Search

Bernard E. Souw

Examiner (ID: 7674, Phone: (571)272-2482 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2814
Total Applications
1406
Issued Applications
1263
Pending Applications
36
Abandoned Applications
111

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6936295 [patent_doc_number] => 20050109856 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-26 [patent_title] => 'Method for preparing polymer electrosprays' [patent_app_type] => utility [patent_app_number] => 10/961669 [patent_app_country] => US [patent_app_date] => 2004-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5720 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20050109856.pdf [firstpage_image] =>[orig_patent_app_number] => 10961669 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/961669
Method for preparing polymer electrosprays Oct 7, 2004 Pending
Array ( [id] => 6936394 [patent_doc_number] => 20050109955 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-26 [patent_title] => 'Charged particle beam lithography system, pattern drawing method, and method of manufacturing semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/959508 [patent_app_country] => US [patent_app_date] => 2004-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3791 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20050109955.pdf [firstpage_image] =>[orig_patent_app_number] => 10959508 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/959508
Charged particle beam lithography system, pattern drawing method, and method of manufacturing semiconductor device Oct 6, 2004 Issued
Array ( [id] => 700037 [patent_doc_number] => 07067807 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-27 [patent_title] => 'Charged particle beam column and method of its operation' [patent_app_type] => utility [patent_app_number] => 10/937802 [patent_app_country] => US [patent_app_date] => 2004-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 21 [patent_no_of_words] => 5114 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/067/07067807.pdf [firstpage_image] =>[orig_patent_app_number] => 10937802 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/937802
Charged particle beam column and method of its operation Sep 7, 2004 Issued
Array ( [id] => 7197821 [patent_doc_number] => 20050051720 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-10 [patent_title] => 'Method of automatically calibrating electronic controls in a mass spectrometer' [patent_app_type] => utility [patent_app_number] => 10/933972 [patent_app_country] => US [patent_app_date] => 2004-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7201 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0051/20050051720.pdf [firstpage_image] =>[orig_patent_app_number] => 10933972 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/933972
Method of automatically calibrating electronic controls in a mass spectrometer Sep 2, 2004 Issued
Array ( [id] => 7189909 [patent_doc_number] => 20050040137 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-24 [patent_title] => 'Low-aberration deflectors for use in charged-particle-beam optical systems, and methods for fabricating such deflectors' [patent_app_type] => utility [patent_app_number] => 10/934016 [patent_app_country] => US [patent_app_date] => 2004-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 9250 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20050040137.pdf [firstpage_image] =>[orig_patent_app_number] => 10934016 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/934016
Low-aberration deflectors for use in charged-particle-beam optical systems, and methods for fabricating such deflectors Sep 1, 2004 Abandoned
Array ( [id] => 756003 [patent_doc_number] => 07019308 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-28 [patent_title] => 'Thermal compensation in magnetic field influencing of an electron beam' [patent_app_type] => utility [patent_app_number] => 10/932340 [patent_app_country] => US [patent_app_date] => 2004-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3526 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/019/07019308.pdf [firstpage_image] =>[orig_patent_app_number] => 10932340 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/932340
Thermal compensation in magnetic field influencing of an electron beam Aug 31, 2004 Issued
Array ( [id] => 484214 [patent_doc_number] => 07220973 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-05-22 [patent_title] => 'Modular manipulation system for manipulating a sample under study with a microscope' [patent_app_type] => utility [patent_app_number] => 10/931650 [patent_app_country] => US [patent_app_date] => 2004-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 12417 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/220/07220973.pdf [firstpage_image] =>[orig_patent_app_number] => 10931650 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/931650
Modular manipulation system for manipulating a sample under study with a microscope Aug 30, 2004 Issued
Array ( [id] => 880547 [patent_doc_number] => 07350404 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-01 [patent_title] => 'Scanning type probe microscope and probe moving control method therefor' [patent_app_type] => utility [patent_app_number] => 10/569373 [patent_app_country] => US [patent_app_date] => 2004-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 7579 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/350/07350404.pdf [firstpage_image] =>[orig_patent_app_number] => 10569373 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/569373
Scanning type probe microscope and probe moving control method therefor Aug 26, 2004 Issued
Array ( [id] => 7592932 [patent_doc_number] => 07652269 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-26 [patent_title] => 'Laser atom probe methods' [patent_app_type] => utility [patent_app_number] => 11/597080 [patent_app_country] => US [patent_app_date] => 2004-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 13472 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/652/07652269.pdf [firstpage_image] =>[orig_patent_app_number] => 11597080 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/597080
Laser atom probe methods Aug 18, 2004 Issued
Array ( [id] => 7190703 [patent_doc_number] => 20050040328 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-24 [patent_title] => 'Reduction of matrix interference for MALDI mass spectrometry analysis' [patent_app_type] => utility [patent_app_number] => 10/914395 [patent_app_country] => US [patent_app_date] => 2004-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3544 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20050040328.pdf [firstpage_image] =>[orig_patent_app_number] => 10914395 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/914395
Reduction of matrix interference for MALDI mass spectrometry analysis Aug 8, 2004 Issued
Array ( [id] => 5817834 [patent_doc_number] => 20060022147 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-02 [patent_title] => 'Method and device of monitoring and controlling ion beam energy distribution' [patent_app_type] => utility [patent_app_number] => 10/902939 [patent_app_country] => US [patent_app_date] => 2004-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2785 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0022/20060022147.pdf [firstpage_image] =>[orig_patent_app_number] => 10902939 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/902939
Method and device of monitoring and controlling ion beam energy distribution Aug 1, 2004 Abandoned
Array ( [id] => 642628 [patent_doc_number] => 07122794 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-10-17 [patent_title] => 'Systems and methods for ion mobility control' [patent_app_type] => utility [patent_app_number] => 10/903497 [patent_app_country] => US [patent_app_date] => 2004-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 39 [patent_no_of_words] => 10294 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/122/07122794.pdf [firstpage_image] =>[orig_patent_app_number] => 10903497 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/903497
Systems and methods for ion mobility control Jul 29, 2004 Issued
Array ( [id] => 911213 [patent_doc_number] => 07329878 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-12 [patent_title] => 'Method for manufacturing a lens assembly of microcolumn and lens assembly of microcolumn manufactured by the same' [patent_app_type] => utility [patent_app_number] => 10/565373 [patent_app_country] => US [patent_app_date] => 2004-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 5018 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/329/07329878.pdf [firstpage_image] =>[orig_patent_app_number] => 10565373 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/565373
Method for manufacturing a lens assembly of microcolumn and lens assembly of microcolumn manufactured by the same Jul 23, 2004 Issued
Array ( [id] => 651226 [patent_doc_number] => 07112803 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-26 [patent_title] => 'Beam directing system and method for use in a charged particle beam column' [patent_app_type] => utility [patent_app_number] => 10/897635 [patent_app_country] => US [patent_app_date] => 2004-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 7358 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/112/07112803.pdf [firstpage_image] =>[orig_patent_app_number] => 10897635 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/897635
Beam directing system and method for use in a charged particle beam column Jul 22, 2004 Issued
Array ( [id] => 7022775 [patent_doc_number] => 20050017169 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-27 [patent_title] => 'Time-of-flight mass spectrometer' [patent_app_type] => utility [patent_app_number] => 10/896064 [patent_app_country] => US [patent_app_date] => 2004-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5744 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20050017169.pdf [firstpage_image] =>[orig_patent_app_number] => 10896064 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/896064
Time-of-flight mass spectrometer Jul 21, 2004 Issued
Array ( [id] => 5735956 [patent_doc_number] => 20060006346 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-12 [patent_title] => 'DEVICE AND METHOD FOR MEASUREMENT OF BEAM ANGLE AND DIVERGENCE NORMAL TO PLANE OF SCANNED BEAM OR RIBBON BEAM' [patent_app_type] => utility [patent_app_number] => 10/886308 [patent_app_country] => US [patent_app_date] => 2004-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5518 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20060006346.pdf [firstpage_image] =>[orig_patent_app_number] => 10886308 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/886308
Device and method for measurement of beam angle and divergence Jul 6, 2004 Issued
Array ( [id] => 7120223 [patent_doc_number] => 20050012052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-20 [patent_title] => 'Ion irradiation of a target at very high and very low kinetic ion energies' [patent_app_type] => utility [patent_app_number] => 10/886463 [patent_app_country] => US [patent_app_date] => 2004-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4476 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20050012052.pdf [firstpage_image] =>[orig_patent_app_number] => 10886463 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/886463
Ion irradiation of a target at very high and very low kinetic ion energies Jul 6, 2004 Issued
Array ( [id] => 408682 [patent_doc_number] => 07285781 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-23 [patent_title] => 'Characterizing resist line shrinkage due to CD-SEM inspection' [patent_app_type] => utility [patent_app_number] => 10/886387 [patent_app_country] => US [patent_app_date] => 2004-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 2399 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/285/07285781.pdf [firstpage_image] =>[orig_patent_app_number] => 10886387 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/886387
Characterizing resist line shrinkage due to CD-SEM inspection Jul 6, 2004 Issued
Array ( [id] => 7323286 [patent_doc_number] => 20040251425 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-16 [patent_title] => 'Rotational stage for high speed, large area scanning in focused beam systems' [patent_app_type] => new [patent_app_number] => 10/884698 [patent_app_country] => US [patent_app_date] => 2004-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2324 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 3 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0251/20040251425.pdf [firstpage_image] =>[orig_patent_app_number] => 10884698 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/884698
Rotational stage for high speed, large area scanning in focused beam systems Jun 30, 2004 Issued
Array ( [id] => 7030664 [patent_doc_number] => 20050029446 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-10 [patent_title] => 'Sample plate for matrix-assisted laser desorption and ionization mass spectrometry' [patent_app_type] => utility [patent_app_number] => 10/881913 [patent_app_country] => US [patent_app_date] => 2004-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 37 [patent_no_of_words] => 7710 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0029/20050029446.pdf [firstpage_image] =>[orig_patent_app_number] => 10881913 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/881913
Sample plate for matrix-assisted laser desorption and ionization mass spectrometry Jun 29, 2004 Issued
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