Search

Bernard E. Souw

Examiner (ID: 892, Phone: (571)272-2482 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2814
Total Applications
1406
Issued Applications
1263
Pending Applications
36
Abandoned Applications
111

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 538218 [patent_doc_number] => 07173252 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-06 [patent_title] => 'Ionizer and method for gas-cluster ion-beam formation' [patent_app_type] => utility [patent_app_number] => 11/257524 [patent_app_country] => US [patent_app_date] => 2005-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7329 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/173/07173252.pdf [firstpage_image] =>[orig_patent_app_number] => 11257524 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/257524
Ionizer and method for gas-cluster ion-beam formation Oct 24, 2005 Issued
Array ( [id] => 5804974 [patent_doc_number] => 20060091326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-04 [patent_title] => 'Fluid treatment system and radiation source module for use therein' [patent_app_type] => utility [patent_app_number] => 11/250473 [patent_app_country] => US [patent_app_date] => 2005-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 7350 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20060091326.pdf [firstpage_image] =>[orig_patent_app_number] => 11250473 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/250473
Fluid treatment system and radiation source module for use therein Oct 16, 2005 Issued
Array ( [id] => 5713129 [patent_doc_number] => 20060076492 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-13 [patent_title] => 'Transmission electron microscope and image observation method using it' [patent_app_type] => utility [patent_app_number] => 11/245428 [patent_app_country] => US [patent_app_date] => 2005-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4346 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0076/20060076492.pdf [firstpage_image] =>[orig_patent_app_number] => 11245428 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/245428
Transmission electron microscope and image observation method using it Oct 6, 2005 Issued
Array ( [id] => 534777 [patent_doc_number] => 07180058 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-02-20 [patent_title] => 'LDI/MALDI source for enhanced spatial resolution' [patent_app_type] => utility [patent_app_number] => 11/244626 [patent_app_country] => US [patent_app_date] => 2005-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3786 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/180/07180058.pdf [firstpage_image] =>[orig_patent_app_number] => 11244626 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/244626
LDI/MALDI source for enhanced spatial resolution Oct 4, 2005 Issued
Array ( [id] => 370105 [patent_doc_number] => 07476879 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-13 [patent_title] => 'Placement effects correction in raster pattern generator' [patent_app_type] => utility [patent_app_number] => 11/241887 [patent_app_country] => US [patent_app_date] => 2005-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3452 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/476/07476879.pdf [firstpage_image] =>[orig_patent_app_number] => 11241887 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/241887
Placement effects correction in raster pattern generator Sep 29, 2005 Issued
Array ( [id] => 345401 [patent_doc_number] => 07498591 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-03 [patent_title] => 'Critical dimension effects correction in raster pattern generator' [patent_app_type] => utility [patent_app_number] => 11/241792 [patent_app_country] => US [patent_app_date] => 2005-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3158 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/498/07498591.pdf [firstpage_image] =>[orig_patent_app_number] => 11241792 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/241792
Critical dimension effects correction in raster pattern generator Sep 29, 2005 Issued
Array ( [id] => 401483 [patent_doc_number] => 07291849 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-11-06 [patent_title] => 'Calibration standard for transmission electron microscopy' [patent_app_type] => utility [patent_app_number] => 11/237410 [patent_app_country] => US [patent_app_date] => 2005-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2361 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/291/07291849.pdf [firstpage_image] =>[orig_patent_app_number] => 11237410 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/237410
Calibration standard for transmission electron microscopy Sep 27, 2005 Issued
Array ( [id] => 256648 [patent_doc_number] => 07576323 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-18 [patent_title] => 'Point-of-care mass spectrometer system' [patent_app_type] => utility [patent_app_number] => 11/663844 [patent_app_country] => US [patent_app_date] => 2005-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4023 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/576/07576323.pdf [firstpage_image] =>[orig_patent_app_number] => 11663844 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/663844
Point-of-care mass spectrometer system Sep 26, 2005 Issued
Array ( [id] => 511923 [patent_doc_number] => 07199383 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-04-03 [patent_title] => 'Method for reducing particles during ion implantation' [patent_app_type] => utility [patent_app_number] => 11/161995 [patent_app_country] => US [patent_app_date] => 2005-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1660 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/199/07199383.pdf [firstpage_image] =>[orig_patent_app_number] => 11161995 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/161995
Method for reducing particles during ion implantation Aug 24, 2005 Issued
Array ( [id] => 4997477 [patent_doc_number] => 20070040111 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-22 [patent_title] => 'Dual mode ion mobility spectrometer and method for ion mobility spectrometry' [patent_app_type] => utility [patent_app_number] => 11/209534 [patent_app_country] => US [patent_app_date] => 2005-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8993 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20070040111.pdf [firstpage_image] =>[orig_patent_app_number] => 11209534 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/209534
Dual mode ion mobility spectrometer and method for ion mobility spectrometry Aug 21, 2005 Issued
Array ( [id] => 538094 [patent_doc_number] => 07173241 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-06 [patent_title] => 'Sample plate for matrix-assisted laser desorption and ionization mass spectrometry' [patent_app_type] => utility [patent_app_number] => 11/207393 [patent_app_country] => US [patent_app_date] => 2005-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 36 [patent_figures_cnt] => 36 [patent_no_of_words] => 7760 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/173/07173241.pdf [firstpage_image] =>[orig_patent_app_number] => 11207393 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/207393
Sample plate for matrix-assisted laser desorption and ionization mass spectrometry Aug 18, 2005 Issued
Array ( [id] => 5634882 [patent_doc_number] => 20060065855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-30 [patent_title] => 'Particle beam irradiarion system' [patent_app_type] => utility [patent_app_number] => 11/206150 [patent_app_country] => US [patent_app_date] => 2005-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3356 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0065/20060065855.pdf [firstpage_image] =>[orig_patent_app_number] => 11206150 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/206150
Particle beam irradiation system Aug 17, 2005 Issued
Array ( [id] => 547111 [patent_doc_number] => 07170055 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-01-30 [patent_title] => 'Nanotube arrangements and methods therefor' [patent_app_type] => utility [patent_app_number] => 11/206672 [patent_app_country] => US [patent_app_date] => 2005-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4543 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/170/07170055.pdf [firstpage_image] =>[orig_patent_app_number] => 11206672 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/206672
Nanotube arrangements and methods therefor Aug 17, 2005 Issued
Array ( [id] => 5724080 [patent_doc_number] => 20060054840 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-16 [patent_title] => 'Focused ion beam apparatus and aperture' [patent_app_type] => utility [patent_app_number] => 11/205086 [patent_app_country] => US [patent_app_date] => 2005-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3268 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20060054840.pdf [firstpage_image] =>[orig_patent_app_number] => 11205086 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/205086
Focused ion beam apparatus and aperture Aug 16, 2005 Issued
Array ( [id] => 5691575 [patent_doc_number] => 20060151720 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-13 [patent_title] => 'Electromagnetic focusing method for electron-beam lithography system' [patent_app_type] => utility [patent_app_number] => 11/205148 [patent_app_country] => US [patent_app_date] => 2005-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4581 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0151/20060151720.pdf [firstpage_image] =>[orig_patent_app_number] => 11205148 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/205148
Electromagnetic focusing method for electron-beam lithography system Aug 16, 2005 Issued
Array ( [id] => 5588687 [patent_doc_number] => 20060038138 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-23 [patent_title] => 'Apparatus for ion implantation' [patent_app_type] => utility [patent_app_number] => 11/205651 [patent_app_country] => US [patent_app_date] => 2005-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 884 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0038/20060038138.pdf [firstpage_image] =>[orig_patent_app_number] => 11205651 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/205651
Apparatus for ion implantation Aug 16, 2005 Issued
Array ( [id] => 487286 [patent_doc_number] => 07217924 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-05-15 [patent_title] => 'Holey mirror arrangement for dual-energy e-beam inspector' [patent_app_type] => utility [patent_app_number] => 11/205367 [patent_app_country] => US [patent_app_date] => 2005-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5224 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/217/07217924.pdf [firstpage_image] =>[orig_patent_app_number] => 11205367 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/205367
Holey mirror arrangement for dual-energy e-beam inspector Aug 15, 2005 Issued
Array ( [id] => 817384 [patent_doc_number] => 07411192 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-12 [patent_title] => 'Focused ion beam apparatus and focused ion beam irradiation method' [patent_app_type] => utility [patent_app_number] => 11/189901 [patent_app_country] => US [patent_app_date] => 2005-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 12 [patent_no_of_words] => 5933 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/411/07411192.pdf [firstpage_image] =>[orig_patent_app_number] => 11189901 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/189901
Focused ion beam apparatus and focused ion beam irradiation method Jul 26, 2005 Issued
Array ( [id] => 5588674 [patent_doc_number] => 20060038125 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-23 [patent_title] => 'Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system' [patent_app_type] => utility [patent_app_number] => 11/189897 [patent_app_country] => US [patent_app_date] => 2005-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 11819 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0038/20060038125.pdf [firstpage_image] =>[orig_patent_app_number] => 11189897 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/189897
Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system Jul 26, 2005 Issued
Array ( [id] => 865403 [patent_doc_number] => 07368713 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-05-06 [patent_title] => 'Method and apparatus for inspecting semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/189898 [patent_app_country] => US [patent_app_date] => 2005-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 45 [patent_no_of_words] => 10686 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/368/07368713.pdf [firstpage_image] =>[orig_patent_app_number] => 11189898 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/189898
Method and apparatus for inspecting semiconductor device Jul 26, 2005 Issued
Menu