Brent J Andrews

Array ( [id] => 8446974 [patent_doc_number] => 08289031 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2012-10-16 [patent_title] => 'Apparatus for measuring insulation characteristics of coated steel sheet' [patent_app_type] => utility [patent_app_number] => 13/108142 [patent_app_country] => US [patent_app_date] => 2011-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 15 [patent_no_of_words] => 7024 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13108142 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7584619 [patent_doc_number] => 20110279129 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-17 [patent_title] => 'DETECTION DEVICE FOR DETECTING IMPEDANCE OF SENSOR ELEMENT IN GAS SENSOR AND SENSOR UNIT EQUIPPED WITH DETECTION DEVICE' [patent_app_type] => utility [patent_app_number] => 13/108091 [patent_app_country] => US [patent_app_date] => 2011-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 11191 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20110279129.pdf [firstpage_image] =>[orig_patent_app_number] => 13108091 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6059427 [patent_doc_number] => 20110199110 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-18 [patent_title] => 'SYSTEM AND METHOD FOR MODULATION MAPPING' [patent_app_type] => utility [patent_app_number] => 13/095831 [patent_app_country] => US [patent_app_date] => 2011-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8378 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0199/20110199110.pdf [firstpage_image] =>[orig_patent_app_number] => 13095831 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6189163 [patent_doc_number] => 20110171838 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-14 [patent_title] => 'SEGMENTED CONTACTOR' [patent_app_type] => utility [patent_app_number] => 13/073585 [patent_app_country] => US [patent_app_date] => 2011-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7534 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0171/20110171838.pdf [firstpage_image] =>[orig_patent_app_number] => 13073585 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8403606 [patent_doc_number] => 20120235667 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-09-20 [patent_title] => 'THREE-PHASE SELECTABLE ENERGY METER' [patent_app_type] => utility [patent_app_number] => 13/047459 [patent_app_country] => US [patent_app_date] => 2011-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3536 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13047459 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8007303 [patent_doc_number] => 08085056 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-12-27 [patent_title] => 'Circuit for testing internal voltage of semiconductor memory apparatus' [patent_app_type] => utility [patent_app_number] => 13/036985 [patent_app_country] => US [patent_app_date] => 2011-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2738 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/085/08085056.pdf [firstpage_image] =>[orig_patent_app_number] => 13036985 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9128004 [patent_doc_number] => 08575955 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2013-11-05 [patent_title] => 'Apparatus and method for electrical detection and localization of shorts in metal interconnect lines' [patent_app_type] => utility [patent_app_number] => 13/028138 [patent_app_country] => US [patent_app_date] => 2011-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 5625 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13028138 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6138443 [patent_doc_number] => 20110128029 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-02 [patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES' [patent_app_type] => utility [patent_app_number] => 13/022443 [patent_app_country] => US [patent_app_date] => 2011-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7887 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20110128029.pdf [firstpage_image] =>[orig_patent_app_number] => 13022443 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8773171 [patent_doc_number] => 08427134 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-23 [patent_title] => 'Current detection printed board, voltage detection printed board, current/voltage detection printed board, current/voltage detector, current detector and voltage detector' [patent_app_type] => utility [patent_app_number] => 13/014288 [patent_app_country] => US [patent_app_date] => 2011-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 67 [patent_no_of_words] => 18994 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13014288 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8730593 [patent_doc_number] => 20130076162 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-03-28 [patent_title] => 'Suspension Member for a Vibration Actuator' [patent_app_type] => utility [patent_app_number] => 13/517245 [patent_app_country] => US [patent_app_date] => 2010-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4407 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13517245 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7505408 [patent_doc_number] => 08035408 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-10-11 [patent_title] => 'Socket fixture for testing warped memory modules on a PC motherboard' [patent_app_type] => utility [patent_app_number] => 12/965693 [patent_app_country] => US [patent_app_date] => 2010-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 2532 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 226 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/035/08035408.pdf [firstpage_image] =>[orig_patent_app_number] => 12965693 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6209083 [patent_doc_number] => 20110133748 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-09 [patent_title] => 'SIGNAL OUTPUT CIRCUIT, TIMING GENERATE CIRCUIT, TEST APPARATUS AND RECEIVER CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/959302 [patent_app_country] => US [patent_app_date] => 2010-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6763 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0133/20110133748.pdf [firstpage_image] =>[orig_patent_app_number] => 12959302 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8083369 [patent_doc_number] => 08149011 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2012-04-03 [patent_title] => 'Stress programming of transistors' [patent_app_type] => utility [patent_app_number] => 12/953117 [patent_app_country] => US [patent_app_date] => 2010-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4023 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/149/08149011.pdf [firstpage_image] =>[orig_patent_app_number] => 12953117 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8871323 [patent_doc_number] => 08466702 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-18 [patent_title] => 'Test system and substrate unit for testing' [patent_app_type] => utility [patent_app_number] => 12/953352 [patent_app_country] => US [patent_app_date] => 2010-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 5319 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12953352 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6115702 [patent_doc_number] => 20110074453 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-31 [patent_title] => 'SEMICONDUCTOR CHIP HAVING A CRACK TEST CIRCUIT AND METHOD OF TESTING A CRACK OF A SEMICONDUCTOR CHIP USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/926512 [patent_app_country] => US [patent_app_date] => 2010-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6009 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20110074453.pdf [firstpage_image] =>[orig_patent_app_number] => 12926512 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6004702 [patent_doc_number] => 20110057662 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-10 [patent_title] => 'Arc Detector And Associated Method For Detecting Undesired Arcs' [patent_app_type] => utility [patent_app_number] => 12/909674 [patent_app_country] => US [patent_app_date] => 2010-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3321 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0057/20110057662.pdf [firstpage_image] =>[orig_patent_app_number] => 12909674 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8933378 [patent_doc_number] => 08493083 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-07-23 [patent_title] => 'Test apparatus, test method and computer readable medium' [patent_app_type] => utility [patent_app_number] => 12/869545 [patent_app_country] => US [patent_app_date] => 2010-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 12591 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12869545 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4622312 [patent_doc_number] => RE042637 [patent_country] => US [patent_kind] => E1 [patent_issue_date] => 2011-08-23 [patent_title] => 'Probe card' [patent_app_type] => reissue [patent_app_number] => 12/806046 [patent_app_country] => US [patent_app_date] => 2010-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8135 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 248 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/RE/042/RE042637.pdf [firstpage_image] =>[orig_patent_app_number] => 12806046 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6193606 [patent_doc_number] => 20110025360 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-03 [patent_title] => 'SEMICONDUCTOR INTEGRATED CIRCUIT TEST DEVICE' [patent_app_type] => utility [patent_app_number] => 12/838967 [patent_app_country] => US [patent_app_date] => 2010-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6923 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20110025360.pdf [firstpage_image] =>[orig_patent_app_number] => 12838967 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9324285 [patent_doc_number] => 08659312 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-02-25 [patent_title] => 'Probe card and semiconductor wafer inspection method using the same' [patent_app_type] => utility [patent_app_number] => 12/838849 [patent_app_country] => US [patent_app_date] => 2010-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 22 [patent_no_of_words] => 11841 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12838849 [rel_patent_id] =>[rel_patent_doc_number] =>)