patent_app_date] => 2014-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 14191
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14585365
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/585365 | Article, compositions, systems, and methods using selectively detackified adhesives | Dec 29, 2014 | Issued |
Array
(
[id] => 10315070
[patent_doc_number] => 20150200073
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-07-16
[patent_title] => 'Ion Implantation System and Method with Variable Energy Control'
[patent_app_type] => utility
[patent_app_number] => 14/584252
[patent_app_country] => US
[patent_app_date] => 2014-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 11755
[patent_no_of_claims] => 50
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14584252
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/584252 | Ion implantation system and method with variable energy control | Dec 28, 2014 | Issued |
Array
(
[id] => 10118518
[patent_doc_number] => 09153406
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-10-06
[patent_title] => 'Supporting structure and ion generator using the same'
[patent_app_type] => utility
[patent_app_number] => 14/582696
[patent_app_country] => US
[patent_app_date] => 2014-12-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5693
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14582696
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/582696 | Supporting structure and ion generator using the same | Dec 23, 2014 | Issued |
Array
(
[id] => 10348814
[patent_doc_number] => 20150233819
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-20
[patent_title] => 'POSITIONING APPARATUS, PROCESSING APPARATUS USING THE SAME, AND POSITIONING METHOD AND PROCESSING METHOD USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 14/580709
[patent_app_country] => US
[patent_app_date] => 2014-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3158
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14580709
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/580709 | POSITIONING APPARATUS, PROCESSING APPARATUS USING THE SAME, AND POSITIONING METHOD AND PROCESSING METHOD USING THE SAME | Dec 22, 2014 | Abandoned |
Array
(
[id] => 10118527
[patent_doc_number] => 09153415
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-10-06
[patent_title] => 'Charged particle lithography system with sensor assembly'
[patent_app_type] => utility
[patent_app_number] => 14/581728
[patent_app_country] => US
[patent_app_date] => 2014-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 6411
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14581728
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/581728 | Charged particle lithography system with sensor assembly | Dec 22, 2014 | Issued |
Array
(
[id] => 10263263
[patent_doc_number] => 20150148260
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-05-28
[patent_title] => 'ANALYTE MASS SPECTROMETRY QUANTITATION USING A UNIVERSAL REPORTER'
[patent_app_type] => utility
[patent_app_number] => 14/579206
[patent_app_country] => US
[patent_app_date] => 2014-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 36
[patent_figures_cnt] => 36
[patent_no_of_words] => 16721
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14579206
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/579206 | Analyte mass spectrometry quantitation using a universal reporter | Dec 21, 2014 | Issued |
Array
(
[id] => 11966965
[patent_doc_number] => 20170271117
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-09-21
[patent_title] => 'CORNER ROUNDING CORRECTION FOR ELECTRON BEAM (EBEAM) DIRECT WRITE SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 15/329880
[patent_app_country] => US
[patent_app_date] => 2014-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 40
[patent_figures_cnt] => 40
[patent_no_of_words] => 23570
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15329880
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/329880 | Corner rounding correction for electron beam (Ebeam) direct write system | Dec 21, 2014 | Issued |
Array
(
[id] => 10294423
[patent_doc_number] => 20150179421
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-06-25
[patent_title] => 'ION OPTICAL ELEMENT'
[patent_app_type] => utility
[patent_app_number] => 14/579038
[patent_app_country] => US
[patent_app_date] => 2014-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 10653
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14579038
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/579038 | Ion optical element | Dec 21, 2014 | Issued |
Array
(
[id] => 10294939
[patent_doc_number] => 20150179938
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-06-25
[patent_title] => 'REPLICATION OF PATTERNED THIN-FILM STRUCTURES FOR USE IN PLASMONICS AND METAMATERIALS'
[patent_app_type] => utility
[patent_app_number] => 14/578873
[patent_app_country] => US
[patent_app_date] => 2014-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 25
[patent_no_of_words] => 19443
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14578873
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/578873 | Replication of patterned thin-film structures for use in plasmonics and metamaterials | Dec 21, 2014 | Issued |
Array
(
[id] => 10158470
[patent_doc_number] => 09190254
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2015-11-17
[patent_title] => 'Ion trap mass analyzer apparatus, methods, and systems utilizing one or more multiple potential ion guide (MPIG) electrodes'
[patent_app_type] => utility
[patent_app_number] => 14/570529
[patent_app_country] => US
[patent_app_date] => 2014-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
[patent_figures_cnt] => 41
[patent_no_of_words] => 11257
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14570529
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/570529 | Ion trap mass analyzer apparatus, methods, and systems utilizing one or more multiple potential ion guide (MPIG) electrodes | Dec 14, 2014 | Issued |
Array
(
[id] => 10259791
[patent_doc_number] => 20150144788
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-05-28
[patent_title] => 'Charged Particle Beam Apparatus'
[patent_app_type] => utility
[patent_app_number] => 14/564921
[patent_app_country] => US
[patent_app_date] => 2014-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 7113
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14564921
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/564921 | Charged particle beam apparatus | Dec 8, 2014 | Issued |
Array
(
[id] => 11854801
[patent_doc_number] => 20170229294
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-08-10
[patent_title] => 'FILTER APPARATUS FOR ARC ION EVAPORATOR USED IN CATHODIC ARC PLASMA DEPOSITION SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 15/501598
[patent_app_country] => US
[patent_app_date] => 2014-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 3992
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15501598
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/501598 | Filter apparatus for arc ion evaporator used in cathodic arc plasma deposition system | Dec 7, 2014 | Issued |
Array
(
[id] => 10424182
[patent_doc_number] => 20150309193
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-10-29
[patent_title] => 'Radiation Beam Direction Determination Using Three-Dimensional Measurement Device'
[patent_app_type] => utility
[patent_app_number] => 14/559797
[patent_app_country] => US
[patent_app_date] => 2014-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3690
[patent_no_of_claims] => 1
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14559797
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/559797 | Radiation Beam Direction Determination Using Three-Dimensional Measurement Device | Dec 2, 2014 | Abandoned |
Array
(
[id] => 11909416
[patent_doc_number] => 09778224
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-10-03
[patent_title] => 'Dielectric barrier discharge ionization source for spectrometry'
[patent_app_type] => utility
[patent_app_number] => 15/039586
[patent_app_country] => US
[patent_app_date] => 2014-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 9
[patent_no_of_words] => 3086
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15039586
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/039586 | Dielectric barrier discharge ionization source for spectrometry | Nov 25, 2014 | Issued |
Array
(
[id] => 11298942
[patent_doc_number] => 09506947
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-11-29
[patent_title] => 'System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing'
[patent_app_type] => utility
[patent_app_number] => 14/552399
[patent_app_country] => US
[patent_app_date] => 2014-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 3828
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 61
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14552399
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/552399 | System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing | Nov 23, 2014 | Issued |
Array
(
[id] => 10527340
[patent_doc_number] => 09253868
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2016-02-02
[patent_title] => 'Neutral beam source with plasma sheath-shaping neutralization grid'
[patent_app_type] => utility
[patent_app_number] => 14/549854
[patent_app_country] => US
[patent_app_date] => 2014-11-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 3041
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 110
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14549854
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/549854 | Neutral beam source with plasma sheath-shaping neutralization grid | Nov 20, 2014 | Issued |
Array
(
[id] => 11091972
[patent_doc_number] => 20160288940
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-10-06
[patent_title] => 'REDUCING THE DETERIORATON OF WETTED HYDROPHILIC COATINGS SUBJECTED TO STERILIZATION BY RADIATION'
[patent_app_type] => utility
[patent_app_number] => 15/037605
[patent_app_country] => US
[patent_app_date] => 2014-11-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 13507
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15037605
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/037605 | Reducing the deterioraton of wetted hydrophilic coatings subjected to sterilization by radiation | Nov 19, 2014 | Issued |
Array
(
[id] => 13653123
[patent_doc_number] => 09852881
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-12-26
[patent_title] => Scanning electron microscope system, pattern measurement method using same, and scanning electron microscope
[patent_app_type] => utility
[patent_app_number] => 15/039527
[patent_app_country] => US
[patent_app_date] => 2014-11-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 41
[patent_no_of_words] => 8951
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 116
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15039527
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/039527 | Scanning electron microscope system, pattern measurement method using same, and scanning electron microscope | Nov 18, 2014 | Issued |