Bernard E. Souw

Array ( [id] => 1302011 [patent_doc_number] => 06624432 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-23 [patent_title] => 'EMI containment apparatus' [patent_app_type] => B1 [patent_app_number] => 09/684188 [patent_app_country] => US [patent_app_date] => 2000-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 3051 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/624/06624432.pdf [firstpage_image] =>[orig_patent_app_number] => 09684188 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1181907 [patent_doc_number] => 06740893 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-05-25 [patent_title] => 'Optical instrument, and device manufacturing method' [patent_app_type] => B1 [patent_app_number] => 09/678255 [patent_app_country] => US [patent_app_date] => 2000-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3936 [patent_no_of_claims] => 47 [patent_no_of_ind_claims] => 16 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/740/06740893.pdf [firstpage_image] =>[orig_patent_app_number] => 09678255 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1373550 [patent_doc_number] => 06566652 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-20 [patent_title] => 'Mass spectrometry apparatus having ion source not at negative pressure when finishing measurement' [patent_app_type] => B1 [patent_app_number] => 09/660166 [patent_app_country] => US [patent_app_date] => 2000-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3991 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/566/06566652.pdf [firstpage_image] =>[orig_patent_app_number] => 09660166 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1402654 [patent_doc_number] => 06541769 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-01 [patent_title] => 'Mass spectrometer' [patent_app_type] => B1 [patent_app_number] => 09/660359 [patent_app_country] => US [patent_app_date] => 2000-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 6231 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/541/06541769.pdf [firstpage_image] =>[orig_patent_app_number] => 09660359 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1385590 [patent_doc_number] => 06555816 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-29 [patent_title] => 'Scanning electron microscope and sample observation method using the same' [patent_app_type] => B1 [patent_app_number] => 09/656836 [patent_app_country] => US [patent_app_date] => 2000-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 5981 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/555/06555816.pdf [firstpage_image] =>[orig_patent_app_number] => 09656836 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1381515 [patent_doc_number] => 06567156 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-20 [patent_title] => 'Apparatus and method for examining the shape of gemstones' [patent_app_type] => B1 [patent_app_number] => 09/652465 [patent_app_country] => US [patent_app_date] => 2000-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2476 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/567/06567156.pdf [firstpage_image] =>[orig_patent_app_number] => 09652465 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1207936 [patent_doc_number] => 06717660 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-04-06 [patent_title] => 'System for monitoring and testing of light sources' [patent_app_type] => B1 [patent_app_number] => 09/629352 [patent_app_country] => US [patent_app_date] => 2000-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3717 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/717/06717660.pdf [firstpage_image] =>[orig_patent_app_number] => 09629352 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1363771 [patent_doc_number] => 06573517 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-03 [patent_title] => 'Ion implantation apparatus' [patent_app_type] => B1 [patent_app_number] => 09/629622 [patent_app_country] => US [patent_app_date] => 2000-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4381 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/573/06573517.pdf [firstpage_image] =>[orig_patent_app_number] => 09629622 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1336212 [patent_doc_number] => 06596998 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-07-22 [patent_title] => 'Method and system for identifying the source of a signal' [patent_app_type] => B1 [patent_app_number] => 09/629286 [patent_app_country] => US [patent_app_date] => 2000-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 4853 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/596/06596998.pdf [firstpage_image] =>[orig_patent_app_number] => 09629286 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1203357 [patent_doc_number] => 06720563 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-04-13 [patent_title] => 'Ion implantation apparatus and ion implantation method' [patent_app_type] => B1 [patent_app_number] => 09/629618 [patent_app_country] => US [patent_app_date] => 2000-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 5343 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/720/06720563.pdf [firstpage_image] =>[orig_patent_app_number] => 09629618 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1318737 [patent_doc_number] => 06608318 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-19 [patent_title] => 'Ionization chamber for reactive samples' [patent_app_type] => B1 [patent_app_number] => 09/629467 [patent_app_country] => US [patent_app_date] => 2000-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5642 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/608/06608318.pdf [firstpage_image] =>[orig_patent_app_number] => 09629467 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1367860 [patent_doc_number] => 06570168 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-27 [patent_title] => 'Illumination system with a plurality of light sources' [patent_app_type] => B1 [patent_app_number] => 09/627559 [patent_app_country] => US [patent_app_date] => 2000-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 16 [patent_no_of_words] => 4406 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/570/06570168.pdf [firstpage_image] =>[orig_patent_app_number] => 09627559 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1028256 [patent_doc_number] => 06881954 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-04-19 [patent_title] => 'Scanning probe microscope and method of measurement' [patent_app_type] => utility [patent_app_number] => 09/626106 [patent_app_country] => US [patent_app_date] => 2000-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 14463 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/881/06881954.pdf [firstpage_image] =>[orig_patent_app_number] => 09626106 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1402859 [patent_doc_number] => 06541781 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-01 [patent_title] => 'Waveguide for microwave excitation of plasma in an ion beam guide' [patent_app_type] => B1 [patent_app_number] => 09/625718 [patent_app_country] => US [patent_app_date] => 2000-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 17 [patent_no_of_words] => 7633 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/541/06541781.pdf [firstpage_image] =>[orig_patent_app_number] => 09625718 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1302006 [patent_doc_number] => 06624431 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-23 [patent_title] => 'High collection angle short wavelength radiation collimator and focusing optic' [patent_app_type] => B1 [patent_app_number] => 09/621404 [patent_app_country] => US [patent_app_date] => 2000-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2945 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/624/06624431.pdf [firstpage_image] =>[orig_patent_app_number] => 09621404 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1026310 [patent_doc_number] => 06885466 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-04-26 [patent_title] => 'Method for measuring thickness of oxide film' [patent_app_type] => utility [patent_app_number] => 09/616372 [patent_app_country] => US [patent_app_date] => 2000-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 4206 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/885/06885466.pdf [firstpage_image] =>[orig_patent_app_number] => 09616372 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1315784 [patent_doc_number] => 06610989 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-26 [patent_title] => 'Proximity effect correction method for charged particle beam exposure' [patent_app_type] => B1 [patent_app_number] => 09/583880 [patent_app_country] => US [patent_app_date] => 2000-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 42 [patent_no_of_words] => 8048 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/610/06610989.pdf [firstpage_image] =>[orig_patent_app_number] => 09583880 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7603233 [patent_doc_number] => 07235800 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-06-26 [patent_title] => 'Electrical probing of SOI circuits' [patent_app_type] => utility [patent_app_number] => 09/583617 [patent_app_country] => US [patent_app_date] => 2000-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2874 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/235/07235800.pdf [firstpage_image] =>[orig_patent_app_number] => 09583617 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1318678 [patent_doc_number] => 06608308 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-19 [patent_title] => 'Electrostatic lens systems for secondary-electron mapping-projection apparatus, and mapping-projection apparatus and methods comprising same' [patent_app_type] => B1 [patent_app_number] => 09/580533 [patent_app_country] => US [patent_app_date] => 2000-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 7456 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/608/06608308.pdf [firstpage_image] =>[orig_patent_app_number] => 09580533 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1272548 [patent_doc_number] => 06653634 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-11-25 [patent_title] => 'Method of measuring length with scanning type electron microscope' [patent_app_type] => B1 [patent_app_number] => 09/575635 [patent_app_country] => US [patent_app_date] => 2000-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 24 [patent_no_of_words] => 9226 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/653/06653634.pdf [firstpage_image] =>[orig_patent_app_number] => 09575635 [rel_patent_id] =>[rel_patent_doc_number] =>)