Search

Bernard E. Souw

Examiner (ID: 892, Phone: (571)272-2482 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2814
Total Applications
1406
Issued Applications
1263
Pending Applications
36
Abandoned Applications
111

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6032818 [patent_doc_number] => 20110055987 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-03 [patent_title] => 'METHOD TO REDUCE WEDGE EFFECTS IN MOLDED TRIGONAL TIPS' [patent_app_type] => utility [patent_app_number] => 12/868601 [patent_app_country] => US [patent_app_date] => 2010-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 4898 [patent_no_of_claims] => 48 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0055/20110055987.pdf [firstpage_image] =>[orig_patent_app_number] => 12868601 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/868601
Method to reduce wedge effects in molded trigonal tips Aug 24, 2010 Issued
Array ( [id] => 6609552 [patent_doc_number] => 20100310180 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-09 [patent_title] => 'Pattern Inspection Method and Pattern Inspection System' [patent_app_type] => utility [patent_app_number] => 12/858209 [patent_app_country] => US [patent_app_date] => 2010-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 10365 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0310/20100310180.pdf [firstpage_image] =>[orig_patent_app_number] => 12858209 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/858209
Pattern inspection method and pattern inspection system Aug 16, 2010 Issued
Array ( [id] => 8909901 [patent_doc_number] => 08481964 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-07-09 [patent_title] => 'Charged particle beam drawing apparatus and method' [patent_app_type] => utility [patent_app_number] => 12/846215 [patent_app_country] => US [patent_app_date] => 2010-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 14281 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12846215 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/846215
Charged particle beam drawing apparatus and method Jul 28, 2010 Issued
Array ( [id] => 7727948 [patent_doc_number] => 20120012763 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-01-19 [patent_title] => 'Method and Apparatus Pertaining to Use of Jaws During Radiation Treatment' [patent_app_type] => utility [patent_app_number] => 12/837123 [patent_app_country] => US [patent_app_date] => 2010-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3429 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20120012763.pdf [firstpage_image] =>[orig_patent_app_number] => 12837123 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/837123
Method and apparatus pertaining to use of jaws during radiation treatment Jul 14, 2010 Issued
Array ( [id] => 8082719 [patent_doc_number] => 08148681 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-03 [patent_title] => 'Microengineered vacuum interface for an ionization system' [patent_app_type] => utility [patent_app_number] => 12/837100 [patent_app_country] => US [patent_app_date] => 2010-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4645 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/148/08148681.pdf [firstpage_image] =>[orig_patent_app_number] => 12837100 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/837100
Microengineered vacuum interface for an ionization system Jul 14, 2010 Issued
Array ( [id] => 8147064 [patent_doc_number] => 08164075 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-24 [patent_title] => 'Treatment apparatuses and methods using proton' [patent_app_type] => utility [patent_app_number] => 12/836489 [patent_app_country] => US [patent_app_date] => 2010-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2883 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/164/08164075.pdf [firstpage_image] =>[orig_patent_app_number] => 12836489 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/836489
Treatment apparatuses and methods using proton Jul 13, 2010 Issued
Array ( [id] => 5988854 [patent_doc_number] => 20110012033 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-20 [patent_title] => 'Adjustable Louvered Plasma Electron Flood Enclosure' [patent_app_type] => utility [patent_app_number] => 12/835138 [patent_app_country] => US [patent_app_date] => 2010-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6398 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20110012033.pdf [firstpage_image] =>[orig_patent_app_number] => 12835138 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/835138
Adjustable louvered plasma electron flood enclosure Jul 12, 2010 Issued
Array ( [id] => 5988790 [patent_doc_number] => 20110012016 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-20 [patent_title] => 'SPECTROPHOTOMETRIC IDENTIFICATION OF MICROBE SUBSPECIES' [patent_app_type] => utility [patent_app_number] => 12/834504 [patent_app_country] => US [patent_app_date] => 2010-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 8594 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20110012016.pdf [firstpage_image] =>[orig_patent_app_number] => 12834504 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/834504
Spectrophotometric identification of microbe subspecies Jul 11, 2010 Issued
Array ( [id] => 6130069 [patent_doc_number] => 20110006208 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-13 [patent_title] => 'Method for Inspecting a Sample' [patent_app_type] => utility [patent_app_number] => 12/833750 [patent_app_country] => US [patent_app_date] => 2010-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6370 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20110006208.pdf [firstpage_image] =>[orig_patent_app_number] => 12833750 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/833750
Method for inspecting a sample Jul 8, 2010 Issued
Array ( [id] => 5991513 [patent_doc_number] => 20110013166 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-20 [patent_title] => 'RADIATION SYSTEM AND LITHOGRAPHIC APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/832258 [patent_app_country] => US [patent_app_date] => 2010-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7349 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20110013166.pdf [firstpage_image] =>[orig_patent_app_number] => 12832258 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/832258
Radiation system and lithographic apparatus Jul 7, 2010 Issued
Array ( [id] => 8147050 [patent_doc_number] => 08164060 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-24 [patent_title] => 'System and method for a charged particle beam' [patent_app_type] => utility [patent_app_number] => 12/832127 [patent_app_country] => US [patent_app_date] => 2010-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4862 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/164/08164060.pdf [firstpage_image] =>[orig_patent_app_number] => 12832127 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/832127
System and method for a charged particle beam Jul 7, 2010 Issued
Array ( [id] => 6130061 [patent_doc_number] => 20110006202 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-13 [patent_title] => 'GAS SAMPLING DEVICE AND GAS ANALYZER EMPLOYING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/831945 [patent_app_country] => US [patent_app_date] => 2010-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5763 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20110006202.pdf [firstpage_image] =>[orig_patent_app_number] => 12831945 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/831945
Gas sampling device and gas analyzer employing the same Jul 6, 2010 Issued
Array ( [id] => 6130060 [patent_doc_number] => 20110006201 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-01-13 [patent_title] => 'GC-MS ANALYSIS APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/831921 [patent_app_country] => US [patent_app_date] => 2010-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5189 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20110006201.pdf [firstpage_image] =>[orig_patent_app_number] => 12831921 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/831921
GC-MS analysis apparatus Jul 6, 2010 Issued
Array ( [id] => 8933034 [patent_doc_number] => 08492736 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-07-23 [patent_title] => 'Ozone plenum as UV shutter or tunable UV filter for cleaning semiconductor substrates' [patent_app_type] => utility [patent_app_number] => 12/797196 [patent_app_country] => US [patent_app_date] => 2010-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3619 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12797196 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/797196
Ozone plenum as UV shutter or tunable UV filter for cleaning semiconductor substrates Jun 8, 2010 Issued
Array ( [id] => 6285585 [patent_doc_number] => 20100237241 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-23 [patent_title] => 'Electrostatic Charge Measurement Method, Focus Adjustment Method, and Scanning Electron Microscope' [patent_app_type] => utility [patent_app_number] => 12/792808 [patent_app_country] => US [patent_app_date] => 2010-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3824 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20100237241.pdf [firstpage_image] =>[orig_patent_app_number] => 12792808 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/792808
Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope Jun 2, 2010 Issued
Array ( [id] => 6416858 [patent_doc_number] => 20100306886 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-02 [patent_title] => 'Probe Microscope' [patent_app_type] => utility [patent_app_number] => 12/789796 [patent_app_country] => US [patent_app_date] => 2010-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6996 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0306/20100306886.pdf [firstpage_image] =>[orig_patent_app_number] => 12789796 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/789796
Probe Microscope May 27, 2010 Abandoned
Array ( [id] => 8177250 [patent_doc_number] => 20120110707 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-05-03 [patent_title] => 'Metrology Probe and Method of Configuring a Metrology Probe' [patent_app_type] => utility [patent_app_number] => 13/322568 [patent_app_country] => US [patent_app_date] => 2010-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 8149 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0110/20120110707.pdf [firstpage_image] =>[orig_patent_app_number] => 13322568 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/322568
Metrology probe and method of configuring a metrology probe May 27, 2010 Issued
Array ( [id] => 8273394 [patent_doc_number] => 08214917 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-03 [patent_title] => 'Molded microfluidic fluid cell for atomic force microscopy' [patent_app_type] => utility [patent_app_number] => 12/790513 [patent_app_country] => US [patent_app_date] => 2010-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 19 [patent_no_of_words] => 4385 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12790513 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/790513
Molded microfluidic fluid cell for atomic force microscopy May 27, 2010 Issued
Array ( [id] => 6374469 [patent_doc_number] => 20100301211 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-02 [patent_title] => 'DUAL BEAM SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/788836 [patent_app_country] => US [patent_app_date] => 2010-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6392 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0301/20100301211.pdf [firstpage_image] =>[orig_patent_app_number] => 12788836 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/788836
Dual beam system May 26, 2010 Issued
Array ( [id] => 6139822 [patent_doc_number] => 20110128519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-02 [patent_title] => 'Radiation Source' [patent_app_type] => utility [patent_app_number] => 12/788903 [patent_app_country] => US [patent_app_date] => 2010-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 6587 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20110128519.pdf [firstpage_image] =>[orig_patent_app_number] => 12788903 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/788903
Radiation source May 26, 2010 Issued
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