
Brooke J. Purinton
Examiner (ID: 1374, Phone: (571)270-5384 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 4174, 2881 |
| Total Applications | 573 |
| Issued Applications | 393 |
| Pending Applications | 1 |
| Abandoned Applications | 182 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 267345
[patent_doc_number] => 07566871
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-07-28
[patent_title] => 'Method and apparatus for pattern inspection'
[patent_app_type] => utility
[patent_app_number] => 11/698025
[patent_app_country] => US
[patent_app_date] => 2007-01-26
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 6154
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/566/07566871.pdf
[firstpage_image] =>[orig_patent_app_number] => 11698025
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/698025 | Method and apparatus for pattern inspection | Jan 25, 2007 | Issued |
Array
(
[id] => 5060199
[patent_doc_number] => 20070221836
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-09-27
[patent_title] => 'Mass analysis system'
[patent_app_type] => utility
[patent_app_number] => 11/698105
[patent_app_country] => US
[patent_app_date] => 2007-01-26
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[firstpage_image] =>[orig_patent_app_number] => 11698105
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/698105 | Mass analysis system | Jan 25, 2007 | Abandoned |
Array
(
[id] => 4590892
[patent_doc_number] => 07861316
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-12-28
[patent_title] => 'Microscope probe having an ultra-tall tip'
[patent_app_type] => utility
[patent_app_number] => 11/608456
[patent_app_country] => US
[patent_app_date] => 2006-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 4399
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[pdf_file] => patents/07/861/07861316.pdf
[firstpage_image] =>[orig_patent_app_number] => 11608456
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/608456 | Microscope probe having an ultra-tall tip | Dec 7, 2006 | Issued |
Array
(
[id] => 4782447
[patent_doc_number] => 20080135776
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-12
[patent_title] => 'MAGNETIC MONITORING OF A FARADAY CUP FOR AN ION IMPLANTER'
[patent_app_type] => utility
[patent_app_number] => 11/608595
[patent_app_country] => US
[patent_app_date] => 2006-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => publications/A1/0135/20080135776.pdf
[firstpage_image] =>[orig_patent_app_number] => 11608595
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/608595 | Magnetic monitoring of a Faraday cup for an ion implanter | Dec 7, 2006 | Issued |
Array
(
[id] => 5307360
[patent_doc_number] => 20090014641
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'Mass Spectrometer'
[patent_app_type] => utility
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[patent_app_date] => 2006-12-07
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 12094561
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/094561 | Closed loop ion guide with pseudo-potential well | Dec 6, 2006 | Issued |
Array
(
[id] => 5587666
[patent_doc_number] => 20090106868
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-23
[patent_title] => 'ATOMIC FORCE MICROSCOPE TIP SHAPE DETERMINATION TOOL'
[patent_app_type] => utility
[patent_app_number] => 12/096953
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/096953 | ATOMIC FORCE MICROSCOPE TIP SHAPE DETERMINATION TOOL | Dec 3, 2006 | Abandoned |
Array
(
[id] => 359979
[patent_doc_number] => 07485858
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-02-03
[patent_title] => 'Inspection method for semiconductor wafer and apparatus for reviewing defects'
[patent_app_type] => utility
[patent_app_number] => 11/607906
[patent_app_country] => US
[patent_app_date] => 2006-12-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/485/07485858.pdf
[firstpage_image] =>[orig_patent_app_number] => 11607906
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/607906 | Inspection method for semiconductor wafer and apparatus for reviewing defects | Dec 3, 2006 | Issued |
Array
(
[id] => 285788
[patent_doc_number] => 07550717
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-06-23
[patent_title] => 'Quadrupole FAIMS apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/607789
[patent_app_country] => US
[patent_app_date] => 2006-11-30
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[pdf_file] => patents/07/550/07550717.pdf
[firstpage_image] =>[orig_patent_app_number] => 11607789
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/607789 | Quadrupole FAIMS apparatus | Nov 29, 2006 | Issued |
Array
(
[id] => 4936206
[patent_doc_number] => 20080073520
[patent_country] => US
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[patent_issue_date] => 2008-03-27
[patent_title] => 'Tip structure for scanning devices, method of its preparation and devices thereon'
[patent_app_type] => utility
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[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/606442 | Tip structure for scanning devices, method of its preparation and devices thereon | Nov 29, 2006 | Abandoned |
Array
(
[id] => 5431940
[patent_doc_number] => 20090166526
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-07-02
[patent_title] => 'Method of and Equipment for Measuring Ionic Mobility'
[patent_app_type] => utility
[patent_app_number] => 12/085687
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[firstpage_image] =>[orig_patent_app_number] => 12085687
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/085687 | Method of and equipment for measuring ionic mobility | Nov 28, 2006 | Issued |
Array
(
[id] => 5076831
[patent_doc_number] => 20070120055
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-31
[patent_title] => 'Method of measuring aberrations and correcting aberrations using ronchigram and electron microscope'
[patent_app_type] => utility
[patent_app_number] => 11/604977
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/604977 | Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope | Nov 27, 2006 | Issued |
Array
(
[id] => 5499122
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[patent_title] => 'Particle-Optical Component'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/095198 | Particle-Optical Component | Nov 27, 2006 | Abandoned |
Array
(
[id] => 4820420
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Array
(
[id] => 5262125
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[patent_title] => 'MASS SPECTROMETER'
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Array
(
[id] => 5268361
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[firstpage_image] =>[orig_patent_app_number] => 12092313
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/092313 | Mass spectrometer with corrugations, wells, or barriers and a driving DC voltage or potential | Oct 31, 2006 | Issued |
Array
(
[id] => 4691104
[patent_doc_number] => 20080083874
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[patent_title] => 'Vacuum interface for mass spectrometer'
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[firstpage_image] =>[orig_patent_app_number] => 11546197
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Array
(
[id] => 5191600
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[patent_title] => 'Toothbrush Box With Sterilization Function'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/538057 | Toothbrush Box With Sterilization Function | Oct 2, 2006 | Abandoned |
Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/533306 | METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON MICROSCOPE | Sep 18, 2006 | Abandoned |