
Bernard E. Souw
Examiner (ID: 892, Phone: (571)272-2482 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 2881, 2814 |
| Total Applications | 1406 |
| Issued Applications | 1263 |
| Pending Applications | 36 |
| Abandoned Applications | 111 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5175067
[patent_doc_number] => 20070176125
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Particle beam therapy system and control system for particle beam therapy'
[patent_app_type] => utility
[patent_app_number] => 11/602489
[patent_app_country] => US
[patent_app_date] => 2006-11-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
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[pdf_file] => publications/A1/0176/20070176125.pdf
[firstpage_image] =>[orig_patent_app_number] => 11602489
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/602489 | Particle beam therapy system and control system for particle beam therapy | Nov 20, 2006 | Issued |
Array
(
[id] => 5233806
[patent_doc_number] => 20070125961
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[patent_kind] => A1
[patent_issue_date] => 2007-06-07
[patent_title] => 'MICROMECHANICAL SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 11/560830
[patent_app_country] => US
[patent_app_date] => 2006-11-16
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0125/20070125961.pdf
[firstpage_image] =>[orig_patent_app_number] => 11560830
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/560830 | MICROMECHANICAL SYSTEM | Nov 15, 2006 | Abandoned |
Array
(
[id] => 296332
[patent_doc_number] => 07541604
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-06-02
[patent_title] => 'Arrangement for the generation of short-wavelength radiation based on a gas discharge plasma and method for the production of coolant-carrying electrode housings'
[patent_app_type] => utility
[patent_app_number] => 11/560118
[patent_app_country] => US
[patent_app_date] => 2006-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => patents/07/541/07541604.pdf
[firstpage_image] =>[orig_patent_app_number] => 11560118
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/560118 | Arrangement for the generation of short-wavelength radiation based on a gas discharge plasma and method for the production of coolant-carrying electrode housings | Nov 14, 2006 | Issued |
Array
(
[id] => 296325
[patent_doc_number] => 07541597
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-06-02
[patent_title] => 'Automatic cleaning of ion sources'
[patent_app_type] => utility
[patent_app_number] => 11/559086
[patent_app_country] => US
[patent_app_date] => 2006-11-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 3761
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[pdf_file] => patents/07/541/07541597.pdf
[firstpage_image] =>[orig_patent_app_number] => 11559086
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/559086 | Automatic cleaning of ion sources | Nov 12, 2006 | Issued |
Array
(
[id] => 330770
[patent_doc_number] => 07511267
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-03-31
[patent_title] => 'Data-dependent accurate mass neutral loss analysis'
[patent_app_type] => utility
[patent_app_number] => 11/595023
[patent_app_country] => US
[patent_app_date] => 2006-11-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/07/511/07511267.pdf
[firstpage_image] =>[orig_patent_app_number] => 11595023
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/595023 | Data-dependent accurate mass neutral loss analysis | Nov 9, 2006 | Issued |
Array
(
[id] => 225183
[patent_doc_number] => 07605368
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[patent_kind] => B2
[patent_issue_date] => 2009-10-20
[patent_title] => 'Vibration-type cantilever holder and scanning probe microscope'
[patent_app_type] => utility
[patent_app_number] => 11/595184
[patent_app_country] => US
[patent_app_date] => 2006-11-09
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[pdf_file] => patents/07/605/07605368.pdf
[firstpage_image] =>[orig_patent_app_number] => 11595184
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/595184 | Vibration-type cantilever holder and scanning probe microscope | Nov 8, 2006 | Issued |
Array
(
[id] => 373608
[patent_doc_number] => 07473912
[patent_country] => US
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[patent_issue_date] => 2009-01-06
[patent_title] => 'Method and apparatus for patterning micro and nano structures using a mask-less process'
[patent_app_type] => utility
[patent_app_number] => 11/558441
[patent_app_country] => US
[patent_app_date] => 2006-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => patents/07/473/07473912.pdf
[firstpage_image] =>[orig_patent_app_number] => 11558441
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/558441 | Method and apparatus for patterning micro and nano structures using a mask-less process | Nov 8, 2006 | Issued |
Array
(
[id] => 5092788
[patent_doc_number] => 20070114397
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-24
[patent_title] => 'Circuit pattern inspection apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/594985
[patent_app_country] => US
[patent_app_date] => 2006-11-09
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0114/20070114397.pdf
[firstpage_image] =>[orig_patent_app_number] => 11594985
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594985 | Circuit pattern inspection apparatus | Nov 8, 2006 | Issued |
Array
(
[id] => 5092827
[patent_doc_number] => 20070114436
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-24
[patent_title] => 'Filament member, ion source, and ion implantation apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/594939
[patent_app_country] => US
[patent_app_date] => 2006-11-09
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11594939
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594939 | Filament member, ion source, and ion implantation apparatus | Nov 8, 2006 | Abandoned |
Array
(
[id] => 5175046
[patent_doc_number] => 20070176103
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Method and device for observing a specimen in a field of view of an electron microscope'
[patent_app_type] => utility
[patent_app_number] => 11/594222
[patent_app_country] => US
[patent_app_date] => 2006-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
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[pdf_file] => publications/A1/0176/20070176103.pdf
[firstpage_image] =>[orig_patent_app_number] => 11594222
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594222 | Method and device for observing a specimen in a field of view of an electron microscope | Nov 7, 2006 | Issued |
Array
(
[id] => 5092780
[patent_doc_number] => 20070114389
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-24
[patent_title] => 'Non-contact detector system with plasma ion source'
[patent_app_type] => utility
[patent_app_number] => 11/594401
[patent_app_country] => US
[patent_app_date] => 2006-11-08
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0114/20070114389.pdf
[firstpage_image] =>[orig_patent_app_number] => 11594401
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/594401 | Non-contact detector system with plasma ion source | Nov 7, 2006 | Issued |
Array
(
[id] => 4654770
[patent_doc_number] => 20080023630
[patent_country] => US
[patent_kind] => A1
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[patent_title] => 'POLYMER PROBE DOPED WITH CONDUCTIVE MATERIAL FOR MASS SPECTROMETRY'
[patent_app_type] => utility
[patent_app_number] => 11/557286
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/557286 | POLYMER PROBE DOPED WITH CONDUCTIVE MATERIAL FOR MASS SPECTROMETRY | Nov 6, 2006 | Abandoned |
Array
(
[id] => 300119
[patent_doc_number] => 07538322
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-05-26
[patent_title] => 'Method of fabricating sample membranes for transmission electron microscopy analysis'
[patent_app_type] => utility
[patent_app_number] => 11/556198
[patent_app_country] => US
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[pdf_file] => patents/07/538/07538322.pdf
[firstpage_image] =>[orig_patent_app_number] => 11556198
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/556198 | Method of fabricating sample membranes for transmission electron microscopy analysis | Nov 2, 2006 | Issued |
Array
(
[id] => 4964419
[patent_doc_number] => 20080107239
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-08
[patent_title] => 'Collimator changer'
[patent_app_type] => utility
[patent_app_number] => 11/592803
[patent_app_country] => US
[patent_app_date] => 2006-11-03
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11592803
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/592803 | Collimator changer | Nov 2, 2006 | Issued |
Array
(
[id] => 326907
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[patent_issue_date] => 2009-04-07
[patent_title] => 'Scanning probe microscope for measuring angle and method of measuring a sample using the same'
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[firstpage_image] =>[orig_patent_app_number] => 11591794
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/591794 | Scanning probe microscope for measuring angle and method of measuring a sample using the same | Oct 31, 2006 | Issued |
Array
(
[id] => 174130
[patent_doc_number] => 07659509
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[patent_issue_date] => 2010-02-09
[patent_title] => 'System for scanning probe microscope input device'
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[patent_app_number] => 11/555220
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[firstpage_image] =>[orig_patent_app_number] => 11555220
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/555220 | System for scanning probe microscope input device | Oct 30, 2006 | Issued |
Array
(
[id] => 1077249
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[patent_issue_date] => 2009-11-10
[patent_title] => 'Charged particle beam apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/589821 | Charged particle beam apparatus | Oct 30, 2006 | Issued |
Array
(
[id] => 4863684
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[patent_title] => 'Filling System For Potentially Hazardous Materials'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/553625 | Filling system for potentially hazardous materials | Oct 26, 2006 | Issued |
Array
(
[id] => 185895
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[patent_title] => 'Microscale gas discharge ion detector'
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[firstpage_image] =>[orig_patent_app_number] => 11553948
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/553948 | Microscale gas discharge ion detector | Oct 26, 2006 | Issued |
Array
(
[id] => 5019337
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[patent_title] => 'Protecting Aperture for Charged Particle Emitter'
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[firstpage_image] =>[orig_patent_app_number] => 11553153
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/553153 | Protecting Aperture for Charged Particle Emitter | Oct 25, 2006 | Abandoned |