
Bijan Tadayon
Examiner (ID: 1405)
| Most Active Art Unit | 2721 |
| Art Unit(s) | 2606, 2721, 2714, 2616, 2621 |
| Total Applications | 253 |
| Issued Applications | 196 |
| Pending Applications | 28 |
| Abandoned Applications | 29 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
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[patent_title] => 'Rigidity checking method and apparatus with the result freed from the influence of picture resolutions'
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Array
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[patent_issue_date] => 1999-03-09
[patent_title] => 'Method for position recognition'
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Array
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[patent_issue_date] => 1999-11-09
[patent_title] => 'Automated defect spatial signature analysis for semiconductor manufacturing process'
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[patent_app_date] => 1997-01-08
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Array
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[patent_issue_date] => 1999-11-02
[patent_title] => 'Adaptive inspection method and system'
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Array
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Array
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[patent_title] => 'Motion vector detecting apparatus and method'
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Array
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Array
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[patent_title] => 'Global models with parametric offsets for object recovery'
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Array
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[patent_title] => 'Parallel propagating embedded binary sequence for parameterizing two dimensional image domain code patterns in two dimensional address space'
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Array
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[patent_title] => 'Method and apparatus for approximating a contour image of an object in a video signal'
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Array
(
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[patent_title] => 'Method and apparatus for in-line solder paste inspection'
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Array
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Array
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Array
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Array
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Array
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Array
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