Search

Bernard E. Souw

Examiner (ID: 7674, Phone: (571)272-2482 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2814
Total Applications
1406
Issued Applications
1263
Pending Applications
36
Abandoned Applications
111

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 900776 [patent_doc_number] => 07339164 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-04 [patent_title] => 'Systems and methods for ion mobility control' [patent_app_type] => utility [patent_app_number] => 11/509334 [patent_app_country] => US [patent_app_date] => 2006-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 39 [patent_no_of_words] => 10335 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 18 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/339/07339164.pdf [firstpage_image] =>[orig_patent_app_number] => 11509334 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509334
Systems and methods for ion mobility control Aug 22, 2006 Issued
Array ( [id] => 356501 [patent_doc_number] => 07488938 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-02-10 [patent_title] => 'Charge-control method and apparatus for electron beam imaging' [patent_app_type] => utility [patent_app_number] => 11/509137 [patent_app_country] => US [patent_app_date] => 2006-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4685 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/488/07488938.pdf [firstpage_image] =>[orig_patent_app_number] => 11509137 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509137
Charge-control method and apparatus for electron beam imaging Aug 22, 2006 Issued
Array ( [id] => 4679743 [patent_doc_number] => 20080245969 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-09 [patent_title] => 'Method and Apparatus for Creating a Plasma' [patent_app_type] => utility [patent_app_number] => 12/064249 [patent_app_country] => US [patent_app_date] => 2006-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3600 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0245/20080245969.pdf [firstpage_image] =>[orig_patent_app_number] => 12064249 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/064249
Method and apparatus for creating a plasma Aug 20, 2006 Issued
Array ( [id] => 4836568 [patent_doc_number] => 20080277584 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-13 [patent_title] => 'Method for Changing Energy of Electron Beam in Electron Column' [patent_app_type] => utility [patent_app_number] => 12/064076 [patent_app_country] => US [patent_app_date] => 2006-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2579 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0277/20080277584.pdf [firstpage_image] =>[orig_patent_app_number] => 12064076 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/064076
Method for Changing Energy of Electron Beam in Electron Column Aug 17, 2006 Abandoned
Array ( [id] => 264075 [patent_doc_number] => 07569842 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-04 [patent_title] => 'Method for correcting electron beam exposure data' [patent_app_type] => utility [patent_app_number] => 11/506171 [patent_app_country] => US [patent_app_date] => 2006-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 21 [patent_no_of_words] => 7529 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/569/07569842.pdf [firstpage_image] =>[orig_patent_app_number] => 11506171 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/506171
Method for correcting electron beam exposure data Aug 17, 2006 Issued
Array ( [id] => 4668261 [patent_doc_number] => 20080043321 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'EUV optics' [patent_app_type] => utility [patent_app_number] => 11/505177 [patent_app_country] => US [patent_app_date] => 2006-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9900 [patent_no_of_claims] => 62 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20080043321.pdf [firstpage_image] =>[orig_patent_app_number] => 11505177 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/505177
EUV optics Aug 15, 2006 Issued
Array ( [id] => 4756503 [patent_doc_number] => 20080308728 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'Atom Probes, Atom Probe Specimens, and Associated Methods' [patent_app_type] => utility [patent_app_number] => 12/064020 [patent_app_country] => US [patent_app_date] => 2006-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8089 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0308/20080308728.pdf [firstpage_image] =>[orig_patent_app_number] => 12064020 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/064020
Atom probes, atom probe specimens, and associated methods Aug 14, 2006 Issued
Array ( [id] => 113646 [patent_doc_number] => 07714304 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-11 [patent_title] => 'Computed tomography measuring arrangement and method' [patent_app_type] => utility [patent_app_number] => 12/064104 [patent_app_country] => US [patent_app_date] => 2006-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 5488 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/714/07714304.pdf [firstpage_image] =>[orig_patent_app_number] => 12064104 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/064104
Computed tomography measuring arrangement and method Aug 14, 2006 Issued
Array ( [id] => 4997484 [patent_doc_number] => 20070040118 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-22 [patent_title] => 'Method and apparatus for scanning and measurement by electron beam' [patent_app_type] => utility [patent_app_number] => 11/503997 [patent_app_country] => US [patent_app_date] => 2006-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 9286 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20070040118.pdf [firstpage_image] =>[orig_patent_app_number] => 11503997 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/503997
Method and apparatus for scanning and measurement by electron beam Aug 14, 2006 Issued
Array ( [id] => 4952508 [patent_doc_number] => 20080185532 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-07 [patent_title] => 'Radiation-Shielding Assembly Having Container Location Feature' [patent_app_type] => utility [patent_app_number] => 12/063452 [patent_app_country] => US [patent_app_date] => 2006-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5529 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 13 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0185/20080185532.pdf [firstpage_image] =>[orig_patent_app_number] => 12063452 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/063452
Radiation-shielding assembly having container location feature Aug 10, 2006 Issued
Array ( [id] => 5685765 [patent_doc_number] => 20060284080 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-21 [patent_title] => 'Obtaining tandem mass spectrometry data for multiple parent ions in an ion population' [patent_app_type] => utility [patent_app_number] => 11/494405 [patent_app_country] => US [patent_app_date] => 2006-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 11654 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20060284080.pdf [firstpage_image] =>[orig_patent_app_number] => 11494405 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/494405
Obtaining tandem mass spectrometry data for multiple parent ions in an ion population Jul 25, 2006 Issued
Array ( [id] => 4919059 [patent_doc_number] => 20080067370 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-20 [patent_title] => 'Electron microscope and scanning probe microscope calibration device' [patent_app_type] => utility [patent_app_number] => 11/428388 [patent_app_country] => US [patent_app_date] => 2006-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2049 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20080067370.pdf [firstpage_image] =>[orig_patent_app_number] => 11428388 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/428388
Electron microscope and scanning probe microscope calibration device Jun 30, 2006 Abandoned
Array ( [id] => 885508 [patent_doc_number] => 07351971 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-01 [patent_title] => 'Charged-particle beam instrument and method of detection' [patent_app_type] => utility [patent_app_number] => 11/479975 [patent_app_country] => US [patent_app_date] => 2006-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 5025 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/351/07351971.pdf [firstpage_image] =>[orig_patent_app_number] => 11479975 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/479975
Charged-particle beam instrument and method of detection Jun 29, 2006 Issued
Array ( [id] => 5601274 [patent_doc_number] => 20060291619 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Method and Apparatus for Material Identification' [patent_app_type] => utility [patent_app_number] => 11/427284 [patent_app_country] => US [patent_app_date] => 2006-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 10961 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0291/20060291619.pdf [firstpage_image] =>[orig_patent_app_number] => 11427284 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/427284
Method and apparatus for material identification Jun 27, 2006 Issued
Array ( [id] => 4919118 [patent_doc_number] => 20080067430 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-20 [patent_title] => 'NON-AMBIPOLAR RADIO-FREQUENCY PLASMA ELECTRON SOURCE AND SYSTEMS AND METHODS FOR GENERATING ELECTRON BEAMS' [patent_app_type] => utility [patent_app_number] => 11/427273 [patent_app_country] => US [patent_app_date] => 2006-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10649 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20080067430.pdf [firstpage_image] =>[orig_patent_app_number] => 11427273 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/427273
Non-ambipolar radio-frequency plasma electron source and systems and methods for generating electron beams Jun 27, 2006 Issued
Array ( [id] => 334549 [patent_doc_number] => 07507961 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-24 [patent_title] => 'Method and apparatus of pattern inspection and semiconductor inspection system using the same' [patent_app_type] => utility [patent_app_number] => 11/453229 [patent_app_country] => US [patent_app_date] => 2006-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 65 [patent_no_of_words] => 12365 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/507/07507961.pdf [firstpage_image] =>[orig_patent_app_number] => 11453229 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/453229
Method and apparatus of pattern inspection and semiconductor inspection system using the same Jun 14, 2006 Issued
Array ( [id] => 370094 [patent_doc_number] => 07476868 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-13 [patent_title] => 'Apparatus and method for generating ions of an ion implanter' [patent_app_type] => utility [patent_app_number] => 11/453075 [patent_app_country] => US [patent_app_date] => 2006-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 4289 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/476/07476868.pdf [firstpage_image] =>[orig_patent_app_number] => 11453075 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/453075
Apparatus and method for generating ions of an ion implanter Jun 14, 2006 Issued
Array ( [id] => 5601277 [patent_doc_number] => 20060291622 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Inspection system with material identification' [patent_app_type] => utility [patent_app_number] => 11/453545 [patent_app_country] => US [patent_app_date] => 2006-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 10284 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0291/20060291622.pdf [firstpage_image] =>[orig_patent_app_number] => 11453545 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/453545
Inspection system with material identification Jun 13, 2006 Issued
Array ( [id] => 5685790 [patent_doc_number] => 20060284105 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-21 [patent_title] => 'Ion source' [patent_app_type] => utility [patent_app_number] => 11/452563 [patent_app_country] => US [patent_app_date] => 2006-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2361 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20060284105.pdf [firstpage_image] =>[orig_patent_app_number] => 11452563 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/452563
Ion source Jun 13, 2006 Abandoned
Array ( [id] => 370097 [patent_doc_number] => 07476871 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-13 [patent_title] => 'Specimen box for electron microscope capable of observing general specimen and live cell' [patent_app_type] => utility [patent_app_number] => 11/452333 [patent_app_country] => US [patent_app_date] => 2006-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 12 [patent_no_of_words] => 3579 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/476/07476871.pdf [firstpage_image] =>[orig_patent_app_number] => 11452333 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/452333
Specimen box for electron microscope capable of observing general specimen and live cell Jun 13, 2006 Issued
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