Search

Brent J Andrews

Examiner (ID: 6776, Phone: (571)272-6101 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2868, 2858
Total Applications
322
Issued Applications
224
Pending Applications
37
Abandoned Applications
61

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5340979 [patent_doc_number] => 20090179629 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-16 [patent_title] => 'On-chip current sensing methods and systems' [patent_app_type] => utility [patent_app_number] => 12/382286 [patent_app_country] => US [patent_app_date] => 2009-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4855 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20090179629.pdf [firstpage_image] =>[orig_patent_app_number] => 12382286 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/382286
On-chip current sensing methods and systems Mar 11, 2009 Issued
Array ( [id] => 4477862 [patent_doc_number] => 07868631 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-11 [patent_title] => 'Solar cell testing apparatus' [patent_app_type] => utility [patent_app_number] => 12/395712 [patent_app_country] => US [patent_app_date] => 2009-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3381 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/868/07868631.pdf [firstpage_image] =>[orig_patent_app_number] => 12395712 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/395712
Solar cell testing apparatus Mar 1, 2009 Issued
Array ( [id] => 5512502 [patent_doc_number] => 20090212806 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-27 [patent_title] => 'System for Making Contact Between a Transmit/Receive Module and a Testing Device' [patent_app_type] => utility [patent_app_number] => 12/392712 [patent_app_country] => US [patent_app_date] => 2009-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2912 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20090212806.pdf [firstpage_image] =>[orig_patent_app_number] => 12392712 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/392712
System for making contact between a transmit/receive module and a testing device Feb 24, 2009 Issued
Array ( [id] => 4576794 [patent_doc_number] => 07859283 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-28 [patent_title] => 'Probe apparatus, probing method, and storage medium' [patent_app_type] => utility [patent_app_number] => 12/389913 [patent_app_country] => US [patent_app_date] => 2009-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 35 [patent_no_of_words] => 7403 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 306 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/859/07859283.pdf [firstpage_image] =>[orig_patent_app_number] => 12389913 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/389913
Probe apparatus, probing method, and storage medium Feb 19, 2009 Issued
Array ( [id] => 8422470 [patent_doc_number] => 08278959 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-02 [patent_title] => 'Method and system for measuring laser induced phenomena changes in a semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/372914 [patent_app_country] => US [patent_app_date] => 2009-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3130 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12372914 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/372914
Method and system for measuring laser induced phenomena changes in a semiconductor device Feb 17, 2009 Issued
Array ( [id] => 4528290 [patent_doc_number] => 07952378 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-31 [patent_title] => 'Tunable stress technique for reliability degradation measurement' [patent_app_type] => utility [patent_app_number] => 12/358510 [patent_app_country] => US [patent_app_date] => 2009-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 5726 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/952/07952378.pdf [firstpage_image] =>[orig_patent_app_number] => 12358510 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/358510
Tunable stress technique for reliability degradation measurement Jan 22, 2009 Issued
Array ( [id] => 6193604 [patent_doc_number] => 20110025358 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-03 [patent_title] => 'PROBE UNIT' [patent_app_type] => utility [patent_app_number] => 12/735598 [patent_app_country] => US [patent_app_date] => 2009-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5288 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20110025358.pdf [firstpage_image] =>[orig_patent_app_number] => 12735598 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/735598
Probe unit Jan 21, 2009 Issued
Array ( [id] => 6305833 [patent_doc_number] => 20100109661 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-06 [patent_title] => 'HALL-EFFECT SWITCH CIRCUIT ALLOWING LOW VOLTAGE OPERATION' [patent_app_type] => utility [patent_app_number] => 12/355042 [patent_app_country] => US [patent_app_date] => 2009-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2553 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20100109661.pdf [firstpage_image] =>[orig_patent_app_number] => 12355042 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/355042
Hall-effect switch circuit allowing low voltage operation Jan 15, 2009 Issued
Array ( [id] => 124532 [patent_doc_number] => 07705623 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-27 [patent_title] => 'Method and device for detecting interlaminar short circuits' [patent_app_type] => utility [patent_app_number] => 12/352923 [patent_app_country] => US [patent_app_date] => 2009-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 6365 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/705/07705623.pdf [firstpage_image] =>[orig_patent_app_number] => 12352923 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/352923
Method and device for detecting interlaminar short circuits Jan 12, 2009 Issued
Array ( [id] => 5328384 [patent_doc_number] => 20090108861 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-30 [patent_title] => 'STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES' [patent_app_type] => utility [patent_app_number] => 12/345740 [patent_app_country] => US [patent_app_date] => 2008-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5404 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0108/20090108861.pdf [firstpage_image] =>[orig_patent_app_number] => 12345740 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/345740
Stiffener assembly for use with testing devices Dec 29, 2008 Issued
Array ( [id] => 4436180 [patent_doc_number] => 07898277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-01 [patent_title] => 'Hot-electronic injection testing of transistors on a wafer' [patent_app_type] => utility [patent_app_number] => 12/344016 [patent_app_country] => US [patent_app_date] => 2008-12-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3499 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/898/07898277.pdf [firstpage_image] =>[orig_patent_app_number] => 12344016 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/344016
Hot-electronic injection testing of transistors on a wafer Dec 23, 2008 Issued
Array ( [id] => 6282601 [patent_doc_number] => 20100156519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-24 [patent_title] => 'ELECTRICAL SYSTEM, VOLTAGE REFERENCE GENERATION CIRCUIT, AND CALIBRATION METHOD OF THE CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/340110 [patent_app_country] => US [patent_app_date] => 2008-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3871 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20100156519.pdf [firstpage_image] =>[orig_patent_app_number] => 12340110 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/340110
Electrical system, voltage reference generation circuit, and calibration method of the circuit Dec 18, 2008 Issued
Array ( [id] => 7535853 [patent_doc_number] => 08049487 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-11-01 [patent_title] => 'Power measurement circuit' [patent_app_type] => utility [patent_app_number] => 12/338235 [patent_app_country] => US [patent_app_date] => 2008-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 19 [patent_no_of_words] => 3671 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/049/08049487.pdf [firstpage_image] =>[orig_patent_app_number] => 12338235 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/338235
Power measurement circuit Dec 17, 2008 Issued
Array ( [id] => 5432508 [patent_doc_number] => 20090167094 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-02 [patent_title] => 'VOLTAGE ADJUSTING CIRCUITS AND VOLTAGE ADJUSTING METHODS' [patent_app_type] => utility [patent_app_number] => 12/335062 [patent_app_country] => US [patent_app_date] => 2008-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3061 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0167/20090167094.pdf [firstpage_image] =>[orig_patent_app_number] => 12335062 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/335062
Voltage adjusting circuits and voltage adjusting methods Dec 14, 2008 Issued
Array ( [id] => 8018527 [patent_doc_number] => 08138771 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-20 [patent_title] => 'Touch controller with read-out line' [patent_app_type] => utility [patent_app_number] => 12/315856 [patent_app_country] => US [patent_app_date] => 2008-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 21492 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/138/08138771.pdf [firstpage_image] =>[orig_patent_app_number] => 12315856 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/315856
Touch controller with read-out line Dec 4, 2008 Issued
Array ( [id] => 8245418 [patent_doc_number] => 08203345 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-06-19 [patent_title] => 'Storage battery and battery tester' [patent_app_type] => utility [patent_app_number] => 12/328022 [patent_app_country] => US [patent_app_date] => 2008-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4664 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/203/08203345.pdf [firstpage_image] =>[orig_patent_app_number] => 12328022 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/328022
Storage battery and battery tester Dec 3, 2008 Issued
Array ( [id] => 7546096 [patent_doc_number] => 08054070 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-11-08 [patent_title] => 'Nanomagnet-based magnetic anomaly detector' [patent_app_type] => utility [patent_app_number] => 12/328065 [patent_app_country] => US [patent_app_date] => 2008-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4185 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/054/08054070.pdf [firstpage_image] =>[orig_patent_app_number] => 12328065 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/328065
Nanomagnet-based magnetic anomaly detector Dec 3, 2008 Issued
Array ( [id] => 4576735 [patent_doc_number] => 07859276 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-12-28 [patent_title] => 'Non-destructive validation of semiconductor devices' [patent_app_type] => utility [patent_app_number] => 12/326224 [patent_app_country] => US [patent_app_date] => 2008-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 14 [patent_no_of_words] => 2819 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/859/07859276.pdf [firstpage_image] =>[orig_patent_app_number] => 12326224 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/326224
Non-destructive validation of semiconductor devices Dec 1, 2008 Issued
Array ( [id] => 4624980 [patent_doc_number] => 08004282 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-23 [patent_title] => 'Method of measuring and imaging RXO (near wellbore resistivity) using transient EM' [patent_app_type] => utility [patent_app_number] => 12/325841 [patent_app_country] => US [patent_app_date] => 2008-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 3584 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/004/08004282.pdf [firstpage_image] =>[orig_patent_app_number] => 12325841 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/325841
Method of measuring and imaging RXO (near wellbore resistivity) using transient EM Nov 30, 2008 Issued
Array ( [id] => 6554412 [patent_doc_number] => 20100127754 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-27 [patent_title] => 'POWER MEASUREMENT CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/277811 [patent_app_country] => US [patent_app_date] => 2008-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3330 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0127/20100127754.pdf [firstpage_image] =>[orig_patent_app_number] => 12277811 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/277811
POWER MEASUREMENT CIRCUIT Nov 24, 2008 Abandoned
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