Search

Bernard E. Souw

Examiner (ID: 7674, Phone: (571)272-2482 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2814
Total Applications
1406
Issued Applications
1263
Pending Applications
36
Abandoned Applications
111

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5060234 [patent_doc_number] => 20070221871 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-27 [patent_title] => 'Determining ion beam parallelism using refraction method' [patent_app_type] => utility [patent_app_number] => 11/386596 [patent_app_country] => US [patent_app_date] => 2006-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5419 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0221/20070221871.pdf [firstpage_image] =>[orig_patent_app_number] => 11386596 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/386596
Determining ion beam parallelism using refraction method Mar 21, 2006 Issued
Array ( [id] => 5832077 [patent_doc_number] => 20060243907 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-02 [patent_title] => 'Substrate inspection method, manufacturing method of semiconductor device and substrate inspection apparatus' [patent_app_type] => utility [patent_app_number] => 11/385706 [patent_app_country] => US [patent_app_date] => 2006-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5119 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0243/20060243907.pdf [firstpage_image] =>[orig_patent_app_number] => 11385706 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/385706
Substrate inspection method, manufacturing method of semiconductor device and substrate inspection apparatus Mar 21, 2006 Issued
Array ( [id] => 5060200 [patent_doc_number] => 20070221837 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-27 [patent_title] => 'Multiple electrospray probe interface for mass spectrometry' [patent_app_type] => utility [patent_app_number] => 11/386389 [patent_app_country] => US [patent_app_date] => 2006-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2278 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0221/20070221837.pdf [firstpage_image] =>[orig_patent_app_number] => 11386389 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/386389
Multiple electrospray probe interface for mass spectrometry Mar 21, 2006 Issued
Array ( [id] => 5599455 [patent_doc_number] => 20060289800 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Implanting a substrate using an ion beam' [patent_app_type] => utility [patent_app_number] => 11/386090 [patent_app_country] => US [patent_app_date] => 2006-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5737 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0289/20060289800.pdf [firstpage_image] =>[orig_patent_app_number] => 11386090 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/386090
Implanting a substrate using an ion beam Mar 21, 2006 Abandoned
Array ( [id] => 5060233 [patent_doc_number] => 20070221870 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-27 [patent_title] => 'Technique for isocentric ion beam scanning' [patent_app_type] => utility [patent_app_number] => 11/385634 [patent_app_country] => US [patent_app_date] => 2006-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3394 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0221/20070221870.pdf [firstpage_image] =>[orig_patent_app_number] => 11385634 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/385634
Technique for isocentric ion beam scanning Mar 20, 2006 Issued
Array ( [id] => 5664550 [patent_doc_number] => 20060169900 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-03 [patent_title] => 'Testing apparatus using charged particles and device manufacturing method using the testing apparatus' [patent_app_type] => utility [patent_app_number] => 11/378465 [patent_app_country] => US [patent_app_date] => 2006-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 151 [patent_figures_cnt] => 151 [patent_no_of_words] => 99697 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20060169900.pdf [firstpage_image] =>[orig_patent_app_number] => 11378465 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/378465
Testing apparatus using charged particles and device manufacturing method using the testing apparatus Mar 19, 2006 Issued
Array ( [id] => 5451114 [patent_doc_number] => 20090067150 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-12 [patent_title] => 'Protection Film for Preventing Leakage of Information, Portable Pouch, Card Case, and Information-Leakage Preventing Plate' [patent_app_type] => utility [patent_app_number] => 11/886814 [patent_app_country] => US [patent_app_date] => 2006-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 37 [patent_no_of_words] => 14854 [patent_no_of_claims] => 59 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20090067150.pdf [firstpage_image] =>[orig_patent_app_number] => 11886814 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/886814
Protection Film for Preventing Leakage of Information, Portable Pouch, Card Case, and Information-Leakage Preventing Plate Mar 19, 2006 Abandoned
Array ( [id] => 806923 [patent_doc_number] => 07420106 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-09-02 [patent_title] => 'Scanning probe characterization of surfaces' [patent_app_type] => utility [patent_app_number] => 11/375867 [patent_app_country] => US [patent_app_date] => 2006-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 7550 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/420/07420106.pdf [firstpage_image] =>[orig_patent_app_number] => 11375867 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/375867
Scanning probe characterization of surfaces Mar 14, 2006 Issued
Array ( [id] => 419020 [patent_doc_number] => 07276693 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-02 [patent_title] => 'Inspection method and apparatus using charged particle beam' [patent_app_type] => utility [patent_app_number] => 11/375070 [patent_app_country] => US [patent_app_date] => 2006-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 24 [patent_no_of_words] => 10427 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/276/07276693.pdf [firstpage_image] =>[orig_patent_app_number] => 11375070 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/375070
Inspection method and apparatus using charged particle beam Mar 14, 2006 Issued
Array ( [id] => 840708 [patent_doc_number] => 07391039 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-06-24 [patent_title] => 'Semiconductor processing method and system' [patent_app_type] => utility [patent_app_number] => 11/371935 [patent_app_country] => US [patent_app_date] => 2006-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 5789 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/391/07391039.pdf [firstpage_image] =>[orig_patent_app_number] => 11371935 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/371935
Semiconductor processing method and system Mar 9, 2006 Issued
Array ( [id] => 5256616 [patent_doc_number] => 20070210248 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-13 [patent_title] => 'Technique for monitoring and controlling a plasma process' [patent_app_type] => utility [patent_app_number] => 11/371907 [patent_app_country] => US [patent_app_date] => 2006-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 5493 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0210/20070210248.pdf [firstpage_image] =>[orig_patent_app_number] => 11371907 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/371907
Technique for monitoring and controlling a plasma process Mar 9, 2006 Issued
Array ( [id] => 5038007 [patent_doc_number] => 20070090289 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'Method of observing live unit under electron microscope' [patent_app_type] => utility [patent_app_number] => 11/370916 [patent_app_country] => US [patent_app_date] => 2006-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2485 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20070090289.pdf [firstpage_image] =>[orig_patent_app_number] => 11370916 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/370916
Method of observing live unit under electron microscope Mar 8, 2006 Abandoned
Array ( [id] => 4701705 [patent_doc_number] => 20080061227 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-13 [patent_title] => 'Branched radio frequency multipole' [patent_app_type] => utility [patent_app_number] => 11/373354 [patent_app_country] => US [patent_app_date] => 2006-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3597 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0061/20080061227.pdf [firstpage_image] =>[orig_patent_app_number] => 11373354 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/373354
Branched radio frequency multipole Mar 8, 2006 Issued
Array ( [id] => 4492699 [patent_doc_number] => 07918293 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-04-05 [patent_title] => 'Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume' [patent_app_type] => utility [patent_app_number] => 11/370425 [patent_app_country] => US [patent_app_date] => 2006-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 18 [patent_no_of_words] => 7965 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/918/07918293.pdf [firstpage_image] =>[orig_patent_app_number] => 11370425 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/370425
Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume Mar 7, 2006 Issued
Array ( [id] => 457387 [patent_doc_number] => 07244949 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-17 [patent_title] => 'Particle-optical systems and arrangements and particle-optical components for such systems and arrangements' [patent_app_type] => utility [patent_app_number] => 11/366533 [patent_app_country] => US [patent_app_date] => 2006-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 30 [patent_no_of_words] => 25140 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/244/07244949.pdf [firstpage_image] =>[orig_patent_app_number] => 11366533 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/366533
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Mar 2, 2006 Issued
Array ( [id] => 5703071 [patent_doc_number] => 20060192118 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-31 [patent_title] => 'Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus' [patent_app_type] => utility [patent_app_number] => 11/360948 [patent_app_country] => US [patent_app_date] => 2006-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4592 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0192/20060192118.pdf [firstpage_image] =>[orig_patent_app_number] => 11360948 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/360948
Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus Feb 22, 2006 Issued
Array ( [id] => 5703068 [patent_doc_number] => 20060192115 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-31 [patent_title] => 'Addressable field enhancement microscopy' [patent_app_type] => utility [patent_app_number] => 11/361018 [patent_app_country] => US [patent_app_date] => 2006-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 12547 [patent_no_of_claims] => 48 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0192/20060192115.pdf [firstpage_image] =>[orig_patent_app_number] => 11361018 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/361018
Addressable field enhancement microscopy Feb 22, 2006 Issued
Array ( [id] => 823929 [patent_doc_number] => 07405402 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-07-29 [patent_title] => 'Method and apparatus for aberration-insensitive electron beam imaging' [patent_app_type] => utility [patent_app_number] => 11/360930 [patent_app_country] => US [patent_app_date] => 2006-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 3405 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/405/07405402.pdf [firstpage_image] =>[orig_patent_app_number] => 11360930 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/360930
Method and apparatus for aberration-insensitive electron beam imaging Feb 21, 2006 Issued
Array ( [id] => 370111 [patent_doc_number] => 07476885 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-13 [patent_title] => 'Disinfecting device utilizing ultraviolet radiation' [patent_app_type] => utility [patent_app_number] => 11/360046 [patent_app_country] => US [patent_app_date] => 2006-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 19 [patent_no_of_words] => 10118 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/476/07476885.pdf [firstpage_image] =>[orig_patent_app_number] => 11360046 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/360046
Disinfecting device utilizing ultraviolet radiation Feb 21, 2006 Issued
Array ( [id] => 803565 [patent_doc_number] => 07423269 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-09-09 [patent_title] => 'Automated feature analysis with off-axis tilting' [patent_app_type] => utility [patent_app_number] => 11/360325 [patent_app_country] => US [patent_app_date] => 2006-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 4859 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/423/07423269.pdf [firstpage_image] =>[orig_patent_app_number] => 11360325 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/360325
Automated feature analysis with off-axis tilting Feb 21, 2006 Issued
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