Bernard E. Souw

Array ( [id] => 1144196 [patent_doc_number] => 06777698 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-08-17 [patent_title] => 'Electron beam exposure apparatus exposing method using an electron beam' [patent_app_type] => B2 [patent_app_number] => 10/352209 [patent_app_country] => US [patent_app_date] => 2003-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3869 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 260 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/777/06777698.pdf [firstpage_image] =>[orig_patent_app_number] => 10352209 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7278673 [patent_doc_number] => 20040061050 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-04-01 [patent_title] => 'Ion trap type mass spectrometer' [patent_app_type] => new [patent_app_number] => 10/351446 [patent_app_country] => US [patent_app_date] => 2003-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 7855 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 25 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0061/20040061050.pdf [firstpage_image] =>[orig_patent_app_number] => 10351446 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1241485 [patent_doc_number] => 06683308 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-01-27 [patent_title] => 'Method and apparatus for measuring thickness of thin film' [patent_app_type] => B2 [patent_app_number] => 10/336766 [patent_app_country] => US [patent_app_date] => 2003-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 9477 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/683/06683308.pdf [firstpage_image] =>[orig_patent_app_number] => 10336766 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6785665 [patent_doc_number] => 20030136904 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-24 [patent_title] => 'Liquid chromatograph mass spectrometer' [patent_app_type] => new [patent_app_number] => 10/330064 [patent_app_country] => US [patent_app_date] => 2002-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2378 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0136/20030136904.pdf [firstpage_image] =>[orig_patent_app_number] => 10330064 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6803338 [patent_doc_number] => 20030230732 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-12-18 [patent_title] => 'Ion irradiation system' [patent_app_type] => new [patent_app_number] => 10/334544 [patent_app_country] => US [patent_app_date] => 2002-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4750 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 31 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0230/20030230732.pdf [firstpage_image] =>[orig_patent_app_number] => 10334544 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1180014 [patent_doc_number] => 06744058 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-06-01 [patent_title] => 'Geometric compensation method for charged particle beam irradiation' [patent_app_type] => B1 [patent_app_number] => 10/324964 [patent_app_country] => US [patent_app_date] => 2002-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 2725 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/744/06744058.pdf [firstpage_image] =>[orig_patent_app_number] => 10324964 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6758710 [patent_doc_number] => 20030122071 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-03 [patent_title] => 'Use of notched broadband waveforms in a linear ion trap' [patent_app_type] => new [patent_app_number] => 10/322464 [patent_app_country] => US [patent_app_date] => 2002-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6129 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20030122071.pdf [firstpage_image] =>[orig_patent_app_number] => 10322464 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6955545 [patent_doc_number] => 20050211915 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-29 [patent_title] => 'Probe for an atomic force microscope and method for making such a probe' [patent_app_type] => utility [patent_app_number] => 10/499174 [patent_app_country] => US [patent_app_date] => 2002-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 955 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0211/20050211915.pdf [firstpage_image] =>[orig_patent_app_number] => 10499174 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7101290 [patent_doc_number] => 20050104016 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-19 [patent_title] => 'Component support and radioisotope generator including one or more component supports' [patent_app_type] => utility [patent_app_number] => 10/508718 [patent_app_country] => US [patent_app_date] => 2002-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4453 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0104/20050104016.pdf [firstpage_image] =>[orig_patent_app_number] => 10508718 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6666611 [patent_doc_number] => 20030111594 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-06-19 [patent_title] => 'Optical device and optical process for particle displacement' [patent_app_type] => new [patent_app_number] => 10/310767 [patent_app_country] => US [patent_app_date] => 2002-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2361 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 22 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0111/20030111594.pdf [firstpage_image] =>[orig_patent_app_number] => 10310767 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1143982 [patent_doc_number] => 06777676 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-08-17 [patent_title] => 'Non-destructive root cause analysis on blocked contact or via' [patent_app_type] => B1 [patent_app_number] => 10/303267 [patent_app_country] => US [patent_app_date] => 2002-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 6541 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/777/06777676.pdf [firstpage_image] =>[orig_patent_app_number] => 10303267 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6799419 [patent_doc_number] => 20030094583 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-05-22 [patent_title] => 'Wafer holding apparatus for ion implanting system' [patent_app_type] => new [patent_app_number] => 10/302664 [patent_app_country] => US [patent_app_date] => 2002-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4480 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0094/20030094583.pdf [firstpage_image] =>[orig_patent_app_number] => 10302664 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7458538 [patent_doc_number] => 20040094703 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-05-20 [patent_title] => 'SPACE-ANGLE FOCUSING REFLECTOR FOR TIME-OF-FLIGHT MASS SPECTROMETERS' [patent_app_type] => new [patent_app_number] => 10/298169 [patent_app_country] => US [patent_app_date] => 2002-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2555 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0094/20040094703.pdf [firstpage_image] =>[orig_patent_app_number] => 10298169 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1301876 [patent_doc_number] => 06624413 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-23 [patent_title] => 'Corona treatment apparatus with segmented electrode' [patent_app_type] => B1 [patent_app_number] => 10/292266 [patent_app_country] => US [patent_app_date] => 2002-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2389 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 229 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/624/06624413.pdf [firstpage_image] =>[orig_patent_app_number] => 10292266 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1009684 [patent_doc_number] => 06900446 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-05-31 [patent_title] => 'Charged particle beam irradiation equipment and control method thereof' [patent_app_type] => utility [patent_app_number] => 10/287656 [patent_app_country] => US [patent_app_date] => 2002-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 8212 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/900/06900446.pdf [firstpage_image] =>[orig_patent_app_number] => 10287656 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7189032 [patent_doc_number] => 20040084613 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-05-06 [patent_title] => 'Mass spectrometer and method of mass spectrometry' [patent_app_type] => new [patent_app_number] => 10/274989 [patent_app_country] => US [patent_app_date] => 2002-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9464 [patent_no_of_claims] => 83 [patent_no_of_ind_claims] => 13 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0084/20040084613.pdf [firstpage_image] =>[orig_patent_app_number] => 10274989 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6760155 [patent_doc_number] => 20030123516 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-03 [patent_title] => 'Quantum-interferometrically enhanced optical nonlinearities for photon switches and logic gates' [patent_app_type] => new [patent_app_number] => 10/270183 [patent_app_country] => US [patent_app_date] => 2002-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8695 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0123/20030123516.pdf [firstpage_image] =>[orig_patent_app_number] => 10270183 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1346624 [patent_doc_number] => 06586753 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-07-01 [patent_title] => 'Electron beam apparatus and electron beam adjusting method' [patent_app_type] => B2 [patent_app_number] => 10/270068 [patent_app_country] => US [patent_app_date] => 2002-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 20 [patent_no_of_words] => 5615 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/586/06586753.pdf [firstpage_image] =>[orig_patent_app_number] => 10270068 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1246534 [patent_doc_number] => 06677586 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-01-13 [patent_title] => 'Methods and apparatus for electron beam inspection of samples' [patent_app_type] => B1 [patent_app_number] => 10/272468 [patent_app_country] => US [patent_app_date] => 2002-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4417 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/677/06677586.pdf [firstpage_image] =>[orig_patent_app_number] => 10272468 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7130066 [patent_doc_number] => 20040041095 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-03-04 [patent_title] => 'Methods and apparatus for electron beam inspection of samples' [patent_app_type] => new [patent_app_number] => 10/272467 [patent_app_country] => US [patent_app_date] => 2002-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4557 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0041/20040041095.pdf [firstpage_image] =>[orig_patent_app_number] => 10272467 [rel_patent_id] =>[rel_patent_doc_number] =>)