Search

Bernard E. Souw

Examiner (ID: 892, Phone: (571)272-2482 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2814
Total Applications
1406
Issued Applications
1263
Pending Applications
36
Abandoned Applications
111

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6777346 [patent_doc_number] => 20030048427 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-13 [patent_title] => 'Electron beam lithography system having improved electron gun' [patent_app_type] => new [patent_app_number] => 10/055869 [patent_app_country] => US [patent_app_date] => 2002-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7136 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 35 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20030048427.pdf [firstpage_image] =>[orig_patent_app_number] => 10055869 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/055869
Electron beam lithography system having improved electron gun Jan 21, 2002 Abandoned
10/031081 Method for determining structure of soft material Jan 15, 2002 Abandoned
Array ( [id] => 1281020 [patent_doc_number] => 06646277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-11-11 [patent_title] => 'Charging control and dosimetry system for gas cluster ion beam' [patent_app_type] => B2 [patent_app_number] => 10/036179 [patent_app_country] => US [patent_app_date] => 2001-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 5 [patent_no_of_words] => 5209 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/646/06646277.pdf [firstpage_image] =>[orig_patent_app_number] => 10036179 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/036179
Charging control and dosimetry system for gas cluster ion beam Dec 25, 2001 Issued
Array ( [id] => 6655594 [patent_doc_number] => 20030132382 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-17 [patent_title] => 'System and method for inspecting a mask' [patent_app_type] => new [patent_app_number] => 10/026379 [patent_app_country] => US [patent_app_date] => 2001-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 18341 [patent_no_of_claims] => 142 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20030132382.pdf [firstpage_image] =>[orig_patent_app_number] => 10026379 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/026379
System and method for inspecting a mask Dec 17, 2001 Abandoned
Array ( [id] => 7410800 [patent_doc_number] => 20040206901 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-21 [patent_title] => 'High throughput ion source with multiple ion sprayers and ion lenses' [patent_app_type] => new [patent_app_number] => 10/475295 [patent_app_country] => US [patent_app_date] => 2004-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 31 [patent_figures_cnt] => 31 [patent_no_of_words] => 18789 [patent_no_of_claims] => 56 [patent_no_of_ind_claims] => 16 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0206/20040206901.pdf [firstpage_image] =>[orig_patent_app_number] => 10475295 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/475295
High throughput ion source with multiple ion sprayers and ion lenses Nov 27, 2001 Issued
Array ( [id] => 6858850 [patent_doc_number] => 20030089858 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-05-15 [patent_title] => 'Electron beam lithography system and method' [patent_app_type] => new [patent_app_number] => 09/986485 [patent_app_country] => US [patent_app_date] => 2001-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4398 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0089/20030089858.pdf [firstpage_image] =>[orig_patent_app_number] => 09986485 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/986485
Electron beam lithography system and method Nov 8, 2001 Issued
09/869081 Map ion diode puff valve and gas dam and method of using the same Sep 30, 2001 Abandoned
09/830390 Device for the detecting atoms and/or molecules, analyzing said atoms and/or molecules by laser ablation and transferring them to an ion trap of a spectrometer, method for operating said device and specific uses of said method Jul 30, 2001 Abandoned
09/857311 DEVICE FOR ENABLING AN OBSERVER TO VERIFY THE ANGLE-DEPENDENT SCATTERING BEHAVIOUR OF AN OBJECT Jul 22, 2001 Abandoned
Array ( [id] => 7301089 [patent_doc_number] => 20040113066 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-06-17 [patent_title] => 'Sample support for mass spectrometers' [patent_app_type] => new [patent_app_number] => 10/296490 [patent_app_country] => US [patent_app_date] => 2002-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1815 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0113/20040113066.pdf [firstpage_image] =>[orig_patent_app_number] => 10296490 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/296490
Sample support for mass spectrometers May 22, 2001 Issued
Array ( [id] => 1351207 [patent_doc_number] => 06580076 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-17 [patent_title] => 'Micro-manipulation method' [patent_app_type] => B1 [patent_app_number] => 09/856430 [patent_app_country] => US [patent_app_date] => 2001-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2105 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/580/06580076.pdf [firstpage_image] =>[orig_patent_app_number] => 09856430 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/856430
Micro-manipulation method May 20, 2001 Issued
Array ( [id] => 1113595 [patent_doc_number] => 06803565 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-10-12 [patent_title] => 'Ionization source utilizing a multi-capillary inlet and method of operation' [patent_app_type] => B2 [patent_app_number] => 09/860727 [patent_app_country] => US [patent_app_date] => 2001-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4337 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/803/06803565.pdf [firstpage_image] =>[orig_patent_app_number] => 09860727 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/860727
Ionization source utilizing a multi-capillary inlet and method of operation May 17, 2001 Issued
Array ( [id] => 6505769 [patent_doc_number] => 20020134949 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-26 [patent_title] => 'Through-the-lens neutralization for charged particle beam system' [patent_app_type] => new [patent_app_number] => 09/859295 [patent_app_country] => US [patent_app_date] => 2001-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6728 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 35 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0134/20020134949.pdf [firstpage_image] =>[orig_patent_app_number] => 09859295 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/859295
Through-the-lens neutralization for charged particle beam system May 15, 2001 Issued
Array ( [id] => 7076872 [patent_doc_number] => 20010040222 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-11-15 [patent_title] => 'Electron beam processing device' [patent_app_type] => new [patent_app_number] => 09/852726 [patent_app_country] => US [patent_app_date] => 2001-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3722 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20010040222.pdf [firstpage_image] =>[orig_patent_app_number] => 09852726 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/852726
Electron beam processing device May 10, 2001 Issued
Array ( [id] => 6458441 [patent_doc_number] => 20020020814 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-02-21 [patent_title] => 'Electron spectroscopy employing controlled surface charging' [patent_app_type] => new [patent_app_number] => 09/847583 [patent_app_country] => US [patent_app_date] => 2001-05-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 9832 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0020/20020020814.pdf [firstpage_image] =>[orig_patent_app_number] => 09847583 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/847583
Electron spectroscopy employing controlled surface charging May 2, 2001 Issued
09/786507 Apparatus for generating focused electromagnetic radiation Apr 30, 2001 Abandoned
Array ( [id] => 7619836 [patent_doc_number] => 06943349 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-09-13 [patent_title] => 'Multi beam charged particle device' [patent_app_type] => utility [patent_app_number] => 10/258869 [patent_app_country] => US [patent_app_date] => 2001-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 20 [patent_no_of_words] => 6388 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 21 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/943/06943349.pdf [firstpage_image] =>[orig_patent_app_number] => 10258869 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/258869
Multi beam charged particle device Apr 26, 2001 Issued
Array ( [id] => 6045637 [patent_doc_number] => 20020167655 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-14 [patent_title] => 'Image integration and multiple laser source projection' [patent_app_type] => new [patent_app_number] => 09/842146 [patent_app_country] => US [patent_app_date] => 2001-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3569 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0167/20020167655.pdf [firstpage_image] =>[orig_patent_app_number] => 09842146 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/842146
Image integration and multiple laser source projection Apr 25, 2001 Abandoned
Array ( [id] => 1037809 [patent_doc_number] => 06872960 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-03-29 [patent_title] => 'Robust infrared countermeasure system and method' [patent_app_type] => utility [patent_app_number] => 09/837733 [patent_app_country] => US [patent_app_date] => 2001-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3655 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/872/06872960.pdf [firstpage_image] =>[orig_patent_app_number] => 09837733 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/837733
Robust infrared countermeasure system and method Apr 17, 2001 Issued
Array ( [id] => 6169871 [patent_doc_number] => 20020153482 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-24 [patent_title] => 'Method and apparatus for detecting contaminating species on a wafer edge' [patent_app_type] => new [patent_app_number] => 09/837124 [patent_app_country] => US [patent_app_date] => 2001-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3023 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20020153482.pdf [firstpage_image] =>[orig_patent_app_number] => 09837124 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/837124
Method and apparatus for detecting contaminating species on a wafer edge Apr 17, 2001 Issued
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