Search

Bernard E. Souw

Examiner (ID: 892, Phone: (571)272-2482 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 2814
Total Applications
1406
Issued Applications
1263
Pending Applications
36
Abandoned Applications
111

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1026310 [patent_doc_number] => 06885466 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-04-26 [patent_title] => 'Method for measuring thickness of oxide film' [patent_app_type] => utility [patent_app_number] => 09/616372 [patent_app_country] => US [patent_app_date] => 2000-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 4206 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/885/06885466.pdf [firstpage_image] =>[orig_patent_app_number] => 09616372 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/616372
Method for measuring thickness of oxide film Jul 12, 2000 Issued
Array ( [id] => 7603233 [patent_doc_number] => 07235800 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-06-26 [patent_title] => 'Electrical probing of SOI circuits' [patent_app_type] => utility [patent_app_number] => 09/583617 [patent_app_country] => US [patent_app_date] => 2000-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2874 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/235/07235800.pdf [firstpage_image] =>[orig_patent_app_number] => 09583617 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/583617
Electrical probing of SOI circuits May 30, 2000 Issued
Array ( [id] => 1315784 [patent_doc_number] => 06610989 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-26 [patent_title] => 'Proximity effect correction method for charged particle beam exposure' [patent_app_type] => B1 [patent_app_number] => 09/583880 [patent_app_country] => US [patent_app_date] => 2000-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 42 [patent_no_of_words] => 8048 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/610/06610989.pdf [firstpage_image] =>[orig_patent_app_number] => 09583880 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/583880
Proximity effect correction method for charged particle beam exposure May 30, 2000 Issued
Array ( [id] => 1318678 [patent_doc_number] => 06608308 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-19 [patent_title] => 'Electrostatic lens systems for secondary-electron mapping-projection apparatus, and mapping-projection apparatus and methods comprising same' [patent_app_type] => B1 [patent_app_number] => 09/580533 [patent_app_country] => US [patent_app_date] => 2000-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 7456 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/608/06608308.pdf [firstpage_image] =>[orig_patent_app_number] => 09580533 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/580533
Electrostatic lens systems for secondary-electron mapping-projection apparatus, and mapping-projection apparatus and methods comprising same May 25, 2000 Issued
Array ( [id] => 1272548 [patent_doc_number] => 06653634 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-11-25 [patent_title] => 'Method of measuring length with scanning type electron microscope' [patent_app_type] => B1 [patent_app_number] => 09/575635 [patent_app_country] => US [patent_app_date] => 2000-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 24 [patent_no_of_words] => 9226 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/653/06653634.pdf [firstpage_image] =>[orig_patent_app_number] => 09575635 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/575635
Method of measuring length with scanning type electron microscope May 21, 2000 Issued
Array ( [id] => 1363648 [patent_doc_number] => 06573508 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-03 [patent_title] => 'Electron beam exposing method' [patent_app_type] => B1 [patent_app_number] => 09/575849 [patent_app_country] => US [patent_app_date] => 2000-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3832 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/573/06573508.pdf [firstpage_image] =>[orig_patent_app_number] => 09575849 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/575849
Electron beam exposing method May 18, 2000 Issued
Array ( [id] => 1379106 [patent_doc_number] => 06563125 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-13 [patent_title] => 'Charged-particle-beam microlithography apparatus and methods for preventing coulomb effects using the hollow-beam technique' [patent_app_type] => B1 [patent_app_number] => 09/575211 [patent_app_country] => US [patent_app_date] => 2000-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 4022 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/563/06563125.pdf [firstpage_image] =>[orig_patent_app_number] => 09575211 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/575211
Charged-particle-beam microlithography apparatus and methods for preventing coulomb effects using the hollow-beam technique May 17, 2000 Issued
Array ( [id] => 1385608 [patent_doc_number] => 06555817 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-29 [patent_title] => 'Method and apparatus for correcting magnetic field distortions in electron backscatter diffraction patterns obtained in an electron microscope' [patent_app_type] => B1 [patent_app_number] => 09/572198 [patent_app_country] => US [patent_app_date] => 2000-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4609 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/555/06555817.pdf [firstpage_image] =>[orig_patent_app_number] => 09572198 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/572198
Method and apparatus for correcting magnetic field distortions in electron backscatter diffraction patterns obtained in an electron microscope May 16, 2000 Issued
Array ( [id] => 1276501 [patent_doc_number] => 06649920 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-11-18 [patent_title] => 'Cell projection using an electron beam' [patent_app_type] => B1 [patent_app_number] => 09/573785 [patent_app_country] => US [patent_app_date] => 2000-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 2912 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/649/06649920.pdf [firstpage_image] =>[orig_patent_app_number] => 09573785 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/573785
Cell projection using an electron beam May 16, 2000 Issued
Array ( [id] => 1390102 [patent_doc_number] => 06552339 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-22 [patent_title] => 'Micro goniometer for scanning probe microscopy' [patent_app_type] => B1 [patent_app_number] => 09/572209 [patent_app_country] => US [patent_app_date] => 2000-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 21 [patent_no_of_words] => 6424 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/552/06552339.pdf [firstpage_image] =>[orig_patent_app_number] => 09572209 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/572209
Micro goniometer for scanning probe microscopy May 16, 2000 Issued
Array ( [id] => 1398932 [patent_doc_number] => 06545283 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-08 [patent_title] => 'Process of improving the whitening of a polymeric tampon applicator' [patent_app_type] => B1 [patent_app_number] => 09/573103 [patent_app_country] => US [patent_app_date] => 2000-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1803 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/545/06545283.pdf [firstpage_image] =>[orig_patent_app_number] => 09573103 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/573103
Process of improving the whitening of a polymeric tampon applicator May 16, 2000 Issued
Array ( [id] => 1367726 [patent_doc_number] => 06570156 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-27 [patent_title] => 'Autoadjusting electron microscope' [patent_app_type] => B1 [patent_app_number] => 09/571976 [patent_app_country] => US [patent_app_date] => 2000-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 43 [patent_no_of_words] => 19505 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/570/06570156.pdf [firstpage_image] =>[orig_patent_app_number] => 09571976 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/571976
Autoadjusting electron microscope May 15, 2000 Issued
Array ( [id] => 1108764 [patent_doc_number] => 06809312 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-10-26 [patent_title] => 'Ionization source chamber and ion beam delivery system for mass spectrometry' [patent_app_type] => B1 [patent_app_number] => 09/570797 [patent_app_country] => US [patent_app_date] => 2000-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6394 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/809/06809312.pdf [firstpage_image] =>[orig_patent_app_number] => 09570797 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/570797
Ionization source chamber and ion beam delivery system for mass spectrometry May 11, 2000 Issued
Array ( [id] => 1346397 [patent_doc_number] => 06586730 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-07-01 [patent_title] => 'Plasma ion source mass spectrometer' [patent_app_type] => B1 [patent_app_number] => 09/505428 [patent_app_country] => US [patent_app_date] => 2000-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 22 [patent_no_of_words] => 9523 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 302 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/586/06586730.pdf [firstpage_image] =>[orig_patent_app_number] => 09505428 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/505428
Plasma ion source mass spectrometer Feb 15, 2000 Issued
Array ( [id] => 1181818 [patent_doc_number] => 06740875 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-05-25 [patent_title] => 'Gamma watermarking' [patent_app_type] => B1 [patent_app_number] => 09/502859 [patent_app_country] => US [patent_app_date] => 2000-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 6674 [patent_no_of_claims] => 58 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/740/06740875.pdf [firstpage_image] =>[orig_patent_app_number] => 09502859 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/502859
Gamma watermarking Feb 10, 2000 Issued
Array ( [id] => 7612485 [patent_doc_number] => 06903351 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-06-07 [patent_title] => 'Charged particle beam irradiation equipment having scanning electromagnet power supplies' [patent_app_type] => utility [patent_app_number] => 09/623040 [patent_app_country] => US [patent_app_date] => 1999-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 8194 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/903/06903351.pdf [firstpage_image] =>[orig_patent_app_number] => 09623040 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/623040
Charged particle beam irradiation equipment having scanning electromagnet power supplies Sep 26, 1999 Issued
Array ( [id] => 4286691 [patent_doc_number] => 06211068 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-03 [patent_title] => 'Dual damascene process for manufacturing interconnects' [patent_app_type] => 1 [patent_app_number] => 9/318228 [patent_app_country] => US [patent_app_date] => 1999-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 1933 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/211/06211068.pdf [firstpage_image] =>[orig_patent_app_number] => 318228 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/318228
Dual damascene process for manufacturing interconnects May 24, 1999 Issued
Array ( [id] => 4084413 [patent_doc_number] => 06162722 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-19 [patent_title] => 'Unlanded via process' [patent_app_type] => 1 [patent_app_number] => 9/312969 [patent_app_country] => US [patent_app_date] => 1999-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 1237 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/162/06162722.pdf [firstpage_image] =>[orig_patent_app_number] => 312969 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/312969
Unlanded via process May 16, 1999 Issued
Array ( [id] => 4191591 [patent_doc_number] => 06130151 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-10 [patent_title] => 'Method of manufacturing air gap in multilevel interconnection' [patent_app_type] => 1 [patent_app_number] => 9/307208 [patent_app_country] => US [patent_app_date] => 1999-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 17 [patent_no_of_words] => 2743 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/130/06130151.pdf [firstpage_image] =>[orig_patent_app_number] => 307208 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/307208
Method of manufacturing air gap in multilevel interconnection May 6, 1999 Issued
Array ( [id] => 4154925 [patent_doc_number] => 06103624 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-15 [patent_title] => 'Method of improving Cu damascene interconnect reliability by laser anneal before barrier polish' [patent_app_type] => 1 [patent_app_number] => 9/293559 [patent_app_country] => US [patent_app_date] => 1999-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2027 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/103/06103624.pdf [firstpage_image] =>[orig_patent_app_number] => 293559 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/293559
Method of improving Cu damascene interconnect reliability by laser anneal before barrier polish Apr 14, 1999 Issued
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