
Bernard E. Souw
Examiner (ID: 892, Phone: (571)272-2482 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 2881, 2814 |
| Total Applications | 1406 |
| Issued Applications | 1263 |
| Pending Applications | 36 |
| Abandoned Applications | 111 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 538218
[patent_doc_number] => 07173252
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-02-06
[patent_title] => 'Ionizer and method for gas-cluster ion-beam formation'
[patent_app_type] => utility
[patent_app_number] => 11/257524
[patent_app_country] => US
[patent_app_date] => 2005-10-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 7329
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 78
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/173/07173252.pdf
[firstpage_image] =>[orig_patent_app_number] => 11257524
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/257524 | Ionizer and method for gas-cluster ion-beam formation | Oct 24, 2005 | Issued |
Array
(
[id] => 5804974
[patent_doc_number] => 20060091326
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-05-04
[patent_title] => 'Fluid treatment system and radiation source module for use therein'
[patent_app_type] => utility
[patent_app_number] => 11/250473
[patent_app_country] => US
[patent_app_date] => 2005-10-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 7350
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0091/20060091326.pdf
[firstpage_image] =>[orig_patent_app_number] => 11250473
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/250473 | Fluid treatment system and radiation source module for use therein | Oct 16, 2005 | Issued |
Array
(
[id] => 5713129
[patent_doc_number] => 20060076492
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-13
[patent_title] => 'Transmission electron microscope and image observation method using it'
[patent_app_type] => utility
[patent_app_number] => 11/245428
[patent_app_country] => US
[patent_app_date] => 2005-10-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4346
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0076/20060076492.pdf
[firstpage_image] =>[orig_patent_app_number] => 11245428
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/245428 | Transmission electron microscope and image observation method using it | Oct 6, 2005 | Issued |
Array
(
[id] => 534777
[patent_doc_number] => 07180058
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-02-20
[patent_title] => 'LDI/MALDI source for enhanced spatial resolution'
[patent_app_type] => utility
[patent_app_number] => 11/244626
[patent_app_country] => US
[patent_app_date] => 2005-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3786
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/180/07180058.pdf
[firstpage_image] =>[orig_patent_app_number] => 11244626
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/244626 | LDI/MALDI source for enhanced spatial resolution | Oct 4, 2005 | Issued |
Array
(
[id] => 370105
[patent_doc_number] => 07476879
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-01-13
[patent_title] => 'Placement effects correction in raster pattern generator'
[patent_app_type] => utility
[patent_app_number] => 11/241887
[patent_app_country] => US
[patent_app_date] => 2005-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3452
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/476/07476879.pdf
[firstpage_image] =>[orig_patent_app_number] => 11241887
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/241887 | Placement effects correction in raster pattern generator | Sep 29, 2005 | Issued |
Array
(
[id] => 345401
[patent_doc_number] => 07498591
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-03-03
[patent_title] => 'Critical dimension effects correction in raster pattern generator'
[patent_app_type] => utility
[patent_app_number] => 11/241792
[patent_app_country] => US
[patent_app_date] => 2005-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3158
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 52
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/498/07498591.pdf
[firstpage_image] =>[orig_patent_app_number] => 11241792
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/241792 | Critical dimension effects correction in raster pattern generator | Sep 29, 2005 | Issued |
Array
(
[id] => 401483
[patent_doc_number] => 07291849
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-11-06
[patent_title] => 'Calibration standard for transmission electron microscopy'
[patent_app_type] => utility
[patent_app_number] => 11/237410
[patent_app_country] => US
[patent_app_date] => 2005-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 2361
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 73
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/291/07291849.pdf
[firstpage_image] =>[orig_patent_app_number] => 11237410
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/237410 | Calibration standard for transmission electron microscopy | Sep 27, 2005 | Issued |
Array
(
[id] => 256648
[patent_doc_number] => 07576323
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-08-18
[patent_title] => 'Point-of-care mass spectrometer system'
[patent_app_type] => utility
[patent_app_number] => 11/663844
[patent_app_country] => US
[patent_app_date] => 2005-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4023
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/576/07576323.pdf
[firstpage_image] =>[orig_patent_app_number] => 11663844
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/663844 | Point-of-care mass spectrometer system | Sep 26, 2005 | Issued |
Array
(
[id] => 511923
[patent_doc_number] => 07199383
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-04-03
[patent_title] => 'Method for reducing particles during ion implantation'
[patent_app_type] => utility
[patent_app_number] => 11/161995
[patent_app_country] => US
[patent_app_date] => 2005-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1660
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 168
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/199/07199383.pdf
[firstpage_image] =>[orig_patent_app_number] => 11161995
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/161995 | Method for reducing particles during ion implantation | Aug 24, 2005 | Issued |
Array
(
[id] => 4997477
[patent_doc_number] => 20070040111
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-22
[patent_title] => 'Dual mode ion mobility spectrometer and method for ion mobility spectrometry'
[patent_app_type] => utility
[patent_app_number] => 11/209534
[patent_app_country] => US
[patent_app_date] => 2005-08-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 8993
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0040/20070040111.pdf
[firstpage_image] =>[orig_patent_app_number] => 11209534
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/209534 | Dual mode ion mobility spectrometer and method for ion mobility spectrometry | Aug 21, 2005 | Issued |
Array
(
[id] => 538094
[patent_doc_number] => 07173241
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-02-06
[patent_title] => 'Sample plate for matrix-assisted laser desorption and ionization mass spectrometry'
[patent_app_type] => utility
[patent_app_number] => 11/207393
[patent_app_country] => US
[patent_app_date] => 2005-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 36
[patent_figures_cnt] => 36
[patent_no_of_words] => 7760
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 55
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/173/07173241.pdf
[firstpage_image] =>[orig_patent_app_number] => 11207393
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/207393 | Sample plate for matrix-assisted laser desorption and ionization mass spectrometry | Aug 18, 2005 | Issued |
Array
(
[id] => 5634882
[patent_doc_number] => 20060065855
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-30
[patent_title] => 'Particle beam irradiarion system'
[patent_app_type] => utility
[patent_app_number] => 11/206150
[patent_app_country] => US
[patent_app_date] => 2005-08-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3356
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0065/20060065855.pdf
[firstpage_image] =>[orig_patent_app_number] => 11206150
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/206150 | Particle beam irradiation system | Aug 17, 2005 | Issued |
Array
(
[id] => 547111
[patent_doc_number] => 07170055
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-01-30
[patent_title] => 'Nanotube arrangements and methods therefor'
[patent_app_type] => utility
[patent_app_number] => 11/206672
[patent_app_country] => US
[patent_app_date] => 2005-08-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4543
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/170/07170055.pdf
[firstpage_image] =>[orig_patent_app_number] => 11206672
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/206672 | Nanotube arrangements and methods therefor | Aug 17, 2005 | Issued |
Array
(
[id] => 5724080
[patent_doc_number] => 20060054840
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-16
[patent_title] => 'Focused ion beam apparatus and aperture'
[patent_app_type] => utility
[patent_app_number] => 11/205086
[patent_app_country] => US
[patent_app_date] => 2005-08-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3268
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0054/20060054840.pdf
[firstpage_image] =>[orig_patent_app_number] => 11205086
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/205086 | Focused ion beam apparatus and aperture | Aug 16, 2005 | Issued |
Array
(
[id] => 5691575
[patent_doc_number] => 20060151720
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-07-13
[patent_title] => 'Electromagnetic focusing method for electron-beam lithography system'
[patent_app_type] => utility
[patent_app_number] => 11/205148
[patent_app_country] => US
[patent_app_date] => 2005-08-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4581
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0151/20060151720.pdf
[firstpage_image] =>[orig_patent_app_number] => 11205148
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/205148 | Electromagnetic focusing method for electron-beam lithography system | Aug 16, 2005 | Issued |
Array
(
[id] => 5588687
[patent_doc_number] => 20060038138
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-23
[patent_title] => 'Apparatus for ion implantation'
[patent_app_type] => utility
[patent_app_number] => 11/205651
[patent_app_country] => US
[patent_app_date] => 2005-08-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 884
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0038/20060038138.pdf
[firstpage_image] =>[orig_patent_app_number] => 11205651
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/205651 | Apparatus for ion implantation | Aug 16, 2005 | Issued |
Array
(
[id] => 487286
[patent_doc_number] => 07217924
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-05-15
[patent_title] => 'Holey mirror arrangement for dual-energy e-beam inspector'
[patent_app_type] => utility
[patent_app_number] => 11/205367
[patent_app_country] => US
[patent_app_date] => 2005-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5224
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 61
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/217/07217924.pdf
[firstpage_image] =>[orig_patent_app_number] => 11205367
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/205367 | Holey mirror arrangement for dual-energy e-beam inspector | Aug 15, 2005 | Issued |
Array
(
[id] => 817384
[patent_doc_number] => 07411192
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-08-12
[patent_title] => 'Focused ion beam apparatus and focused ion beam irradiation method'
[patent_app_type] => utility
[patent_app_number] => 11/189901
[patent_app_country] => US
[patent_app_date] => 2005-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 12
[patent_no_of_words] => 5933
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/411/07411192.pdf
[firstpage_image] =>[orig_patent_app_number] => 11189901
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/189901 | Focused ion beam apparatus and focused ion beam irradiation method | Jul 26, 2005 | Issued |
Array
(
[id] => 5588674
[patent_doc_number] => 20060038125
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-23
[patent_title] => 'Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system'
[patent_app_type] => utility
[patent_app_number] => 11/189897
[patent_app_country] => US
[patent_app_date] => 2005-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 11819
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0038/20060038125.pdf
[firstpage_image] =>[orig_patent_app_number] => 11189897
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/189897 | Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system | Jul 26, 2005 | Issued |
Array
(
[id] => 865403
[patent_doc_number] => 07368713
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-05-06
[patent_title] => 'Method and apparatus for inspecting semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/189898
[patent_app_country] => US
[patent_app_date] => 2005-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 45
[patent_no_of_words] => 10686
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 190
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/368/07368713.pdf
[firstpage_image] =>[orig_patent_app_number] => 11189898
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/189898 | Method and apparatus for inspecting semiconductor device | Jul 26, 2005 | Issued |