
Bernard E. Souw
Examiner (ID: 7674, Phone: (571)272-2482 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 2881, 2814 |
| Total Applications | 1406 |
| Issued Applications | 1263 |
| Pending Applications | 36 |
| Abandoned Applications | 111 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5092788
[patent_doc_number] => 20070114397
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-24
[patent_title] => 'Circuit pattern inspection apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/594985
[patent_app_country] => US
[patent_app_date] => 2006-11-09
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0114/20070114397.pdf
[firstpage_image] =>[orig_patent_app_number] => 11594985
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594985 | Circuit pattern inspection apparatus | Nov 8, 2006 | Issued |
Array
(
[id] => 373608
[patent_doc_number] => 07473912
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-01-06
[patent_title] => 'Method and apparatus for patterning micro and nano structures using a mask-less process'
[patent_app_type] => utility
[patent_app_number] => 11/558441
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[patent_app_date] => 2006-11-09
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[pdf_file] => patents/07/473/07473912.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/558441 | Method and apparatus for patterning micro and nano structures using a mask-less process | Nov 8, 2006 | Issued |
Array
(
[id] => 225183
[patent_doc_number] => 07605368
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-20
[patent_title] => 'Vibration-type cantilever holder and scanning probe microscope'
[patent_app_type] => utility
[patent_app_number] => 11/595184
[patent_app_country] => US
[patent_app_date] => 2006-11-09
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/595184 | Vibration-type cantilever holder and scanning probe microscope | Nov 8, 2006 | Issued |
Array
(
[id] => 5092827
[patent_doc_number] => 20070114436
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-24
[patent_title] => 'Filament member, ion source, and ion implantation apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/594939
[patent_app_country] => US
[patent_app_date] => 2006-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[firstpage_image] =>[orig_patent_app_number] => 11594939
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594939 | Filament member, ion source, and ion implantation apparatus | Nov 8, 2006 | Abandoned |
Array
(
[id] => 5175046
[patent_doc_number] => 20070176103
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Method and device for observing a specimen in a field of view of an electron microscope'
[patent_app_type] => utility
[patent_app_number] => 11/594222
[patent_app_country] => US
[patent_app_date] => 2006-11-08
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[pdf_file] => publications/A1/0176/20070176103.pdf
[firstpage_image] =>[orig_patent_app_number] => 11594222
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594222 | Method and device for observing a specimen in a field of view of an electron microscope | Nov 7, 2006 | Issued |
Array
(
[id] => 5092780
[patent_doc_number] => 20070114389
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-24
[patent_title] => 'Non-contact detector system with plasma ion source'
[patent_app_type] => utility
[patent_app_number] => 11/594401
[patent_app_country] => US
[patent_app_date] => 2006-11-08
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11594401
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594401 | Non-contact detector system with plasma ion source | Nov 7, 2006 | Issued |
Array
(
[id] => 4654770
[patent_doc_number] => 20080023630
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-31
[patent_title] => 'POLYMER PROBE DOPED WITH CONDUCTIVE MATERIAL FOR MASS SPECTROMETRY'
[patent_app_type] => utility
[patent_app_number] => 11/557286
[patent_app_country] => US
[patent_app_date] => 2006-11-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
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[pdf_file] => publications/A1/0023/20080023630.pdf
[firstpage_image] =>[orig_patent_app_number] => 11557286
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/557286 | POLYMER PROBE DOPED WITH CONDUCTIVE MATERIAL FOR MASS SPECTROMETRY | Nov 6, 2006 | Abandoned |
Array
(
[id] => 300119
[patent_doc_number] => 07538322
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-05-26
[patent_title] => 'Method of fabricating sample membranes for transmission electron microscopy analysis'
[patent_app_type] => utility
[patent_app_number] => 11/556198
[patent_app_country] => US
[patent_app_date] => 2006-11-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/07/538/07538322.pdf
[firstpage_image] =>[orig_patent_app_number] => 11556198
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/556198 | Method of fabricating sample membranes for transmission electron microscopy analysis | Nov 2, 2006 | Issued |
Array
(
[id] => 4964419
[patent_doc_number] => 20080107239
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-08
[patent_title] => 'Collimator changer'
[patent_app_type] => utility
[patent_app_number] => 11/592803
[patent_app_country] => US
[patent_app_date] => 2006-11-03
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[firstpage_image] =>[orig_patent_app_number] => 11592803
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/592803 | Collimator changer | Nov 2, 2006 | Issued |
Array
(
[id] => 326907
[patent_doc_number] => 07514679
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-04-07
[patent_title] => 'Scanning probe microscope for measuring angle and method of measuring a sample using the same'
[patent_app_type] => utility
[patent_app_number] => 11/591794
[patent_app_country] => US
[patent_app_date] => 2006-11-01
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/514/07514679.pdf
[firstpage_image] =>[orig_patent_app_number] => 11591794
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/591794 | Scanning probe microscope for measuring angle and method of measuring a sample using the same | Oct 31, 2006 | Issued |
Array
(
[id] => 1077249
[patent_doc_number] => 07615765
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[patent_issue_date] => 2009-11-10
[patent_title] => 'Charged particle beam apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/589821
[patent_app_country] => US
[patent_app_date] => 2006-10-31
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[pdf_file] => patents/07/615/07615765.pdf
[firstpage_image] =>[orig_patent_app_number] => 11589821
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/589821 | Charged particle beam apparatus | Oct 30, 2006 | Issued |
Array
(
[id] => 174130
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[patent_title] => 'System for scanning probe microscope input device'
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[firstpage_image] =>[orig_patent_app_number] => 11555220
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/555220 | System for scanning probe microscope input device | Oct 30, 2006 | Issued |
Array
(
[id] => 4863684
[patent_doc_number] => 20080142743
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[patent_issue_date] => 2008-06-19
[patent_title] => 'Filling System For Potentially Hazardous Materials'
[patent_app_type] => utility
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[firstpage_image] =>[orig_patent_app_number] => 11553625
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/553625 | Filling system for potentially hazardous materials | Oct 26, 2006 | Issued |
Array
(
[id] => 185895
[patent_doc_number] => 07645996
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[patent_issue_date] => 2010-01-12
[patent_title] => 'Microscale gas discharge ion detector'
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Array
(
[id] => 5019337
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[patent_title] => 'Protecting Aperture for Charged Particle Emitter'
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Array
(
[id] => 225192
[patent_doc_number] => 07605377
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[patent_kind] => B2
[patent_issue_date] => 2009-10-20
[patent_title] => 'On-chip reflectron and ion optics'
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[firstpage_image] =>[orig_patent_app_number] => 11550241
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/550241 | On-chip reflectron and ion optics | Oct 16, 2006 | Issued |
Array
(
[id] => 4941603
[patent_doc_number] => 20080078926
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[patent_issue_date] => 2008-04-03
[patent_title] => 'SYSTEMS AND METHODS FOR DECREASING SETTLING TIMES IN MS/MS'
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/540897 | Broad beam ion implantation architecture | Sep 28, 2006 | Issued |