
Bruce C. Anderson
Examiner (ID: 15788)
| Most Active Art Unit | 2506 |
| Art Unit(s) | 2899, 2881, 2506, 2878, 2872 |
| Total Applications | 2208 |
| Issued Applications | 1947 |
| Pending Applications | 78 |
| Abandoned Applications | 183 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4384974
[patent_doc_number] => 06303928
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-16
[patent_title] => 'Continuous cold atom beam atomic system'
[patent_app_type] => 1
[patent_app_number] => 9/217722
[patent_app_country] => US
[patent_app_date] => 1998-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4646
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 267
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/303/06303928.pdf
[firstpage_image] =>[orig_patent_app_number] => 217722
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/217722 | Continuous cold atom beam atomic system | Dec 20, 1998 | Issued |
Array
(
[id] => 4107928
[patent_doc_number] => 06051832
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-04-18
[patent_title] => 'Drift chambers'
[patent_app_type] => 1
[patent_app_number] => 9/212906
[patent_app_country] => US
[patent_app_date] => 1998-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 11
[patent_no_of_words] => 3102
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 63
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/051/06051832.pdf
[firstpage_image] =>[orig_patent_app_number] => 212906
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/212906 | Drift chambers | Dec 15, 1998 | Issued |
Array
(
[id] => 4160716
[patent_doc_number] => 06107629
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-08-22
[patent_title] => 'Method to determine depth profiles in an area of thin coating'
[patent_app_type] => 1
[patent_app_number] => 9/077508
[patent_app_country] => US
[patent_app_date] => 1998-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 2770
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 168
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/107/06107629.pdf
[firstpage_image] =>[orig_patent_app_number] => 077508
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/077508 | Method to determine depth profiles in an area of thin coating | Dec 13, 1998 | Issued |
Array
(
[id] => 1486590
[patent_doc_number] => 06365896
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-02
[patent_title] => 'Environmental SEM with a magnetic field for improved secondary electron direction'
[patent_app_type] => B1
[patent_app_number] => 09/205526
[patent_app_country] => US
[patent_app_date] => 1998-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 5309
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 38
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/365/06365896.pdf
[firstpage_image] =>[orig_patent_app_number] => 09205526
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/205526 | Environmental SEM with a magnetic field for improved secondary electron direction | Dec 2, 1998 | Issued |
| 09/204430 | METHOD AND APPARATUS FOR TESTING A SUBSTRATE | Dec 2, 1998 | Abandoned |
Array
(
[id] => 4325862
[patent_doc_number] => 06331710
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-12-18
[patent_title] => 'Reflective optical systems for EUV lithography'
[patent_app_type] => 1
[patent_app_number] => 9/203712
[patent_app_country] => US
[patent_app_date] => 1998-12-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5031
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/331/06331710.pdf
[firstpage_image] =>[orig_patent_app_number] => 203712
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/203712 | Reflective optical systems for EUV lithography | Dec 1, 1998 | Issued |
| 09/199112 | DETECTOR CONFIGURATION FOR EFFICIENT SECONDARY ELECTRON COLLECTION IN MICROCOLUMNS | Nov 23, 1998 | Abandoned |
Array
(
[id] => 1486583
[patent_doc_number] => 06365892
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-02
[patent_title] => 'Method and apparatus for correction of initial ion velocity in a reflectron time-of-flight mass spectrometer'
[patent_app_type] => B1
[patent_app_number] => 09/199108
[patent_app_country] => US
[patent_app_date] => 1998-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 6315
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/365/06365892.pdf
[firstpage_image] =>[orig_patent_app_number] => 09199108
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/199108 | Method and apparatus for correction of initial ion velocity in a reflectron time-of-flight mass spectrometer | Nov 23, 1998 | Issued |
Array
(
[id] => 4387605
[patent_doc_number] => 06278125
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-21
[patent_title] => 'Shielded radiation assembly'
[patent_app_type] => 1
[patent_app_number] => 9/197229
[patent_app_country] => US
[patent_app_date] => 1998-11-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2417
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/278/06278125.pdf
[firstpage_image] =>[orig_patent_app_number] => 197229
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/197229 | Shielded radiation assembly | Nov 22, 1998 | Issued |
Array
(
[id] => 4400796
[patent_doc_number] => 06297500
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-02
[patent_title] => 'Quadrupole RF ion traps for mass spectrometers'
[patent_app_type] => 1
[patent_app_number] => 9/196707
[patent_app_country] => US
[patent_app_date] => 1998-11-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 3636
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/297/06297500.pdf
[firstpage_image] =>[orig_patent_app_number] => 196707
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/196707 | Quadrupole RF ion traps for mass spectrometers | Nov 19, 1998 | Issued |
Array
(
[id] => 4385036
[patent_doc_number] => 06303932
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-16
[patent_title] => 'Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beam'
[patent_app_type] => 1
[patent_app_number] => 9/195711
[patent_app_country] => US
[patent_app_date] => 1998-11-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 8419
[patent_no_of_claims] => 19
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/303/06303932.pdf
[firstpage_image] =>[orig_patent_app_number] => 195711
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/195711 | Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beam | Nov 18, 1998 | Issued |
Array
(
[id] => 4385017
[patent_doc_number] => 06303931
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-16
[patent_title] => 'Method for determining a profile quality grade of an inspected feature'
[patent_app_type] => 1
[patent_app_number] => 9/193720
[patent_app_country] => US
[patent_app_date] => 1998-11-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 5681
[patent_no_of_claims] => 53
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[pdf_file] => patents/06/303/06303931.pdf
[firstpage_image] =>[orig_patent_app_number] => 193720
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/193720 | Method for determining a profile quality grade of an inspected feature | Nov 16, 1998 | Issued |
Array
(
[id] => 4256874
[patent_doc_number] => 06207965
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-03-27
[patent_title] => 'Apparatus and method for electron beam lithography and semiconductor device'
[patent_app_type] => 1
[patent_app_number] => 9/193228
[patent_app_country] => US
[patent_app_date] => 1998-11-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 7745
[patent_no_of_claims] => 17
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/207/06207965.pdf
[firstpage_image] =>[orig_patent_app_number] => 193228
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/193228 | Apparatus and method for electron beam lithography and semiconductor device | Nov 16, 1998 | Issued |
Array
(
[id] => 4264423
[patent_doc_number] => 06204511
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-03-20
[patent_title] => 'Electron beam image picturing method and image picturing device'
[patent_app_type] => 1
[patent_app_number] => 9/192311
[patent_app_country] => US
[patent_app_date] => 1998-11-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/204/06204511.pdf
[firstpage_image] =>[orig_patent_app_number] => 192311
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/192311 | Electron beam image picturing method and image picturing device | Nov 15, 1998 | Issued |
| 09/180929 | CORONA ELECTRODE ARRANGEMENT | Nov 15, 1998 | Abandoned |
Array
(
[id] => 4265240
[patent_doc_number] => 06259094
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-10
[patent_title] => 'Electron beam inspection method and apparatus'
[patent_app_type] => 1
[patent_app_number] => 9/191116
[patent_app_country] => US
[patent_app_date] => 1998-11-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => patents/06/259/06259094.pdf
[firstpage_image] =>[orig_patent_app_number] => 191116
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/191116 | Electron beam inspection method and apparatus | Nov 12, 1998 | Issued |
Array
(
[id] => 1562996
[patent_doc_number] => 06362486
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-26
[patent_title] => 'Magnetic lens for focusing a charged particle beam'
[patent_app_type] => B1
[patent_app_number] => 09/191102
[patent_app_country] => US
[patent_app_date] => 1998-11-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 2573
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/362/06362486.pdf
[firstpage_image] =>[orig_patent_app_number] => 09191102
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/191102 | Magnetic lens for focusing a charged particle beam | Nov 11, 1998 | Issued |
Array
(
[id] => 4413342
[patent_doc_number] => 06300625
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-09
[patent_title] => 'Time-of-flight mass spectrometer'
[patent_app_type] => 1
[patent_app_number] => 9/183224
[patent_app_country] => US
[patent_app_date] => 1998-10-30
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/300/06300625.pdf
[firstpage_image] =>[orig_patent_app_number] => 183224
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/183224 | Time-of-flight mass spectrometer | Oct 29, 1998 | Issued |
Array
(
[id] => 4413802
[patent_doc_number] => 06265719
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-24
[patent_title] => 'Inspection method and apparatus using electron beam'
[patent_app_type] => 1
[patent_app_number] => 9/182415
[patent_app_country] => US
[patent_app_date] => 1998-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_claims] => 15
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/265/06265719.pdf
[firstpage_image] =>[orig_patent_app_number] => 182415
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/182415 | Inspection method and apparatus using electron beam | Oct 29, 1998 | Issued |
Array
(
[id] => 4365699
[patent_doc_number] => 06255662
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-03
[patent_title] => 'Rutherford backscattering detection for use in Ion implantation'
[patent_app_type] => 1
[patent_app_number] => 9/179314
[patent_app_country] => US
[patent_app_date] => 1998-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/06/255/06255662.pdf
[firstpage_image] =>[orig_patent_app_number] => 179314
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/179314 | Rutherford backscattering detection for use in Ion implantation | Oct 26, 1998 | Issued |