Bernard E. Souw

Array ( [id] => 7120223 [patent_doc_number] => 20050012052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-20 [patent_title] => 'Ion irradiation of a target at very high and very low kinetic ion energies' [patent_app_type] => utility [patent_app_number] => 10/886463 [patent_app_country] => US [patent_app_date] => 2004-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4476 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20050012052.pdf [firstpage_image] =>[orig_patent_app_number] => 10886463 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5735956 [patent_doc_number] => 20060006346 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-12 [patent_title] => 'DEVICE AND METHOD FOR MEASUREMENT OF BEAM ANGLE AND DIVERGENCE NORMAL TO PLANE OF SCANNED BEAM OR RIBBON BEAM' [patent_app_type] => utility [patent_app_number] => 10/886308 [patent_app_country] => US [patent_app_date] => 2004-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5518 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20060006346.pdf [firstpage_image] =>[orig_patent_app_number] => 10886308 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 408682 [patent_doc_number] => 07285781 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-23 [patent_title] => 'Characterizing resist line shrinkage due to CD-SEM inspection' [patent_app_type] => utility [patent_app_number] => 10/886387 [patent_app_country] => US [patent_app_date] => 2004-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 2399 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/285/07285781.pdf [firstpage_image] =>[orig_patent_app_number] => 10886387 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7323286 [patent_doc_number] => 20040251425 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-16 [patent_title] => 'Rotational stage for high speed, large area scanning in focused beam systems' [patent_app_type] => new [patent_app_number] => 10/884698 [patent_app_country] => US [patent_app_date] => 2004-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2324 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 3 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0251/20040251425.pdf [firstpage_image] =>[orig_patent_app_number] => 10884698 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7030664 [patent_doc_number] => 20050029446 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-10 [patent_title] => 'Sample plate for matrix-assisted laser desorption and ionization mass spectrometry' [patent_app_type] => utility [patent_app_number] => 10/881913 [patent_app_country] => US [patent_app_date] => 2004-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 37 [patent_no_of_words] => 7710 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0029/20050029446.pdf [firstpage_image] =>[orig_patent_app_number] => 10881913 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 687618 [patent_doc_number] => 07078700 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-07-18 [patent_title] => 'Optics for extreme ultraviolet lithography' [patent_app_type] => utility [patent_app_number] => 10/883048 [patent_app_country] => US [patent_app_date] => 2004-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3287 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/078/07078700.pdf [firstpage_image] =>[orig_patent_app_number] => 10883048 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7190751 [patent_doc_number] => 20050040346 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-24 [patent_title] => 'Ion beam irradiation device and operating method thereof' [patent_app_type] => utility [patent_app_number] => 10/880254 [patent_app_country] => US [patent_app_date] => 2004-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 7939 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20050040346.pdf [firstpage_image] =>[orig_patent_app_number] => 10880254 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 954065 [patent_doc_number] => 06958480 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-10-25 [patent_title] => 'Sample desorption/ionization from mesoporous silica' [patent_app_type] => utility [patent_app_number] => 10/877690 [patent_app_country] => US [patent_app_date] => 2004-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4058 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/958/06958480.pdf [firstpage_image] =>[orig_patent_app_number] => 10877690 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 613099 [patent_doc_number] => 07148498 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-12-12 [patent_title] => 'Externally controlled electromagnetic energy spot curing system' [patent_app_type] => utility [patent_app_number] => 10/875586 [patent_app_country] => US [patent_app_date] => 2004-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2372 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/148/07148498.pdf [firstpage_image] =>[orig_patent_app_number] => 10875586 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7197823 [patent_doc_number] => 20050051721 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-10 [patent_title] => 'Sample dimension-measuring method and charged particle beam apparatus' [patent_app_type] => utility [patent_app_number] => 10/875509 [patent_app_country] => US [patent_app_date] => 2004-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 7928 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0051/20050051721.pdf [firstpage_image] =>[orig_patent_app_number] => 10875509 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 946781 [patent_doc_number] => 06965115 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-15 [patent_title] => 'Airtight processing apparatus, airtight processing method, and electron beam processing apparatus' [patent_app_type] => utility [patent_app_number] => 10/875166 [patent_app_country] => US [patent_app_date] => 2004-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4699 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/965/06965115.pdf [firstpage_image] =>[orig_patent_app_number] => 10875166 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7219881 [patent_doc_number] => 20050077483 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-14 [patent_title] => 'Radiation system, contamination barrier, lithographic apparatus, device manufacturing method and device manufactured thereby' [patent_app_type] => utility [patent_app_number] => 10/873646 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5668 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0077/20050077483.pdf [firstpage_image] =>[orig_patent_app_number] => 10873646 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 783324 [patent_doc_number] => 06992307 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-01-31 [patent_title] => 'Electron beam source and electron beam exposure apparatus employing the electron beam source' [patent_app_type] => utility [patent_app_number] => 10/873250 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5145 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/992/06992307.pdf [firstpage_image] =>[orig_patent_app_number] => 10873250 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7030695 [patent_doc_number] => 20050029466 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-10 [patent_title] => 'Multipole lens, charged-particle beam instrument fitted with multipole lenses, and method of fabricating multipole lens' [patent_app_type] => utility [patent_app_number] => 10/874797 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4023 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0029/20050029466.pdf [firstpage_image] =>[orig_patent_app_number] => 10874797 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6975338 [patent_doc_number] => 20050285053 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-29 [patent_title] => 'Method and apparatus for electron beam processing of substrates' [patent_app_type] => utility [patent_app_number] => 10/875629 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5868 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0285/20050285053.pdf [firstpage_image] =>[orig_patent_app_number] => 10875629 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7114265 [patent_doc_number] => 20050067565 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-31 [patent_title] => 'Mass spectrometer' [patent_app_type] => utility [patent_app_number] => 10/873107 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7084 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20050067565.pdf [firstpage_image] =>[orig_patent_app_number] => 10873107 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 702887 [patent_doc_number] => 07064336 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-06-20 [patent_title] => 'Adaptable radiation monitoring system and method' [patent_app_type] => utility [patent_app_number] => 10/874127 [patent_app_country] => US [patent_app_date] => 2004-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 3972 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/064/07064336.pdf [firstpage_image] =>[orig_patent_app_number] => 10874127 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6969582 [patent_doc_number] => 20050035292 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-17 [patent_title] => 'Charged particle deflecting system' [patent_app_type] => utility [patent_app_number] => 10/871879 [patent_app_country] => US [patent_app_date] => 2004-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 17244 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0035/20050035292.pdf [firstpage_image] =>[orig_patent_app_number] => 10871879 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1028251 [patent_doc_number] => 06881952 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-04-19 [patent_title] => 'Residual gas analyzer of semiconductor device manufacturing equipment' [patent_app_type] => utility [patent_app_number] => 10/866755 [patent_app_country] => US [patent_app_date] => 2004-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2224 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 34 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/881/06881952.pdf [firstpage_image] =>[orig_patent_app_number] => 10866755 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7023251 [patent_doc_number] => 20050017645 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-27 [patent_title] => 'Multi-grid ion beam source for generating a highly collimated ion beam' [patent_app_type] => utility [patent_app_number] => 10/867580 [patent_app_country] => US [patent_app_date] => 2004-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 8262 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20050017645.pdf [firstpage_image] =>[orig_patent_app_number] => 10867580 [rel_patent_id] =>[rel_patent_doc_number] =>)