
Bernard E. Souw
Examiner (ID: 9221, Phone: (571)272-2482 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 2814, 2881 |
| Total Applications | 1406 |
| Issued Applications | 1263 |
| Pending Applications | 36 |
| Abandoned Applications | 111 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6611669
[patent_doc_number] => 20100224775
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-09
[patent_title] => 'LASER SYSTEM FOR MALDI MASS SPECTROMETRY'
[patent_app_type] => utility
[patent_app_number] => 12/716813
[patent_app_country] => US
[patent_app_date] => 2010-03-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 6217
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0224/20100224775.pdf
[firstpage_image] =>[orig_patent_app_number] => 12716813
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/716813 | Laser system for MALDI mass spectrometry | Mar 2, 2010 | Issued |
Array
(
[id] => 7551056
[patent_doc_number] => 08063390
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-11-22
[patent_title] => 'Electron cooling system and method for increasing the phase space intensity and overall intensity of ion beams in multiple overlap regions'
[patent_app_type] => utility
[patent_app_number] => 12/716477
[patent_app_country] => US
[patent_app_date] => 2010-03-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 7876
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 236
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/063/08063390.pdf
[firstpage_image] =>[orig_patent_app_number] => 12716477
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/716477 | Electron cooling system and method for increasing the phase space intensity and overall intensity of ion beams in multiple overlap regions | Mar 2, 2010 | Issued |
Array
(
[id] => 6407966
[patent_doc_number] => 20100140472
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-10
[patent_title] => 'PATTERN DISPLACEMENT MEASURING METHOD AND PATTERN MEASURING DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/708148
[patent_app_country] => US
[patent_app_date] => 2010-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 3711
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0140/20100140472.pdf
[firstpage_image] =>[orig_patent_app_number] => 12708148
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/708148 | Pattern displacement measuring method and pattern measuring device | Feb 17, 2010 | Issued |
Array
(
[id] => 8859020
[patent_doc_number] => 08461555
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-06-11
[patent_title] => 'Charged particle beam writing method and charged particle beam writing apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/706207
[patent_app_country] => US
[patent_app_date] => 2010-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 6148
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12706207
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/706207 | Charged particle beam writing method and charged particle beam writing apparatus | Feb 15, 2010 | Issued |
Array
(
[id] => 6239810
[patent_doc_number] => 20100133449
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-03
[patent_title] => 'ION IMPLANTATION APPARATUS, SUBSTRATE CLAMPING MECHANISM, AND ION IMPLANTATION METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/702779
[patent_app_country] => US
[patent_app_date] => 2010-02-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 4004
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0133/20100133449.pdf
[firstpage_image] =>[orig_patent_app_number] => 12702779
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/702779 | Ion implantation apparatus, substrate clamping mechanism, and ion implantation method | Feb 8, 2010 | Issued |
Array
(
[id] => 4644765
[patent_doc_number] => 08022371
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-09-20
[patent_title] => 'Cathode having electron production and focusing grooves, ion source and related method'
[patent_app_type] => utility
[patent_app_number] => 12/702748
[patent_app_country] => US
[patent_app_date] => 2010-02-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 1846
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 53
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/022/08022371.pdf
[firstpage_image] =>[orig_patent_app_number] => 12702748
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/702748 | Cathode having electron production and focusing grooves, ion source and related method | Feb 8, 2010 | Issued |
Array
(
[id] => 6516531
[patent_doc_number] => 20100230587
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-16
[patent_title] => 'ELECTROSPRAY IONIZATION MASS SPECTROMETRY METHODOLOGY'
[patent_app_type] => utility
[patent_app_number] => 12/700992
[patent_app_country] => US
[patent_app_date] => 2010-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 4689
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0230/20100230587.pdf
[firstpage_image] =>[orig_patent_app_number] => 12700992
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/700992 | Electrospray ionization mass spectrometry methodology | Feb 4, 2010 | Issued |
Array
(
[id] => 6160779
[patent_doc_number] => 20110192968
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-08-11
[patent_title] => 'Multi-Needle Multi-Parallel Nanospray Ionization Source for Mass Spectrometry'
[patent_app_type] => utility
[patent_app_number] => 12/701011
[patent_app_country] => US
[patent_app_date] => 2010-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 8377
[patent_no_of_claims] => 35
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0192/20110192968.pdf
[firstpage_image] =>[orig_patent_app_number] => 12701011
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/701011 | Multi-needle multi-parallel nanospray ionization source for mass spectrometry | Feb 4, 2010 | Issued |
Array
(
[id] => 8147057
[patent_doc_number] => 08164067
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-24
[patent_title] => 'Arrangement and method for the contrast improvement in a charged particle beam device for inspecting a specimen'
[patent_app_type] => utility
[patent_app_number] => 12/701463
[patent_app_country] => US
[patent_app_date] => 2010-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 8
[patent_no_of_words] => 8367
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 162
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/164/08164067.pdf
[firstpage_image] =>[orig_patent_app_number] => 12701463
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/701463 | Arrangement and method for the contrast improvement in a charged particle beam device for inspecting a specimen | Feb 4, 2010 | Issued |
Array
(
[id] => 4647202
[patent_doc_number] => 08024816
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-09-20
[patent_title] => 'Approach method for probe and sample in scanning probe microscope'
[patent_app_type] => utility
[patent_app_number] => 12/700236
[patent_app_country] => US
[patent_app_date] => 2010-02-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 15
[patent_no_of_words] => 13042
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 226
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/024/08024816.pdf
[firstpage_image] =>[orig_patent_app_number] => 12700236
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/700236 | Approach method for probe and sample in scanning probe microscope | Feb 3, 2010 | Issued |
Array
(
[id] => 9239626
[patent_doc_number] => 08604419
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-12-10
[patent_title] => 'Dual ion trapping for ion/ion reactions in a linear RF multipole trap with an additional DC gradient'
[patent_app_type] => utility
[patent_app_number] => 12/700605
[patent_app_country] => US
[patent_app_date] => 2010-02-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 24
[patent_no_of_words] => 12949
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 161
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12700605
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/700605 | Dual ion trapping for ion/ion reactions in a linear RF multipole trap with an additional DC gradient | Feb 3, 2010 | Issued |
Array
(
[id] => 7805589
[patent_doc_number] => 20120056541
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-03-08
[patent_title] => 'ION GENERATING DEVICE FOR DUCT'
[patent_app_type] => utility
[patent_app_number] => 13/320562
[patent_app_country] => US
[patent_app_date] => 2010-02-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 12661
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0056/20120056541.pdf
[firstpage_image] =>[orig_patent_app_number] => 13320562
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/320562 | Ion generating device for duct | Feb 1, 2010 | Issued |
Array
(
[id] => 9245812
[patent_doc_number] => 08610095
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-12-17
[patent_title] => 'Extreme ultraviolet light source device'
[patent_app_type] => utility
[patent_app_number] => 12/695630
[patent_app_country] => US
[patent_app_date] => 2010-01-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 9857
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 102
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12695630
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/695630 | Extreme ultraviolet light source device | Jan 27, 2010 | Issued |
Array
(
[id] => 5972411
[patent_doc_number] => 20110068283
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-24
[patent_title] => 'ELECTROMAGNETIC WAVE ABSORPTION COMPONENT AND DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/695557
[patent_app_country] => US
[patent_app_date] => 2010-01-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4185
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0068/20110068283.pdf
[firstpage_image] =>[orig_patent_app_number] => 12695557
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/695557 | ELECTROMAGNETIC WAVE ABSORPTION COMPONENT AND DEVICE | Jan 27, 2010 | Abandoned |
Array
(
[id] => 7713237
[patent_doc_number] => 08093565
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-10
[patent_title] => 'Wind and temperature spectrometer with crossed small-deflection energy analyzer'
[patent_app_type] => utility
[patent_app_number] => 12/695478
[patent_app_country] => US
[patent_app_date] => 2010-01-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 3978
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 244
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/093/08093565.pdf
[firstpage_image] =>[orig_patent_app_number] => 12695478
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/695478 | Wind and temperature spectrometer with crossed small-deflection energy analyzer | Jan 27, 2010 | Issued |
Array
(
[id] => 6271388
[patent_doc_number] => 20100116985
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-05-13
[patent_title] => 'LASER ATOM PROBE METHODS'
[patent_app_type] => utility
[patent_app_number] => 12/692394
[patent_app_country] => US
[patent_app_date] => 2010-01-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 12911
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0116/20100116985.pdf
[firstpage_image] =>[orig_patent_app_number] => 12692394
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/692394 | Laser atom probe methods | Jan 21, 2010 | Issued |
Array
(
[id] => 8178039
[patent_doc_number] => 08178840
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-05-15
[patent_title] => 'Specimen inspection equipment and how to make the electron beam absorbed current images'
[patent_app_type] => utility
[patent_app_number] => 12/691331
[patent_app_country] => US
[patent_app_date] => 2010-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 3690
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/178/08178840.pdf
[firstpage_image] =>[orig_patent_app_number] => 12691331
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/691331 | Specimen inspection equipment and how to make the electron beam absorbed current images | Jan 20, 2010 | Issued |
Array
(
[id] => 7540770
[patent_doc_number] => 08058614
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-11-15
[patent_title] => 'Electron microscope for inspecting and processing of an object with miniaturized structures and method thereof'
[patent_app_type] => utility
[patent_app_number] => 12/655940
[patent_app_country] => US
[patent_app_date] => 2010-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 7361
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 167
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/058/08058614.pdf
[firstpage_image] =>[orig_patent_app_number] => 12655940
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/655940 | Electron microscope for inspecting and processing of an object with miniaturized structures and method thereof | Jan 10, 2010 | Issued |
Array
(
[id] => 7805157
[patent_doc_number] => 20120056109
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-03-08
[patent_title] => 'METHOD FOR EVALUATING RADIATION MODEL DATA IN PARTICLE BEAM RADIATION APPLICATIONS'
[patent_app_type] => utility
[patent_app_number] => 13/257408
[patent_app_country] => US
[patent_app_date] => 2010-01-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 3663
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0056/20120056109.pdf
[firstpage_image] =>[orig_patent_app_number] => 13257408
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/257408 | Method for evaluating radiation model data in particle beam radiation applications | Jan 7, 2010 | Issued |
Array
(
[id] => 6152869
[patent_doc_number] => 20110155929
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-06-30
[patent_title] => 'APPARATUS AND SYSTEM FOR CONTROLLING ION RIBBON BEAM UNIFORMITY IN AN ION IMPLANTER'
[patent_app_type] => utility
[patent_app_number] => 12/647152
[patent_app_country] => US
[patent_app_date] => 2009-12-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4158
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0155/20110155929.pdf
[firstpage_image] =>[orig_patent_app_number] => 12647152
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/647152 | Apparatus and system for controlling ion ribbon beam uniformity in an ion implanter | Dec 23, 2009 | Issued |