Search

Brooke J. Purinton

Examiner (ID: 1374, Phone: (571)270-5384 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
4174, 2881
Total Applications
573
Issued Applications
393
Pending Applications
1
Abandoned Applications
182

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 267345 [patent_doc_number] => 07566871 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-07-28 [patent_title] => 'Method and apparatus for pattern inspection' [patent_app_type] => utility [patent_app_number] => 11/698025 [patent_app_country] => US [patent_app_date] => 2007-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 6154 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 307 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/566/07566871.pdf [firstpage_image] =>[orig_patent_app_number] => 11698025 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/698025
Method and apparatus for pattern inspection Jan 25, 2007 Issued
Array ( [id] => 5060199 [patent_doc_number] => 20070221836 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-27 [patent_title] => 'Mass analysis system' [patent_app_type] => utility [patent_app_number] => 11/698105 [patent_app_country] => US [patent_app_date] => 2007-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 6872 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0221/20070221836.pdf [firstpage_image] =>[orig_patent_app_number] => 11698105 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/698105
Mass analysis system Jan 25, 2007 Abandoned
Array ( [id] => 4590892 [patent_doc_number] => 07861316 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-28 [patent_title] => 'Microscope probe having an ultra-tall tip' [patent_app_type] => utility [patent_app_number] => 11/608456 [patent_app_country] => US [patent_app_date] => 2006-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 24 [patent_no_of_words] => 4399 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 251 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/861/07861316.pdf [firstpage_image] =>[orig_patent_app_number] => 11608456 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/608456
Microscope probe having an ultra-tall tip Dec 7, 2006 Issued
Array ( [id] => 4782447 [patent_doc_number] => 20080135776 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-12 [patent_title] => 'MAGNETIC MONITORING OF A FARADAY CUP FOR AN ION IMPLANTER' [patent_app_type] => utility [patent_app_number] => 11/608595 [patent_app_country] => US [patent_app_date] => 2006-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5852 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0135/20080135776.pdf [firstpage_image] =>[orig_patent_app_number] => 11608595 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/608595
Magnetic monitoring of a Faraday cup for an ion implanter Dec 7, 2006 Issued
Array ( [id] => 5307360 [patent_doc_number] => 20090014641 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-15 [patent_title] => 'Mass Spectrometer' [patent_app_type] => utility [patent_app_number] => 12/094561 [patent_app_country] => US [patent_app_date] => 2006-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 16969 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 14 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0014/20090014641.pdf [firstpage_image] =>[orig_patent_app_number] => 12094561 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/094561
Closed loop ion guide with pseudo-potential well Dec 6, 2006 Issued
Array ( [id] => 5587666 [patent_doc_number] => 20090106868 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-23 [patent_title] => 'ATOMIC FORCE MICROSCOPE TIP SHAPE DETERMINATION TOOL' [patent_app_type] => utility [patent_app_number] => 12/096953 [patent_app_country] => US [patent_app_date] => 2006-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3871 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0106/20090106868.pdf [firstpage_image] =>[orig_patent_app_number] => 12096953 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/096953
ATOMIC FORCE MICROSCOPE TIP SHAPE DETERMINATION TOOL Dec 3, 2006 Abandoned
Array ( [id] => 359979 [patent_doc_number] => 07485858 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-02-03 [patent_title] => 'Inspection method for semiconductor wafer and apparatus for reviewing defects' [patent_app_type] => utility [patent_app_number] => 11/607906 [patent_app_country] => US [patent_app_date] => 2006-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 7330 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/485/07485858.pdf [firstpage_image] =>[orig_patent_app_number] => 11607906 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/607906
Inspection method for semiconductor wafer and apparatus for reviewing defects Dec 3, 2006 Issued
Array ( [id] => 285788 [patent_doc_number] => 07550717 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-06-23 [patent_title] => 'Quadrupole FAIMS apparatus' [patent_app_type] => utility [patent_app_number] => 11/607789 [patent_app_country] => US [patent_app_date] => 2006-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 5894 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 348 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/550/07550717.pdf [firstpage_image] =>[orig_patent_app_number] => 11607789 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/607789
Quadrupole FAIMS apparatus Nov 29, 2006 Issued
Array ( [id] => 4936206 [patent_doc_number] => 20080073520 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-27 [patent_title] => 'Tip structure for scanning devices, method of its preparation and devices thereon' [patent_app_type] => utility [patent_app_number] => 11/606442 [patent_app_country] => US [patent_app_date] => 2006-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 9994 [patent_no_of_claims] => 50 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0073/20080073520.pdf [firstpage_image] =>[orig_patent_app_number] => 11606442 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/606442
Tip structure for scanning devices, method of its preparation and devices thereon Nov 29, 2006 Abandoned
Array ( [id] => 5431940 [patent_doc_number] => 20090166526 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-02 [patent_title] => 'Method of and Equipment for Measuring Ionic Mobility' [patent_app_type] => utility [patent_app_number] => 12/085687 [patent_app_country] => US [patent_app_date] => 2006-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4670 [patent_no_of_claims] => 55 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0166/20090166526.pdf [firstpage_image] =>[orig_patent_app_number] => 12085687 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/085687
Method of and equipment for measuring ionic mobility Nov 28, 2006 Issued
Array ( [id] => 5076831 [patent_doc_number] => 20070120055 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-31 [patent_title] => 'Method of measuring aberrations and correcting aberrations using ronchigram and electron microscope' [patent_app_type] => utility [patent_app_number] => 11/604977 [patent_app_country] => US [patent_app_date] => 2006-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4373 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0120/20070120055.pdf [firstpage_image] =>[orig_patent_app_number] => 11604977 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/604977
Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope Nov 27, 2006 Issued
Array ( [id] => 5499122 [patent_doc_number] => 20090159810 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-25 [patent_title] => 'Particle-Optical Component' [patent_app_type] => utility [patent_app_number] => 12/095198 [patent_app_country] => US [patent_app_date] => 2006-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 19413 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0159/20090159810.pdf [firstpage_image] =>[orig_patent_app_number] => 12095198 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/095198
Particle-Optical Component Nov 27, 2006 Abandoned
Array ( [id] => 4820420 [patent_doc_number] => 20080121802 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-29 [patent_title] => 'Method, computer program and apparatus for the characterization of molecules' [patent_app_type] => utility [patent_app_number] => 11/604726 [patent_app_country] => US [patent_app_date] => 2006-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7483 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0121/20080121802.pdf [firstpage_image] =>[orig_patent_app_number] => 11604726 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/604726
Method, computer program and apparatus for the characterization of molecules Nov 27, 2006 Issued
Array ( [id] => 5262125 [patent_doc_number] => 20090114810 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-07 [patent_title] => 'MASS SPECTROMETER' [patent_app_type] => utility [patent_app_number] => 12/094318 [patent_app_country] => US [patent_app_date] => 2006-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 17301 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 17 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0114/20090114810.pdf [firstpage_image] =>[orig_patent_app_number] => 12094318 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/094318
Mass spectrometer Nov 22, 2006 Issued
Array ( [id] => 5268361 [patent_doc_number] => 20090072136 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-19 [patent_title] => 'Mass Spectrometer' [patent_app_type] => utility [patent_app_number] => 12/092313 [patent_app_country] => US [patent_app_date] => 2006-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 17188 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 14 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20090072136.pdf [firstpage_image] =>[orig_patent_app_number] => 12092313 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/092313
Mass spectrometer with corrugations, wells, or barriers and a driving DC voltage or potential Oct 31, 2006 Issued
Array ( [id] => 4691104 [patent_doc_number] => 20080083874 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-10 [patent_title] => 'Vacuum interface for mass spectrometer' [patent_app_type] => utility [patent_app_number] => 11/546197 [patent_app_country] => US [patent_app_date] => 2006-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2866 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0083/20080083874.pdf [firstpage_image] =>[orig_patent_app_number] => 11546197 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/546197
Vacuum interface for mass spectrometer Oct 9, 2006 Abandoned
Array ( [id] => 5191600 [patent_doc_number] => 20070080081 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-12 [patent_title] => 'Toothbrush Box With Sterilization Function' [patent_app_type] => utility [patent_app_number] => 11/538057 [patent_app_country] => US [patent_app_date] => 2006-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2201 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0080/20070080081.pdf [firstpage_image] =>[orig_patent_app_number] => 11538057 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/538057
Toothbrush Box With Sterilization Function Oct 2, 2006 Abandoned
Array ( [id] => 4980450 [patent_doc_number] => 20070085006 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-19 [patent_title] => 'Pattern observation apparatus, pattern observation method, method of manufacturing semiconductor device, and program' [patent_app_type] => utility [patent_app_number] => 11/528589 [patent_app_country] => US [patent_app_date] => 2006-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5710 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20070085006.pdf [firstpage_image] =>[orig_patent_app_number] => 11528589 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/528589
Pattern observation apparatus, pattern observation method, method of manufacturing semiconductor device, and program Sep 27, 2006 Issued
Array ( [id] => 373601 [patent_doc_number] => 07473905 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-06 [patent_title] => 'Electrostatic deflector' [patent_app_type] => utility [patent_app_number] => 11/528942 [patent_app_country] => US [patent_app_date] => 2006-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 4301 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 388 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/473/07473905.pdf [firstpage_image] =>[orig_patent_app_number] => 11528942 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/528942
Electrostatic deflector Sep 27, 2006 Issued
Array ( [id] => 5038006 [patent_doc_number] => 20070090288 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 11/533306 [patent_app_country] => US [patent_app_date] => 2006-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3285 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20070090288.pdf [firstpage_image] =>[orig_patent_app_number] => 11533306 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/533306
METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON MICROSCOPE Sep 18, 2006 Abandoned
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