
Brooke J. Purinton
Examiner (ID: 1374, Phone: (571)270-5384 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 4174, 2881 |
| Total Applications | 573 |
| Issued Applications | 393 |
| Pending Applications | 1 |
| Abandoned Applications | 182 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7535536
[patent_doc_number] => 08049162
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-11-01
[patent_title] => 'Zeeman-slower, coil for a Zeeman-slower device and a method for cooling an atom beam'
[patent_app_type] => utility
[patent_app_number] => 12/305098
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[pdf_file] => patents/08/049/08049162.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/305098 | Zeeman-slower, coil for a Zeeman-slower device and a method for cooling an atom beam | May 23, 2007 | Issued |
Array
(
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[patent_doc_number] => 20080179511
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[patent_kind] => A1
[patent_issue_date] => 2008-07-31
[patent_title] => 'MICROSPRAY LIQUID-LIQUID EXTRACTIVE IONIZATION DEVICE'
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[patent_app_number] => 11/751718
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Array
(
[id] => 4789303
[patent_doc_number] => 20080290276
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[patent_kind] => A1
[patent_issue_date] => 2008-11-27
[patent_title] => 'DICOROTRON HAVING ADJUSTABLE WIRE HEIGHT'
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[patent_app_date] => 2007-05-22
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Array
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[patent_issue_date] => 2010-08-03
[patent_title] => 'Miniature mass spectrometer for the analysis of chemical and biological solid samples'
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Array
(
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[patent_title] => 'APPARATUS AND METHOD OF DETECTING SECONDARY ELECTRONS'
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Array
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Array
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[patent_issue_date] => 2008-11-20
[patent_title] => 'IN-SITU HIGH-RESOLUTION LIGHT-OPTICAL CHANNEL FOR OPTICAL VIEWING AND SURFACE PROCESSING IN PARALLEL WITH CHARGED PARTICLE (FIB AND SEM) TECHNIQUES'
[patent_app_type] => utility
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[pdf_file] => publications/A1/0283/20080283777.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/749350 | In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (FIB and SEM) techniques | May 15, 2007 | Issued |
Array
(
[id] => 4919085
[patent_doc_number] => 20080067396
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[patent_issue_date] => 2008-03-20
[patent_title] => 'Electron Lens and Charged Particle Beam Apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/749181
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Array
(
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[patent_title] => 'MACHINING OF MICROSTRUCTURES'
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Array
(
[id] => 4919060
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[patent_issue_date] => 2008-03-20
[patent_title] => 'SEM-TYPE REVIEWING APPARATUS AND A METHOD FOR REVIEWING DEFECTS USING THE SAME'
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[patent_app_number] => 11/747253
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Array
(
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[patent_issue_date] => 2010-03-30
[patent_title] => 'Drive stage for scanning probe apparatus, and scanning probe apparatus'
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Array
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Array
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Array
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Array
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Array
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