Search

Bruce C. Anderson

Examiner (ID: 15788)

Most Active Art Unit
2506
Art Unit(s)
2899, 2881, 2506, 2878, 2872
Total Applications
2208
Issued Applications
1947
Pending Applications
78
Abandoned Applications
183

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4384974 [patent_doc_number] => 06303928 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-16 [patent_title] => 'Continuous cold atom beam atomic system' [patent_app_type] => 1 [patent_app_number] => 9/217722 [patent_app_country] => US [patent_app_date] => 1998-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4646 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/303/06303928.pdf [firstpage_image] =>[orig_patent_app_number] => 217722 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/217722
Continuous cold atom beam atomic system Dec 20, 1998 Issued
Array ( [id] => 4107928 [patent_doc_number] => 06051832 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-04-18 [patent_title] => 'Drift chambers' [patent_app_type] => 1 [patent_app_number] => 9/212906 [patent_app_country] => US [patent_app_date] => 1998-12-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 3102 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/051/06051832.pdf [firstpage_image] =>[orig_patent_app_number] => 212906 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/212906
Drift chambers Dec 15, 1998 Issued
Array ( [id] => 4160716 [patent_doc_number] => 06107629 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-22 [patent_title] => 'Method to determine depth profiles in an area of thin coating' [patent_app_type] => 1 [patent_app_number] => 9/077508 [patent_app_country] => US [patent_app_date] => 1998-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2770 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/107/06107629.pdf [firstpage_image] =>[orig_patent_app_number] => 077508 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/077508
Method to determine depth profiles in an area of thin coating Dec 13, 1998 Issued
Array ( [id] => 1486590 [patent_doc_number] => 06365896 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-02 [patent_title] => 'Environmental SEM with a magnetic field for improved secondary electron direction' [patent_app_type] => B1 [patent_app_number] => 09/205526 [patent_app_country] => US [patent_app_date] => 1998-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 5309 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/365/06365896.pdf [firstpage_image] =>[orig_patent_app_number] => 09205526 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/205526
Environmental SEM with a magnetic field for improved secondary electron direction Dec 2, 1998 Issued
09/204430 METHOD AND APPARATUS FOR TESTING A SUBSTRATE Dec 2, 1998 Abandoned
Array ( [id] => 4325862 [patent_doc_number] => 06331710 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-18 [patent_title] => 'Reflective optical systems for EUV lithography' [patent_app_type] => 1 [patent_app_number] => 9/203712 [patent_app_country] => US [patent_app_date] => 1998-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5031 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/331/06331710.pdf [firstpage_image] =>[orig_patent_app_number] => 203712 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/203712
Reflective optical systems for EUV lithography Dec 1, 1998 Issued
09/199112 DETECTOR CONFIGURATION FOR EFFICIENT SECONDARY ELECTRON COLLECTION IN MICROCOLUMNS Nov 23, 1998 Abandoned
Array ( [id] => 1486583 [patent_doc_number] => 06365892 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-02 [patent_title] => 'Method and apparatus for correction of initial ion velocity in a reflectron time-of-flight mass spectrometer' [patent_app_type] => B1 [patent_app_number] => 09/199108 [patent_app_country] => US [patent_app_date] => 1998-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6315 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/365/06365892.pdf [firstpage_image] =>[orig_patent_app_number] => 09199108 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/199108
Method and apparatus for correction of initial ion velocity in a reflectron time-of-flight mass spectrometer Nov 23, 1998 Issued
Array ( [id] => 4387605 [patent_doc_number] => 06278125 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-21 [patent_title] => 'Shielded radiation assembly' [patent_app_type] => 1 [patent_app_number] => 9/197229 [patent_app_country] => US [patent_app_date] => 1998-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2417 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/278/06278125.pdf [firstpage_image] =>[orig_patent_app_number] => 197229 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/197229
Shielded radiation assembly Nov 22, 1998 Issued
Array ( [id] => 4400796 [patent_doc_number] => 06297500 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-02 [patent_title] => 'Quadrupole RF ion traps for mass spectrometers' [patent_app_type] => 1 [patent_app_number] => 9/196707 [patent_app_country] => US [patent_app_date] => 1998-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 3636 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/297/06297500.pdf [firstpage_image] =>[orig_patent_app_number] => 196707 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/196707
Quadrupole RF ion traps for mass spectrometers Nov 19, 1998 Issued
Array ( [id] => 4385036 [patent_doc_number] => 06303932 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-16 [patent_title] => 'Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beam' [patent_app_type] => 1 [patent_app_number] => 9/195711 [patent_app_country] => US [patent_app_date] => 1998-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 8419 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/303/06303932.pdf [firstpage_image] =>[orig_patent_app_number] => 195711 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/195711
Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beam Nov 18, 1998 Issued
Array ( [id] => 4385017 [patent_doc_number] => 06303931 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-16 [patent_title] => 'Method for determining a profile quality grade of an inspected feature' [patent_app_type] => 1 [patent_app_number] => 9/193720 [patent_app_country] => US [patent_app_date] => 1998-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 5681 [patent_no_of_claims] => 53 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/303/06303931.pdf [firstpage_image] =>[orig_patent_app_number] => 193720 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/193720
Method for determining a profile quality grade of an inspected feature Nov 16, 1998 Issued
Array ( [id] => 4256874 [patent_doc_number] => 06207965 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-27 [patent_title] => 'Apparatus and method for electron beam lithography and semiconductor device' [patent_app_type] => 1 [patent_app_number] => 9/193228 [patent_app_country] => US [patent_app_date] => 1998-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 7745 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 299 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/207/06207965.pdf [firstpage_image] =>[orig_patent_app_number] => 193228 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/193228
Apparatus and method for electron beam lithography and semiconductor device Nov 16, 1998 Issued
Array ( [id] => 4264423 [patent_doc_number] => 06204511 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-20 [patent_title] => 'Electron beam image picturing method and image picturing device' [patent_app_type] => 1 [patent_app_number] => 9/192311 [patent_app_country] => US [patent_app_date] => 1998-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 5270 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/204/06204511.pdf [firstpage_image] =>[orig_patent_app_number] => 192311 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/192311
Electron beam image picturing method and image picturing device Nov 15, 1998 Issued
09/180929 CORONA ELECTRODE ARRANGEMENT Nov 15, 1998 Abandoned
Array ( [id] => 4265240 [patent_doc_number] => 06259094 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-10 [patent_title] => 'Electron beam inspection method and apparatus' [patent_app_type] => 1 [patent_app_number] => 9/191116 [patent_app_country] => US [patent_app_date] => 1998-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 5703 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/259/06259094.pdf [firstpage_image] =>[orig_patent_app_number] => 191116 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/191116
Electron beam inspection method and apparatus Nov 12, 1998 Issued
Array ( [id] => 1562996 [patent_doc_number] => 06362486 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-26 [patent_title] => 'Magnetic lens for focusing a charged particle beam' [patent_app_type] => B1 [patent_app_number] => 09/191102 [patent_app_country] => US [patent_app_date] => 1998-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2573 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/362/06362486.pdf [firstpage_image] =>[orig_patent_app_number] => 09191102 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/191102
Magnetic lens for focusing a charged particle beam Nov 11, 1998 Issued
Array ( [id] => 4413342 [patent_doc_number] => 06300625 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-09 [patent_title] => 'Time-of-flight mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/183224 [patent_app_country] => US [patent_app_date] => 1998-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2153 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/300/06300625.pdf [firstpage_image] =>[orig_patent_app_number] => 183224 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/183224
Time-of-flight mass spectrometer Oct 29, 1998 Issued
Array ( [id] => 4413802 [patent_doc_number] => 06265719 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Inspection method and apparatus using electron beam' [patent_app_type] => 1 [patent_app_number] => 9/182415 [patent_app_country] => US [patent_app_date] => 1998-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3710 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/265/06265719.pdf [firstpage_image] =>[orig_patent_app_number] => 182415 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/182415
Inspection method and apparatus using electron beam Oct 29, 1998 Issued
Array ( [id] => 4365699 [patent_doc_number] => 06255662 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-03 [patent_title] => 'Rutherford backscattering detection for use in Ion implantation' [patent_app_type] => 1 [patent_app_number] => 9/179314 [patent_app_country] => US [patent_app_date] => 1998-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2820 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/255/06255662.pdf [firstpage_image] =>[orig_patent_app_number] => 179314 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/179314
Rutherford backscattering detection for use in Ion implantation Oct 26, 1998 Issued
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